Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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08/10/2004 | US6775006 Height scanning interferometry method and apparatus including phase gap analysis |
08/05/2004 | WO2004066036A2 Reduction of reference hologram noise and fourier space smearing in direct-to-digital holography |
08/05/2004 | WO2004066017A2 Method and device for testing sunglasses |
08/05/2004 | WO2004065901A1 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
08/05/2004 | WO2004065898A1 Interferometer alignment |
08/05/2004 | WO2004065897A2 Interferometric measuring device |
08/05/2004 | WO2004065894A2 Optical path difference scanning interferometer |
08/05/2004 | US20040151436 Scannable mirror arrangement for an interferometer |
08/05/2004 | US20040150834 Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses |
08/05/2004 | US20040150833 Interferometric plural-dimensional displacement measuring system |
08/05/2004 | US20040150832 Method and apparatus for measuring motion |
08/05/2004 | US20040150831 Compact multi-axis interferometer |
08/05/2004 | US20040150830 Interferometer having a scanning mirror |
08/05/2004 | US20040150829 Interferometric arrangement for determining the transit time of light in a sample |
08/05/2004 | DE10301607A1 Measurement of the relative positions of at least two surfaces, e.g. for use in the manufacture of semi-finished goods, whereby an optical interference measurement probe is used that generates at least two measurement beams |
08/04/2004 | EP1443304A2 Interferometric plural-dimensional displacement measuring system |
08/04/2004 | EP1442269A1 Position measuring device |
08/04/2004 | CN1517672A Interferometer equipment and method for low coherence measurement and high coherence measurement |
08/03/2004 | US6772084 Overlay measurements using periodic gratings |
08/03/2004 | US6771375 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
07/29/2004 | WO2004034524A3 Laser system using ultrashort laser pulses |
07/29/2004 | US20040145804 Microscope lens and the use of a microscope lens of this type in a microscope |
07/29/2004 | US20040145752 Grating sensor |
07/29/2004 | US20040145751 Square wafer chuck with mirror |
07/29/2004 | US20040145746 System and method for determining coordinates on three-dimensional space using beam phase interference |
07/29/2004 | US20040145745 Direct-to-digital holography reduction of reference hologram noise and fourier space smearing |
07/29/2004 | US20040145729 Method and device for testing sunglasses |
07/29/2004 | DE10326580A1 Interferometer for surface profiling of objects has an adaptive optical element to permit depth scanning of an object without the object having to be displaced relative to an imaging device |
07/28/2004 | EP1441215A1 Optical scanning type observation device |
07/27/2004 | US6768554 Fringe analysis method using fourier transform |
07/27/2004 | US6768553 Continuous-zoom imaging device of interferometer |
07/27/2004 | US6768552 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
07/22/2004 | WO2004061518A1 Adaptive optical system with self-referencing contrast control |
07/22/2004 | WO2004023171A8 Intrinsic fabry-perot optical fiber sensors and their multiplexing |
07/22/2004 | US20040141186 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
07/22/2004 | US20040141185 Compensation of refractivity perturbations in an interferometer path |
07/22/2004 | US20040141184 Interferometer apparatus for both low and high coherence measurement and method thereof |
07/22/2004 | US20040141180 Autocorrelator based on triangle delay line and grating delay line |
07/21/2004 | CN1514202A High definition projector device |
07/20/2004 | US6765683 Interferometer system and method of manufacturing projection optical system using same |
07/20/2004 | US6765679 Multi-cavity interferometer with dispersion compensating resonators |
07/20/2004 | US6765677 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
07/20/2004 | CA2289598C Grating based phase control optical delay line |
07/15/2004 | WO2004059244A1 High-powered microscope observation device |
07/15/2004 | WO2004027686A3 Non-destructive optical imaging system for enhanced lateral resolution |
07/15/2004 | WO2004011963A3 Fourier transform spectrometry with a multi-aperture interferometer |
07/15/2004 | WO2003062739A3 Method and apparatus for compensation of time-varying optical properties of gas in interferometry |
07/15/2004 | US20040136190 Illumination device and method for illuminating an object |
07/15/2004 | US20040136008 Optical characteristic measurement device and optical type displacement meter |
07/15/2004 | US20040136006 Interferometer alignment |
07/15/2004 | US20040135980 In-process correction of stage mirror deformations during a photolithography exposure cycle |
07/15/2004 | DE10260256A1 Interferometersystem und Meß-/Bearbeitungswerkzeug Interferometer and measuring / cutting tool |
07/14/2004 | EP1436570A1 Measurement of complex surface shapes using a spherical wavefront |
07/14/2004 | EP1435835A1 Systems and methods for processing signals from an interferometer by an ultrasound console |
07/14/2004 | EP1224434B1 Interferometric measuring device for form measurement |
07/13/2004 | US6762845 Multiple-pass interferometry |
07/13/2004 | US6762843 Modular interferometric recombination device and a beam splitter for use in it |
07/13/2004 | US6762839 System and method for performing selected optical measurements utilizing a position changeable aperture |
07/08/2004 | WO2004057267A1 System and method for inspection using white light interferometry |
07/08/2004 | WO2004057266A2 Interferometer system and measuring device |
07/08/2004 | US20040130762 Optical acquisition systems for direct-to-digital holography and holovision |
07/08/2004 | US20040130728 Highly-sensitive displacement-measuring optical device |
07/07/2004 | CN1510390A Laser interfere length measuring system with real time compensation for Abbe error |
07/07/2004 | CN1156683C Surface plasma wave microscope with phase shift interference |
07/06/2004 | US6760114 Support apparatus for optical wave interferometer reference plate |
07/06/2004 | US6759671 Method of measuring the movement of a material sheet and optical sensor for performing the method |
07/01/2004 | WO2004055570A2 Coherence microscope |
07/01/2004 | WO2004055473A1 Method and arrangement for optical coherence tomography |
07/01/2004 | WO2004036164A3 System and a method of measuring an optical path difference in a sensing interferometer |
07/01/2004 | US20040126048 Fiber-based optical low coherence tomography |
07/01/2004 | US20040125380 Adaptive optical system with self-referencing contrast control |
07/01/2004 | US20040125379 Interferometric measuring method and device |
07/01/2004 | DE10260887A1 Kohärenzmikroskop Coherence microscope |
06/30/2004 | EP1432960A2 Optical amplification in coherence reflectometry |
06/30/2004 | CN2622670Y Globoid interfrometer |
06/30/2004 | CN2622669Y Semiconductor pump whole laser and multifunctional electronic speckle interferometer |
06/30/2004 | CN1155796C 2D concentric lens rotator for optical measurement |
06/29/2004 | US6757067 Fringe pattern discriminator for grazing incidence interferometer |
06/29/2004 | US6757066 Multiple degree of freedom interferometer |
06/29/2004 | US6755075 Ultra micro indentation testing apparatus |
06/29/2004 | CA2233305C Integrated optic interferometric sensor |
06/24/2004 | WO2004053425A1 In-process correction of stage mirror deformations during a photolithography exposure cycle |
06/24/2004 | WO2004032810A3 Method and system for determining the position and alignment of a surface of an object in relation to a laser beam |
06/24/2004 | WO2004003463A3 Interferometer system of compact configuration |
06/24/2004 | WO2002073122A9 Cyclic error reduction in average interferometric position measurements |
06/24/2004 | US20040119984 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
06/24/2004 | US20040119983 High accuracy laser fine autofocus system |
06/24/2004 | US20040119982 Angle-of-rotation measuring device and angle-of-rotation measuring method |
06/23/2004 | CN1506393A Process for continuous producing water absorption resin products |
06/22/2004 | US6753969 Microinterferometer for measuring distance with improved sensitivity |
06/22/2004 | US6753968 Optical storage system based on scanning interferometric near-field confocal microscopy |
06/22/2004 | US6753690 Interferometric signal processing apparatus |
06/17/2004 | WO2004051183A1 Interferometric system with reduced vibration sensitivity and related method |
06/17/2004 | WO2004051182A1 Simultaneous phase shifting module for use in interferometry |
06/17/2004 | WO2004029543A3 Interferometric measuring device |
06/17/2004 | WO2003107494A3 Gas discharge ultraviolet wavemeter with enhanced illumination |
06/17/2004 | WO2003106919A3 Interferometry systems involving a dynamic beam-steering assembly |
06/17/2004 | US20040114848 Intrinsic Fabry-Perot optical fiber sensors and their multiplexing |
06/17/2004 | US20040114152 Interferometry systems involving a dynamic beam-steering assembly |
06/17/2004 | US20040114151 High-speed optical delay generating method by rotation reflector in optical coherence tomography and optical coherence tomography device |