| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 11/24/2005 | US20050259769 Quadrature phase shift interferometer (QPSI) decoder and method of decoding |
| 11/24/2005 | US20050259270 Fiberoptic fabry-perot optical processor |
| 11/24/2005 | US20050259269 Shearing interferometer with dynamic pupil fill |
| 11/24/2005 | US20050259268 Heterodyne laser interferometer for measuring wafer stage translation |
| 11/24/2005 | US20050259265 Methods and systems for determining optical properties using low-coherence interference signals |
| 11/24/2005 | DE10341585B4 Verfahren und Vorrichtung zur Belastungsprüfung an einer Stützkonstruktion eines Behälters Method and apparatus for load test of a supporting structure of a container |
| 11/24/2005 | DE102004020059A1 Measuring device, for discontinuous absolute measurement of displacements, has fiber interferometer and determines displacement based on measured reflected light |
| 11/23/2005 | EP1598648A2 Shearing interferometer with dynamic pupil fill |
| 11/23/2005 | EP1598647A1 Interferometer and fourier transform spectrometer |
| 11/23/2005 | EP1598635A1 Interferometric signal conditioner for measurement of displacements of a Fabry-Pérot interferometer |
| 11/23/2005 | EP1597591A1 Gas velocity sensor |
| 11/23/2005 | EP1597536A2 Interferometric measuring device |
| 11/23/2005 | EP1021699B1 Determining the location of a separation in a deformable structure ( tyre ) |
| 11/23/2005 | CN1700099A Shearing interferometer with dynamic pupil fill |
| 11/23/2005 | CN1699914A Heterodyne laser interferometer for measuring wafer stage translation |
| 11/22/2005 | US6968038 Apparatus and method for generating high-order harmonic X-ray, and point-diffraction interferometer using high-order harmonic X-ray |
| 11/22/2005 | US6967723 Interferometric measuring device |
| 11/17/2005 | WO2005108915A1 Device and method for a combined interferometry and image-based determination of geometry, especially for use in microsystems technology |
| 11/17/2005 | WO2005108914A2 Apparatus and methods for measurement of critical dimensions of features and detection of defects in uv, vuv, and euv lithography masks |
| 11/17/2005 | WO2005108913A1 Polarising interferometer with removal or separation of error beam caused by leakage of polarised light |
| 11/17/2005 | WO2005047849A3 Methods and apparatus for the improved measurment of circular and linear dichroism and uses thereof |
| 11/17/2005 | WO2004068554A8 Analysis and monitoring of stresses in embedded lines and vias integrated on substrates |
| 11/17/2005 | WO2004003464A3 Frequency-scanning interferometer with non-specular reference surface |
| 11/17/2005 | US20050254063 Apparatus and method for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks |
| 11/17/2005 | US20050254061 Low coherence interferometry for detecting and characterizing plaques |
| 11/17/2005 | US20050254060 Low coherence interferometry for detecting and characterizing plaques |
| 11/17/2005 | US20050254059 Low coherence interferometric system for optical metrology |
| 11/17/2005 | US20050254058 Low coherence interferometry utilizing magnitude |
| 11/17/2005 | US20050254057 Low coherence interferometry utilizing phase |
| 11/17/2005 | US20050254041 Tilted edge for optical-transfer-function measurement |
| 11/17/2005 | US20050254040 Apparatus and process for the determination of static lens field curvature |
| 11/17/2005 | DE10252314B4 Detektorsystem, Interferenz-Meßsystem und optisches Meßverfahren Detector system, interference measurement system and optical measurement technique |
| 11/16/2005 | EP1595108A2 Longitudinal differential interferometric confocal microscopy |
| 11/16/2005 | EP1595107A2 Method and apparatus for dark field interferometric confocal microscopy |
| 11/16/2005 | EP1595106A2 Transverse differential interferometric confocal microscopy |
| 11/16/2005 | EP1509747A4 Metrology system for precision 3d motion |
| 11/16/2005 | EP1350081B1 Fiber optic displacement sensor |
| 11/16/2005 | CN2740998Y Laser detector by workpiece projecting size |
| 11/16/2005 | CN1227618C Optical input device for measuring finger movement |
| 11/16/2005 | CN1227617C Method and apparatus for measuring movement of input device |
| 11/16/2005 | CN1227520C Long-distance scattered micro vibrating signal measurement and fidelity pickup interferometer |
| 11/15/2005 | US6965436 System and method for calibrating a spatial light modulator array using shearing interferometry |
| 11/15/2005 | US6965435 Interferometer system for measuring surface shape |
| 11/15/2005 | CA2367785C Monolithic optical assembly |
| 11/10/2005 | WO2005106635A1 An optical input device and method of measuring relative movement of an object and an optical input device |
| 11/10/2005 | WO2005106634A1 Relative movement sensor |
| 11/10/2005 | WO2005106593A2 Method and apparatus for measurement of exit pupil transmittance |
| 11/10/2005 | WO2005106386A2 Vibration resistant interferometry |
| 11/10/2005 | WO2005106383A2 Interferometry systems and methods of using interferometry systems |
| 11/10/2005 | WO2005106382A2 Optical transducer for detecting liquid level and electronic circuit therefor |
| 11/10/2005 | WO2004068065A3 Leaky guided-wave modes used in interferometric confocal microscopy to measure properties of trenches |
| 11/10/2005 | US20050249107 Multi-layer Optical Disc And System |
| 11/10/2005 | US20050248773 Beam profile complex reflectance system and method for thin film and critical dimension measurements |
| 11/10/2005 | US20050248772 Interferometry systems and methods of using interferometry systems |
| 11/10/2005 | US20050248771 Lithographic interferometer system |
| 11/10/2005 | US20050248770 Interferometric apparatus and method for surface profile detection |
| 11/10/2005 | DE102004033187B3 Interferometrische Vorrichtung The interferometric device |
| 11/08/2005 | US6963408 Method and apparatus for point diffraction interferometry |
| 11/08/2005 | US6963407 Process end point detection apparatus and method, polishing apparatus, semiconductor device manufacturing method, and recording medium recorded with signal processing program |
| 11/08/2005 | US6963406 Fused off-axis object illumination direct-to-digital holography with a plurality of illumination sources |
| 11/08/2005 | US6963405 Laser counter-measure using fourier transform imaging spectrometers |
| 11/08/2005 | CA2240727C Sensing method and apparatus |
| 11/03/2005 | WO2005104311A2 Duv light source optical element improvements |
| 11/03/2005 | WO2005103790A1 Dual technology (confocal and intererometric) optical profilometer for the inspection and three-dimensional measurement of surfaces |
| 11/03/2005 | US20050244096 Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a fabry-perot interferometer |
| 11/03/2005 | US20050243327 Compact Optical Apparatus |
| 11/03/2005 | US20050243326 Imaginary polarizing measuring method for simultaneously measuring the optical crystal thickness and the optic axis direction |
| 11/03/2005 | US20050243324 Entangled photon spectroscopy for stand-off detection and characterization |
| 11/03/2005 | US20050243323 Method and apparatus for automatic registration and visualization of occluded targets using ladar data |
| 11/02/2005 | EP1591751A2 Method and apparatus for measuring micro-structure, and micro-structure analytical system |
| 11/02/2005 | EP1590696A2 Full-filled optical measurements of surface properties of panels, substrates and wafers |
| 11/02/2005 | EP1590626A2 Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
| 11/02/2005 | EP1590625A2 Interferometer |
| 11/02/2005 | EP1590624A1 Interferometer alignment |
| 11/02/2005 | CN1692269A Fringe pattern discriminator for grazing incidence interferometer |
| 11/02/2005 | CN1692268A Interferometry method based on changing frequency |
| 11/01/2005 | US6961132 Interference system and semiconductor exposure apparatus having the same |
| 11/01/2005 | US6961130 Heterodyne beam delivery with active control of two orthogonal polarizations |
| 11/01/2005 | US6961129 Active control of two orthogonal polarizations for heterodyne interferometry |
| 11/01/2005 | US6961116 Alignment system uses a self-referencing interferometer that produces two overlapping and relatively rotated images of an alignment markers. |
| 10/27/2005 | WO2005082046A3 Method of full-color optical coherence tomography |
| 10/27/2005 | WO2005079657A3 Device and method for compensation of corneal birefringence of the eye |
| 10/27/2005 | US20050237538 Optical mems cavity having a wide scanning range for measuring a sensing interferometer |
| 10/27/2005 | US20050237537 Determination of thin film topograhpy |
| 10/27/2005 | US20050237536 Interferometry systems and methods of using interferometry systems |
| 10/27/2005 | US20050237535 Vibration resistant interferometry |
| 10/27/2005 | US20050237534 Vibration resistant interferometry |
| 10/27/2005 | US20050237533 Multi-beam heterodyne laser doppler vibrometer |
| 10/27/2005 | US20050237512 Method and apparatus for measurement of exit pupil transmittance |
| 10/27/2005 | US20050237068 Sensor cable having easily changeable entire length and allowing accurate and high speed signal transmission even when entire length is made longer, and amplifier-separated type sensor with the cable |
| 10/27/2005 | US20050236592 Optical transducer for detecting liquid level and electrical circuit therefor |
| 10/27/2005 | US20050236591 Optical transducer for detecting liquid level |
| 10/27/2005 | DE10297689T5 Verfahren und Gerät zur Bestimmung von atherosklerotischem Belag durch Messung von optischen Gewebeeigenschaften Method and apparatus for determination of atherosclerotic plaque by measurement of tissue optical properties |
| 10/26/2005 | EP1588254A2 Analysis and monitoring of stresses in embedded lines and vias integrated on substrates |
| 10/26/2005 | EP1588203A2 Interferometer having a scanning mirror |
| 10/26/2005 | EP1588199A2 Scannable mirror arrangement for an interferometer |
| 10/26/2005 | EP1588122A1 Single point laser measurement reference |
| 10/26/2005 | EP1588120A2 Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
| 10/26/2005 | EP1588119A2 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
| 10/26/2005 | CN1688945A Content-based fused off-axis illumination direct-to-digital holography |