Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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03/02/1994 | EP0584233A1 Methods of fabricating integrated, aligned tunneling tip pairs |
02/22/1994 | US5289408 Memory apparatus using tunnel current techniques |
02/15/1994 | US5286977 Positioning device |
02/09/1994 | EP0582376A1 Displacement element, cantilever probe and information processing apparatus using cantilever probe |
02/01/1994 | US5283442 Surface profiling using scanning force microscopy |
02/01/1994 | US5282924 Containing cantilever beam |
01/25/1994 | US5282191 Information reproducing method and information reproducing apparatus which uses the method |
01/20/1994 | WO1994001206A1 Time-of-flight direct recoil ion scattering spectrometer |
01/12/1994 | EP0578228A2 Microactuator |
01/04/1994 | US5276672 Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof |
01/04/1994 | US5276324 Composite scanning tunneling microscope |
12/28/1993 | USRE34489 Atomic force microscope with optional replaceable fluid cell |
12/28/1993 | US5272913 Cantilever for a scanning probe microscope and a method of manufacturing the same |
12/15/1993 | EP0574234A1 Automatic tip approach method and apparatus for scanning probe microscope |
12/14/1993 | US5270543 Electronic probe and method for its manufacture |
12/08/1993 | EP0572972A1 Probe for scanning tunneling microscope and manufacturing method thereof |
12/07/1993 | US5268579 Electron beam apparatus for examining an object |
12/07/1993 | US5268571 Micro-displacement element, and scanning tunneling microscope and information processing apparatus using same |
11/23/1993 | US5264696 Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios |
11/16/1993 | US5262643 Automatic tip approach method and apparatus for scanning probe microscope |
11/09/1993 | US5260926 Atomic force microscope with a plurality of cantilevers for recording/reproducing information |
11/09/1993 | US5260577 Sample carriage for scanning probe microscope |
11/09/1993 | US5260572 Scanning probe microscope including height plus deflection method and apparatus to achieve both high resolution and high speed scanning |
11/09/1993 | US5260567 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
10/27/1993 | EP0566912A1 Apparatus for retaining an electrode by a magnetically shielded magnet |
10/19/1993 | US5255258 Microprobe, preparation thereof and electronic device by use of said microprobe |
10/19/1993 | US5254854 Scanning microscope comprising force-sensing means and position-sensitive photodetector |
10/19/1993 | US5253515 Atomic probe microscope and cantilever unit for use in the microscope |
10/13/1993 | EP0565227A1 Scanning force microscope |
10/06/1993 | EP0564088A1 Scanning force microscope with integrated optics and cantilever mount |
10/05/1993 | US5251200 Tracking method for memory apparatus |
09/28/1993 | US5248912 Integrated scanning tunneling microscope |
09/16/1993 | WO1993018525A1 Scanning probe microscope |
09/14/1993 | US5245187 Microtip, process for preparation thereof, surface-observing apparatus and information-treating apparatus employing the same |
09/07/1993 | US5242541 Method of producing ultrafine silicon tips for the afm/stm profilometry |
08/10/1993 | US5235187 Methods of fabricating integrated, aligned tunneling tip pairs |
06/29/1993 | US5222396 Tunnelling acoustic microscope |
06/22/1993 | US5221415 Method of forming microfabricated cantilever stylus with integrated pyramidal tip |
06/16/1993 | EP0546921A1 Gas photonanograph for fabrication and optical analysis of nanometer scale patterns |
06/15/1993 | US5220555 Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof |
06/09/1993 | EP0545538A1 Scanning microscope comprising force-sensing means |
06/08/1993 | US5218262 Apparatus for retaining an electrode by a magnetically shielded magnet |
06/01/1993 | US5216254 Circuit pattern forming apparatus using mu-stm |
05/25/1993 | US5214284 Method and arrangement for testing and repairing an integrated circuit |
05/25/1993 | US5214282 Method and apparatus for processing a minute portion of a specimen |
05/12/1993 | EP0540839A1 Probe for atomic force microscope usable for scanning tunneling microscope |
05/11/1993 | US5210714 Distance-controlled tunneling transducer and direct access storage unit employing the transducer |
05/05/1993 | EP0539731A1 Probe of scanning electrochemical microscope and method of manufacturing the same |
05/04/1993 | US5208457 Cesium oxide ion as primary beam |
04/20/1993 | US5204851 Apparatus for reading and/or inputting information |
04/07/1993 | EP0535934A1 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same |
04/06/1993 | US5200617 PMN translator and linearization system in scanning probe microscope |
03/30/1993 | US5199021 Method of access to recording medium, and apparatus and method for processing information |
03/23/1993 | US5196713 Optical position sensor with corner-cube and servo-feedback for scanning microscopes |
03/16/1993 | US5193385 Cantilever for use in atomic force microscope and manufacturing method therefor |
03/10/1993 | EP0530473A1 Cantilever for atomic force microscope and method of manufacturing the same |
03/10/1993 | EP0530427A1 Multiple STM-tip unit, method for manufacturing and application thereof in a direct access storage unit |
03/10/1993 | CN1069827A 采用金刚石涂层的模制场致发射电子发射极及其制造方法 Molded using a diamond-coated field emission electron emitter and its manufacturing method |
03/10/1993 | CN1069826A 采用金刚石覆层的场致发射电子源及其制造方法 Diamond coating using a field emission electron source and method of manufacturing |
03/02/1993 | US5189906 Compact atomic force microscope |
02/24/1993 | EP0528391A1 A field emission electron source employing a diamond coating and method for producing same |
02/24/1993 | EP0528322A1 A molded field emission electron emitter employing a diamond coating and method for producing same |
02/21/1993 | CA2071065A1 Field emission electron source empolying a diamond coating and method for producing same |
02/21/1993 | CA2071064A1 Molded field emission electron emitter employing a diamond coating and method for producing same |
02/17/1993 | EP0527601A1 Composite scanning tunnelling microscope and optical microscope |
02/17/1993 | EP0527379A1 Method for targeted modification of surfaces of solid state body in the nanometer range through local laminar separation as well as use of the method for storing information units |
02/17/1993 | EP0527370A1 Procedure for implementing localised catalytic reactions with or on solid state surfaces on a nanometric or subnanometric scale |
02/16/1993 | US5187367 Cantilever type probe, scanning tunneling microscope and information processing device equipped with said probe |
02/16/1993 | US5186789 Method of making a cantilever stylus for use in an atomic force microscope |
02/11/1993 | CA2074438A1 Specific modification of the surfaces of solids in the nanometer range by local delamination, and the storage of information units |
02/10/1993 | CA2074437A1 Performance of location-selective catalytic reactions with or on the surfaces of solids in the namometer or subnanometer range |
02/03/1993 | EP0526237A1 Information processing apparatus, and electrode substrate and information recording medium used in the apparatus |
01/19/1993 | CA1312952C Microprobe, preparation thereof and electronic device by use of said microprobe |
01/13/1993 | EP0407460A4 An integrated mass storage device |
01/12/1993 | US5178742 Method of and apparatus for forming a micromelt structure on an electrically-conductive probe tip |
12/23/1992 | WO1992022783A1 Microprobe for surface-scanning microscopes |
12/23/1992 | EP0519622A2 Evanescent wave sensor shell and apparatus |
12/23/1992 | EP0519269A1 Method for targeted modification of isolated nanometer structures of a solid state body surface |
12/22/1992 | US5173605 Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control |
12/22/1992 | CA1311863C Low-voltage source for narrow electron/ion beams |
12/21/1992 | CA2070210A1 Selective modification of individual nanometer and subnanometer structures in the surface of a solid |
12/16/1992 | EP0518618A2 Scanning tunneling microscope with cantilever type displacement element |
12/16/1992 | EP0518240A2 Information reproducing method and information reproducing apparatus which uses the method |
12/15/1992 | US5171992 Rigid needle-like structure; formed by decomposition of organic compounds by electron beams |
12/09/1992 | EP0517074A2 Information recording/reproduction apparatus and method for recording and/or reproducing information onto and/or from recording medium using probe electrodes |
12/08/1992 | CA2069538A1 Evanescent wave sensor shell and apparatus |
12/02/1992 | EP0516418A1 Probe-driving mechanism, production thereof, and apparatus and piezoelectric actuator employing the same |
12/02/1992 | EP0516380A2 Micro-displacement element for a scanning tunneling microscope |
11/26/1992 | WO1992021135A1 Universal, microfabricated probe for scanning probe microscopes |
11/26/1992 | WO1992020842A1 Methods of fabricating integrated, aligned tunneling tip pairs |
11/24/1992 | US5166520 Universal, microfabricated probe for scanning probe microscopes |
11/17/1992 | US5164594 Charged particle extraction arrangement |
11/04/1992 | EP0511662A1 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method |
10/28/1992 | EP0510895A2 Information processor |
10/21/1992 | EP0509856A1 Scanning probe type microscope combined with an optical microscope |
10/21/1992 | EP0509716A1 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
10/20/1992 | US5157256 System for exchanging samples and electrode tip units in a surface probe microscope |
10/20/1992 | US5157251 Scanning force microscope having aligning and adjusting means |
10/20/1992 | US5156976 For spectrophotometric assays of fluid analytes; having shell with surfaces to propagate radiation between by internal reflection |
09/02/1992 | EP0501750A1 Single crystal microtip, preparation and applications thereof |