| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 03/06/2003 | WO2003018465A1 Substituted donor atoms in silicon crystal for quantum computer |
| 03/06/2003 | US20030042416 Large geometric factor charged particle spectrometer |
| 03/04/2003 | US6529793 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
| 03/04/2003 | US6528785 Microscope probe needle |
| 03/04/2003 | US6528780 Optical probe for proximity field |
| 03/04/2003 | US6528020 Nanotube devices that can be employed in a variety of applications. In particular, the nanotube devices of the present invention provide a new class of versatile chemical and biological provide a new class of versatile chemical and |
| 02/27/2003 | US20030038244 Electrostatically focused addressable field emission array chips (AFEA's) for high-speed massively parallel maskless digital e-beam direct write lithography and scanning electron microscopy |
| 02/27/2003 | US20030038233 Probe opening fabricating apparatus, and near-field optical microscope using the same |
| 02/27/2003 | US20030037605 Conductive transparent probe and probe control apparatus |
| 02/25/2003 | US6523392 Apparatus and method for sensing chemical and/or biological analytes includes a deflectable arm of a microcantilever formed over and contacting a sensing element. A gaseous or liquid medium which may include the analyte being detected, is |
| 02/20/2003 | WO2002022889A9 Direct haplotyping using carbon nanotube probes |
| 02/20/2003 | US20030034453 Coaxial probe and scanning micro-wave microscope including the same |
| 02/20/2003 | US20030033863 Atomic force microscopy for high throughput analysis |
| 02/18/2003 | US6521921 Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same |
| 02/18/2003 | US6521896 Blanker assembly employing dielectric material |
| 02/18/2003 | US6520005 System for sensing a sample |
| 02/13/2003 | US20030030449 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
| 02/13/2003 | US20030029996 Probe for scanning microscope produced by focused ion beam machining |
| 02/12/2003 | CN1397012A Probe for scanning microscope produced by focused ion beam machining |
| 02/12/2003 | CN1397011A Cantilever for vertical scanning microscope and probe for vertical scan microscope using it |
| 02/12/2003 | CN1397010A Conductive probe for scanning microscope and machining method using the same |
| 02/06/2003 | US20030025498 Scanning probe microscope |
| 02/05/2003 | EP1282121A2 Optical near-field generating element and optical apparatus including the same |
| 02/05/2003 | CN1395681A Scanning type probe microscope probe and method of producing the same, and scanning type probe microscope having this probe and polymer processing method using the same |
| 02/04/2003 | US6515898 Memory element, method for structuring a surface, and storage device |
| 02/04/2003 | US6515277 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 01/30/2003 | WO2003007881A2 Antibodies specific for nanotubes and related methods and compositions |
| 01/30/2003 | US20030022470 Parallel, individually addressable probes for nanolithography |
| 01/30/2003 | US20030020500 Multiple local probe measuring device and method |
| 01/30/2003 | US20030020025 Lithographic method using ultra-fine probe needle |
| 01/30/2003 | US20030020010 Time-of- flight mass spectrometer array instrument |
| 01/29/2003 | EP1157407A4 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 01/23/2003 | WO2003006952A2 Method and apparatus for manipulating a sample |
| 01/23/2003 | US20030015651 Optical apparatuses using the near-field light |
| 01/22/2003 | EP1278056A1 Probe for scanning microscope produced by focused ion beam machining |
| 01/22/2003 | EP1278055A1 Cantilever for vertical scanning microscope and probe for vertical scan microscope using it |
| 01/21/2003 | US6509619 Detectors |
| 01/16/2003 | US20030013111 Method and apparatus for solid state molecular analysis |
| 01/16/2003 | US20030011389 Nano-substance mass measurement method and apparatus |
| 01/16/2003 | US20030010910 Continuous fiber of single-wall carbon nanotubes |
| 01/16/2003 | US20030010755 Nanotube length control method |
| 01/16/2003 | US20030010100 Cantilever for vertical scanning microscope and probe for vertical scan microscope |
| 01/16/2003 | US20030010099 Scanning probe microscope |
| 01/16/2003 | US20030010097 Microcantilever sensor |
| 01/09/2003 | WO2002020873A3 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof |
| 01/07/2003 | US6504152 Probe tip configuration and a method of fabrication thereof |
| 01/07/2003 | US6504151 Wear coating applied to an atomic force probe tip |
| 01/03/2003 | WO2002018266A8 Single molecule array on silicon substrate for quantum computer |
| 01/03/2003 | WO2002001599A3 Time-of-flight mass spectrometer array instrument |
| 01/02/2003 | US20030004905 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements |
| 01/02/2003 | US20030003676 Ultra-fine alignment system and method using acoustic-AFM interaction |
| 01/02/2003 | US20030001091 Conductive probe for scanning microscope and machining method using the same |
| 01/02/2003 | EP1271554A2 Scanning probe microscope |
| 01/02/2003 | EP1271155A1 Micromechanical component comprising a diamond layer, and production process |
| 01/02/2003 | EP1271135A2 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements |
| 12/31/2002 | US6501725 Method of recording/reproducing an information signal |
| 12/27/2002 | WO2002103328A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
| 12/27/2002 | WO2002102523A1 Method and apparatus for solid state molecular analysis |
| 12/27/2002 | WO2001077694A9 Ultrananocrystalline diamond cantilever wide dynamic range acceleration/vibration/pressure sensor |
| 12/24/2002 | US6498349 Electrostatically focused addressable field emission array chips (AFEA's) for high-speed massively parallel maskless digital E-beam direct write lithography and scanning electron microscopy |
| 12/19/2002 | US20020190604 Microactuator |
| 12/19/2002 | US20020189330 Caliper method, system, and apparatus |
| 12/10/2002 | CA2326703C High intensity focused ultrasound system for scanning and treating tumors |
| 12/05/2002 | WO2002073125B1 Apparatus and method for isolating and measuring movement in a metrology apparatus |
| 12/05/2002 | US20020182109 Gene sequence-reading instrument |
| 12/05/2002 | US20020179434 Carbon nanotube devices |
| 12/05/2002 | US20020178846 Carbon nanotubes and methods of fabrication thereof using a catalyst precursor |
| 12/05/2002 | US20020178800 Apparatus for evaluating electrical characteristics |
| 12/05/2002 | US20020178799 SPM cantilever |
| 12/03/2002 | US6489629 Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same |
| 11/28/2002 | US20020174716 Method for replacing a probe sensor assembly on a scanning probe microscope |
| 11/28/2002 | US20020174715 Cantilever for scanning probe microscope |
| 11/28/2002 | US20020174714 System for sensing a sample |
| 11/21/2002 | WO2002093615A1 Scanning atom probe and analysis method using scanning atom probe |
| 11/21/2002 | WO2002093585A1 Actuating and sensing device for scanning probe microscopes |
| 11/21/2002 | US20020171038 Scanning type probe microscope probe and method of producing the same, and a scanning type probe microscope having this probe and polymer processing method using the same |
| 11/20/2002 | EP1257780A1 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device |
| 11/14/2002 | WO2002073126B1 Apparatus and method for isolating and measuring movement in metrology apparatus |
| 11/14/2002 | US20020166957 Near-field light-generating element, near-field optical recording device, and near-field optical microscope |
| 11/13/2002 | EP1256962A1 Actuating and sensing device for scanning probe microscopes |
| 11/12/2002 | US6479817 Cantilever assembly and scanning tip therefor with associated optical sensor |
| 11/05/2002 | US6477132 Probe and information recording/reproduction apparatus using the same |
| 10/31/2002 | US20020159943 Heating the mixture under oxidizing conditions sufficient to remove the amorphous carbon, followed by recovering a product consisting of 80% by weight of single-wall carbon nanotubes |
| 10/31/2002 | US20020158480 Nanotweezers and nanomanipulator |
| 10/31/2002 | US20020157457 Method and apparatus for performing atomic force microscopy measurements |
| 10/30/2002 | CN1376906A Magnetic scanning detector and probe thereof |
| 10/29/2002 | US6473351 Nanocapsules containing charged particles, their uses and methods of forming same |
| 10/29/2002 | US6472794 Microactuator |
| 10/24/2002 | WO2002084757A1 Heterostructure component |
| 10/24/2002 | US20020152804 Cantilever for scanning probe microscopy |
| 10/24/2002 | US20020152795 Macroscopic model of scanning force microscope |
| 10/24/2002 | DE10118405A1 Heterostructure component used in electronic devices comprises a single hetero-nanotube having regions made from nanotube materials having different energy band gaps value |
| 10/23/2002 | EP1251383A2 Near-field light-generating element, near-field optical recording device, and near-field optical microscope |
| 10/23/2002 | CN1375891A Electric connecting structure, its producing method and electric wiring method |
| 10/22/2002 | US6469293 Multiprobe and scanning probe microscope |
| 10/17/2002 | WO2001054163A9 Shaped and low density focused ion beams |
| 10/17/2002 | US20020150524 Carbon embedded in matrix |
| 10/17/2002 | US20020149362 Scanning magnetism detector and probe |
| 10/17/2002 | US20020148954 Signal detector and probe microscope using the same |
| 10/16/2002 | EP1248859A1 Method for synthesising and immobilising nucleic acids on a silanized solid support |