| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 09/28/2004 | US6797529 Processing apparatus with measuring unit and method |
| 09/23/2004 | WO2004081491A1 Method and device for determination of residual stresses |
| 09/23/2004 | WO2004066036A3 Reduction of reference hologram noise and fourier space smearing in direct-to-digital holography |
| 09/23/2004 | WO2004065894A3 Optical path difference scanning interferometer |
| 09/23/2004 | US20040184037 Heterodyne lateral grating interferometric encoder |
| 09/23/2004 | US20040182408 Device, method, and system for application of a hair product |
| 09/22/2004 | CN1167937C Polarized-light linear displacement sensor |
| 09/21/2004 | US6795612 Device and method for measuring angle of slant surface of an optical component |
| 09/21/2004 | US6795574 Method of correcting physically-conditioned errors in measurement of microscopic objects |
| 09/21/2004 | US6795240 Microscope system |
| 09/21/2004 | US6795199 Method and apparatus for dispersion compensated reflected time-of-flight tomography |
| 09/21/2004 | US6795197 Interferometer system and litographic step-and-scan apparatus provided with such a system |
| 09/16/2004 | WO2004079295A2 Profiling complex surface structures using scanning interferometry |
| 09/16/2004 | WO2004079294A2 Characterizing and profiling complex surface structures using scanning interferometry |
| 09/16/2004 | WO2003087945A3 Interferometric measuring device and projection illumination installation comprising one such measuring device |
| 09/16/2004 | US20040181148 Optical scanning observation apparatus |
| 09/16/2004 | US20040179204 Speckle interferometer apparatus |
| 09/16/2004 | US20040179202 Scatterometry by phase sensitive reflectometer |
| 09/16/2004 | DE10317828B3 Interferometric investigation of measurement object involves forming measurement and reference beams in first interferometer unit, scanning object and passing reflected beams to second unit with reference beams |
| 09/15/2004 | EP1456600A1 System and method for measuring optical distance |
| 09/15/2004 | EP1019795B1 Extended resolution phase measurement |
| 09/15/2004 | CN1529125A Magnetic suspension motion platfrom height measuring and calibrating method and apparatus thereof |
| 09/15/2004 | CN1529120A Small-sized on-line radical shear interferometer and its aspheric surface measuring method |
| 09/15/2004 | CN1529119A Surface light source device for image identification |
| 09/14/2004 | US6792368 System and method for heterodyne interferometer high velocity type non-linearity compensation |
| 09/14/2004 | US6791695 Shearographic imaging machine with archive memory for animation data and air handling system |
| 09/14/2004 | US6791693 Multiple-pass interferometry |
| 09/10/2004 | WO2004077067A1 Gas velocity sensor |
| 09/10/2004 | WO2004077019A2 Capillary rise technique for the assessment of the wettability of particulate surfaces |
| 09/09/2004 | US20040174955 Apparatus and method for generating high-order harmonic X-ray, and point-diffraction interferometer using high-order harmonic X-ray |
| 09/09/2004 | US20040174535 Abberration measuring apparatus |
| 09/09/2004 | US20040174534 Interferometer, exposure apparatus and method for manufacturing device |
| 09/09/2004 | US20040174533 Wavefront aberration measuring apparatus |
| 09/09/2004 | US20040174532 Aberration measuring apparatus |
| 09/09/2004 | US20040174530 Semiconductor fabricating apparatus with function of determining etching processing state |
| 09/09/2004 | US20040174527 Photosensor for a transmitted light method used for detecting the direction of movement of intensity maxima and intensity minima of an optical standing wave |
| 09/09/2004 | US20040174526 Non linear phase shift calibration for interferometric measurement of multiple surfaces |
| 09/08/2004 | EP1455170A1 Apparatus and method for measuring characteristics of light |
| 09/08/2004 | EP1454113A1 System and method for inspection using white light interferometry |
| 09/08/2004 | EP1454112A2 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance |
| 09/08/2004 | CN1527023A Wide-band white light interferometer |
| 09/08/2004 | CN1165744C Micro displacement self-mixing interference measurer and its signal controller and measuring method |
| 09/07/2004 | US6788424 Optical frequency discriminator |
| 09/07/2004 | US6788421 Arrangements for coherence topographic ray tracing on the eye |
| 09/07/2004 | US6788420 Heterodyne interferometer with a phase modulated source |
| 09/07/2004 | US6788417 Optical fiber infrasound sensor |
| 09/07/2004 | US6786650 Method and apparatus for analyzing the end face of a multifiber ferrule |
| 09/02/2004 | WO2004074881A2 Method and apparatus for dark field interferometric confocal microscopy |
| 09/02/2004 | WO2004074880A2 Longitudinal differential interferometric confocal microscopy |
| 09/02/2004 | WO2004073501A2 Optical coherence tomography with 3d coherence scanning |
| 09/02/2004 | US20040169903 Method for tracking particles and life forms in three dimensions and in time |
| 09/02/2004 | US20040169837 Enhanced lithographic displacement measurement system |
| 09/01/2004 | EP1451556A1 Sensor and method for detecting fiber optic faults |
| 09/01/2004 | EP1451525A1 A method of alignment by using interferometry |
| 09/01/2004 | EP1451524A2 Phase-shifting interferometry method and system |
| 08/31/2004 | US6785002 Variable filter-based optical spectrometer |
| 08/31/2004 | US6785001 Method and apparatus for measuring wavelength jitter of light signal |
| 08/31/2004 | US6785000 Bulk optical interferometer |
| 08/26/2004 | WO2004072695A2 Transverse differential interferometric confocal microscopy |
| 08/26/2004 | WO2004055570A3 Coherence microscope |
| 08/26/2004 | US20040165192 Device and method for determining the chromatic dispersion of optical components |
| 08/26/2004 | US20040165191 Interference measuring probe |
| 08/26/2004 | US20040165176 Portable real-time high-resolution digital phase-stepping shearography with integrated excitation mechanisms |
| 08/26/2004 | US20040165166 Exposure apparatus and production method of device using the same |
| 08/26/2004 | DE10348316A1 Kompaktes Mehrachseninterferometer Compact multi-axis |
| 08/26/2004 | DE10244554B4 Verfahren und Vorrichtung zur Messung der Wanddicke eines Rohres in einem Rohrwalzwerk Method and device for measuring the wall thickness of a tube in a tube rolling mill |
| 08/25/2004 | EP1450149A1 Method and apparatus for determining the chromatic dispersion of optical components |
| 08/24/2004 | US6781740 Achromatic phase shift device and interferometer using achromatic phase shift device |
| 08/24/2004 | US6781701 Method and apparatus for measuring optical phase and amplitude |
| 08/24/2004 | US6781700 Scanning interferometer for aspheric surfaces and wavefronts |
| 08/24/2004 | US6781699 Two-wavelength confocal interferometer for measuring multiple surfaces |
| 08/19/2004 | WO2004025379A3 Optical acquisition systems for direct-to-digital holography and holovision |
| 08/19/2004 | US20040160611 Interferometric optical imaging and storage devices |
| 08/19/2004 | DE10302785A1 Fiber optic laser resonator for optical coherence tomography has a polarization control unit with which the polarization direction in the resonator can be actively adjusted |
| 08/18/2004 | EP1446698A1 An interferometer system for a semiconductor exposure system |
| 08/18/2004 | EP1446634A1 Method for biomolecular sensing and system thereof |
| 08/17/2004 | US6778281 Phase shift fringe analysis method and apparatus using the same |
| 08/17/2004 | US6778280 Interferometry system and method employing an angular difference in propagation between orthogonally polarized input beam components |
| 08/17/2004 | US6778278 Temperature insensitive Mach-Zehnder interferometers and devices |
| 08/17/2004 | CA2205937C Electro-optical measuring device for absolute distances |
| 08/12/2004 | WO2004068554A2 Analysis and monitoring of stresses in embedded lines and vias integrated on substrates |
| 08/12/2004 | WO2004068187A2 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
| 08/12/2004 | WO2004068186A2 Interferometric confocal microscopy incorporating a pihnole array beam-splitter |
| 08/12/2004 | WO2004068185A2 Scannable mirror arrangement for an interferometer |
| 08/12/2004 | WO2004068184A2 Interferometer having a scanning mirror |
| 08/12/2004 | WO2004068088A2 Optical characterization of surfaces and plates |
| 08/12/2004 | WO2004068066A2 Full-filled optical measurements of surface properties of panels, substrates and wafers |
| 08/12/2004 | WO2004068065A2 Leaky guided-wave modes used in interferometric confocal microscopy to measure properties of trenches |
| 08/12/2004 | US20040156053 Method and arrangement for the depth-resolved detection of specimens |
| 08/12/2004 | US20040154402 Remote laser beam delivery system and method for use with a robotic positioning system for ultrasonic testing purposes |
| 08/12/2004 | DE202004007647U1 Laser interferometer for spacing measurement has reference sphere positioned on post and base plate made of thermally invariant material |
| 08/12/2004 | DE10304317A1 Speckle shear interferometry device for measurement of strain or deformation of objects, including in-plane and out-of-plane measurements uses a commercial digital camera with a screen and special shear objective |
| 08/12/2004 | DE10242628B4 Verfahren und System zur Größenkalibrierung Method and system for size calibration |
| 08/12/2004 | DE10225193B4 Verfahren zur Kalibrierung der Vergrößerung eines Mikroskops sowie kalibrierbares Mikroskop Method of calibrating the magnification of a microscope and can be calibrated microscope |
| 08/11/2004 | EP1444758A1 System and method for measuring stimuli using vcsel |
| 08/11/2004 | EP1444482A1 Scanning interferometer for aspheric surfaces and wavefronts |
| 08/11/2004 | EP1444481A1 Rapid in situ mastering of an aspheric fizeau |
| 08/11/2004 | EP1444480A1 Apparatus and method for calibrating an interferometer |
| 08/10/2004 | US6775009 Differential interferometric scanning near-field confocal microscopy |
| 08/10/2004 | US6775007 Frequency-encoded parallel OCT and associated systems and methods |