Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
03/1994
03/02/1994EP0584233A1 Methods of fabricating integrated, aligned tunneling tip pairs
02/1994
02/22/1994US5289408 Memory apparatus using tunnel current techniques
02/15/1994US5286977 Positioning device
02/09/1994EP0582376A1 Displacement element, cantilever probe and information processing apparatus using cantilever probe
02/01/1994US5283442 Surface profiling using scanning force microscopy
02/01/1994US5282924 Containing cantilever beam
01/1994
01/25/1994US5282191 Information reproducing method and information reproducing apparatus which uses the method
01/20/1994WO1994001206A1 Time-of-flight direct recoil ion scattering spectrometer
01/12/1994EP0578228A2 Microactuator
01/04/1994US5276672 Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof
01/04/1994US5276324 Composite scanning tunneling microscope
12/1993
12/28/1993USRE34489 Atomic force microscope with optional replaceable fluid cell
12/28/1993US5272913 Cantilever for a scanning probe microscope and a method of manufacturing the same
12/15/1993EP0574234A1 Automatic tip approach method and apparatus for scanning probe microscope
12/14/1993US5270543 Electronic probe and method for its manufacture
12/08/1993EP0572972A1 Probe for scanning tunneling microscope and manufacturing method thereof
12/07/1993US5268579 Electron beam apparatus for examining an object
12/07/1993US5268571 Micro-displacement element, and scanning tunneling microscope and information processing apparatus using same
11/1993
11/23/1993US5264696 Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios
11/16/1993US5262643 Automatic tip approach method and apparatus for scanning probe microscope
11/09/1993US5260926 Atomic force microscope with a plurality of cantilevers for recording/reproducing information
11/09/1993US5260577 Sample carriage for scanning probe microscope
11/09/1993US5260572 Scanning probe microscope including height plus deflection method and apparatus to achieve both high resolution and high speed scanning
11/09/1993US5260567 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit
10/1993
10/27/1993EP0566912A1 Apparatus for retaining an electrode by a magnetically shielded magnet
10/19/1993US5255258 Microprobe, preparation thereof and electronic device by use of said microprobe
10/19/1993US5254854 Scanning microscope comprising force-sensing means and position-sensitive photodetector
10/19/1993US5253515 Atomic probe microscope and cantilever unit for use in the microscope
10/13/1993EP0565227A1 Scanning force microscope
10/06/1993EP0564088A1 Scanning force microscope with integrated optics and cantilever mount
10/05/1993US5251200 Tracking method for memory apparatus
09/1993
09/28/1993US5248912 Integrated scanning tunneling microscope
09/16/1993WO1993018525A1 Scanning probe microscope
09/14/1993US5245187 Microtip, process for preparation thereof, surface-observing apparatus and information-treating apparatus employing the same
09/07/1993US5242541 Method of producing ultrafine silicon tips for the afm/stm profilometry
08/1993
08/10/1993US5235187 Methods of fabricating integrated, aligned tunneling tip pairs
06/1993
06/29/1993US5222396 Tunnelling acoustic microscope
06/22/1993US5221415 Method of forming microfabricated cantilever stylus with integrated pyramidal tip
06/16/1993EP0546921A1 Gas photonanograph for fabrication and optical analysis of nanometer scale patterns
06/15/1993US5220555 Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof
06/09/1993EP0545538A1 Scanning microscope comprising force-sensing means
06/08/1993US5218262 Apparatus for retaining an electrode by a magnetically shielded magnet
06/01/1993US5216254 Circuit pattern forming apparatus using mu-stm
05/1993
05/25/1993US5214284 Method and arrangement for testing and repairing an integrated circuit
05/25/1993US5214282 Method and apparatus for processing a minute portion of a specimen
05/12/1993EP0540839A1 Probe for atomic force microscope usable for scanning tunneling microscope
05/11/1993US5210714 Distance-controlled tunneling transducer and direct access storage unit employing the transducer
05/05/1993EP0539731A1 Probe of scanning electrochemical microscope and method of manufacturing the same
05/04/1993US5208457 Cesium oxide ion as primary beam
04/1993
04/20/1993US5204851 Apparatus for reading and/or inputting information
04/07/1993EP0535934A1 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same
04/06/1993US5200617 PMN translator and linearization system in scanning probe microscope
03/1993
03/30/1993US5199021 Method of access to recording medium, and apparatus and method for processing information
03/23/1993US5196713 Optical position sensor with corner-cube and servo-feedback for scanning microscopes
03/16/1993US5193385 Cantilever for use in atomic force microscope and manufacturing method therefor
03/10/1993EP0530473A1 Cantilever for atomic force microscope and method of manufacturing the same
03/10/1993EP0530427A1 Multiple STM-tip unit, method for manufacturing and application thereof in a direct access storage unit
03/10/1993CN1069827A 采用金刚石涂层的模制场致发射电子发射极及其制造方法 Molded using a diamond-coated field emission electron emitter and its manufacturing method
03/10/1993CN1069826A 采用金刚石覆层的场致发射电子源及其制造方法 Diamond coating using a field emission electron source and method of manufacturing
03/02/1993US5189906 Compact atomic force microscope
02/1993
02/24/1993EP0528391A1 A field emission electron source employing a diamond coating and method for producing same
02/24/1993EP0528322A1 A molded field emission electron emitter employing a diamond coating and method for producing same
02/21/1993CA2071065A1 Field emission electron source empolying a diamond coating and method for producing same
02/21/1993CA2071064A1 Molded field emission electron emitter employing a diamond coating and method for producing same
02/17/1993EP0527601A1 Composite scanning tunnelling microscope and optical microscope
02/17/1993EP0527379A1 Method for targeted modification of surfaces of solid state body in the nanometer range through local laminar separation as well as use of the method for storing information units
02/17/1993EP0527370A1 Procedure for implementing localised catalytic reactions with or on solid state surfaces on a nanometric or subnanometric scale
02/16/1993US5187367 Cantilever type probe, scanning tunneling microscope and information processing device equipped with said probe
02/16/1993US5186789 Method of making a cantilever stylus for use in an atomic force microscope
02/11/1993CA2074438A1 Specific modification of the surfaces of solids in the nanometer range by local delamination, and the storage of information units
02/10/1993CA2074437A1 Performance of location-selective catalytic reactions with or on the surfaces of solids in the namometer or subnanometer range
02/03/1993EP0526237A1 Information processing apparatus, and electrode substrate and information recording medium used in the apparatus
01/1993
01/19/1993CA1312952C Microprobe, preparation thereof and electronic device by use of said microprobe
01/13/1993EP0407460A4 An integrated mass storage device
01/12/1993US5178742 Method of and apparatus for forming a micromelt structure on an electrically-conductive probe tip
12/1992
12/23/1992WO1992022783A1 Microprobe for surface-scanning microscopes
12/23/1992EP0519622A2 Evanescent wave sensor shell and apparatus
12/23/1992EP0519269A1 Method for targeted modification of isolated nanometer structures of a solid state body surface
12/22/1992US5173605 Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control
12/22/1992CA1311863C Low-voltage source for narrow electron/ion beams
12/21/1992CA2070210A1 Selective modification of individual nanometer and subnanometer structures in the surface of a solid
12/16/1992EP0518618A2 Scanning tunneling microscope with cantilever type displacement element
12/16/1992EP0518240A2 Information reproducing method and information reproducing apparatus which uses the method
12/15/1992US5171992 Rigid needle-like structure; formed by decomposition of organic compounds by electron beams
12/09/1992EP0517074A2 Information recording/reproduction apparatus and method for recording and/or reproducing information onto and/or from recording medium using probe electrodes
12/08/1992CA2069538A1 Evanescent wave sensor shell and apparatus
12/02/1992EP0516418A1 Probe-driving mechanism, production thereof, and apparatus and piezoelectric actuator employing the same
12/02/1992EP0516380A2 Micro-displacement element for a scanning tunneling microscope
11/1992
11/26/1992WO1992021135A1 Universal, microfabricated probe for scanning probe microscopes
11/26/1992WO1992020842A1 Methods of fabricating integrated, aligned tunneling tip pairs
11/24/1992US5166520 Universal, microfabricated probe for scanning probe microscopes
11/17/1992US5164594 Charged particle extraction arrangement
11/04/1992EP0511662A1 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method
10/1992
10/28/1992EP0510895A2 Information processor
10/21/1992EP0509856A1 Scanning probe type microscope combined with an optical microscope
10/21/1992EP0509716A1 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit
10/20/1992US5157256 System for exchanging samples and electrode tip units in a surface probe microscope
10/20/1992US5157251 Scanning force microscope having aligning and adjusting means
10/20/1992US5156976 For spectrophotometric assays of fluid analytes; having shell with surfaces to propagate radiation between by internal reflection
09/1992
09/02/1992EP0501750A1 Single crystal microtip, preparation and applications thereof
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