Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
10/2005
10/26/2005CN1688944A Off-axis illumination direct-to-digital holography
10/25/2005US6958818 Fabry-Perot interferometer including membrane supported reflector
10/25/2005US6958817 Method of interferometry with modulated optical path-length difference and interferometer
10/25/2005US6958816 Microrheology methods and systems using low-coherence dynamic light scattering
10/25/2005CA2261773C Interferometer and method for compensation of dispersion or increase in spectral resolution of such an interferometer
10/20/2005WO2005098398A1 Interferometric system for use of a special lenses
10/20/2005WO2005098353A1 Interferometric measuring device comprising an adaptation device for adapting the light intensity
10/20/2005WO2005098351A1 Displacement measuring instrument
10/20/2005US20050232317 Control system and apparatus for use with laser excitation and ionization
10/20/2005US20050231733 Non-destructive testing system
10/20/2005US20050231730 Interferometric signal conditioner for measurement of the absolute length of gaps in a fiber optic fabry-perot interferometer
10/20/2005US20050231729 Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor
10/20/2005US20050231728 Q-point stabilization for linear interferometric sensors using tunable diffraction grating
10/20/2005US20050231727 Compact high resolution imaging apparatus
10/19/2005EP1586867A2 Method and apparatus for continuous readout and fabry-perot fiber optic sensor
10/19/2005EP1586854A2 Interferometric signal conditioner for measurement of the absolute length of gaps in a fiber optic Fabry-Pérot interferometer
10/19/2005CN1685196A Interferometric measuring device
10/18/2005US6957005 Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components
10/18/2005US6956657 Method for self-calibrated sub-aperture stitching for surface figure measurement
10/18/2005US6956656 Interferometric servo control system for stage metrology
10/18/2005US6956655 Characterization and compensation of non-cyclic errors in interferometry systems
10/18/2005US6956653 Dual electrooptic waveguide interferometer
10/13/2005WO2005095918A2 Simple high efficiency optical coherence domain reflectometer design
10/13/2005WO2005095885A1 Noise reduction of laser ultrasound detection system
10/13/2005US20050225775 Resonant ellipsometer and method for determining ellipsometric parameters of a surface
10/13/2005US20050225774 Method for measuring and manufacturing an optical element and optical apparatus
10/13/2005US20050225773 Ultra high frequency imaging acoustic microscope
10/13/2005US20050225772 Interferometric servo control system for stage metrology
10/13/2005US20050225770 Laser interferometer for repeatable mounting on the wall of a vacuum chamber
10/13/2005US20050225769 Surface profiling apparatus
10/13/2005US20050225768 Flexured athermalized pseudokinematic mount
10/13/2005DE102005013555A1 Radarvorrichtung Radar device
10/13/2005DE102004013521A1 Curved profile measuring machine has contactless probe using common ray path and confocal imaging system with suitable coated beam splitter
10/12/2005EP1583934A1 In-process correction of stage mirror deformations during a photolithography exposure cycle
10/12/2005CN2733414Y Quasi-aplanatic atomic beam holographic interferometer for measuring phase change
10/11/2005US6954273 Laser-based measuring apparatus for measuring an axial run-out in a cylinder of rotation and method for measuring the same utilizing opposing incident measuring light beams
10/06/2005WO2005093483A1 Method for measuring focal position of sample with high precision
10/06/2005WO2005029193A3 Interferometric analysis of surfaces.
10/06/2005US20050219550 Apparatus for optical system coherence testing
10/06/2005US20050219548 Method of measuring micro-structure, micro-structure measurement apparatus, and micro-structure analytical system
10/06/2005US20050219545 Optical image measuring apparatus
10/06/2005US20050219544 Optical image measuring apparatus
10/06/2005US20050219543 Optical pulse evaluation device and in-service optical pulse evaluation device
10/06/2005US20050219516 Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
10/06/2005US20050219515 Aberration measuring method
10/06/2005US20050218305 Optical element, optical transmission unit and optical transmission system
10/06/2005DE102004028204B3 Verfahren zur Signalauswertung bei der OCT A method for signal processing of the OCT
10/06/2005DE102004013072A1 Indirect viewing object position determination procedure uses laser system with intermediate reflector to convert geodetic to global positioning systems
10/05/2005EP1582143A1 Optical interferometer for imaging at several depth regions of an object
10/05/2005EP1582142A1 Optical interferometer for imaging at several depth regions of an object
10/05/2005CN1677450A Sensor cable and amplifier-separated type sensor with the cable
10/05/2005CN1677164A Optical analyzers of polarization properties
10/05/2005CN1221798C Angle-of-rotation measuring device and angle-of-rotation measuring method
10/04/2005US6952270 Apparatus and methods for surface contour measurements
10/04/2005US6952266 Interferometer alignment
10/04/2005US6952175 Phase digitizer for signals in imperfect quadrature
09/2005
09/29/2005WO2005090901A1 Interferometric measuring device
09/29/2005WO2005089506A2 A system for aligning optical components by using an interferometer and a diffractive element.
09/29/2005WO2005089299A2 Interferometer having an auxiliary reference surface
09/29/2005WO2005029192A3 Surface triangulation and profiling through a thin film coating
09/29/2005US20050213210 Phase difference plate and optical head device
09/29/2005US20050213107 Microscope using quantum-mechanically entangled photons
09/29/2005US20050213105 Optical beam shearing apparatus
09/29/2005US20050213104 Optical analyzers of polarization properties
09/29/2005US20050213103 Simple high efficiency optical coherence domain reflectometer design
09/29/2005US20050213102 Method and apparatus for measuring dynamic configuration surface
09/29/2005US20050213074 Radar device
09/29/2005DE102004014095A1 Laser goniometer e.g. for angle measurement, has laser to control equipment and energy source attached and detector unit and between laser and detector unit optical deflecting system is supported by plate
09/29/2005DE102004012426A1 Niederkohärenz-interferometrisches Verfahren und Gerät zur lichtoptischen Abtastung von Oberflächen Low-coherence interferometric method and apparatus for light-optical scanning of surfaces
09/29/2005CA2497372A1 Optical analyzers of polarization properties
09/28/2005EP1169613B1 Characterizing and correcting cyclic errors in distance measuring and dispersion interferometry
09/28/2005CN1675515A Common-path frequency-scanning interferometer
09/27/2005US6950692 Optical coherence tomography apparatus, optical fiber lateral scanner and a method for studying biological tissues in vivo
09/27/2005US6950194 Alignment sensor
09/27/2005US6950193 System for monitoring substrate conditions
09/27/2005US6950192 Cyclic error compensation in interferometry systems
09/27/2005US6948825 Illumination device and method for illuminating an object
09/22/2005WO2005088783A1 Laser system using ultra-short laser pulses
09/22/2005WO2005088241A1 Low-coherence interferometric method and appliance for scanning surfaces in a light-optical manner
09/22/2005WO2005087088A1 Method and apparatus for displaying oct cross sections
09/22/2005WO2005086672A2 Crystalline optical fiber sensors for harsh environments
09/22/2005WO2005086671A2 Optical fiber sensors for harsh environments
09/22/2005WO2005019872A3 Method and apparatus for alignment of a precision optical assembly
09/22/2005US20050207752 Physical quantity measuring method using brillouin optical fiber sensor
09/22/2005US20050206909 Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy
09/22/2005US20050206908 Optical system alignment system and method with high accuracy and simple operation
09/22/2005US20050206907 Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness
09/22/2005US20050206906 Optical image measuring apparatus
09/22/2005US20050206904 Entangled photon fourier transform spectroscopy
09/22/2005US20050206880 Optical apparatus, method of determining position of optical element in optical system, and device manufacturing method
09/22/2005DE10356968A1 Optical system for use as e.g. interferometer, has phase plate with spherical phase disk at its center, where plate is shifted to introduce phase shift between wave fronts of phase object and zero order diffraction
09/22/2005DE102004010754A1 Interferometrische Messanordnung Interferometric measurement arrangement
09/22/2005CA2557891A1 Optical fiber sensors for harsh environments
09/21/2005EP1577637A1 Optical heterodyne interferometer for shape measurement
09/21/2005EP1576405A2 Coherence microscope
09/21/2005EP1576337A1 Method and arrangement for optical coherence tomography
09/21/2005EP1208350B1 Polarizing interferometer with reduced ghosts
09/21/2005CN2727699Y Free falling body measuring device for dual-frequency laser interferometer measuring speed
09/21/2005CN2727698Y 双频激光干涉仪 Frequency laser interferometer
09/21/2005CN1670508A Optical image measuring apparatus
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