Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
06/2005
06/21/2005US6909510 Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses
06/21/2005CA2217687C Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing
06/16/2005WO2005054780A1 Method and apparatus for three-dimensional spectrally encoded imaging
06/16/2005WO2005054778A1 Digital phase detector for periodically alternating signals
06/16/2005WO2005053906A1 Method of manufacturing mirrors from joined mirror blanks, x-y interferometer and method of inspecting wafers
06/16/2005WO2005022128A3 Device and method for the non-invasive detection and measurement of the properties of a medium
06/16/2005WO2004111575B1 Interferometric absolute and real-time surface curvature sensor insensitive to tilt, translation and vibration
06/16/2005US20050128594 Optical displacement sensor
06/16/2005US20050128589 Phase-compensated cube corner in laser interferometry
06/16/2005US20050128488 Method and apparatus for three-dimensional spectrally encoded imaging
06/16/2005US20050128487 Leaky guided wave modes used in interferometric confocal microscopy to measure properties of trenches
06/16/2005US20050128468 Eccentricity measuring method and eccentricity measuring apparatus
06/16/2005DE10351319A1 Interferometer for optical coherence tomography, e.g. for use with a medical scanning OCT-enabled endoscope, has a deflection mirror for beam deflection in the sample arm of the interferometer
06/16/2005CA2543581A1 Digital phase detector for periodically alternating signals
06/15/2005EP1540315A1 Optical waveguide interferometer comprising a laminate structure with a first planar waveguide monolayer and a second sandwich layer
06/15/2005EP1540271A1 Method for measuring contour variations
06/15/2005CN1206511C Interferometer and measurement method adotping said interferometer
06/14/2005US6906865 Light altering device
06/14/2005US6906864 Light altering device
06/14/2005US6906806 Method and apparatus for measuring motion
06/14/2005US6906784 Spatial filtering in interferometry
06/14/2005US6906303 Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
06/09/2005WO2005052507A1 Single-pole optical wavelength selector
06/09/2005WO2005052502A2 Pixelated phase-mask interferometer
06/09/2005WO2005051187A2 Rotated measuring device
06/09/2005WO2004093272A3 System and method for measuring physical, chemical and biological stimuli using vertical cavity surface emitting lasers with integrated tuner
06/09/2005WO2004086948A3 A confocal microscope system for real-time simultaneous temporal measurements of metachronal wave period and ciliary beat frequency
06/09/2005US20050122577 Confocal microscope and measuring method by this confocal microscope
06/09/2005US20050122527 Method and device for microscopicdisplay with local probes of a three-dimensional object
06/09/2005DE202005003933U1 Michelson interferometer has beam splitter comprising mirror image prisms bonded together with silvered and part silvered deflecting, input and output planes
06/09/2005DE10392396T5 Interferometer Interferometer
06/09/2005DE10349736A1 Feedback-Regelung eines Interferometers Feedback control of an interferometer
06/08/2005EP1537458A2 Rapid direct-to-digital holographic acquisition of object off-axis illuminated by several illumination sources
06/08/2005EP1537457A2 Direct-to-digital holographic acquisition of content-based off-axis illuminated object
06/08/2005EP1537456A2 Direct-to-digital off-axis holography with off-axis illuminated object
06/08/2005EP1537378A1 Method and system for size calibration
06/08/2005CN1624421A Depth of parallelism measuring method
06/07/2005US6903854 Optical coherence tomography apparatus, optical fiber lateral scanner and a method for studying biological tissues in vivo
06/07/2005US6903820 Measurements of substances using two different propagation modes of light through a common optical path
06/07/2005US6903819 Alignment method for optimizing extinction ratios of coated polarizing beam splitters
06/07/2005US6901673 Tie-in device for the correlation of coordinate systems
06/02/2005US20050117170 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method
06/02/2005US20050117169 Interferometric optical system
06/02/2005US20050117168 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method
06/02/2005US20050117167 Light interference measurement method using computer-generated hologram, and interferometer using this method
06/02/2005DE10348498A1 Shearing-speckle interferometry method in which an object surface is illuminated with coherent laser light and null, loaded and or time-averaged shearograms recorded prior to digital processing and subtraction
06/01/2005EP1536287A2 Measuring method and apparatus using a shearing interferometer, exposure method and apparatus using the same, and device manufacturing method
06/01/2005EP1535024A1 Phase measuring method and apparatus for multi-frequency interferometry
06/01/2005EP1535023A2 Intrinsic fabry-perot optical fiber sensors and their multiplexing
06/01/2005EP0943075B1 A system and method for performing selected optical measurements
06/01/2005CN1623085A Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
06/01/2005CN1621798A Eccentricity measuring method and eccentricity measuring apparatus
05/2005
05/31/2005US6900943 Optical amplification in coherent optical frequency modulated continuous wave reflectometry
05/31/2005US6900899 Interferometers with coated polarizing beam splitters that are rotated to optimize extinction ratios
05/31/2005US6900898 Temperature insensitive Mach-Zehnder interferometers and devices
05/31/2005US6900897 Apparatus and method for correcting errors generated by a laser with non-ideal tuning characteristics
05/31/2005US6900896 Method and system for measuring optical characteristics of a sub-component within a composite optical system
05/31/2005US6900895 Phase noise compensation in an interferometric system
05/26/2005WO2005047974A2 Measurement and compensation of errors in interferometers
05/26/2005WO2005047907A1 Optical flow monitor
05/26/2005WO2005047849A2 Methods and apparatus for the improved measurment of circular and linear dichroism and uses thereof
05/26/2005WO2004111661A3 System and method for low coherence broadband quadrature interferometry
05/26/2005WO2004072695A3 Transverse differential interferometric confocal microscopy
05/26/2005US20050113701 Rotating measuring device
05/26/2005US20050111606 Digital phase detector for periodically alternating signals
05/26/2005US20050111007 Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces
05/26/2005US20050111006 Apparatus and method for ellipsometric measurements with high spatial resolution
05/26/2005US20050111005 Lithographic interferometer system
05/26/2005US20050110971 Lithographic apparatus and device manufacturing method
05/25/2005EP1533686A2 Low power consumption, broad navigability optical mouse
05/25/2005EP1068491B1 Noise supression apparatus and method for time division multiplexed fiber optic sensor arrays
05/25/2005DE10349977A1 Interferometer set-up e.g. for operating an interferometer, has radiation reflector connected and along measuring section in measuring direction is adjustable linearly, for determining measuring distance
05/25/2005DE10341714A1 Interferometer sensor e.g. for quality control of prefabricated parts, sensor and electronics are integrated in sensor housing with optics having special arrangement of polarization-optical components and four image sensors
05/25/2005CN1203338C Fibre-optical differential interferometer
05/24/2005US6898017 Light altering device
05/24/2005US6898016 Light altering device
05/24/2005US6897962 Interferometer using beam re-tracing to eliminate beam walk-off
05/24/2005US6897961 Heterodyne lateral grating interferometric encoder
05/19/2005WO2005045529A2 Characterization and compensation of errors in multi-axis interferometry system
05/19/2005WO2005045403A1 Interferometric device
05/19/2005WO2005045361A2 Scanning interferometry for thin film thickness and surface measurements
05/19/2005WO2004111575A3 Interferometric absolute and real-time surface curvature sensor insensitive to tilt, translation and vibration
05/19/2005WO2004079294A3 Characterizing and profiling complex surface structures using scanning interferometry
05/19/2005WO2004074880A3 Longitudinal differential interferometric confocal microscopy
05/19/2005US20050107184 Multi-beam probe with adjustable beam angle
05/19/2005US20050105100 Optical position measuring system and method using a low coherence light source
05/19/2005US20050105099 Coherent photothermal interferometric spectroscopy system and method for chemical sensing
05/19/2005US20050105097 Systems and methods for phase measurements
05/18/2005CN1202402C Wide-band white light interferometer
05/12/2005WO2005043787A1 Components for optical qubits in the radio frequency basis
05/12/2005WO2005043075A1 Interferometer
05/12/2005WO2005043073A2 Reconfigureable interferometer system
05/12/2005WO2004074881A3 Method and apparatus for dark field interferometric confocal microscopy
05/12/2005US20050099635 Exposure apparatus with interferometer
05/12/2005US20050099634 System and method to reduce laser noise for improved interferometric laser ultrasound detection
05/12/2005US20050099633 Fiber optic scanning interferometer using a polarization splitting coupler
05/12/2005DE19746535B4 Justiervorrichtung für ein Interferometer Adjusting device for an interferometer
05/11/2005EP1530032A2 System and method for reducing the laser noise in interferometric laser ultrasound detection
05/10/2005US6891624 Cyclic error reduction in average interferometric position measurements
05/10/2005US6891149 Optical phase detector
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