Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
08/2004
08/10/2004US6775006 Height scanning interferometry method and apparatus including phase gap analysis
08/05/2004WO2004066036A2 Reduction of reference hologram noise and fourier space smearing in direct-to-digital holography
08/05/2004WO2004066017A2 Method and device for testing sunglasses
08/05/2004WO2004065901A1 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques
08/05/2004WO2004065898A1 Interferometer alignment
08/05/2004WO2004065897A2 Interferometric measuring device
08/05/2004WO2004065894A2 Optical path difference scanning interferometer
08/05/2004US20040151436 Scannable mirror arrangement for an interferometer
08/05/2004US20040150834 Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses
08/05/2004US20040150833 Interferometric plural-dimensional displacement measuring system
08/05/2004US20040150832 Method and apparatus for measuring motion
08/05/2004US20040150831 Compact multi-axis interferometer
08/05/2004US20040150830 Interferometer having a scanning mirror
08/05/2004US20040150829 Interferometric arrangement for determining the transit time of light in a sample
08/05/2004DE10301607A1 Measurement of the relative positions of at least two surfaces, e.g. for use in the manufacture of semi-finished goods, whereby an optical interference measurement probe is used that generates at least two measurement beams
08/04/2004EP1443304A2 Interferometric plural-dimensional displacement measuring system
08/04/2004EP1442269A1 Position measuring device
08/04/2004CN1517672A Interferometer equipment and method for low coherence measurement and high coherence measurement
08/03/2004US6772084 Overlay measurements using periodic gratings
08/03/2004US6771375 Apparatus and method for measuring aspherical optical surfaces and wavefronts
07/2004
07/29/2004WO2004034524A3 Laser system using ultrashort laser pulses
07/29/2004US20040145804 Microscope lens and the use of a microscope lens of this type in a microscope
07/29/2004US20040145752 Grating sensor
07/29/2004US20040145751 Square wafer chuck with mirror
07/29/2004US20040145746 System and method for determining coordinates on three-dimensional space using beam phase interference
07/29/2004US20040145745 Direct-to-digital holography reduction of reference hologram noise and fourier space smearing
07/29/2004US20040145729 Method and device for testing sunglasses
07/29/2004DE10326580A1 Interferometer for surface profiling of objects has an adaptive optical element to permit depth scanning of an object without the object having to be displaced relative to an imaging device
07/28/2004EP1441215A1 Optical scanning type observation device
07/27/2004US6768554 Fringe analysis method using fourier transform
07/27/2004US6768553 Continuous-zoom imaging device of interferometer
07/27/2004US6768552 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them
07/22/2004WO2004061518A1 Adaptive optical system with self-referencing contrast control
07/22/2004WO2004023171A8 Intrinsic fabry-perot optical fiber sensors and their multiplexing
07/22/2004US20040141186 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques
07/22/2004US20040141185 Compensation of refractivity perturbations in an interferometer path
07/22/2004US20040141184 Interferometer apparatus for both low and high coherence measurement and method thereof
07/22/2004US20040141180 Autocorrelator based on triangle delay line and grating delay line
07/21/2004CN1514202A High definition projector device
07/20/2004US6765683 Interferometer system and method of manufacturing projection optical system using same
07/20/2004US6765679 Multi-cavity interferometer with dispersion compensating resonators
07/20/2004US6765677 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects
07/20/2004CA2289598C Grating based phase control optical delay line
07/15/2004WO2004059244A1 High-powered microscope observation device
07/15/2004WO2004027686A3 Non-destructive optical imaging system for enhanced lateral resolution
07/15/2004WO2004011963A3 Fourier transform spectrometry with a multi-aperture interferometer
07/15/2004WO2003062739A3 Method and apparatus for compensation of time-varying optical properties of gas in interferometry
07/15/2004US20040136190 Illumination device and method for illuminating an object
07/15/2004US20040136008 Optical characteristic measurement device and optical type displacement meter
07/15/2004US20040136006 Interferometer alignment
07/15/2004US20040135980 In-process correction of stage mirror deformations during a photolithography exposure cycle
07/15/2004DE10260256A1 Interferometersystem und Meß-/Bearbeitungswerkzeug Interferometer and measuring / cutting tool
07/14/2004EP1436570A1 Measurement of complex surface shapes using a spherical wavefront
07/14/2004EP1435835A1 Systems and methods for processing signals from an interferometer by an ultrasound console
07/14/2004EP1224434B1 Interferometric measuring device for form measurement
07/13/2004US6762845 Multiple-pass interferometry
07/13/2004US6762843 Modular interferometric recombination device and a beam splitter for use in it
07/13/2004US6762839 System and method for performing selected optical measurements utilizing a position changeable aperture
07/08/2004WO2004057267A1 System and method for inspection using white light interferometry
07/08/2004WO2004057266A2 Interferometer system and measuring device
07/08/2004US20040130762 Optical acquisition systems for direct-to-digital holography and holovision
07/08/2004US20040130728 Highly-sensitive displacement-measuring optical device
07/07/2004CN1510390A Laser interfere length measuring system with real time compensation for Abbe error
07/07/2004CN1156683C Surface plasma wave microscope with phase shift interference
07/06/2004US6760114 Support apparatus for optical wave interferometer reference plate
07/06/2004US6759671 Method of measuring the movement of a material sheet and optical sensor for performing the method
07/01/2004WO2004055570A2 Coherence microscope
07/01/2004WO2004055473A1 Method and arrangement for optical coherence tomography
07/01/2004WO2004036164A3 System and a method of measuring an optical path difference in a sensing interferometer
07/01/2004US20040126048 Fiber-based optical low coherence tomography
07/01/2004US20040125380 Adaptive optical system with self-referencing contrast control
07/01/2004US20040125379 Interferometric measuring method and device
07/01/2004DE10260887A1 Kohärenzmikroskop Coherence microscope
06/2004
06/30/2004EP1432960A2 Optical amplification in coherence reflectometry
06/30/2004CN2622670Y Globoid interfrometer
06/30/2004CN2622669Y Semiconductor pump whole laser and multifunctional electronic speckle interferometer
06/30/2004CN1155796C 2D concentric lens rotator for optical measurement
06/29/2004US6757067 Fringe pattern discriminator for grazing incidence interferometer
06/29/2004US6757066 Multiple degree of freedom interferometer
06/29/2004US6755075 Ultra micro indentation testing apparatus
06/29/2004CA2233305C Integrated optic interferometric sensor
06/24/2004WO2004053425A1 In-process correction of stage mirror deformations during a photolithography exposure cycle
06/24/2004WO2004032810A3 Method and system for determining the position and alignment of a surface of an object in relation to a laser beam
06/24/2004WO2004003463A3 Interferometer system of compact configuration
06/24/2004WO2002073122A9 Cyclic error reduction in average interferometric position measurements
06/24/2004US20040119984 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method
06/24/2004US20040119983 High accuracy laser fine autofocus system
06/24/2004US20040119982 Angle-of-rotation measuring device and angle-of-rotation measuring method
06/23/2004CN1506393A Process for continuous producing water absorption resin products
06/22/2004US6753969 Microinterferometer for measuring distance with improved sensitivity
06/22/2004US6753968 Optical storage system based on scanning interferometric near-field confocal microscopy
06/22/2004US6753690 Interferometric signal processing apparatus
06/17/2004WO2004051183A1 Interferometric system with reduced vibration sensitivity and related method
06/17/2004WO2004051182A1 Simultaneous phase shifting module for use in interferometry
06/17/2004WO2004029543A3 Interferometric measuring device
06/17/2004WO2003107494A3 Gas discharge ultraviolet wavemeter with enhanced illumination
06/17/2004WO2003106919A3 Interferometry systems involving a dynamic beam-steering assembly
06/17/2004US20040114848 Intrinsic Fabry-Perot optical fiber sensors and their multiplexing
06/17/2004US20040114152 Interferometry systems involving a dynamic beam-steering assembly
06/17/2004US20040114151 High-speed optical delay generating method by rotation reflector in optical coherence tomography and optical coherence tomography device