Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
05/2004
05/13/2004US20040089821 Method and apparatus for specimen fabrication
05/13/2004US20040089816 Method and system for scanning apertureless fluorescence microscope
05/13/2004US20040089410 Bulk synthesis of long nanotubes of transition metal chalcogenides
05/13/2004DE202004003161U1 Scanning probe microscope used e.g. as scanning tunnel microscope comprises a tip which moves using piezo elements, and a ceramic or glass ceramic holder for the elements
05/11/2004US6734598 Microactuator
05/11/2004US6734425 Scanning probe system with spring probe and actuation/sensing structure
05/06/2004WO2004038767A2 Doped nanoscale wires and method of manufacture
05/06/2004WO2004038762A2 Nanomotion sensing system and method
05/06/2004US20040086883 Method and device for characterising and/or for detecting a bonding complex
05/06/2004US20040084737 SPM cantilever and fabricating method thereof
05/04/2004US6730905 Covering layer containing electrically conductive polymer and catalyst; dna sequence determination
04/2004
04/29/2004US20040079673 Electroconductive container of a nanotube product
04/29/2004US20040079142 Apparatus and method for isolating and measuring movement in metrology apparatus
04/29/2004DE10296461T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a metrological device
04/27/2004US6727065 Methods of use of semiconductor nanocrystal probes for treating a material
04/22/2004WO2004033480A2 Peptide and protein arrays and direct-write lithographic printing of peptides and proteins
04/22/2004US20040074288 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus
04/21/2004EP1411341A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
04/21/2004EP1410436A2 Parallel, individually addressable probes for nanolithography
04/20/2004US6724712 Nanometer scale data storage device and associated positioning system
04/15/2004US20040069944 Balanced momentum probe holder
04/14/2004EP1408327A2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
04/13/2004US6720728 Devices containing a carbon nanotube
04/13/2004US6720553 Tip calibration standard and method for tip calibration
04/13/2004US6719602 Nanotube length control method
04/13/2004US6718821 Laser interferometry force-feedback sensor for an interfacial force microscope
04/08/2004US20040065819 Scanning unit and scanning microscope having the same
04/06/2004US6717402 Probe having at least one magnetic resistive element for measuring leakage magnetic field
04/06/2004US6716409 Fabrication of nanotube microscopy tips
04/06/2004US6715345 Coaxial probe with cantilever and scanning micro-wave microscope including the same
04/01/2004WO2004027809A2 Charged particle beam system
04/01/2004WO2004027808A2 Particle-optical device and detection means
04/01/2004WO2004027791A1 Patterning magnetic nanostructures
04/01/2004WO2004027095A1 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading
03/2004
03/31/2004EP0927331B1 Macroscopically manipulable nanoscale devices made from nanotube assemblies
03/25/2004WO2003046926A3 Tailoring domain engineered structures in ferroelectric materials
03/25/2004WO2002014862A8 Method and device for characterising and/or for detecting a bonding complex
03/25/2004US20040058328 Using oligonucleotide probes for detection, identification and/or sequencing of nucleic acids and/or biomolecules; for use in medical diagnostics, forensics, toxicology, pathology, biological warfare
03/25/2004US20040056207 Deflection method and system for use in a charged particle beam column
03/25/2004US20040056195 Method of sample preparation for atom probes and source of specimens
03/25/2004US20040055892 Deposition method for nanostructure materials
03/24/2004EP1399385A2 Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires
03/23/2004US6708556 Atomic force microscope and driving method therefor
03/18/2004WO2004023490A2 Fluid delivery for scanning probe microscopy
03/18/2004US20040053308 Probe immobilized substrate and method for manufacturing the same, and analytical method
03/18/2004US20040051522 Techniques for electrically characterizing tunnel junction film stacks with little or no processing
03/18/2004US20040051424 Micropositioning device
03/16/2004US6705154 Cantilever for vertical scanning microscope and probe for vertical scan microscope
03/11/2004US20040046119 SPM sensor and process for producing it
03/09/2004US6703615 Light receiving and emitting probe and light receiving and emitting probe apparatus
03/09/2004US6703612 Large geometric factor charged particle spectrometer
03/04/2004WO2003056567A3 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture
03/04/2004US20040040373 Method for measuring a configuration of an object
03/04/2004DE10296462T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer Messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a measuring device of Technology
03/02/2004US6700121 Methods of sampling specimens for microanalysis
02/2004
02/26/2004WO2004017329A1 Sensor with cantilever and optical resonator
02/26/2004US20040037959 Nanolithography, forming a pattern on a substrate by using a coated tip pen, coated with a compound, atomic force microscope imaging, drawing
02/26/2004US20040036403 Fabrication method of carbon nanotubes
02/26/2004DE10236150A1 Method for forming opening in semiconductor substrate layer for manufacture of calibration standard for scanning microscopy, micromechanical sensor or other components
02/24/2004US6694805 Cantilever for scanning probe microscopy
02/19/2004WO2004015455A2 Improved method and system for scanning apertureless fluorescence microscope
02/19/2004WO2004014785A2 Method for producing at least one small opening in a layer on a substrate and components produced according to said method
02/19/2004WO2003042627A3 Field effect transistor sensor for a screen probe microscope
02/12/2004WO2004013603A2 A method of sample preparation for atom probes and source of specimens
02/12/2004US20040028814 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
02/12/2004US20040027889 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory
02/12/2004US20040026629 Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device
02/12/2004US20040026007 Method and apparatus for direct fabrication of nanostructures
02/10/2004US6690008 Probe and method of manufacturing mounted AFM probes
02/05/2004WO2004012201A2 Method of and apparatus for calibrating cantilevers
02/05/2004US20040023519 Single molecule array on silicon substrate for quantum computer
02/05/2004US20040022943 Prongs that are grown, via chemical vapor deposition, from patches of catalytic material deposited on a surface of a tip of the tweezer.
02/04/2004EP1386324A1 Actuating and sensing device for scanning probe microscopes
02/03/2004US6685639 High intensity focused ultrasound system for scanning and curing tumor
02/03/2004US6684686 Non-contact type atomic microscope and observation method using it
02/03/2004US6684676 Apparatus for forming optical aperture
01/2004
01/29/2004WO2004010475A2 Method of reducing internal stress in materials
01/27/2004US6683783 Purification of graphite mixtures by combustion to remove amorphous carbon, then recovering and cutting the fullerene tubes formed for use in power transmission cables, solar cells, batteries, electronics, detectors or as composites
01/22/2004DE10230657A1 Verfahren und Vorrichtung zur Positionierung und Verformung von schmelzbaren Partikeln an Messspitzen Method and apparatus for positioning and deformation of the fusible particles of probe tips
01/20/2004US6680617 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
01/15/2004US20040009308 Method of producing a branched carbon nanotube for use with an atomic force microscope
01/15/2004US20040007053 SPM sensor and process for producing same
01/13/2004US6677697 Force scanning probe microscope
01/13/2004US6677567 Scanning probe microscope with improved scan accuracy, scan speed, and optical vision
01/13/2004US6675637 Touch sensor
01/08/2004WO2004003551A1 Probe support, method of constructing probe support, method of evaluating probe support and method of detecting target nucleic acid using the same
01/08/2004US20040004484 System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes
01/08/2004US20040004182 Sample for simultaneously conducting electro-chemical and topographic near-field microscopy
01/07/2004EP1378017A1 Heterostructure component
01/07/2004EP1377794A1 Improved scanning probe microscope
01/07/2004CN1466707A Pinhole defect repair by resist blow
01/02/2004EP1376650A1 Scanning atom probe and analysis method using scanning atom probe
12/2003
12/30/2003US6669256 Nanotweezers and nanomanipulator
12/30/2003US6668652 Nano-substance mass measurement method and apparatus
12/30/2003US6668628 Scanning probe system with spring probe
12/25/2003US20030233871 Multi-walled carbon nanotube scanning probe apparatus having a sharpened tip and method of sharpening for high resolution, high aspect ratio imaging
12/23/2003US6667467 Microprobe and scanning probe apparatus having microprobe
12/23/2003US6666075 System and method of multi-dimensional force sensing for scanning probe microscopy
12/18/2003WO2003083437A3 Method and apparatus for identifying molecular species on a conductive surface
12/18/2003WO2003027011B1 Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires
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