Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
03/2004
03/30/2004US6714307 Measurement of complex surface shapes using a spherical wavefront
03/30/2004US6714306 Sensor for optically sensing air borne acoustic waves
03/25/2004WO2004025379A2 Optical acquisition systems for direct-to-digital holography and holovision
03/25/2004WO2004025217A1 Method and system for size calibration
03/25/2004WO2004025216A1 Method for measuring contour variations
03/25/2004US20040059526 Deformation measuring method and apparatus using electronic speckle pattern interferometry
03/25/2004US20040057874 Light-interference fluid characteristics analyzer and frame for such analyzer
03/25/2004US20040057056 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
03/25/2004US20040057054 Deformation measuring method and apparatus using electronic speckle pattern interferometry
03/25/2004DE10242628A1 Image size calibration method for calibrating dimensions of an electronic image generated by an object uses an optical instrument with a downstream digital camera to create the image
03/25/2004DE10224761B3 Laser beam interferometer has radiation divider feeding measurement arm, reference branch, beam combiner superimposing individual beams from reference branch, measurement arm onto detector in pairs
03/25/2004DE10204136B4 Interferometrische Messvorrichtung Interferometric measurement device
03/24/2004EP1400779A1 Deformation measuring method and apparatus using electronic speckle pattern interferometry
03/24/2004EP1399709A1 Photosensor for a transmitted light method used for detecting the direction of movement of intensity maxima and intensity minima of an optical standing wave
03/24/2004EP1399708A1 Movement detection speckle interferometer
03/24/2004CN1483998A Amplifying holographic device for axle recorded phase difference
03/23/2004US6711342 Optical random number generator and method of optically generating random numbers
03/23/2004US6710884 Apparatus and method for measuring mirrors in situ
03/23/2004US6710881 Heterodyne interferometry for small spacing measurement
03/23/2004US6710880 Interferometric apparatus for ultra-high precision displacement measurement
03/23/2004US6710799 Microscopic motion measuring
03/23/2004US6710316 Fiber-coupled, high-speed, angled-dual-axis optical coherence scanning microscopes
03/18/2004WO2004023219A2 Rapid direct-to-digital holographic acquisition of object off-axis illuminated by several illumination sources
03/18/2004WO2004023217A2 Direct-to-digital off-axis holography with off-axis illuminated object
03/18/2004WO2004023171A2 Intrinsic fabry-perot optical fiber sensors and their multiplexing
03/18/2004WO2004023071A1 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
03/18/2004WO2004023069A1 Measurement and compensation of errors in interferometrs
03/18/2004US20040051877 Small-beam lateral-shear interferometer
03/18/2004DE10256273B3 Interference-optical shape measurement device with phase shifting has interferometer producing interference patterns from specified measurement areas, phase shift element array and adjustment device
03/17/2004EP1397640A1 Scanning interferometer for aspheric surfaces and wavefronts
03/17/2004EP1397638A2 Apparatus and method for measuring aspherical optical surfaces and wavefronts
03/17/2004CN1482478A Fibre-optical differential interferometer
03/16/2004US6707027 Method of measuring the movement of an input device
03/16/2004US6705767 Method and apparatus for analyzing the end face of a multifiber ferrule
03/11/2004WO2004020987A1 Optical waveguide interferometer comprising a laminate structure with a first planar waveguide monolayer and a second sandwich layer
03/11/2004WO2004020937A1 Phase measuring method and apparatus for multi-frequency interferometry
03/11/2004US20040047027 Interferometer with reduced shear
03/11/2004US20040046965 Interferometric stage metrology system
03/11/2004DE10239468A1 Objekterfassung Object detection
03/10/2004CN2606332Y Individual interference stripe subdivider
03/10/2004CN2606331Y Nonlinear fault compensator for interference measuring unit
03/09/2004US6704112 Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses
03/04/2004WO2004018983A1 Spectrometry method and device for carrying out said method
03/04/2004WO2004018964A1 Interferometer optical element alignment
03/04/2004WO2003096391A3 System and method for controlling wafer temperature
03/04/2004WO2003078925A3 Surface profiling apparatus
03/04/2004WO2002101379A3 Chemical micro-sensor
03/04/2004US20040042057 Off-axis illumination direct-to-digital holography
03/04/2004US20040042056 Rapid acquisition fused off-axis illumination direct-to-digital holography
03/04/2004US20040042016 Optical interferometer
03/04/2004US20040042015 Content-based fused off-axis illumination direct-to-digital holography
03/04/2004US20040042014 Laser scanner with amplitude and phase detection
03/03/2004EP1394500A1 Object detection
03/03/2004EP1393014A2 Microinterferometers with performance optimization
03/03/2004CN1479074A Position detection device
03/03/2004CN1140777C Optical fiber F-P interferometer of metal-ceramic structure
03/02/2004US6700665 Interferometric apparatus for measuring the topography of mirrors in situ and providing error correction signals therefor
02/2004
02/26/2004WO2003095942A3 System and method for control of paint thickness by using an optoacoustic technique
02/26/2004WO2003086180A3 Measurement of optical properties
02/26/2004WO2003034009A9 Optical interferometric sensor with optical error compensation
02/26/2004US20040037175 Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical system
02/26/2004US20040036888 Interferometer having improved modulation depth and free-spectral range and method of manufacturing
02/26/2004US20040036887 Laser distance measuring system and laser distance measuring method
02/26/2004US20040036884 Spectral imaging for vertical sectioning
02/26/2004DE10137719B4 Vorrichtung und Verfahren zur Einstellung der Phasenbeziehung zwischen kohärenten Lichtwellen in einem endoskopischen Speckle-Interferometer Apparatus and method for adjusting the phase relationship between coherent light waves in an endoscopic speckle interferometer
02/25/2004EP1391718A1 High-speed optical delay generating method by rotation reflector in optical coherence tomography and optical coherence tomography device
02/25/2004EP1390722A1 Interferometric determination of three-dimensional refractive index distribution
02/25/2004EP1390690A2 Cyclic error reduction in average interferometric position measurements
02/25/2004EP1390689A1 Reducing coherent artifacts in an interferometer
02/25/2004CN1477448A Method for mfg. photoetching device and component
02/24/2004US6697162 Optical interferometric measuring instrument and laser interference apparatus
02/24/2004US6697160 Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer
02/19/2004WO2004015367A1 Determining topography and composition of a sample by using an interferometer
02/19/2004WO2004015366A1 Surface shape determining method and its device
02/19/2004US20040033426 Alignment system uses a self-referencing interferometer that produces two overlapping and relatively rotated images of an alignment markers.
02/19/2004DE19541144B4 Gerät und Verfahren zum Steuern des Antriebs der Bewegung einer Vorrichtung Apparatus and method for controlling the drive of the movement of a device
02/18/2004CN1475769A Method for analyzing low-coherence fringe
02/17/2004US6693715 Fringe analysis method using fourier transform
02/17/2004US6693714 Position sensor for movable body and optical interferometer
02/12/2004WO2004013565A2 Fringe pattern discriminator for grazing incidence interferometer
02/12/2004WO2003095940A3 Compensation for geometric effects of beam misalignments in plane mirror interferometers
02/12/2004US20040027585 Phase gap analysis for scanning interferometry
02/12/2004US20040027584 Advanced signal processing technique for translating fringe line disturbances into sample height at a particular position above an interferometer's sample stage
02/12/2004US20040027583 Pre-established reference scale for interferometric topological metrology
02/12/2004US20040027582 Method and apparatus for determining sample composition with an interferometer
02/12/2004US20040027579 Fringe pattern discriminator for grazing incidence interferometer
02/12/2004US20040027578 Method and apparatus for ultrasonic laser testing
02/12/2004US20040027576 Interferometric optical systems having simultaneously scanned optical path length and focus
02/12/2004DE10244552B3 Interferometric measuring device for determining the shape, roughness or distance of the surface of a measurement object comprises a measurement probe coupled to an interferometer via an optical fiber arrangement
02/12/2004DE10235669A1 Laser-based position measurement instrument of the interferometer or diffraction grating type is configured so that a single mode laser source interacts with feedback means to cause excitation of multimode operation
02/11/2004EP0981733B1 Grating based phase control optical delay line
02/10/2004US6690474 Apparatus and methods for surface contour measurement
02/05/2004WO2004011963A2 Fourier transform spectrometry with a multi-aperture interferometer
02/05/2004WO2003060422A3 Interferometric optical system
02/05/2004US20040021874 Integrated scanning and ocular tomography system and method
02/05/2004US20040021873 Sensor for optically sensing air borne acoustic waves
02/05/2004US20040021872 Stable Fabry-Perot interferometer
02/05/2004US20040021871 Holographic imaging spectrometer
02/05/2004US20040021870 Athermal interferometric device
02/05/2004DE10244553B3 Interferometric measuring device for detecting shape, roughness of distance of object surface has beam from modulation interferometer fed to optical measuring probe with angled light output surface