G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means

Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
12/2004
12/23/2004	US20040257587 Full-field optical measurements of surface properties of panels, substrates and wafers
12/23/2004	US20040257586 Common element confocal interferometer
12/23/2004	US20040257579 Chemical sensor
12/23/2004	US20040257578 Optical pulse characterization for telecommunications applications
12/23/2004	US20040257577 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry
12/23/2004	US20040256552 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
12/23/2004	US20040255650 Capillary rise technique for the assessment of the wettability of particulate surfaces
12/23/2004	DE10341585A1 Container support load test procedure has fibre optic deformation sensors combined with temperature sensors for statistical modelling to monitor corrosion weakening
12/23/2004	DE10325443A1 Interferometrische Messvorrichtung Interferometric measurement device
12/23/2004	DE102004022654A1 Heterodynstrahl-Bereitstellung mit Aktivsteuerung zweier orthogonaler Polarisierungen Heterodynstrahl deployment with active control of two orthogonal polarizations
12/22/2004	CN1556371A Multifunction tridimension displacement laser interference measuring system
12/21/2004	US6833962 Light altering device
12/16/2004	WO2004109245A2 An interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror
12/16/2004	WO2004109226A2 Interferometric measuring device
12/16/2004	WO2004109225A1 Switched point light source array and its use in interferometry
12/16/2004	US20040252387 Temperature insensitive Mach-Zehnder interferometers and devices
12/16/2004	US20040252311 Method and apparatus for point diffraction interferometry
12/16/2004	US20040252310 Scanning interferometry
12/16/2004	US20040252309 Interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror
12/16/2004	US20040250438 Rigger-spread measuring instruments
12/15/2004	EP1485675A2 Surface profiling apparatus
12/15/2004	EP1203257B1 Scanning interferometric near-field confocal microscopy
12/15/2004	CN2663922Y Micrometer eyepiece with accurate reading
12/15/2004	CN2663921Y Bidirectional shearing interferometer
12/15/2004	CN1180222C Double-frequency confocal step height microscope measuring device
12/09/2004	WO2004106978A2 Packaging method and apparatus for fabrication of the optical transmitter and receiver in the optical wireless communication system
12/09/2004	WO2004106849A1 Optical device for studying an object
12/09/2004	WO2004106848A1 Interferometer arrangement and use of the interferometer arrangement
12/09/2004	WO2004106846A1 Three-point extensometer
12/09/2004	WO2004083793A3 Method and device for the generation of a carrier for an interferogramme
12/09/2004	US20040246490 Measurements of substances using two different propagation modes of light through a common optical path
12/09/2004	US20040246486 Interferometric confocal microscopy incorporating a pinhole array beam-splitter
12/09/2004	DE102004003090A1 Aktive Steuerung zweier orthogonaler Polarisationen für eine heterodyne Interferometrie Active control of two orthogonal polarizations for a heterodyne interferometry
12/09/2004	CA2527259A1 Optical device for studying an object
12/08/2004	EP1483547A1 Optical interferometer
12/08/2004	EP1153263B1 Combining interference fringe patterns to a moire fringe pattern
12/08/2004	CN1553141A Microscope focus height-finding method
12/02/2004	WO2004104666A1 Optical element, optical transmission unit and optical transmission system
12/02/2004	WO2004073501A3 Optical coherence tomography with 3d coherence scanning
12/02/2004	US20040243935 Systems and methods for processing instrument data
12/02/2004	US20040240506 DUV light source optical element improvements
12/02/2004	US20040239947 Measurement of complex surface shapes using a spherical wavefront
12/02/2004	US20040239946 Method and apparatus for imaging internal structures of transparent and translucent materials
12/02/2004	US20040239943 System and method for low coherence broadband quadrature interferometry
12/02/2004	US20040239942 Optical coherence tomography device
12/02/2004	US20040239940 Systems and methods for fiber optic devices with reduced thermal sensitivity
12/02/2004	US20040239939 Stationary fourier transform spectrometer
12/02/2004	US20040239938 System for fourier domain optical coherence tomography
12/02/2004	DE10321895A1 Topography measuring sensor employs microscopic white light interferometry and has a variable refractive power imaging system in the plane of the test objective focal plane
12/02/2004	DE10321887A1 Optical sensor for high speed scanning of an object, e.g. for use in optical metrology, has a light source and a focussing objective that generates an astigmatic image on a sensor camera chip
12/02/2004	DE10321886A1 Interferometric sensor for object scanning, has a beam splitter system that is configured as a triangle-shaped interferometer with a beam splitter layer system
12/02/2004	DE10319369A1 Verfahren zur Bestimmung des Niveaus mehrerer Messpunkte sowie Anordnung dafür Method for determining the levels of several measuring points and arrangement therefor
12/01/2004	EP1482420A1 System and method for processing data of measurement instruments
12/01/2004	EP1482335A1 Fiber optic device with reduced thermal sensitivity
12/01/2004	EP1482288A1 Static Fourier-transform spectrometer
12/01/2004	EP1482287A1 Polarization Fourier transform spectrometer
12/01/2004	EP1480552A2 Tracking assisted optical coherence tomography
12/01/2004	EP1281040A4 Reduced coherence symmetric grazing incidence differential interferometer
12/01/2004	EP0937229B1 Interferometric measuring device for form measurement on rough surfaces
12/01/2004	CN2660556Y Master controller of microscope for observing nano particle
12/01/2004	CN1551974A Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping
12/01/2004	CN1551043A Interferometer based navigation device
12/01/2004	CN1550751A Path_matching path type interferometer device
11/2004
11/30/2004	US6825934 Vibration noise mitigation in an interferometric system
11/25/2004	WO2004102112A1 Apparatus for optical coherence tomography (oct)
11/25/2004	WO2004102111A1 Digital holographic microscope for 3d imaging and process using it
11/25/2004	US20040233944 Laser system using ultra-short laser pulses
11/25/2004	US20040233459 Movement detection speckle interferometer
11/25/2004	US20040233457 Optical mapping apparatus with optimized OCT configuration
11/25/2004	US20040233455 Increasing of the long-term operational reliability of a fiber optic interferometer by protecting the light source
11/25/2004	US20040233445 Determination of center of focus by parameter variability analysis
11/25/2004	DE10319711A1 High accuracy interferometric object measurement procedure uses rotary table and additional adjustment on coordinate measuring machine to align measurement and laser axes
11/24/2004	EP1480005A1 Light weight structural element
11/24/2004	EP1272812B1 Interferometric measuring device
11/24/2004	CN1548936A Long-distance scatterer microvibrating signal measurement and fidelit pickup interferometer
11/24/2004	CN1177193C Double-wavelength nanometer-precision real-time interferometer
11/23/2004	US6823094 Interferometer and its fabrication method
11/23/2004	US6822745 Optical systems for measuring form and geometric dimensions of precision engineered parts
11/18/2004	WO2004099877A1 Optical measuring device and operating method for an optical imaging system
11/18/2004	WO2004057266A3 Interferometer system and measuring device
11/18/2004	US20040228007 Light altering device
11/18/2004	US20040227957 Method and apparatus for measuring flatness and/or relative angle between top and bottom surfaces of a chip
11/18/2004	US20040227956 Grating array systems having a plurality of gratings operative in a coherently additive mode and methods for making such grating array systems
11/18/2004	US20040227954 Interferometer based navigation device
11/18/2004	US20040227953 System and method for inspection using white light interferometry
11/18/2004	US20040227951 Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry
11/18/2004	US20040227950 Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry
11/18/2004	US20040227943 Heterodyne beam delivery with active control of two orthogonal polarizations
11/18/2004	US20040227942 Active control of two orthogonal polarizations for heterodyne interferometry
11/18/2004	DE10317826A1 Interferometric method for measuring spaces uses an interferometer to separate a source beam for a source of light emitting short-coherent or incoherent light into reference and measuring beams
11/17/2004	EP1477888A2 Interferometer based navigation device
11/17/2004	EP1476717A1 Optical displacement sensor
11/17/2004	EP1476716A1 Low-coherence inferometric device for light-optical scanning of an object
11/17/2004	EP1476715A1 Improved spatial wavefront analysis and 3d measurement
11/17/2004	EP1125150B1 Multilayer mirrors for dispersion control
11/17/2004	CN1546943A Micro-electromechanical system testing device and method based on micro-interference technique
11/17/2004	CN1176351C Method and device of 3D digital imaging with dynamic multiple resolution ratio
11/17/2004	CN1176347C Rapid adjustment method of Mach-Zhender interferometer
11/17/2004	CN1176346C Dual frequency laser synthesized wavelength interferometer
11/16/2004	US6819812 System and method for measuring physical, chemical and biological stimuli using vertical cavity surface emitting lasers with integrated tuner

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