| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 08/17/1999 | US5939719 Scanning probe microscope with scan correction |
| 08/12/1999 | WO1999040445A1 Optical probe for proximity field |
| 08/11/1999 | EP0935137A1 Scanning probe microscope |
| 08/10/1999 | US5936243 Conductive micro-probe and memory device |
| 08/10/1999 | US5936237 Combined topography and electromagnetic field scanning probe microscope |
| 08/05/1999 | WO1999039215A1 Multi-probe test head |
| 08/05/1999 | CA2281932A1 Multi-probe test head |
| 08/03/1999 | US5932876 Tunnel effect sensor, suitable for determining the topography of a surface |
| 08/03/1999 | CA2053533C Information recording unit, apparatus and method for information recording/reproduction in conjunction with a scanning tunneling microscope |
| 07/29/1999 | WO1999037364A1 A high intensity focused ultrasound system for scanning and curing tumor |
| 07/28/1999 | EP0932020A1 Micro surface measuring apparatus and probe manufacturing |
| 07/27/1999 | US5929438 Cantilever and measuring apparatus using it |
| 07/13/1999 | US5923637 For use in a scanning probe microscope or information recording apparatus |
| 07/13/1999 | US5923033 Integrated SPM sensor having a photodetector mounted on a probe on a free end of a supported cantilever |
| 07/07/1999 | EP0927331A1 Macroscopically manipulable nanoscale devices made from nanotube assemblies |
| 06/16/1999 | EP0922929A1 Scanning-probe device with compensation for the disturbing influence of mechanical vibrations on the scanning process |
| 06/15/1999 | US5912468 Charged particle beam exposure system |
| 06/15/1999 | US5912461 Probe scanning mechanism for a scanning probe microscope |
| 06/03/1999 | WO1999015851A9 Method and apparatus for obtaining improved vertical metrology measurements |
| 05/25/1999 | US5907095 High-sensitivity strain probe |
| 05/18/1999 | US5905260 Triboluminescent damage sensors |
| 05/11/1999 | US5902928 Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator |
| 05/06/1999 | EP0913508A2 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device |
| 05/05/1999 | CN1215616A High-intensity focus supersonic tumor scanning therapy system |
| 04/27/1999 | US5898106 Method and apparatus for obtaining improved vertical metrology measurements |
| 04/21/1999 | EP0909937A1 Semiconductor strain sensor, method of manufacturing the sensor, and scanning probe microscope |
| 04/15/1999 | DE19752202C1 Micromechanical device production involving ion deposition on substrate region |
| 04/14/1999 | EP0908719A1 Stage unit used for sample positioning and scanning probe microscope with such a stage unit |
| 04/07/1999 | EP0907076A2 Methods of fabricating integrated, aligned tunneling tip pairs |
| 04/06/1999 | US5892223 Multilayer microtip probe and method |
| 04/01/1999 | WO1999015851A1 Method and apparatus for obtaining improved vertical metrology measurements |
| 03/30/1999 | US5888371 Method of fabricating an aperture for a near field scanning optical microscope |
| 03/25/1999 | WO1999014793A1 Atom probe |
| 03/25/1999 | WO1999014785A1 Electron detectors |
| 03/23/1999 | US5885434 Measuring and storing surface topography of the workpiece during a first scan with a fine tip probe, then using the stored information to control probe position during a second scan in which an electrochemical reaction is performed |
| 03/17/1999 | EP0584233B1 Submicron tip structure with opposed tips |
| 03/16/1999 | US5883387 SPM cantilever and a method for manufacturing the same |
| 03/10/1999 | CN1042470C Moulded field emission electron emitter formations and their production |
| 03/03/1999 | EP0899538A1 A probe tip configuration, a method of fabricating probe tips and use thereof |
| 03/02/1999 | US5877891 Scanning probe microscope having a single viewing device for on-axis and oblique optical views |
| 03/02/1999 | US5877497 Data acquisition and control apparatus for scanning probe systems |
| 02/23/1999 | US5874669 Scanning force microscope with removable probe illuminator assembly |
| 02/23/1999 | US5874668 Atomic force microscope for biological specimens |
| 02/18/1999 | DE19733520A1 Verfahren zur Nanostrukturierung von amorphen Kohlenstoffschichten Method for nanostructuring of amorphous carbon films |
| 02/11/1999 | WO1999006996A1 Method for nano-structuring amorphous carbon layers |
| 02/11/1999 | WO1999006793A1 Microscope for compliance measurement |
| 02/10/1999 | CN1042072C Field emission electron source employing diamond coating and mfg. method thereof |
| 02/03/1999 | EP0895293A2 Semiconductor device comprising an aggregate of semiconductor micro-needles |
| 02/02/1999 | US5866807 Method of forming an indentation in a surface of a sample |
| 02/02/1999 | US5866805 Cantilevers for a magnetically driven atomic force microscope |
| 02/02/1999 | US5866021 Method of manufacturing micro-tip and female mold substrate therefor, and method of manufacturing probe with micro-tip and the probe |
| 02/02/1999 | US5865839 Artificial retina |
| 01/27/1999 | EP0893834A2 Semiconductor device comprising an aggregate of semiconductor micro-needles |
| 01/20/1999 | EP0892446A2 Method of manufacturing an aggregate of semiconductor micro-needles and method of manufacturing a semiconductor device comprising an aggregate of semiconductor micro-needles |
| 01/20/1999 | EP0892445A2 Semiconductor device comprising an aggregate of semiconductor micro-needles |
| 01/20/1999 | EP0892444A2 Semiconductor device comprising an aggregate of semiconductor micro-needles |
| 01/19/1999 | US5861624 Atomic force microscope for attachment to optical microscope |
| 01/19/1999 | CA2069702C Micro-displacement element, and scanning tunneling microscope and information processing apparatus using same |
| 01/19/1999 | CA2065593C Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
| 01/12/1999 | US5859364 Scanning probe microscope |
| 01/07/1999 | EP0855045A4 High resolution fiber optic probe for near field optical microscopy |
| 01/05/1999 | US5856672 Single-crystal silicon cantilever with integral in-plane tip for use in atomic force microscope system |
| 12/30/1998 | EP0887867A2 Semiconductor device comprising an aggregate of semiconductor micro-needles |
| 12/30/1998 | EP0887866A2 Semiconductor device comprising an aggregate of semiconductor micro-needles |
| 12/30/1998 | EP0886758A1 Cantilever structures |
| 12/29/1998 | US5854487 Scanning probe microscope providing unobstructed top down and bottom up views |
| 12/22/1998 | US5851902 Semiconductor layer structure and recording medium for a large capacity memory |
| 12/16/1998 | EP0884617A1 Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe |
| 12/16/1998 | EP0884557A2 Conductive micro-probe and memory device |
| 12/08/1998 | US5847387 Support device and stage assembly for a scanned-probe microscope |
| 12/02/1998 | EP0880671A2 Microfabricated torsional cantilevers for sensitive force detection |
| 12/01/1998 | US5844803 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
| 11/26/1998 | WO1998053481A1 Electron beam aperture element |
| 11/25/1998 | EP0880043A2 Scanning near field optical microscope |
| 11/17/1998 | US5838005 In a method for forming a sensor |
| 11/17/1998 | US5836996 Artificial retina |
| 11/11/1998 | EP0805946A4 Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system |
| 11/11/1998 | EP0721564A4 High precision scale and position sensor |
| 11/05/1998 | WO1998034092A3 Object inspection and/or modification system and method |
| 10/22/1998 | DE19816914A1 Scanning microscope with stage observing=evaluating parameters of sample surface |
| 10/20/1998 | US5824470 Protection of detectors by passivation and deprotection in a microscopic environment |
| 10/14/1998 | EP0871166A1 Apparatus for machining, recording, or reproducing, using scanning probe microscope |
| 10/13/1998 | US5821410 Scanning tip microwave near field microscope |
| 10/13/1998 | CA2111770C Information recording and reproducing apparatus for recording and reproducing information by using a probe electrode |
| 10/10/1998 | CA2231224A1 Apparatus for machining, recording, and reproducing, using scanning probe microscope |
| 10/07/1998 | EP0869329A2 Torsion type probe and scanning probe microscope using the same |
| 10/07/1998 | EP0868648A1 Integrated silicon profilometer and afm head |
| 09/22/1998 | US5812722 Optical fiber and method for manufacturing the same |
| 09/22/1998 | US5811802 Scanning probe microscope with hollow pivot assembly |
| 09/22/1998 | US5811017 Cantilever for use in a scanning probe microscope and method of manufacturing the same |
| 09/22/1998 | CA2051192C Tracking method for memory apparatus |
| 09/16/1998 | EP0864899A2 Scanning near-field optical microscope |
| 09/12/1998 | CA2229221A1 Scanning near-field optical microscope |
| 09/09/1998 | EP0722574B1 Near-field optical microscope |
| 09/03/1998 | WO1998038501A1 Scanning probe microscope providing unobstructed top down and bottom up views |
| 09/02/1998 | EP0862045A2 Atomic force microscope with optional replaceable fluid cell. |
| 09/02/1998 | EP0861428A1 Triboluminescent damage sensors |
| 09/01/1998 | US5801472 Micro-fabricated device with integrated electrostatic actuator |
| 09/01/1998 | US5801381 Between a microscope probe tip and a sample surface |
| 08/26/1998 | EP0860726A1 Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe |