| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 02/03/2005 | DE10334350B3 Verfahren zur Bestimung der Brechzahl bei interferometrischen Längenmessungen und Interferometeranordnung hierfür Method for Bestimung the refractive index at interferometric length measurements and this interferometer |
| 02/03/2005 | DE10331966A1 Optische Meßeinrichtung Optical measuring device |
| 02/03/2005 | CA2532949A1 Method and apparatus for multiwavelength imaging spectrometer |
| 02/02/2005 | EP1502332A2 Optical array for generating a broadband spectrum |
| 02/02/2005 | EP1502096A1 Improved fizeau interferometer designs for optical coherence tomography |
| 02/02/2005 | EP1502092A1 Optical testing method and apparatus |
| 02/02/2005 | EP1502076A1 Method and apparatus for the elimination of polarization fading in interferometeric sensing systems |
| 02/01/2005 | USH2114 Inspection tool for testing and adjusting a projection unit of a lithography system |
| 02/01/2005 | US6850346 Method and apparatus for storing and retrieving a sequence of digital page data |
| 02/01/2005 | US6850329 Interferometer using integrated imaging array and high-density polarizer array |
| 02/01/2005 | US6850315 Intensity-based optical waveguide sensor |
| 01/27/2005 | WO2005008334A2 Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology |
| 01/27/2005 | WO2005008214A2 Apparatus and method for ellipsometric measurements with high spatial resolution |
| 01/27/2005 | WO2005008201A1 Method for measuring light flux correlation function and device for carrying out said method |
| 01/27/2005 | WO2005008200A2 Method and apparatus for compact dispersive imaging spectrometer |
| 01/27/2005 | WO2005008199A2 Method and apparatus for compact fabry-perot imaging spectrometer |
| 01/27/2005 | WO2005008198A2 Method and apparatus for compact birefringent interference imaging spectrometer |
| 01/27/2005 | WO2005008173A1 Optical measuring apparatus |
| 01/27/2005 | WO2004068185A3 Scannable mirror arrangement for an interferometer |
| 01/27/2005 | US20050021243 Laser and environmental monitoring system |
| 01/27/2005 | US20050018211 Length measure apparatus and the method for measuring |
| 01/27/2005 | US20050018206 Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems |
| 01/27/2005 | US20050018205 Position measuring device |
| 01/27/2005 | US20050018202 Measurements of optical inhomogeneity and other properties in substances using propagation modes of light |
| 01/27/2005 | US20050018201 Apparatus and method for ranging and noise reduction of low coherence interferometry lci and optical coherence tomography oct signals by parallel detection of spectral bands |
| 01/27/2005 | DE10347650B3 Interferometer has stepped body in which the steps form a switchback reflective path lined at each end by plateau zone |
| 01/27/2005 | DE10330363A1 Fabry-Perot fiber interferometer for precise measurements of small displacements comprises an emitting and detecting optical fiber and a deformable reflecting element that follows a displacement that is to be measured |
| 01/26/2005 | EP1499913A1 Polarizing beamsplitter |
| 01/26/2005 | CN2674400Y X-ray double-frequency holographic interferometer |
| 01/26/2005 | CN1186590C 高倍全息位相差放大装置 High power amplification device holographic phase difference |
| 01/25/2005 | US6847461 System and method for calibrating a spatial light modulator array using shearing interferometry |
| 01/25/2005 | US6847457 Interferometer using integrated imaging array and high-density phase-shifting array |
| 01/25/2005 | US6847456 Methods and systems using field-based light scattering spectroscopy |
| 01/25/2005 | US6847455 Heterodyne interferometer with angstrom-level periodic nonlinearity |
| 01/25/2005 | US6847454 Systems and methods for processing signals from an interferometer by an ultrasound console |
| 01/25/2005 | US6847453 All fiber autocorrelator |
| 01/25/2005 | US6847452 Passive zero shear interferometers |
| 01/20/2005 | WO2004068066A3 Full-filled optical measurements of surface properties of panels, substrates and wafers |
| 01/20/2005 | WO2004057266A8 Interferometer system and measuring device |
| 01/19/2005 | EP1498690A1 Thickness measuring device |
| 01/19/2005 | EP1497610A2 Real time high speed high resolution hyper-spectral imaging |
| 01/19/2005 | EP1060369A4 Birefringence measurement system |
| 01/19/2005 | CN1566901A Method for forming dynamic grating stripes |
| 01/19/2005 | CN1566898A Cutter angle measuring microscope |
| 01/19/2005 | CN1566897A Multiple free degree positioning cutter angle measuring microscope |
| 01/19/2005 | CN1185462C Non linear deviation compensation device used for interference measuring element |
| 01/19/2005 | CN1185461C Frequency shift without chromatic aberration of wideband light source and device generation interferential heterodyne signal |
| 01/18/2005 | US6844936 Device for the non-contacting measurement of an object to be measured, particularly for distance and/or vibration measurement |
| 01/13/2005 | WO2005004052A2 Method and apparatus for automatic registration and visualization of occluded targets using ladar data |
| 01/13/2005 | WO2005003681A2 Faster processing of multiple spatially-heterodyned direct to digital holograms |
| 01/13/2005 | WO2004092832A3 Determination of center of focus by parameter variability analysis |
| 01/13/2005 | US20050008322 Direct combination of fiber optic light beams |
| 01/13/2005 | US20050008298 Manipulators for fiber optic cable assemblies |
| 01/13/2005 | US20050007603 Spatial wavefront analysis and 3d measurement |
| 01/13/2005 | US20050007602 Device and method for wavefront measurement of an optical imaging system by means of phase-shifting interferometry |
| 01/13/2005 | US20050007601 Optical characterization of surfaces and plates |
| 01/13/2005 | US20050007599 Stroboscopic interferometry with frequency domain analysis |
| 01/13/2005 | DE10325601B3 Schaltbares Punktlichtquellen-Array und dessen Verwendung in der Interferometrie Switchable point light source array, and its use in interferometry |
| 01/12/2005 | EP1495369A2 Interferometric measuring device and projection illumination installation comprising one such measuring device |
| 01/12/2005 | EP1495285A2 Vertical cavity surface emitting laser (vcsel) as an interferometer reference |
| 01/12/2005 | EP1494575A2 Measurement of optical properties |
| 01/12/2005 | EP1436570A4 Measurement of complex surface shapes using a spherical wavefront |
| 01/12/2005 | CN1563882A Co-optical circuit double-frequency heterodyne confocal micromeasurer |
| 01/12/2005 | CN1563881A Position phase-difference enlarger of combined interferometer |
| 01/11/2005 | US6842291 Light altering device |
| 01/11/2005 | US6842256 Compensating for effects of variations in gas refractivity in interferometers |
| 01/11/2005 | US6842254 System and method for measuring an optical path difference in a sensing interferometer |
| 01/06/2005 | WO2005001522A2 Measurements of optical inhomogeneity and other properties in substances using propagation modes of light |
| 01/06/2005 | WO2005001445A2 Systems and methods for phase measurements |
| 01/06/2005 | US20050002044 Method for determination of the level of two or more measurement points, and an arrangement for this purpose |
| 01/06/2005 | US20050002041 Object imaging system using changing frequency interferometry method |
| 01/06/2005 | US20050002040 Lithographic apparatus, device manufacturing method, and computer program |
| 01/06/2005 | US20050002039 Interferometer |
| 01/05/2005 | EP1492994A2 Method and apparatus for stage mirror mapping |
| 01/05/2005 | EP1492442A1 Apparatus for high resolution imaging of moving organs |
| 01/05/2005 | DE10324044A1 Interferometeranordnung und Verwendung der Interferometeranordnung Interferometer and use of the interferometer |
| 01/04/2005 | US6839143 Method for the interferometric measurement of non-rotationally symmetric wavefront errors |
| 01/04/2005 | US6839141 Method and apparatus for compensation of time-varying optical properties of gas in interferometry |
| 12/30/2004 | US20040263956 Optical microscope system and optical axis correcting method |
| 12/30/2004 | US20040263860 Focus and alignment sensors and methods for use with scanning microlens-array printer |
| 12/30/2004 | US20040263859 Full-field optical coherence tomography and its application to multiple-layer information decoding |
| 12/30/2004 | US20040263858 Apparatus for measuring sub-resonance of optical pickup actuator |
| 12/30/2004 | US20040263826 Gas velocity sensor |
| 12/30/2004 | US20040261537 High-stability instrument mounting system for repeatable field testing of equipment |
| 12/30/2004 | DE10347513A1 Optische Kohärenztomographievorrichtung Optical coherence tomography device |
| 12/29/2004 | WO2004114211A2 Full-field optical coherence tomography and its application to multiple-layer information decoding |
| 12/29/2004 | WO2004113826A2 Compensation for imperfections in a measurement object and for beam misalignments in plane mirror interferometers |
| 12/29/2004 | WO2004090466A3 Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
| 12/29/2004 | EP1491932A1 Optical microscope and a camera alignment method |
| 12/29/2004 | CN1558211A Device and method for determining the chromatic dispersion of optical components |
| 12/29/2004 | CA2530495A1 Full-field optical coherence tomography and its application to multiple-layer information decoding |
| 12/28/2004 | US6836597 Scannable mirror arrangement for an interferometer |
| 12/28/2004 | US6836578 System and method for measuring physical stimuli using vertical cavity surface emitting lasers with integrated tuning means |
| 12/28/2004 | US6836336 Inspection system calibration methods |
| 12/28/2004 | US6836335 Multi-axis interferometer |
| 12/23/2004 | WO2004111929A2 Improved system for fourier domain optical coherence tomography |
| 12/23/2004 | WO2004111661A2 System and method for low coherence broadband quadrature interferometry |
| 12/23/2004 | WO2004111575A2 Interferometric absolute and real-time surface curvature sensor insensitive to tilt, translation and vibration |
| 12/23/2004 | WO2004034079A3 Inspection system calibration methods |
| 12/23/2004 | WO2004008078A9 Delaying interferometer |