| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
|---|
| 09/21/2005 | CN1670468A Dual wavelength two-dimensional space phase shifting electronic speckle interferometer |
| 09/21/2005 | CN1220030C Method for analyzing low-coherence fringe |
| 09/20/2005 | US6947621 Robust heterodyne interferometer optical gauge |
| 09/20/2005 | US6947148 Interferometric apparatus and method with phase shift compensation |
| 09/15/2005 | WO2005085896A1 Passive positioning sensors |
| 09/15/2005 | WO2005085754A1 Interferometric measuring arrangement |
| 09/15/2005 | WO2005085748A1 Optical readhead |
| 09/15/2005 | WO2005008198A3 Method and apparatus for compact birefringent interference imaging spectrometer |
| 09/15/2005 | US20050201663 Hydrophone mandrel for precise placement of gratings |
| 09/15/2005 | US20050200856 Interferometry systems and methods |
| 09/15/2005 | DE102004057020A1 Design method of base e.g. for attaching distance-measuring interferometer to metrology frame, by positioning center of expansion of base on center line defined by centers of expansion of child part and bond connection |
| 09/14/2005 | EP1574885A1 Optical delay line |
| 09/14/2005 | CN2725854Y Objective lens converter for light cross-section microscope |
| 09/14/2005 | CN1219187C Magnetic suspension motion platform height measuring and calibrating method and apparatus thereof |
| 09/14/2005 | CN1219186C Multiple free degree positioning cutter angle measuring microscope |
| 09/13/2005 | US6943897 Method of fabricating and inspecting a transparent optical element having a parabolic optical-quality lateral surface |
| 09/13/2005 | US6943896 Reconfigurable interferometer system |
| 09/13/2005 | US6943895 Interferometric measuring device |
| 09/13/2005 | US6943894 Laser distance measuring system and laser distance measuring method |
| 09/13/2005 | US6943892 Instrument having a multi-mode optical element and method |
| 09/13/2005 | US6943890 Compact interferometer and use in wavelength monitoring |
| 09/13/2005 | US6943889 Athermal interferometric device |
| 09/13/2005 | US6943881 Measurements of optical inhomogeneity and other properties in substances using propagation modes of light |
| 09/13/2005 | US6943870 Deformation measuring method and apparatus using electronic speckle pattern interferometry |
| 09/13/2005 | CA2267558C Fourier-transform spectrometer configuration optimized for self emission suppression and simplified radiometric calibration |
| 09/09/2005 | WO2005082046A2 Method of full-color optical coherence tomography |
| 09/09/2005 | CA2556865A1 Method of full-color optical coherence tomography |
| 09/08/2005 | US20050195404 Interferometers and systems using interferometers |
| 09/08/2005 | US20050195403 Optical fiber sensors for harsh environments |
| 09/08/2005 | US20050195402 Crystalline optical fiber sensors for harsh environments |
| 09/08/2005 | US20050195401 Wavelength meter |
| 09/08/2005 | US20050195400 Fabre-perot interferometer |
| 09/07/2005 | CN2723958Y Broad frequency white light interferometer of wave band sheet structure |
| 09/06/2005 | US6940607 Method for absolute calibration of an interferometer |
| 09/06/2005 | US6940605 Method for measuring interference and apparatus for measuring interference |
| 09/06/2005 | US6940602 Method and device for high-speed interferential microscopic imaging of an object |
| 09/01/2005 | WO2005080912A1 Device and method for measuring the contrast of the fringes in a michelson interferometer and system for examination of the eye comprising such a device |
| 09/01/2005 | WO2005080911A1 High resolution lateral and axial tomography of the retina |
| 09/01/2005 | WO2005079657A2 Device and method for compensation of corneal birefringence of the eye |
| 09/01/2005 | WO2005062941A3 Multi-channel laser interferometric method and apparatus for detection of ultrasonic motion from a surface |
| 09/01/2005 | WO2005008200A3 Method and apparatus for compact dispersive imaging spectrometer |
| 09/01/2005 | US20050190988 Passive positioning sensors |
| 09/01/2005 | US20050190378 Exposure apparatus mounted with measuring apparatus |
| 09/01/2005 | US20050190377 Point diffraction interferometer and exposure apparatus and method using the same |
| 09/01/2005 | US20050190376 Device and method for the determination of imaging errors and microlithography projection exposure system |
| 09/01/2005 | US20050190375 Stage apparatus and control method therefor |
| 09/01/2005 | US20050190374 Optical image measuring apparatus |
| 09/01/2005 | US20050190373 Optical remote sensor with differential Doppler motion compensation |
| 09/01/2005 | US20050190371 Low-coherence inferometric device for light-optical scanning of an object |
| 09/01/2005 | DE10393244T5 Interferometrisches Verfahren für ellipsometrische, reflektometrische und streulichtanalytische Messungen, einschließlich der Charakterisierung von Dünnfilmstrukturen Interferometric method for ellipsometric, reflectometric and scattering light analytical measurements, including the characterization of thin film structures |
| 09/01/2005 | DE10393243T5 Messung und Fehlerausgleichung bei Interferometern Measurement and error evaluation equation with interferometers |
| 09/01/2005 | CA2553743A1 Device and method for measuring the contrast of the fringes in a michelson interferometer and system for examination of the eye comprising such a device |
| 08/31/2005 | EP1568981A2 Physical quantity measuring method using brillouin optical fiber sensor |
| 08/31/2005 | EP1568976A1 Exposure apparatus mounted with measuring apparatus |
| 08/31/2005 | EP1568963A2 Interferometric apparatus for measuring shapes |
| 08/31/2005 | EP1567826A1 A surface profiling apparatus |
| 08/31/2005 | CN1662790A Device for measuring in three dimensions a topographical shape of an object |
| 08/31/2005 | CN1661770A Method to predict and identify defocus wafers and system thereof |
| 08/31/2005 | CN1661358A Optical image measuring apparatus |
| 08/31/2005 | CN1661333A Physical quantity measuring method using brillouin optical fiber sensor |
| 08/30/2005 | US6937351 Non-destructive method of measuring the thickness of a semiconductor wafer |
| 08/30/2005 | US6937347 Small-beam lateral-shear interferometer |
| 08/30/2005 | US6937345 Measuring system for measuring performance of imaging optical system |
| 08/30/2005 | US6937343 Laser scanner with amplitude and phase detection |
| 08/25/2005 | WO2005078526A1 A system for positioning a product |
| 08/25/2005 | WO2005078382A1 Apparatus and method for super-resolution optical microscopy |
| 08/25/2005 | WO2005077255A1 Compact high resolution imaging apparatus |
| 08/25/2005 | WO2005024379A3 Fiber optic sensor system |
| 08/25/2005 | WO2005010474A3 Method and apparatus for multiwavelength imaging spectrometer |
| 08/25/2005 | US20050185192 Method of full-color optical coherence tomography |
| 08/25/2005 | US20050185191 Laser vibrometry with coherent detection |
| 08/25/2005 | US20050185190 Active control of two orthogonal polarizations for heterodyne beam delivery |
| 08/25/2005 | US20050185189 Fiber Optic Sensor |
| 08/25/2005 | US20050185187 Method and apparatus for the direct characterization of the phase of an optical signal |
| 08/25/2005 | US20050185170 Method to predict and identify defocus wafers |
| 08/25/2005 | DE10392754T5 Interferometrisches optisches System und Verfahren, die eine optische Pfadlänge und einen Fokus bzw. Brennpunkt liefern, die gleichzeitig abgetastet werden Interferometric optical system and method which provide an optical path length and a focus or focal point, which are sampled at the same time |
| 08/25/2005 | CA2553761A1 High efficiency low coherence interferometry |
| 08/24/2005 | CN2720458Y Distance-measuring instrument |
| 08/24/2005 | CN1657947A Optical movement information detector, movement information detection system, electronic equipment and encoder |
| 08/24/2005 | CN1216271C X-ray double-frequency holographic interometer |
| 08/23/2005 | US6934038 Method for optical system coherence testing |
| 08/23/2005 | US6934036 Configuration measuring apparatus and method |
| 08/23/2005 | US6934035 System and method for measuring optical distance |
| 08/23/2005 | US6934027 Interferometric measuring device |
| 08/18/2005 | WO2005074789A1 Short-coherence interferometric measurement of length on the eye |
| 08/18/2005 | WO2005074525A2 Entangled-photon fourier transform spectroscopy |
| 08/18/2005 | WO2005045361A3 Scanning interferometry for thin film thickness and surface measurements |
| 08/18/2005 | WO2005001522A3 Measurements of optical inhomogeneity and other properties in substances using propagation modes of light |
| 08/18/2005 | US20050179912 Calibration feedback-control circuit for diffraction light devices |
| 08/18/2005 | US20050179911 Aspheric diffractive reference for interferometric lens metrology |
| 08/18/2005 | US20050179909 Lithographic apparatus, device manufacturing method, and method for determining z-displacement |
| 08/18/2005 | US20050179908 Optical movement information detector, movement information detection system, electronic equipment and encoder |
| 08/18/2005 | US20050179907 Laser scanner with amplitude and phase detection |
| 08/18/2005 | US20050179906 Interferometer |
| 08/18/2005 | US20050179879 Lithographic apparatus, interferometer and device manufacturing method |
| 08/18/2005 | DE10356829B3 Measurement standard for calibrating interferometric systems has opaque layer with surface roughness in atomic range, at least one structure of defined geometry with at least one edge; layer is joined to transmissive substrate |
| 08/18/2005 | DE102004055637A1 Vielstrahltaster bzw. -messkopf mit justierbarem Strahlwinkel Much beam scanner or -messkopf with adjustable beam angle |
| 08/17/2005 | CN1656353A Interferometric measuring device |
| 08/17/2005 | CN1654921A Self-mixed interference HeNe laser displacement transducer with direction recognition function |
| 08/16/2005 | US6931618 Feed forward process control using scatterometry for reticle fabrication |