Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
02/2004
02/05/2004DE10233592A1 Motor vehicle seat or external mirror position determination device, comprises a laser interferometer for measurement of the position of a reflector attached to the seat or mirror relative to a reference point
02/05/2004DE10131608B4 Photosensor für ein Durchlichtverfahren zur Detektion der Bewegungsrichtung von Intensitätsmaxima und Intensitätsminima einer optischen stehenden Welle Photosensor for a transmitted light method for detecting the direction of motion of the intensity maxima and intensity minima of an optical standing wave
02/04/2004EP1387161A1 Angle-of-rotation measuring device and angle-of-rotation measuring method
02/04/2004CN1137369C Trackless large-part measuring device and method
02/03/2004US6687012 Apparatus and method for measuring optical activity
02/03/2004US6687011 Transmission-type extrinsic fabry-perot interferometric optical fiber sensor
02/03/2004US6687010 Rapid depth scanning optical imaging device
02/03/2004US6687009 Method and apparatus for high resolution monitoring of optical signals
02/03/2004US6687008 Waveguide based parallel multi-phaseshift interferometry for high speed metrology, optical inspection, and non-contact sensing
02/03/2004US6687007 Common path interferometer for spectral image generation
01/2004
01/29/2004US20040019445 Calibration methodology and system for optical network analyzer
01/29/2004US20040017760 Optical pickup apparatus having improved holographic optical element and photodetector
01/28/2004EP1384972A1 Microscope with rotary sample stage and integrated display screen
01/28/2004EP1384044A1 Reducing coherent artifacts in an interferometer
01/28/2004CN1470848A Sampler inclination measuring method
01/27/2004CA2222669C Optical timing detection
01/22/2004WO2004008078A1 Delaying interferometer
01/22/2004WO2004006751A2 Method and device for quantitative image correction for optical coherence tomography
01/22/2004WO2003096490A3 Optical array for generating a broadband spectrum
01/22/2004WO2003071222A9 Systems and methods for inspection of ophthalmic lenses
01/22/2004WO2003064962A3 Multi-axis interferometer
01/22/2004US20040013396 Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components
01/22/2004US20040012791 Interferometer having a coupled cavity geometry for use with an extended source
01/22/2004DE4206281B4 Erfassung von Partikeln mit Durchmessern im Submikron-Bereich unter Verwendung eines Feldes mit hoher Dichte Detection of particles having diameters in the submicron range using an array of high density
01/21/2004EP1382139A2 Optical coherent receiver using a time delay interferometer and adaptive beam combiner
01/21/2004CN1469989A Determination of center of focus by diffraction signature analysis
01/20/2004US6680780 Interferometric probe stabilization relative to subject movement
01/15/2004WO2004005847A1 Cyclic error compensation in interferometry systems
01/15/2004WO2004005846A1 Shearing interferometer calibrating method, production method for projection optical system, projection opticalsystem, and projection exposure system
01/15/2004US20040008877 Systems and methods for inspection of ophthalmic lenses
01/15/2004US20040008409 Innovative micrometric measuring instrument
01/15/2004DE10229816A1 Vorrichtung zur Erzeugung einer konvergenten Lichtwellenfront und System zur interferometrischen Linsenflächenvermessung An apparatus for generating a convergent optical system for interferometric and front lens surface surveying
01/14/2004EP1379857A1 Interferometric arrangement for determining the transit time of light in a sample
01/14/2004CN2599525Y Micro-displacement real time noninterence measurer
01/14/2004CN2599524Y Dot diffraction interferometer for detecting surface shape
01/13/2004US6678084 Methods of making mechanisms in which relative locations of elements are maintained during manufacturing
01/13/2004US6678056 Jamin-type interferometers and components therefor
01/08/2004WO2004003526A1 Heterodyne laser interferometer using heterogeneous mode helium-neon laser and super heterodyne phase measuring method
01/08/2004WO2004003468A1 Integrated scanning and ocular tomography system and method
01/08/2004WO2004003467A1 Phase-shifting diffraction grating interferometer and its measuring method
01/08/2004WO2004003464A2 Frequency-scanning interferometer with non-specular reference surface
01/08/2004WO2004003463A2 Interferometer system of compact configuration
01/08/2004WO2003067246A3 Use of electronic speckle interferometry for defect detection in fabricated devices
01/08/2004US20040004762 Method of calibrating a stereomicroscope and a stereomicroscope capable of being calibrated
01/08/2004US20040004723 Position measuring system
01/08/2004US20040004722 Athermal zero-shear interferometer
01/08/2004DE10225193A1 Verfahren zur Kalibrierung eines Stereomikroskops sowie kalibrierbares Stereomikroskop A method for calibrating a stereo microscope and stereomicroscope calibratable
01/07/2004CN2597944Y Apparatus for measuring workpiece parallel degree
01/06/2004US6674521 Optical method and system for rapidly measuring relative angular alignment of flat surfaces
01/06/2004US6674512 Uses the known relative movement between interferometer support blocks and a reference member
01/06/2004US6674510 Off-axis levelling in lithographic projection apparatus
01/02/2004EP1376080A1 Stabilized Fabry-Perot interferometer with oblique reference beams
01/02/2004EP1376050A2 Method of adjusting fixed mirror of double-beam interferometer and interferometric spectrophotometer
01/02/2004EP1373844A2 Variable filter-based optical spectrometer
01/02/2004EP1373827A1 Illumination device and method for illuminating an object
01/02/2004EP0956518B1 Interferometer system and lithographic apparatus comprising such a system
01/01/2004US20040001205 Sample inclination measuring method
12/2003
12/31/2003WO2004001427A2 Common-path frequency-scanning interferometer
12/31/2003WO2004001330A2 Multi-stage data processing for frequency-scanning interferometer
12/31/2003CN2596321Y Large size calibrating device with straightness analysis
12/31/2003CN1464968A Optical signal interleaver and deinterleaver devices with chromatic dispersion compensation
12/30/2003US6671057 Gravity and differential gravity sensor, and system and method for monitoring reservoirs using same
12/30/2003US6671055 Interferometric sensors utilizing bulk sensing mediums extrinsic to the input/output optical fiber
12/30/2003US6671054 Interferometric patterning for lithography
12/25/2003WO2003107494A2 Gas discharge ultraviolet wavemeter with enhanced illumination
12/25/2003US20030234938 Low coherent interference fringe analysis method
12/25/2003US20030234936 Common-path frequency-scanning interferometer
12/25/2003US20030234935 Bulk optical interferometer
12/24/2003WO2003107064A1 Confocal microscope and method for measuring by confocal microscope
12/24/2003WO2003106921A1 Interferometric optical system and methods providing simultaneously scanned optical path length and focus
12/24/2003WO2003106920A1 Interferometry methods and systems having a coupled cavity geometry for use with an extended source
12/24/2003WO2003106919A2 Interferometry systems involving a dynamic beam-steering assembly
12/24/2003WO2003105678A2 Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
12/24/2003WO2003070090A3 Tracking assisted optical coherence tomography
12/18/2003WO2003104744A1 Method for obtaining the image of an object, device for carrying out said method and device for delivering low coherent optical radiation
12/18/2003WO2003087710A3 Method and apparatus for stage mirror mapping
12/18/2003US20030231314 Interferometric measuring device
12/18/2003CA2487893A1 Method for obtaining the image of an object, device for carrying out said method and device for delivering low coherent optical radiation
12/17/2003EP1372040A2 Lithographic apparatus and device manufacturing method
12/17/2003EP1371939A1 A device for measuring in three dimensions a topographical shape of an object
12/16/2003US6665456 Method and apparatus for differential phase optical coherence tomography
12/16/2003US6665109 Compliant mechanism and method of forming same
12/11/2003WO2003102495A2 Metrology system for precision 3d motion
12/11/2003WO2003065119A3 Overlay measurements using periodic gratings
12/11/2003WO2003034009A3 Optical interferometric sensor with optical error compensation
12/11/2003US20030229459 System for real time, non-invasive metrology of microfluidic chips
12/11/2003US20030227658 Spatially-heterodyned holography
12/11/2003US20030227632 Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness
12/11/2003US20030227631 Phase-referenced doppler optical coherence tomography
12/10/2003EP1369663A1 Method of calibration of a stereo microscope and a calibratable stereo microscope
12/10/2003EP1369662A2 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
12/10/2003CN2591561Y Projector with high clarity
12/09/2003US6661522 Interference system and semiconductor exposure apparatus having the same
12/04/2003WO2003088431A3 Vertical cavity surface emitting laser (vcsel) as an interferometer reference
12/04/2003WO2003071222A3 Systems and methods for inspection of ophthalmic lenses
12/04/2003WO2003062802A3 Apparatus and method for rangings and noise reduction of low coherence interferometry lci and optical coherence tomography (oct) signals by parallel detection of spectral bands
12/04/2003US20030223729 Optical random number generator and method of optically generating random numbers
12/04/2003US20030223674 Robust heterodyne interferometer optical gauge
12/04/2003US20030223081 Method for calibrating a radius test bench
12/04/2003US20030223080 Retroreflector coating for an interferometer