Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
12/2003
12/18/2003US20030230726 Apparatus and method for using a volume conductive electrode with ion optical elements for a time-of-flight mass spectrometer
12/18/2003US20030230709 Probe, near-field light generation apparatus including probe, exposure apparatus, and exposing method using probe
12/17/2003CN1462039A Magnetic nano-pipe
12/16/2003US6664552 Method and apparatus for specimen fabrication
12/16/2003US6664540 Microprobe and sample surface measuring apparatus
12/11/2003WO2003038033A3 Protein and peptide nanoarrays
12/10/2003EP1368615A1 Calibration of an analogue probe
12/09/2003US6660533 Attaching proteins to the surface of silica supports via immobilization; medical diagnosis
12/04/2003US20030224170 Magnetic carbon nanotube
12/02/2003US6656369 Method for fabricating a scanning probe microscope probe
12/02/2003US6655196 Scanning probe microscope
11/2003
11/27/2003WO2003007881A3 Antibodies specific for nanotubes and related methods and compositions
11/25/2003US6653630 Tailoring domain engineered structures in ferroelectric materials
11/20/2003WO2003096429A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
11/20/2003WO2003096409A1 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
11/19/2003EP1362230A1 Balanced momentum probe holder
11/19/2003CN2587043Y Intelligent needle-point connecting structure of scanning probe microscope
11/18/2003US6649894 Optical near field generator
11/18/2003US6647766 For thermomechanical writing and thermal readout of binary information in a storage media
11/13/2003US20030209060 Apparatus and method for isolating and measuring movement in metrology apparatus
11/06/2003WO2003091327A1 Rubber composition and process for production thereof
11/06/2003US20030206749 Electrophotographic endless belt, process cartridge, and electrophotographic apparatus
11/05/2003EP1359593A1 SPM sensor and method for its manufacture
11/05/2003EP1359388A1 SPM sensor and method for producing the same
11/05/2003CN1453662A Electronic photographic ring band, processing box and electronic photographic apparatus
11/04/2003US6642129 Parallel, individually addressable probes for nanolithography
10/2003
10/30/2003US20030200798 Atomic force microscope
10/29/2003EP1357445A2 Electrophotographic endless belt, process cartridge, and electrophotographic apparatus
10/23/2003WO2003087709A1 Nanowire microscope probe tips
10/23/2003US20030197456 Devices containing a carbon nanotube
10/23/2003US20030197123 Micromachined microprobe
10/23/2003US20030197120 Nanotube, near-field light detecting apparatus and near-field light detecting method
10/23/2003US20030196988 Process for producing an SPM sensor
10/21/2003US6636050 Four-terminal measuring device that uses nanotube terminals
10/21/2003US6635311 Microfabrication and nanofabrication, atomic force microscope imaging
10/16/2003WO2003027011A3 Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires
10/16/2003WO2003025540A3 Differential tagging of polymers for high resolution linear analysis
10/16/2003WO2003006952A3 Method and apparatus for manipulating a sample
10/15/2003EP1002216B1 Microscope for compliance measurement
10/15/2003CN1449359A Single molecule array on silicon substrate for quantum computer
10/09/2003WO2003083437A2 Method and apparatus for identifying molecular species on a conductive surface
10/09/2003WO2003036767A3 Parallel, individually addressable probes for nanolithography
10/09/2003WO2003019238A3 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
10/09/2003US20030190425 Method for producing a device for simultaneously carrying out an electrochemical and a topographical near-field microscopy
10/09/2003US20030189351 Nanotweezers and nanomanipulator
10/09/2003US20030189350 Nanotweezers and nanomanipulator
10/08/2003EP1351256A2 Scanning probe system with spring probe
10/08/2003EP1350107A2 Method and device for characterising and/or for detecting a bonding complex
10/07/2003US6630307 Chemical and biological targets having an affinity for the nanocrystal which emits upon radiation a charateristic emission spectrum analyzed spectroscopically; immunoassays; ELIZA; accuracy; noncontamination
10/02/2003WO2002073624A3 Memory element, method for structuring a surface, and storage device
10/02/2003US20030186914 Precipitation occurs on substrate surfaces of oxides, nitrides, or carbides of metals and semiconductors, comprising use of water-soluble salts of compounds for treatment of these surfaces as sensor platforms, implants, medical devices
10/02/2003US20030186625 Sharpening method of nanotubes
10/02/2003US20030186311 Using near field scanning probes and microarrays for analyzing pyhsical properties such as viscoelasticity, morphology and friction of liquid sample
10/02/2003US20030183761 Scanning probe system with spring probe and actuation/sensing structure
10/02/2003US20030182993 Scanning probe system with spring probe
09/2003
09/30/2003US6628053 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device
09/25/2003WO2002022889A3 Direct haplotyping using carbon nanotube probes
09/24/2003EP1347264A1 Method of fabricating a probe for SPM
09/24/2003CN1444494A Methods utilizing scanning probe microscope tips and products therefor or produced thereby
09/24/2003CN1444217A Dielectric recording medium and its mfg. method and device
09/23/2003US6624412 Energy filter
09/16/2003US6621080 Apparatus for measuring a micro surface configuration and a method for manufacturing a probe incorporated in this measuring apparatus
09/16/2003US6621065 Imaging probe
09/12/2003WO2003075372A2 Deposition method for nanostructure materials
09/12/2003CA2468685A1 Deposition method for nanostructure materials
09/11/2003US20030169846 Multi-technique thin film analysis tool
09/11/2003US20030169672 Dielectric recording medium, and method of and apparatus for producing the same
09/11/2003US20030167831 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
09/09/2003US6617761 Scanning unit and scanning microscope having the same
09/09/2003US6617569 Probe opening forming apparatus and near-field optical microscope using the same
09/09/2003US6616784 Method for fabricating transmission electron microscope
09/04/2003WO2003073086A1 An apparatus and method for using a volume conductive electrode with ion optical elements for a time-of-flight mass spectrometer
09/03/2003EP1341183A1 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory
09/03/2003EP1340112A1 Micropositioning device
09/02/2003US6614243 Measurement probe for detecting electrical signals in an integrated semiconductor circuit
09/02/2003US6613601 Ultrananocrystalline diamond cantilever wide dynamic range acceleration/vibration/pressure sensor
09/02/2003US6612160 Apparatus and method for isolating and measuring movement in metrology apparatus
08/2003
08/26/2003US6611178 Nanometer-order mechanical vibrator, production method thereof and measuring device using it
08/21/2003WO2003069271A1 Improved scanning probe microscope
08/21/2003US20030157744 Method of producing an integrated circuit with a carbon nanotube
08/21/2003US20030156985 Carbon nanotube connected instrument
08/21/2003US20030155934 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
08/21/2003US20030155481 Scanning probe microscope
08/21/2003US20030154773 Scanning atom probe and analysis method utilizing scanning atom probe
08/20/2003EP1336835A1 Conductive probe for scanning microscope and machining method using the same
08/14/2003WO2003067224A1 Scanning probe microscope and specimen surface structure measuring method
08/07/2003WO2002053489A3 Method for producing microstructured components
08/07/2003US20030148289 Modification of markers such as nanotubes form nanotube assemblies that are easily detected using a number of surface analysis devices such as atomic force microscopy
07/2003
07/31/2003WO2003062742A1 Scanning probe for data storage and microscopy
07/31/2003WO2003038409B1 Cantilever array sensor system
07/31/2003US20030143327 Depositing a catalytic material onto the apex of tip of atomic force microscope; subjecting catalytic material to chemical vapor deposition to initiate growth of carbon nanotube such that carbon nanotube extends from the apex of tip
07/31/2003US20030141444 Near-field optical probe
07/30/2003EP1330742A1 Integrated verification and manufacturability tool
07/30/2003EP1080340B1 Force sensing cantilever for atomic force microscope
07/24/2003WO2003060923A1 Microstructures
07/24/2003US20030139839 Method of sorting a group of integrated circuit devices for those devices requiring special testing
07/24/2003US20030138796 Method for synthesising and immobilising nucleic acids on a silanized solid support
07/22/2003US6597185 Apparatus for localized measurements of complex permittivity of a material
07/22/2003US6597090 Method for manufacturing carbon nanotubes as functional elements of MEMS devices
07/22/2003US6596483 System and method for detecting molecules using an active pixel sensor
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