| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 06/17/2004 | US20040114147 Electronic image registration based on chrominance channel |
| 06/16/2004 | EP0932814B1 An optical wavelength scanner employing a reference system |
| 06/16/2004 | CN1504787A Cramping arrangement for casing and micro interferometer equipped with the same |
| 06/16/2004 | CN1504722A Vertical heavy caliber aspherical mirror tester |
| 06/16/2004 | CN1504719A Position bar for measuring light guide plate nod and measuring method thereof |
| 06/15/2004 | US6750972 Gas discharge ultraviolet wavemeter with enhanced illumination |
| 06/10/2004 | WO2004048886A1 A surface profiling apparatus |
| 06/10/2004 | WO2004038325A3 Systems and methods that detect changes in incident optical radiation |
| 06/10/2004 | WO2004023171A3 Intrinsic fabry-perot optical fiber sensors and their multiplexing |
| 06/10/2004 | WO2004001330A3 Multi-stage data processing for frequency-scanning interferometer |
| 06/10/2004 | US20040110006 Measurement water absorption; classification; mixing polymers |
| 06/10/2004 | US20040109168 Interferometer |
| 06/10/2004 | US20040109167 Etalon testing system and process |
| 06/10/2004 | US20040109164 Rapid depth scanning optical imaging device |
| 06/09/2004 | EP1426730A2 Device for measuring the relative position of objects emitting electromagnetic radiation |
| 06/09/2004 | EP1426402A2 Process for continuous production of water-absorbent resin product |
| 06/09/2004 | EP1147398B1 Optical coherence microscope and method for rapid 3d-in-vivo visualization of biological functions |
| 06/09/2004 | DE10246798B3 Interferometric measuring device for surface examination with setting device for determining optical path difference between 2 partial beams in modulation interferometer |
| 06/09/2004 | CN1503059A Lithographic apparatus and device manufacturing method |
| 06/08/2004 | US6748127 Transmission of orthogonal circular polarizations on a fiber |
| 06/08/2004 | US6747784 Compliant mechanism and method of forming same |
| 06/08/2004 | US6747775 Detunable Fabry-Perot interferometer and an add/drop multiplexer using the same |
| 06/08/2004 | US6747771 Off-axis illumination direct-to-digital holography |
| 06/08/2004 | US6747744 Interferometric servo control system for stage metrology |
| 06/03/2004 | WO2004046641A1 Method for calibrating an interferometer, method for qualifying an object, and method for producing an object |
| 06/03/2004 | WO2004031816A3 Laser system |
| 06/03/2004 | WO2004001427A3 Common-path frequency-scanning interferometer |
| 06/03/2004 | WO2003069264A3 Characterization and compensation of non-cyclic errors in interferometry systems |
| 06/03/2004 | WO2003012367A9 Passive zero shear interferometers |
| 06/03/2004 | US20040105100 Apparatus and methods for surface contour measurements |
| 06/03/2004 | DE10252314A1 Interferometric measurement system for detecting spatial inhomogeneities in a sample is configured to permit use with different optical path lengths without mechanical adjustment |
| 06/03/2004 | DE10223581B4 System zur interferometrischen Prüfung gekrümmter Oberflächen System for interferometric testing of curved surfaces |
| 06/02/2004 | EP1424597A2 Lithographic apparatus and device manufacturing method |
| 06/02/2004 | EP1424546A2 Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements |
| 06/02/2004 | EP1423987A2 Amplified tree structure technology for fiber optic sensor arrays |
| 06/02/2004 | EP1423986A2 Apparauts and method for processing optical signals from two delay coils to increase the dynamic range of a sagnac-based fiber optic sensor array |
| 06/02/2004 | CN1152231C Full-fiber nanometer-precision microdisplacement and microvibration interference measuring instrument |
| 06/01/2004 | US6744555 Ultrashort-pulse source with controllable wavelength output |
| 06/01/2004 | US6744524 Method and apparatus for calibrating a fabry-perot interferometer based measurement system |
| 06/01/2004 | US6744523 Imaging optical system for oblique incidence interferometer |
| 06/01/2004 | US6744517 Combining interference fringe patterns to a moire fringe pattern |
| 05/27/2004 | WO2000066969A3 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance |
| 05/27/2004 | US20040101255 Method and apparatus for analyzing the end face of a multifiber ferrule |
| 05/27/2004 | US20040100637 Quantum optical coherence tomography data collection apparatus and method for processing therefor |
| 05/27/2004 | DE10351142A1 Interferometric measurement of thermally induced surface defects in optical components, by use of an interferometer with Fizeau and Twyman-Green arms the signals of which are superimposed to form a measurement signal |
| 05/27/2004 | DE10204133B4 Interferometrisches Messverfahren und Vorrichtung Interferometric measurement method and apparatus |
| 05/27/2004 | CA2450973A1 A method for tracking particles and life forms in three dimensions and in time |
| 05/26/2004 | EP1422648A2 Sample picture data processing method and sample inspection system and sample inspection method |
| 05/26/2004 | CN1500199A Illumination device and method for illuminating object |
| 05/26/2004 | CN1499495A Method and device for storing and searching digital page data sequency |
| 05/26/2004 | CN1499185A Optical characteristic measurer and optical displacement gage |
| 05/26/2004 | CN1151397C Internally focusing telescope for regulating raster resonator of infrared laser device |
| 05/26/2004 | CN1151396C Objective table of microscope |
| 05/25/2004 | US6741361 Multi-stage data processing for frequency-scanning interferometer |
| 05/25/2004 | US6741359 Optical coherence tomography optical scanner |
| 05/25/2004 | US6741358 Exposure apparatus and device production method in which position of reference plate provided on substrate stage is measured |
| 05/25/2004 | US6741357 Quadrature phase shift interferometer with unwrapping of phase |
| 05/25/2004 | US6741356 Method for detecting physical amount of object and optical apparatus using the same |
| 05/25/2004 | US6741355 Short coherence fiber probe interferometric measuring device |
| 05/21/2004 | WO2004042319A2 Compensation of refractivity perturbations in an intererometer path |
| 05/20/2004 | US20040095580 Fourier transform spectrometry with a multi-aperture interferometer |
| 05/19/2004 | EP1419362A1 In-situ mirror characterization |
| 05/19/2004 | EP1419361A1 Dynamic interferometric controlling direction of input beam |
| 05/19/2004 | EP1419360A1 Tilted interferometer |
| 05/19/2004 | EP1330628B1 Method for correcting physical errors in measuring microscopic objects |
| 05/19/2004 | DE10244554A1 Verfahren und Vorrichtung zur Messung der Wanddicke eines Rohres in einem Rohrwalzwerk Method and device for measuring the wall thickness of a tube in a tube rolling mill |
| 05/19/2004 | CN1498342A Angle-of-rotation measuring device and angle-of-rotation measuring method |
| 05/19/2004 | CN1498340A Variable filter-based optical spectrometer |
| 05/19/2004 | CN1497238A Improved interferometer using integrated image array and high density polarimeter and/or phase shift array |
| 05/19/2004 | CN1496766A Method and device for measuring wall thickness of pipe in pipe mill |
| 05/18/2004 | US6738511 Reduced noise sensitivity method and apparatus for converting an interferogram phase map to a surface profile map |
| 05/18/2004 | US6738144 Non-invasive method and low-coherence apparatus system analysis and process control |
| 05/18/2004 | US6738143 System and method for interferometer non-linearity compensation |
| 05/18/2004 | US6736518 Cube-corner reflector permitting tight beam spacing and minimal wavefront distortion in a multi-axis interferometer |
| 05/18/2004 | US6736508 Tracking assisted optical procedure |
| 05/13/2004 | US20040090636 Position measuring arrangement |
| 05/13/2004 | US20040090635 Measuring device for detecting the dimensions of test samples |
| 05/13/2004 | US20040090634 System and method for inspection using white light intererometry |
| 05/13/2004 | US20040090633 Low-coherence interferometric device for depth scanning an object |
| 05/13/2004 | US20040089804 Control system and apparatus for use with laser excitation or ionization |
| 05/13/2004 | DE19504444B4 Interferometeranordnung mit verstellbarer optischer Weglängendifferenz Interferometer optical path length with adjustable |
| 05/12/2004 | EP1417478A2 Chemical micro-sensor |
| 05/12/2004 | EP1417451A1 Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping |
| 05/12/2004 | EP1417449A1 Optical pulse measurement |
| 05/12/2004 | EP1417448A1 Scanning interferometry with reference signal |
| 05/12/2004 | CN2615639Y Cutting-tool angle measuring microscope |
| 05/12/2004 | CN1149387C Structure of double wavelength heterodyne interferometer for compensating air disturbance |
| 05/11/2004 | US6735463 Doppler flow imaging using optical coherence tomography |
| 05/11/2004 | US6734979 Rapid in situ mastering of an aspheric Fizeau with residual error compensation |
| 05/11/2004 | CA2185006C Interferometer and fourier transform spectrometer |
| 05/06/2004 | WO2004038359A1 Load dependent analyzing optical components |
| 05/06/2004 | WO2004038325A2 Systems and methods that detect changes in incident optical radiation |
| 05/06/2004 | WO2004038322A2 Two-wavelength confocal interferometer for measuring multiple surfaces |
| 05/06/2004 | WO2003102495A3 Metrology system for precision 3d motion |
| 05/06/2004 | US20040086228 Fiber optic fabry-perot interferometer and associated methods |
| 05/06/2004 | US20040085600 Method and apparatus for storing and retrieving a sequence of digital paga data |
| 05/06/2004 | US20040085548 Interference system and semiconductor exposure apparatus having the same |
| 05/06/2004 | US20040085546 Measurement and compensation of errors in interferometers |
| 05/06/2004 | US20040085545 Cyclic error compensation in interferometry systems |
| 05/06/2004 | US20040085544 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |