| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 01/05/2006 | US20060001887 Interferometric optical assemblies and systems including interferometric optical assemblies |
| 01/05/2006 | US20060001886 Precision retroreflector positioning apparatus |
| 01/05/2006 | US20060001876 Systems and methods for chiroptical heterodyning |
| 01/05/2006 | US20060001862 Lens meter |
| 01/05/2006 | US20060001861 Measuring method and measuring system for measuring the imaging quality of an optical imaging system |
| 01/04/2006 | EP1611411A2 Method and apparatus for imaging internal structures of transparent and translucent materials |
| 01/04/2006 | CN2750287Y Large range nano detection optical system |
| 01/04/2006 | CN1235052C Method measuring movement of material sheet and optical sensor for carrying out said method |
| 01/03/2006 | US6982796 Wavefront splitting element for EUV light and phase measuring apparatus using the same |
| 01/03/2006 | US6982790 Coherent imaging in turbid media |
| 12/29/2005 | WO2005124322A1 Phase sensitive heterodyne coherent anti-stokes raman scattering micro-spectroscopy and microscopy systems and methods |
| 12/29/2005 | WO2005124275A2 Improved wavefront sensor using hybrid optical/electronic heterodyne techniques |
| 12/29/2005 | WO2005124274A2 Calibrating method, measuring method, optical measuring device and operating method for a transmitter arrangement |
| 12/29/2005 | WO2004114211A3 Full-field optical coherence tomography and its application to multiple-layer information decoding |
| 12/29/2005 | WO2004088241A3 Method and apparatus for imaging internal structures of transparent and translucent materials |
| 12/29/2005 | US20050286057 Load dependent analyzing optical components |
| 12/29/2005 | US20050286055 Optical measurements of properties in substances using propagation modes of light |
| 12/29/2005 | DE102004022341A1 Vorrichtung und Verfahren zur kombinierten interferometrischen und abbildungsbasierten Geometrieerfassung insbesondere in der Mikrosystemtechnik Apparatus and method for combined interferometric and abstract geometry-based detection especially in microsystem technology |
| 12/28/2005 | EP1610088A1 Device for optically measuring an object |
| 12/28/2005 | EP1608934A2 Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
| 12/28/2005 | EP1608933A2 Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
| 12/28/2005 | CN2748867Y Novel electronic angle gauge |
| 12/28/2005 | CN1233982C Method for measuring position of zero optical path difference in dual beam interference of wideband light source |
| 12/28/2005 | CN1233981C Cutter angle measuring microscope |
| 12/27/2005 | US6980299 Systems and methods for imaging a sample |
| 12/27/2005 | US6980297 Wavelength monitor |
| 12/22/2005 | WO2005121696A1 Method for evaluating signals in optical coherence tomography (oct) |
| 12/22/2005 | US20050280830 Apparatus for optical measurement of an object |
| 12/22/2005 | US20050280828 Systems and methods for imaging a sample |
| 12/22/2005 | US20050280827 Phase sensitive heterodyne coherent anti-Stokes Raman scattering micro-spectroscopy and microscopy systems and methods |
| 12/22/2005 | US20050280802 Distance measuring device with laser indicating device |
| 12/22/2005 | US20050280687 Sheet-type detection device |
| 12/22/2005 | DE102005014455A1 Differenzinterferometer mit verbesserter zyklischer Nichtlinearität Differential interferometer with improved cyclic nonlinearity |
| 12/22/2005 | DE102005009064A1 Systeme, die polarisationsmanipulierende Retroreflektoren verwenden Systems that use polarization-retroreflectors |
| 12/22/2005 | DE102005009062A1 Heterodynlaserinterferometer zum Messen einer Waferstufentranslation Heterodynlaserinterferometer for measuring a wafer stage translation |
| 12/22/2005 | DE102004026193A1 Messverfahren zur Formmessung Measurement method for measuring the shape |
| 12/22/2005 | DE102004017229A1 Interferometrisches System für den Einsatz von Sonderoptiken Interferometric System for the use of special optics |
| 12/22/2005 | DE102004014095B4 Laser goniometer e.g. for angle measurement, has laser to control equipment and energy source attached and detector unit and between laser and detector unit optical deflecting system is supported by plate |
| 12/21/2005 | EP1606575A2 Leaky guided-wave modes used in interferometric confocal microscopy to measure properties of trenches |
| 12/21/2005 | CN1710376A Method for calibrating space resolution ratio of high-resolution digital interference instrument |
| 12/21/2005 | CN1232846C Mach-Zehnder interference type sensing device based on micro curved transmission waveguide |
| 12/20/2005 | US6977731 Method and apparatus for enhancing the resolving power of a tunable optical filter |
| 12/20/2005 | US6977730 Method and apparatus for alignment of a precision optical assembly |
| 12/15/2005 | WO2005119362A2 Laser interferometer mirror assembly |
| 12/15/2005 | WO2005119169A2 Beam profile complex reflectance system and method for thin film and critical dimension measurements |
| 12/15/2005 | WO2005117534A2 Process, system and software arrangement for a chromatic dispersion compensation using reflective layers in optical coherence tomography (oct) imaging |
| 12/15/2005 | WO2005095918A3 Simple high efficiency optical coherence domain reflectometer design |
| 12/15/2005 | WO2005051187A3 Rotated measuring device |
| 12/15/2005 | WO2005001445A3 Systems and methods for phase measurements |
| 12/15/2005 | US20050275849 Method of calibrating an interferometer and method of manufacturing an optical element |
| 12/15/2005 | US20050275848 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry |
| 12/15/2005 | US20050275846 Device for measuring an optical path length difference |
| 12/15/2005 | US20050274894 Tomography imaging apparatus |
| 12/15/2005 | DE102004026275A1 Test body length measurement system has internal pressure of compensation body adjustable by feeding gas in or out of compensation body independently of vacuum in measurement body to reduce required drive forces |
| 12/14/2005 | EP1604248A2 Method and device for opto-acoustical imagery |
| 12/14/2005 | EP1604169A2 Characterizing and profiling complex surface structures using scanning interferometry |
| 12/14/2005 | EP1604168A2 Profiling complex surface structures using scanning interferometry |
| 12/14/2005 | CN1707229A Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof |
| 12/13/2005 | US6975406 Glitch filter for distance measuring interferometry |
| 12/13/2005 | US6975405 Method and apparatus for measuring flatness and/or relative angle between top and bottom surfaces of a chip |
| 12/13/2005 | US6973739 Rigger-spread measuring instruments |
| 12/08/2005 | WO2005116578A2 Shape measurement method |
| 12/08/2005 | WO2004083908A3 Optical pulse characterization for telecommunications applications |
| 12/08/2005 | US20050271395 Multi-pulse heterodyne sub-carrier interrogation of interferometric sensors |
| 12/08/2005 | US20050270544 Variable dispersion step-phase interferometers |
| 12/08/2005 | US20050270543 Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof |
| 12/08/2005 | US20050270542 Direct combination of fiber optic light beams |
| 12/08/2005 | US20050270539 Method of generating interferometric information |
| 12/08/2005 | DE102005014190A1 Sensorkabel mit leicht änderbarer Gesamtlänge, das fehlerfreie und Hochgeschwindigkeits-Signalübertragung ermöglicht, selbst wenn die Gesamtlänge vergrößert wird, und vom Verstärker getrennter Sensortyp mit dem Kabel Sensor cables with modifiable total length, error-free and high-speed signal transmission possible even if the total length is increased, and the amplifier separate type of sensor with cable |
| 12/08/2005 | DE102005013903A1 Method for processing optical element of interferometer optics, involves determining deviation of optical surface of optical element from target shape based on interferometric measurement and property of interferometer optics |
| 12/07/2005 | EP1601939A2 Spherical light-scatter and far-field phase measurement |
| 12/07/2005 | EP1601930A2 Device for the generation of a carrier for an interferogramme |
| 12/07/2005 | EP1407308B1 Microscope lens and the use of a microscope lens of this type in a microscope |
| 12/07/2005 | CN1705867A Wave front aberration measuring device |
| 12/06/2005 | US6972849 Scanning interferometer for aspheric surfaces and wavefronts |
| 12/06/2005 | US6972848 Semiconductor fabricating apparatus with function of determining etching processing state |
| 12/06/2005 | US6972846 Multi-beam heterodyne laser doppler vibrometer |
| 12/06/2005 | CA2407151C Gravity and differential gravity sensor, and system and method for monitoring reservoirs using same |
| 12/01/2005 | WO2005114352A2 Fiberoptic fabry-perot optical processor |
| 12/01/2005 | WO2005114150A1 Low coherence interferometric system for optical metrology |
| 12/01/2005 | WO2005114149A1 Low coherence interferometry utilizing phase |
| 12/01/2005 | WO2005114096A2 Methods and systems for determining optical properties using low-coherence interference signals |
| 12/01/2005 | WO2005114095A2 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry |
| 12/01/2005 | WO2005114094A1 Method and system of low coherence interferometry for analyzing biological samples |
| 12/01/2005 | US20050264827 Interferometric measuring device and projection exposure installation comprising such measuring device |
| 12/01/2005 | US20050264826 Diffraction grating based interferometric systems and methods |
| 12/01/2005 | US20050264823 Systems using polarization-manipulating retroreflectors |
| 12/01/2005 | US20050264822 Differential interferometer with improved cyclic nonlinearity |
| 12/01/2005 | US20050264821 Heterodyne laser interferometer using heterogenous mode helium-neon laser and super heterodyne phase measuring method |
| 12/01/2005 | US20050264820 Optical mapping apparatus with optimized OCT configuration |
| 12/01/2005 | US20050264795 Method for displaying result of measurement of eccentricity |
| 11/30/2005 | CN2743788Y Precise measuring optical projector |
| 11/30/2005 | CN1703646A Laser system |
| 11/30/2005 | CN1703609A Laser interferometer for repeatable mounting on the wall of a vacuum chamber |
| 11/30/2005 | CN1702442A Method for displaying result of measurement of eccentricity |
| 11/30/2005 | CN1702428A Differential interferometer with improved cyclic nonlinearity |
| 11/29/2005 | US6970252 Low-coherence interferometric device for depth scanning an object |
| 11/29/2005 | US6970251 Method for vibration measurement and interferometer |
| 11/24/2005 | WO2005111557A1 Interferometer and fourier transform spectrometer |
| 11/24/2005 | WO2005008214A3 Apparatus and method for ellipsometric measurements with high spatial resolution |