| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 08/29/1995 | CA2046474C Information detection apparatus and displacement information measurement apparatus |
| 08/22/1995 | US5444243 Wien filter apparatus with hyperbolic surfaces |
| 08/22/1995 | US5444191 Information processing apparatus and device for use in same |
| 08/15/1995 | US5442174 Measurement of trace element concentration distribution, and evaluation of carriers, in semiconductors, and preparation of standard samples |
| 08/08/1995 | US5439777 Recording and reproducing apparatus and method for applying a pulse voltage and an electromagnetic wave |
| 08/01/1995 | US5438206 Positioning device |
| 07/25/1995 | US5436452 Uncooled tunneling infrared sensor |
| 07/11/1995 | US5431055 Surface measuring apparatus using a probe microscope |
| 07/06/1995 | WO1995018352A1 Scanning force microscopy process and scanning force microscope with detector probe |
| 06/20/1995 | US5426631 Information recording and reproducing apparatus for recording and reproducing information by using a probe electrode |
| 06/13/1995 | US5423514 Alignment assembly for aligning a spring element with a laser beam in a probe microscope |
| 05/18/1995 | WO1995013518A1 Mounting for a probe tip in a scanning force or scanning tunneling microscope |
| 05/17/1995 | EP0653628A1 Sample stage for scanning probe microscope head |
| 05/16/1995 | US5416327 Ultrafast scanning probe microscopy |
| 05/10/1995 | EP0652600A1 Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same |
| 05/09/1995 | US5414690 Moving apparatus, a moving method and an information detection and/or input apparatus using the same |
| 05/02/1995 | US5412641 Information recording/reproducing apparatus for recording/reproducing information with probes |
| 05/02/1995 | US5412210 Scanning electron microscope and method for production of semiconductor device by using the same |
| 04/26/1995 | EP0650029A2 Atomic force microscope with optional replaceable fluid cell |
| 04/18/1995 | US5406833 Atomic force microscope |
| 04/13/1995 | WO1995010060A1 Near-field optical microscope |
| 04/13/1995 | WO1995010021A1 High precision scale and position sensor |
| 04/11/1995 | US5405481 Gas expansion chamber equipped with gas supply for producing patterns, microcapillaries for gas discharge, optical fiber coupled to light source, means for detecting and processing light signal reflected from sample |
| 04/05/1995 | EP0646913A2 Encoder using the tunnel current effect |
| 04/05/1995 | EP0646787A1 Cantilever for use with atomic force microscope and process for the production thereof |
| 03/21/1995 | US5399232 Microfabricated cantilever stylus with integrated pyramidal tip |
| 03/14/1995 | US5398229 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same |
| 03/09/1995 | DE4338688C1 Holder for a sampling tip of a scanning probe microscope |
| 03/07/1995 | US5396066 Displacement element, cantilever probe and information processing apparatus using cantilever probe |
| 03/02/1995 | DE4430017A1 Wien's filter |
| 03/01/1995 | EP0407460B1 An integrated mass storage device |
| 02/28/1995 | US5394388 Multiple microprobe arrays for recording and reproducing encoded information |
| 02/28/1995 | US5393647 Etching, carbiding or nitriding with organic or ammonia vapor |
| 02/21/1995 | US5392275 Information recording unit and method for information recording/reproduction |
| 02/14/1995 | US5390161 Microprobe, method for producing the same, and information input and/or output apparatus utilizing the same |
| 02/14/1995 | US5388452 Detection system for atomic force microscopes |
| 02/14/1995 | US5388323 Method of forming a probe for an atomic force microscope |
| 01/31/1995 | US5386110 Method of making cantilever chip for scanning probe microscope |
| 01/26/1995 | WO1995002894A1 Superhard tips for micro-probe microscopy and field emission |
| 01/24/1995 | US5383354 Process for measuring surface topography using atomic force microscopy |
| 01/17/1995 | US5382795 Ultrafine silicon tips for AFM/STM profilometry |
| 01/10/1995 | US5381101 System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies |
| 01/03/1995 | US5379230 Semiconductor integrated circuit having semiconductor output device driving external load and microprocessor unit |
| 12/27/1994 | US5376790 Scanning probe microscope |
| 12/20/1994 | US5375087 Tunneling-stabilized magnetic reading and recording |
| 12/13/1994 | US5372930 Force transducer, tip coupled to transducer, and substrate wherein tip and substrate are chemically modified |
| 12/06/1994 | US5371365 Scanning probe microscopy |
| 11/22/1994 | US5367165 Cantilever chip for scanning probe microscope |
| 11/15/1994 | US5363697 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method |
| 11/02/1994 | EP0622652A1 Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe |
| 11/02/1994 | EP0622608A1 Scanning apparatus for investigating surface structures with a resolution of microns and method of its manufacture |
| 11/01/1994 | US5360978 Multiple-tip scanning tunneling microscopy |
| 11/01/1994 | US5360974 Dual quad flexure scanner |
| 10/25/1994 | US5359199 Specific modification of the surfaces of solids in the nanometer range by local delamination, and the storage of information units |
| 10/25/1994 | US5357787 Cantilever for atomic force microscope and method of manufacturing the same |
| 10/25/1994 | CA1332761C Distance-controlled tunneling transducer and direct access storage unit employing the transducer |
| 10/19/1994 | EP0619872A1 Piezoresistive cantilever for atomic force microscopy. |
| 10/18/1994 | US5357109 Probe for scanning tunneling microscope and manufacturing method thereof |
| 10/18/1994 | US5357108 Cantilever type displacement element, and scanning tunneling microscope or information processing apparatus using same |
| 10/18/1994 | US5356218 Probe for providing surface images |
| 10/13/1994 | CA2120975A1 Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe |
| 10/12/1994 | EP0619495A1 Process for manufacturing tunnel sensors |
| 10/11/1994 | US5353632 Probe for atomic force microscope usable for scanning tunneling microscope |
| 10/05/1994 | EP0618425A1 Sensor head and method for its manufacture |
| 09/27/1994 | US5349735 Information detection apparatus and displacement information measurement apparatus |
| 09/14/1994 | EP0615124A1 Method for in-situ growth of single crystal whiskers |
| 09/13/1994 | US5347126 Time-of-flight direct recoil ion scattering spectrometer |
| 09/13/1994 | US5345815 Atomic force microscope having cantilever with piezoresistive deflection sensor |
| 09/07/1994 | EP0404799B1 Integrated scanning tunneling microscope |
| 08/31/1994 | EP0397799B1 A piezoelectric motion transducer and an integrated scanning tunneling microscope using the same |
| 08/30/1994 | US5343460 Information processing device and information processing method |
| 08/30/1994 | US5343042 Selective modification of individual nanometer and subnamometer structures in the surface of a solid |
| 08/16/1994 | US5338932 Method and apparatus for measuring the topography of a semiconductor device |
| 08/09/1994 | US5336887 Scanning probe microscope |
| 08/02/1994 | US5334835 Probe drive mechanism and electronic device which uses the same |
| 08/02/1994 | US5333495 Method and apparatus for processing a minute portion of a specimen |
| 07/12/1994 | US5329514 Information processing apparatus, and electrode substrate and information recording medium used in the apparatus |
| 07/12/1994 | US5329513 Angular relationship detection device and method |
| 07/05/1994 | EP0619872A4 Piezoresistive cantilever for atomic force microscopy. |
| 06/29/1994 | EP0603770A2 Information recording and reproducing apparatus for recording and reproducing information by using a probe electrode |
| 06/21/1994 | US5323375 Information storage apparatus |
| 06/14/1994 | US5319960 For examining surface contours of a specimen |
| 05/31/1994 | US5317533 Integrated mass storage device |
| 05/31/1994 | US5317141 Apparatus and method for high-accuracy alignment |
| 05/24/1994 | US5315373 Method of measuring a minute displacement |
| 05/24/1994 | US5314829 Method for imaging informational biological molecules on a semiconductor substrate |
| 05/18/1994 | EP0597622A1 Sample carriage for scanning probe microscope |
| 05/11/1994 | EP0596494A2 Scanning probe microscope and method of control error correction |
| 05/05/1994 | DE4314301C1 Surface scanning sensor - has a sensor point of a photo-structurable glass |
| 04/27/1994 | EP0594362A1 Carriage assembly and positioning device for a scanning probe |
| 04/21/1994 | CA2098041A1 Dual quad flexure scanner |
| 04/12/1994 | US5302239 In situ plasma dry etching process |
| 04/07/1994 | DE4233399A1 Force microscope with cantilevered point and deflection photodetector - is based on measurement of astigmatism in compact sensor head revolvable into path of optical microscope |
| 03/30/1994 | EP0588888A1 Microprobe for surface-scanning microscopes. |
| 03/29/1994 | US5298760 Performance of location-selective catalytic reactions with or on the surfaces of solids in the nanometer or subnanometer range |
| 03/29/1994 | US5298748 Uncooled tunneling infrared sensor |
| 03/22/1994 | US5296704 For investigating a surface of a sample |
| 03/16/1994 | EP0587165A2 Information processing apparatus having multiprobe control circuit |
| 03/15/1994 | US5294790 Probe unit for near-field optical scanning microscope |
| 03/08/1994 | US5291775 Scanning force microscope with integrated optics and cantilever mount |