| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 06/01/2005 | EP1535300A2 Improved method and system for scanning apertureless fluorescence microscope |
| 05/26/2005 | WO2005048255A1 Data-recording device comprising conductive microtips and production method thereof |
| 05/26/2005 | WO2005046305A2 Method of producing nanostructure tips |
| 05/26/2005 | US20050112791 Method and apparatus for fabricating commercially feasible and structurally robust nanotube-based nanomechanical devices |
| 05/26/2005 | US20050109747 Laser scribing and machining of materials |
| 05/19/2005 | US20050103994 Conductive transparent probe and probe control apparatus |
| 05/19/2005 | US20050103993 Vertically aligned nanostructure scanning probe microscope tips |
| 05/18/2005 | EP1531327A1 SOM cantilever with hole with tip filling with a projected shape |
| 05/18/2005 | CN1617954A Deposition method for nanostructure materials |
| 05/17/2005 | US6894272 Device for simultaneously carrying out an electrochemical and a topographical near-field microscopy |
| 05/17/2005 | US6893986 Method of reducing internal stress in materials |
| 05/17/2005 | US6893966 Method of patterning the surface of an article using positive microcontact printing |
| 05/17/2005 | US6892432 Nanotube cartridge and a method for manufacturing the same |
| 05/12/2005 | WO2005043552A1 A lightweight and thermally stable metrology instrument for a coordinate position apparatus and method of manufacture of said instrument |
| 05/12/2005 | WO2005043551A1 Cantilever assembly |
| 05/12/2005 | US20050099895 Information recording/reproducing apparatus and recording medium |
| 05/11/2005 | EP1530220A1 Cantilever assembly |
| 05/11/2005 | EP1530210A1 Information recording/reproducing apparatus and recording medium |
| 05/10/2005 | US6891151 Probe with hollow waveguide and method for producing the same |
| 05/06/2005 | WO2004038762A3 Nanomotion sensing system and method |
| 05/05/2005 | US20050092907 Oscillating scanning probe microscope |
| 05/04/2005 | EP1527012A2 Method for producing at least one small opening in a layer on a substrate and components produced according to said method |
| 05/03/2005 | US6888135 Scanning probe microscope with probe formed by single conductive material |
| 05/03/2005 | US6887365 Branched cantilever comprising ferromagnetic material and tubules attached to electrode pair coupled to electrical circuit; Magnetic (Resonance) Force Microscopy |
| 05/03/2005 | US6886395 Method of fabricating a surface probing device and probing device produced thereby |
| 04/28/2005 | WO2005037418A2 Processes for fabricating conductive patterns using nanolithography as a patterning tool |
| 04/28/2005 | WO2005017977A3 Carbon nanotube bundle probe for scanning probe microscopes |
| 04/28/2005 | US20050089463 Etching and planarizing a substrate by irradiation with a focused ion beam, decomposing and depositing an organic gas into a columnar electrode, and then attaching the nanotubes to the electrode; maintained electroconductivity between nanotubes and electrodes |
| 04/28/2005 | US20050088173 Method and apparatus for tunable magnetic force interaction in a magnetic force microscope |
| 04/26/2005 | US6884999 Use of scanning probe microscope for defect detection and repair |
| 04/21/2005 | US20050082474 MEMS differential actuated nano probe and method for fabrication |
| 04/21/2005 | US20050081610 Force scanning probe microscope |
| 04/19/2005 | US6881947 Near-field optical probe |
| 04/19/2005 | US6880388 Active cantilever for nanomachining and metrology |
| 04/14/2005 | WO2005034206A2 Selective functionalization of carbon nanotube tips allowing fabrication of new classes of nanoscale sensing and manipulation tools |
| 04/14/2005 | WO2005034134A1 Probe arrangement for a raster probe instrument |
| 04/14/2005 | WO2004105046A3 Scanning probe microscopy probe and method for scanning probe contact printing |
| 04/14/2005 | US20050079551 organic layer formed on a board and having a surface state in which small sections having a different adsorption property from that of a periphery due to a partial difference in molecular structure; and a particle layer having at least one or more nanoparticles arranged on each of the small sections |
| 04/12/2005 | US6878444 Magnetic carbon nanotube |
| 04/07/2005 | US20050074774 Multiplex detection compositions, methods, and kits |
| 04/07/2005 | DE10342644A1 Raster force microscopy probe has nano structure probe tip arm with integrated CMOS piezoelectric sensor |
| 04/06/2005 | EP1520292A2 Software synchronization of multiple scanning probes |
| 04/05/2005 | US6875981 Scanning atom probe and analysis method utilizing scanning atom probe |
| 04/05/2005 | US6875274 Carbon nanotube-nanocrystal heterostructures and methods of making the same |
| 03/31/2005 | WO2004012201A3 Method of and apparatus for calibrating cantilevers |
| 03/31/2005 | US20050069947 Antibodies specific for nanotubes and related methods and compositions |
| 03/30/2005 | EP1519388A1 Manufacturing method for a near-field optical probe |
| 03/30/2005 | EP1248859B1 Method for synthesising and immobilising nucleic acids on a silanized solid support |
| 03/29/2005 | US6871528 Method of producing a branched carbon nanotube for use with an atomic force microscope |
| 03/24/2005 | US20050062116 Field effect transistor sensor |
| 03/24/2005 | DE10300988B4 Vorrichtung zur Bestimmung topologischer und elektrischer Eigenschaften eines Probenkörpers Apparatus for determining topological and electrical properties of a specimen |
| 03/23/2005 | CN1599939A Microstructures |
| 03/22/2005 | US6869807 Method and its apparatus for manufacturing semiconductor device |
| 03/17/2005 | WO2005024392A1 Nanotube probe and method of manufacturing the same |
| 03/17/2005 | WO2005024390A1 Probe manufacturing method, probe, and scanning probe microscope |
| 03/17/2005 | US20050056783 Object inspection and/or modification system and method |
| 03/15/2005 | US6867443 Parallel, individually addressable probes for nanolithography |
| 03/15/2005 | US6866801 Process for making aligned carbon nanotubes |
| 03/15/2005 | US6865927 Sharpness testing of micro-objects such as miniature diamond tool tips |
| 03/10/2005 | WO2005021804A1 Multiplex detection compositions, methods, and kits |
| 03/10/2005 | WO2005020803A2 Raman imaging and sensing apparatus employing nanoantennas |
| 03/10/2005 | WO2004015455A3 Improved method and system for scanning apertureless fluorescence microscope |
| 03/10/2005 | US20050051515 Cantilever microstructure and fabrication method thereof |
| 03/08/2005 | US6864483 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device |
| 03/08/2005 | US6864481 Probe for scanning probe microscope |
| 03/08/2005 | US6864457 Laser machining of materials |
| 03/08/2005 | US6862925 Device for contacting and/or modifying a surface having a cantilever and a method for production of said cantilever |
| 03/08/2005 | US6862921 Method and apparatus for manipulating a sample |
| 03/03/2005 | WO2005020243A1 Probe for scannning probe microscope and method of producing the same |
| 03/02/2005 | EP1290404B1 Sample for simultaneously conducting electro-chemical and topographic near-field microscopy |
| 03/01/2005 | US6861649 Balanced momentum probe holder |
| 03/01/2005 | US6861648 Scanning probe microscopy inspection and modification system |
| 02/24/2005 | WO2005017977A2 Carbon nanotube bundle probe for scanning probe microscopes |
| 02/24/2005 | US20050043917 Image reconstruction method |
| 02/24/2005 | US20050040836 Multiple local probe measuring device and method |
| 02/24/2005 | US20050039523 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 02/22/2005 | US6858851 Apparatus for specimen fabrication and method for specimen fabrication |
| 02/17/2005 | WO2005015570A1 Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device |
| 02/17/2005 | WO2005015188A1 Scanning probe inspection apparatus |
| 02/17/2005 | WO2005014889A2 Deposition method for nanostructure materials |
| 02/17/2005 | US20050034543 Micro-force sensing system |
| 02/17/2005 | US20050034512 System for wide frequency dynamic nanomechanical analysis |
| 02/15/2005 | US6856140 System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes |
| 02/15/2005 | US6855974 Ferroelectric capacitor, process for production thereof and semiconductor device using the same |
| 02/15/2005 | US6854648 Information storage apparatus using semiconductor probe |
| 02/10/2005 | WO2004014785A3 Method for producing at least one small opening in a layer on a substrate and components produced according to said method |
| 02/10/2005 | DE10333485A1 Raster scanning microscopy probe manufacturing method using etching of silicon substrate from 2 opposing sides to provide probe with angled point |
| 02/08/2005 | US6853824 Electrophotographic endless belt comprising meandering-preventive member, and process cartridge and electrophotographic apparatus having such an endless belt |
| 02/08/2005 | US6851301 Cantilever for scanning probe microscope |
| 02/03/2005 | WO2005010502A1 Probe replacing method for scanning probe microscope |
| 02/03/2005 | US20050023462 Tailoring domain engineered structures in ferroelectric materials |
| 02/03/2005 | US20050022726 Carbon nanotube-nanocrystal heterostructures and methods of making the same |
| 02/02/2005 | EP1502306A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication |
| 02/02/2005 | EP1502296A1 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 02/02/2005 | CN1574161A Preparation of field emission array comprising nanostructures |
| 02/02/2005 | CN1187596C Scanning type probe microscope probe and method of producing the same, and polymer processing method using the same |
| 01/27/2005 | WO2005008678A1 Micro-force sensing system |
| 01/27/2005 | WO2004101429B1 Probe |
| 01/27/2005 | US20050017174 Laser stimulated atom probe characterization of semiconductor and dielectric structures |
| 01/27/2005 | US20050017171 Probe structures incorporating nanowhiskers, production methods thereof and methods of forming nanowhiskers |