| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 03/24/2005 | US20050062976 Laser monitoring using both the reflected and transmitted interference patterns of an etalon |
| 03/24/2005 | US20050062957 Phase determination of a radiation wave field |
| 03/24/2005 | US20050062624 Phase digitizer for signals in imperfect quadrature |
| 03/23/2005 | CN1599860A A method of alignment by using interferometry |
| 03/23/2005 | CN1194206C Integrated optical interferometed based on interlinking technology |
| 03/22/2005 | US6870975 Fiber optic sensor usable over wide range of gage lengths |
| 03/22/2005 | US6870629 Optical frequency sweep control and readout by using a phase lock |
| 03/22/2005 | CA2278356C Optical waveguide sensor system for remote detection |
| 03/17/2005 | WO2005024379A2 Fiber optic sensor system |
| 03/17/2005 | WO2005024373A1 Wave front aberration measuring device |
| 03/17/2005 | WO2005024339A2 Optical fiber pressure and acceleration sensor fabricated on a fiber endface |
| 03/17/2005 | WO2004109245A3 An interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror |
| 03/17/2005 | WO2004077019A3 Capillary rise technique for the assessment of the wettability of particulate surfaces |
| 03/17/2005 | US20050057757 Low coherence grazing incidence interferometry systems and methods |
| 03/17/2005 | US20050057756 Systems and methods for phase measurements |
| 03/17/2005 | DE19944018B4 Architektur für ein Luftturbulenz-kompensiertes Zwei-Wellenlängen-Heterodyninterferometer Architecture for an air turbulence-compensated two-wavelength heterodyne |
| 03/17/2005 | DE10337896A1 Interferometrische Messvorrichtung zum Erfassen von Geometriedaten von Oberflächen Interferometric measuring device for detecting geometric data of surfaces |
| 03/17/2005 | DE10337895A1 Heterodyne interferometric measurement device for measuring surface shapes, has a modulation interferometer that is configured in conjunction with light frequency displacement devices |
| 03/16/2005 | EP1514074A2 Interferometry systems involving a dynamic beam-steering assembly |
| 03/16/2005 | CN1595054A Compatible and accurate calibration method for double eye line structure photo-sensor and implementing apparatus |
| 03/15/2005 | US6868347 System for real time, non-invasive metrology of microfluidic chips |
| 03/15/2005 | US6867868 Method and apparatus for tunable interferometer utilizing variable air density |
| 03/15/2005 | US6867867 Interferometric stage metrology system |
| 03/15/2005 | US6867863 Integrated diagnostic for photoelastic modulator |
| 03/10/2005 | WO2005022128A2 Device and method for the non-invasive detection and measurement of the properties of a medium |
| 03/10/2005 | WO2004066017A3 Method and device for testing sunglasses |
| 03/10/2005 | US20050052656 Interferometric measuring device for recording geometric data for surfaces |
| 03/09/2005 | EP1512939A1 Method for obtaining the image of an object, device for carrying out said method and device for delivering low coherent optical radiation |
| 03/09/2005 | EP1127252B1 Phase determination of a radiation wave field |
| 03/09/2005 | CN1592841A Checking system and method using white light interference measuring method |
| 03/09/2005 | CN1192207C Method and device for non-destructive inspection of objects by means of optical holographic interferometry measurement technology |
| 03/08/2005 | US6865211 Gas laser and optical system |
| 03/08/2005 | US6864987 Interferometer having improved modulation depth and free-spectral range and method of manufacturing |
| 03/08/2005 | US6864963 Position measuring system with multiple bar mirrors |
| 03/03/2005 | WO2005019872A2 Method and apparatus for alignment of a precision optical assembly |
| 03/03/2005 | WO2004109226A3 Interferometric measuring device |
| 03/03/2005 | US20050046868 System for monitoring optical output/wavelength |
| 03/03/2005 | US20050046866 Surface inspection apparatus |
| 03/03/2005 | US20050046865 Pixelated phase-mask interferometer |
| 03/03/2005 | US20050046864 Simultaneous phase-shifting fizeau interferometer |
| 03/03/2005 | US20050046863 Common optical-path testing of high-numerical-aperture wavefronts |
| 03/03/2005 | US20050046862 Fiber optic sensing device for measuring a physical parameter |
| 03/03/2005 | US20050046856 Gas discharge mopa laser spectral analysis module |
| 03/02/2005 | EP1509747A2 Metrology system for precision 3d motion |
| 03/02/2005 | CN2682437Y Longitudinal scanning device in optical correlation fault imaging system |
| 03/02/2005 | CN1588144A Full optical fiber interference system |
| 03/02/2005 | CN1587898A Three differential confocal microscopic imaging method and device |
| 03/02/2005 | CN1587897A Zoned split joint multiple He-Ne laser digital speckle interference measuring system |
| 03/02/2005 | CN1587896A Optic 8 fine divided double frequency laser interferometer |
| 03/02/2005 | CN1587895A Double frequency laser interferometer |
| 02/24/2005 | WO2005017449A1 Compensation for errors in off-axis interferometric measurements |
| 02/24/2005 | US20050041257 Method and apparatus for alignment of a precision optical assembly |
| 02/24/2005 | US20050041256 Method and system to detect an alignment mark |
| 02/24/2005 | US20050041254 System for rotation measurement with laser interferometry |
| 02/24/2005 | US20050041244 Method and apparatus for compact birefringent interference imaging spectrometer |
| 02/23/2005 | EP1508065A1 Optical coherence tomography scanner with negative field curvature |
| 02/23/2005 | EP1137908B1 Speckle shearing-interferometer for strain measurement |
| 02/22/2005 | US6859566 Method of analyzing fringe image having separate regions |
| 02/17/2005 | WO2005015124A1 Surface profiling method and apparatus |
| 02/17/2005 | WO2005015122A1 Method for determining the refractive index during interferometric length measurement and interferometeric arrangement therefor |
| 02/17/2005 | WO2004068186A3 Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
| 02/17/2005 | US20050036152 Vibration-resistant interferometer apparatus |
| 02/17/2005 | US20050036150 Method for optical coherence tomography imaging with molecular contrast |
| 02/17/2005 | US20050036149 Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology |
| 02/17/2005 | DE10260256B4 Interferometersystem und Meß-/Bearbeitungswerkzeug Interferometer and measuring / cutting tool |
| 02/16/2005 | EP1506370A2 System and method for control of paint thickness by using an optoacoustic technique |
| 02/16/2005 | EP1506369A2 System and method for controlling tube thickness with ultrasound |
| 02/16/2005 | EP1506367A1 A device for measuring in three dimensions a topographical shape of an object |
| 02/16/2005 | EP1506340A1 System and method for online control of paper elasticity and thickness |
| 02/16/2005 | CN2679707Y Multiple variable, non-distortion acquisition appts. for interfrogram |
| 02/16/2005 | CN2679645Y Calculating holographic non-spherical interference measurer for LED device |
| 02/16/2005 | CN2679644Y D.C. light inntensity active shock resisting and shifting interferometer |
| 02/16/2005 | CN2679643Y Electromechanical preperssuring optical phaser |
| 02/16/2005 | CN2679642Y Full automatic spherical interferometer |
| 02/16/2005 | CN1580727A Parallel interferometric measurements using an expanded local oscillator signal |
| 02/16/2005 | CN1580689A Anti-shock interference instrument |
| 02/15/2005 | US6856716 Optical interferometer generating a mode-locked laser oscillation, all-optical switch, all-optical asymmetric demultiplexer and all optical pulse reshaping apparatus |
| 02/15/2005 | US6856406 Ultra small spot generator |
| 02/15/2005 | US6856405 Non linear phase shift calibration for interferometric measurement of multiple surfaces |
| 02/15/2005 | US6856403 Optically stimulated electron emission contamination monitor and method |
| 02/15/2005 | US6856402 Interferometer with dynamic beam steering element |
| 02/15/2005 | US6856384 Optical metrology system with combined interferometer and ellipsometer |
| 02/10/2005 | WO2005012942A1 Speed measurement |
| 02/10/2005 | US20050030657 Method and apparatus for multiwavelength imaging spectrometer |
| 02/10/2005 | US20050030551 Analysis and monitoring of stresses in embedded lines and vias integrated on substrates |
| 02/10/2005 | US20050030550 Method and apparatus for self-calibration of a tunable-source phase shifting interferometer |
| 02/10/2005 | US20050030549 Spatial filtering in interferometry |
| 02/10/2005 | US20050030548 Interferometric optical apparatus and method for measurements |
| 02/10/2005 | US20050030545 Method and apparatus for compact Fabry-Perot imaging spectrometer |
| 02/10/2005 | US20050030544 Parallel interferometric measurements using an expanded local oscillator signal |
| 02/10/2005 | US20050030533 Method and apparatus for compact dispersive imaging spectrometer |
| 02/10/2005 | US20050030530 Method of calibration of magnification of microscopes having different operational principles for bringing them to a single, absolute scale |
| 02/10/2005 | CA2530703A1 Speed measurement |
| 02/09/2005 | EP1505376A1 Imaging an object with phase determination of a radiation wavefield |
| 02/09/2005 | EP1505365A2 Method and apparatus for self-calibration of a tunable-source phase shifting interferometer |
| 02/09/2005 | EP1505364A2 Apparatus and method for parallel interferometric measurement using an expanded local oscillator signal |
| 02/09/2005 | CN1576776A Interferometer with interference fringe scanning function |
| 02/08/2005 | US6853457 Optical amplification in coherence reflectometry |
| 02/03/2005 | WO2005010474A2 Method and apparatus for multiwavelength imaging spectrometer |
| 02/03/2005 | US20050024645 Method and apparatus for measurement of group delay |