Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
10/2002
10/15/2002US6465782 Strongly textured atomic ridges and tip arrays
10/10/2002WO2002080186A1 Afm cantilevers and methods for making and using same
10/10/2002US20020146714 Detecting single nucleotide polymorphism in gene sample; obtain sample, place on microscope, generate image, analyze and detect nucleotide sequence adjustment
10/08/2002US6461528 Method of fabricating lateral nanopores, directed pore growth and pore interconnects and filter devices using the same
10/01/2002US6459088 Drive stage and scanning probe microscope and information recording/reproducing apparatus using the same
10/01/2002US6458605 Method and apparatus for controlling photolithography overlay registration
10/01/2002US6458206 Cantilever with whisker-grown probe and method for producing thereof
10/01/2002US6457350 Carbon nanotube probe tip grown on a small probe
09/2002
09/26/2002US20020136683 Purifying mixture comprising single-wall carbon nanotubes and amorphous carbon contaminate by heating under oxidizing conditions sufficient to remove amorphous carbon and recovering product
09/26/2002US20020136681 Purifying mixture comprising single-wall carbon nanotubes and amorphous carbon contaminate by heating under oxidizing conditions sufficient to remove amorphous carbon and recovering product
09/26/2002US20020135755 Scanning probe microscope assembly
09/25/2002EP1243915A1 Apparatus for evaluating electrical characteristics
09/24/2002US6455847 Carbon nanotube probes in atomic force microscope to detect partially open/closed contacts
09/24/2002US6455334 Probe grid for integrated circuit analysis
09/19/2002WO2002073624A2 Memory element, method for structuring a surface, and storage device
09/19/2002WO2002073128A1 Calibration of an analogue probe
09/19/2002WO2002073126A1 Apparatus and method for isolating and measuring movement in metrology apparatus
09/19/2002WO2002073125A1 Apparatus and method for isolating and measuring movement in a metrology apparatus
09/19/2002US20020132500 Electrical connection structure, production method thereof, and electric wiring method
09/19/2002US20020131297 Memory element, method for structuring a surface, and storage device
09/18/2002EP1196939A4 Object inspection and/or modification system and method
09/17/2002US6452307 Device for micropositioning of an object
09/17/2002US6452174 Charged particle beam apparatus and method of controlling same
09/17/2002US6452173 Charged particle apparatus
09/17/2002US6452171 Method for sharpening nanotube bundles
09/17/2002US6452161 Scanning probe microscope having optical fiber spaced from point of hp
09/12/2002WO2001027581A9 Force sensing devices with multiple filled and/or empty channels and other attributes
09/12/2002US20020127577 Biosensor for use in the detection of molecular interactions between immobilized ligands and receptors
09/12/2002US20020127169 Purifying a mixture of single-wall carbon nanotubes and amorphous carbon contaminate, by heating under oxidizing conditions to remove amorphous carbon
09/12/2002US20020127162 Mixture of single-wall carbon nanotubes and amorphous carbon contaminate is heated to remove amorphous carbon and recovering a product >/= 80% nanotubes
09/12/2002US20020126937 Fiber, probe and optical head of multiple optical path array type and methods for manufacturing the same
09/12/2002US20020125427 Method and apparatus for manipulating a sample
09/12/2002US20020125415 Apparatus and method for isolating and measuring movement in a metrology apparatus
09/12/2002US20020124636 Apparatus and method for isolating and measuring movement in metrology apparatus
09/11/2002EP1239294A2 Scanning magnetism detector and probe for the same
09/10/2002US6448766 Method of imaging a magnetic field emanating from a surface using a conventional scanning force microscope
09/10/2002US6448553 Signal detector to be used with scanning probe and atomic force microscope
09/10/2002US6448543 Near field optical head and reproduction method
09/05/2002US20020122873 Providing tip comprising internal cavity having external opening; loading cavity with a deposition compound; subjecting tip to driving force to deliver compound through external opening to be deposited on substrate
09/05/2002US20020122766 Direct growth of nanotubes, and their use in nanotweezers
09/05/2002US20020121897 Probe for measuring leakage magnetic field
09/05/2002US20020121131 System and method of multi-dimensional force sensing for scanning probe microscopy
09/04/2002EP1237161A2 Method and apparatus for performing atomic force microscopy measurements
09/03/2002US6445107 Single stage microactuator for multi-dimensional actuation
08/2002
08/29/2002US20020117611 Object inspection and/or modification system and method
08/22/2002WO2002025375A3 Pinhole defect repair by resist flow
08/22/2002US20020112814 Fabrication of nanotube microscopy tips
08/21/2002EP1233259A1 Scanning type probe microscope probe and method of producing the same, and a scanning type probe microscope having this probe and polymer processing method using the same
08/20/2002US6438092 Near-field optical recording/reading apparatus
08/20/2002US6437562 Magnetic field characteristics evaluation apparatus and magnetic field characteristics measuring method
08/20/2002US6437329 Use of carbon nanotubes as chemical sensors by incorporation of fluorescent molecules within the tube
08/20/2002US6435015 Scanning probe microscope
08/15/2002WO2002045215A3 Nanolithography methods and products therefor and produced thereby
08/15/2002US20020110177 Heat emitting probe and heat emitting probe apparatus
08/15/2002US20020109087 Method for producing a catalyst support and compositions thereof
08/15/2002US20020109086 Method for growing continuous carbon fiber and compositions thereof
08/15/2002US20020109082 Light receiving and emitting probe and light receiving and emitting probe apparatus
08/14/2002EP1230448A1 Patterned carbon nanotubes
08/14/2002CN1364141A Nanotweezers and nanomanipulator
08/08/2002US20020104966 Monochromator for charged particles
08/08/2002US20020104612 Method for fabricating transmission electron microscope
08/07/2002EP1228356A1 System and method for detecting molecules using an active pixel sensor
08/06/2002US6430324 Optical probe and method for manufacturing same and scanning proximity field optical microscope
08/01/2002US20020102201 Method for forming an array of single-wall carbon nanotubes in an electric field and compositions thereof
08/01/2002US20020102196 Heating mixture under oxidizing conditions sufficient to remove the amorphous carbon and recovering a product comprising at least single-wall carbon nanotubes
07/2002
07/30/2002US6426499 Multi-probe test head and process using same
07/30/2002US6425189 Probe tip locator having improved marker arrangement for reduced bit encoding error
07/25/2002WO2002057749A1 Balanced momentum probe holder
07/25/2002US20020100005 Integrated verification and manufacturability tool
07/25/2002US20020098135 Array of single-wall carbon nanotubes
07/25/2002US20020096642 Balanced momentum probe holder
07/25/2002US20020096634 Method for cutting single-wall carbon nanotubes
07/24/2002EP0805946B1 Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system
07/23/2002US6423967 Detection apparatus and detection method to be used for scanning probe and observation apparatus and observation method
07/23/2002US6423551 Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes
07/23/2002US6422077 Ultrananocrystalline diamond cantilever wide dynamic range acceleration/vibration/pressure sensor
07/23/2002CA2170860C Near-field optical microscope
07/18/2002US20020094311 Method for cutting nanotubes
07/18/2002US20020092984 Method for purification of as-produced single-wall carbon nanotubes
07/18/2002US20020092983 Method for growing single-wall carbon nanotubes utilizing seed molecules
07/18/2002US20020092982 High frequency dithering probe for high speed scanning probe microscope
07/18/2002US20020092340 Cantilever array sensor system
07/18/2002DE10100439A1 Verfahren zur Herstellung von mikrostrukturierten Bauelementen A process for producing microstructured components
07/17/2002CN1359468A Atomic force microscope and driving method therefor
07/11/2002WO2002053489A2 Method for producing microstructured components
07/11/2002US20020090331 Heating mixture comprising single-wall carbon nanotubes and amorphous carbon contaminate under oxidizing conditions to remove amorphous carbon and recovering a product comprising purified of single-wall carbon nanotubes
07/11/2002US20020090330 Heating mixture comprising single-wall carbon nanotubes and amorphous carbon contaminate under oxidizing conditions to remove amorphous carbon and recovering a product comprising purified of single-wall carbon nanotubes
07/11/2002US20020088938 Method for forming an array of single-wall carbon nanotubes and compositions thereof
07/10/2002EP1221179A1 Strongly textured atomic ridges and dots
07/09/2002US6417673 Scanning depletion microscopy for carrier profiling
07/09/2002US6415654 Scanning probe microscope system including removable probe sensor assembly
07/09/2002US6415653 Cantilever for use in a scanning probe microscope
07/04/2002WO2001031656A9 Technique and process for the imaging and formation of various devices and surfaces
07/04/2002US20020085968 Several component molecule having multiple derivatives brought together to assemble into the three-dimensional structure.
07/04/2002US20020084791 Measurement probe for detecting electrical signals in an integrated semiconductor circuit
07/04/2002US20020084790 Four- terminal measuring device that uses nanotube terminals
07/04/2002US20020084410 Macroscopically manipulable nanoscale devices made from nanotube assemblies
07/03/2002EP1220292A2 Monochromator for charged particles
07/03/2002EP1218947A2 Force sensing devices with multiple filled and/or empty channels and other attributes
07/03/2002EP1218726A1 Method for direct measurement of polycarbonate composition by fluorescence
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