| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 05/06/2005 | WO2005040718A1 Spectral interferometry method and apparatus |
| 05/05/2005 | US20050094155 Reduction of thermal non-cyclic error effects in interferometers |
| 05/05/2005 | US20050094154 Low power consumption, broad navigability optical mouse |
| 05/04/2005 | EP1527318A1 Determining topography and composition of a sample by using an interferometer |
| 05/04/2005 | EP1527317A2 Fringe pattern discriminator for grazing incidence interferometer |
| 05/04/2005 | EP0934501B1 A multi-wavelength reference |
| 05/04/2005 | CN1611915A Method and apparatus for self-calibration of a tunable-source phase shifting interferometer |
| 05/04/2005 | CN1611914A Two-way shear interferometer |
| 05/04/2005 | CN1200325C Amplifying holographic device for co-axle recorded phase difference |
| 05/04/2005 | CN1200261C Superfine indentation tester |
| 05/04/2005 | CN1200247C Transverse double-frequency zeeman laser linearity/coaxality measuring mechanism |
| 05/04/2005 | CN1200245C Apparatus and method for measuring non-spheric surface with hologram and concave surface |
| 05/03/2005 | US6888638 Interferometry system having a dynamic beam steering assembly for measuring angle and distance |
| 05/03/2005 | US6887359 Chemical micro-sensor |
| 05/03/2005 | US6886365 Fiber optic Fabry-Perot interferometer and associated methods |
| 04/28/2005 | US20050088663 Scanning interferometry for thin film thickness and surface measurements |
| 04/28/2005 | US20050088660 Downhole optical sensor system with reference |
| 04/28/2005 | US20050088659 Feedback control of an interferometer |
| 04/28/2005 | US20050088658 Wavelength monitor |
| 04/28/2005 | US20050088638 Off-axis levelling in lithographic projection apparatus |
| 04/27/2005 | EP1526408A1 Lithographic apparatus and device manufacturing method, and measurement systems |
| 04/27/2005 | EP1015844A4 Spectral bio-imaging methods for cell classification |
| 04/27/2005 | CN1609731A Hard X-ray holographic interference apparatus |
| 04/27/2005 | CN1609571A Wavelength monitor |
| 04/27/2005 | CN1609547A Detected lens holding table for interferometer apparatus |
| 04/26/2005 | US6885449 Optical inspection system based on spatial filtering using a refractive-index-grating |
| 04/26/2005 | US6885442 Phase determination of a radiation wave field |
| 04/26/2005 | CA2432727C Fiber optic displacement sensor |
| 04/21/2005 | US20050083537 Reconfigurable interferometer system |
| 04/21/2005 | US20050083534 Agile high sensitivity optical sensor |
| 04/21/2005 | US20050083531 Calibration and error correction in multi-channel imaging |
| 04/20/2005 | EP1524491A1 Apparatus coupling an interferometer and a microscope |
| 04/20/2005 | EP1523657A1 Delaying interferometer |
| 04/19/2005 | US6882433 Interferometer system of compact configuration |
| 04/19/2005 | US6882432 Frequency transform phase shifting interferometry |
| 04/19/2005 | US6882431 Quantum optical coherence tomography data collection apparatus and method for processing therefor |
| 04/19/2005 | US6882430 Spatial filtering in interferometry |
| 04/19/2005 | US6882428 Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser |
| 04/19/2005 | US6882405 Off-axis levelling in lithographic projection apparatus |
| 04/14/2005 | WO2005033747A2 Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy |
| 04/14/2005 | WO2005033643A2 Rugged fabry-perot pressure sensor |
| 04/14/2005 | WO2005033626A1 Gas discharge mopa laser spectral analysis module |
| 04/14/2005 | WO2005033625A1 Gas discharge mopa laser spectral analysis module |
| 04/14/2005 | WO2005033619A2 Robust heterodyne interferometer optical gauge |
| 04/14/2005 | WO2004113826A3 Compensation for imperfections in a measurement object and for beam misalignments in plane mirror interferometers |
| 04/14/2005 | WO2004090507A3 Apparatus and method for correcting errors generated by a laser with non-ideal tuning characteristics |
| 04/14/2005 | WO2004079295A3 Profiling complex surface structures using scanning interferometry |
| 04/14/2005 | US20050078319 Surface profiling using an interference pattern matching template |
| 04/14/2005 | US20050078318 Methods and systems for interferometric analysis of surfaces and related applications |
| 04/14/2005 | US20050078315 Apparatus, method, and program for measuring optical characteristic using quantum interference, and recording medium for recording the program |
| 04/14/2005 | US20050078295 Heterodyne frequency modulated signal demodulator and method of operating the same |
| 04/14/2005 | US20050078288 Lithographic apparatus and interferometer system |
| 04/14/2005 | DE19782060B4 Interferometer mit katadioptrischem Abbildungssystem mit erweitertem numerischem Aperturbereich Interferometer with a catadioptric imaging system with advanced numerical aperture area |
| 04/14/2005 | DE102004020265A1 Laserüberwachung unter Verwendung sowohl der reflektierten als auch der durchgelassenen Interferenzstrukturen eines Etalons A laser survey using both the reflected and the transmitted interference structures of an etalon |
| 04/14/2005 | CA2541312A1 Rugged fabry-perot pressure sensor |
| 04/14/2005 | CA2540092A1 Secure optical communication |
| 04/13/2005 | EP1521942A2 Gas discharge ultraviolet wavemeter with enhanced illumination |
| 04/13/2005 | CN1606235A He-Ne laser beat wave noise filtering equipment and noise filtering method |
| 04/12/2005 | US6879427 Shear inducing beamsplitter for interferometric image processing |
| 04/12/2005 | US6879402 Scanning interferometer for aspheric surfaces and wavefronts |
| 04/07/2005 | WO2005031397A2 Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces |
| 04/07/2005 | WO2005031255A1 Free-form optical surface measuring apparatus and method |
| 04/07/2005 | US20050073692 Profiling complex surface structures using scanning interferometry |
| 04/07/2005 | US20050073691 Optical coherence tomography apparatus, opticalfiber lateral scanner and a method for studying biological tissues in vivo |
| 04/06/2005 | EP1520291A2 System and method for controlling wafer temperature |
| 04/06/2005 | EP1520151A1 Cyclic error compensation in interferometry systems |
| 04/06/2005 | EP1412695B1 Increase of the long-term operational reliability of a fibre optic interferometer by protecting the light source |
| 04/06/2005 | CN1603979A Holographic phasic difference amplifying and reconfiguration unit |
| 04/06/2005 | CN1603738A Large-scale nano detection optical system |
| 04/06/2005 | CN1603737A X ray interferometer with twin zone plates |
| 04/05/2005 | US6876474 Method for tracking particles and life forms in three dimensions and in time |
| 04/05/2005 | US6876456 Absolute calibration of optical flats |
| 04/05/2005 | US6876453 Metrology system for precision 3D motion |
| 04/05/2005 | US6876451 Monolithic multiaxis interferometer |
| 03/31/2005 | WO2005029193A2 Interferometric analysis of surfaces. |
| 03/31/2005 | WO2005029192A2 Surface triangulation and profiling through a thin film coating |
| 03/31/2005 | WO2005029022A1 Method and apparatus for directly measuring the phase change of an optical signal |
| 03/31/2005 | WO2005003681A3 Faster processing of multiple spatially-heterodyned direct to digital holograms |
| 03/31/2005 | WO2004068184A3 Interferometer having a scanning mirror |
| 03/31/2005 | US20050070791 Signal processing using non-linear regression with a sinusoidal model |
| 03/31/2005 | US20050068631 Variable polarization independent optical power splitter |
| 03/31/2005 | US20050068543 System and method for detecting presence of analytes using gratings |
| 03/31/2005 | US20050068542 Optical mountings for gas discharge mopa laser spectral analysis module |
| 03/31/2005 | US20050068540 Triangulation methods and systems for profiling surfaces through a thin film coating |
| 03/31/2005 | CA2533677A1 Method and apparatus for directly measuring the phase change of an optical signal |
| 03/30/2005 | EP1519144A1 Free-form optical surface measuring apparatus and method |
| 03/30/2005 | CN1601223A Device for measuring 2D displacement |
| 03/30/2005 | CN1601222A Interferometer |
| 03/30/2005 | CN1601221A Stabilizing method of ligt source output |
| 03/29/2005 | US6873423 Length measure apparatus and the method for measuring |
| 03/29/2005 | US6873419 Method and apparatus for three-dimensional compositional mapping of heterogeneous materials |
| 03/29/2005 | US6873418 Optical mountings for gas discharge MOPA laser spectral analysis module |
| 03/29/2005 | US6872931 Optical input device for measuring finger movement |
| 03/24/2005 | WO2004106978A3 Packaging method and apparatus for fabrication of the optical transmitter and receiver in the optical wireless communication system |
| 03/24/2005 | WO2004090465A3 Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
| 03/24/2005 | WO2004068187A3 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
| 03/24/2005 | WO2004032722A3 Imaging systems |
| 03/24/2005 | US20050062981 Apparatus for measuring two-dimensional displacement |
| 03/24/2005 | US20050062979 Optical fiber pressure and acceleration sensor fabricated on a fiber endface |
| 03/24/2005 | US20050062978 Method and apparatus for directly measuring the phase change of an optical signal |