Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
08/2005
08/16/2005US6930782 End point detection with imaging matching in semiconductor processing
08/11/2005US20050177339 Precision surface measurement
08/11/2005US20050174576 Gas discharge MOPA laser spectral analysis module
08/11/2005US20050174566 Apparatus and method for measuring eccentricity of aspherical surface
08/11/2005US20050174565 Optical testing method and apparatus
08/11/2005DE202005008892U1 Middle frequency interpolator e.g. for carrier frequency interferometer, connected to input of reference channel and uses mode spacing frequency of laser light as reference signal
08/11/2005DE10330363B4 Fabry-Pérot-Faserinterferometer Fabry-Perot fiber interferometer
08/10/2005CN1653314A Surface profiling apparatus
08/10/2005CN1651854A Mach-Zender phase shift vector shear interferometer
08/10/2005CN1214300C Apparatus and method for recording off-axis hologram
08/09/2005US6927860 Optical mapping apparatus with optimized OCT configuration
08/04/2005WO2005070286A1 Interferometric device
08/04/2005WO2005070166A2 Method and system for optically tracking a target using an interferometric technique
08/04/2005US20050168791 System and method for calibrating a spatial light modulator array using shearing interferometry
08/04/2005US20050168755 Spatial filtering in interferometry
08/04/2005US20050168754 Cyclic error reduction in average interferometric position measurements
08/04/2005US20050168752 Waveguide-based optical interferometer
08/04/2005US20050168748 System and method for investigating photon or particle trajectory and interference pattern formation in double slit experiments
08/03/2005EP1558904A1 Load dependent analyzing optical components
08/03/2005EP1558190A2 Method and system for determining the position and alignment of a surface of an object in relation to a laser beam
08/03/2005CN1650200A Polarizing beamsplitter
08/03/2005CN1648700A Method for structuring feedback delay of optical fiber line and full light fiber white light interference system made thereof
08/03/2005CN1213279C Multifunctional electronic speckle interferometer including semiconductor pump and total solid laser
08/02/2005US6924898 Phase-shifting interferometry method and system
08/02/2005US6924895 Sensor for optically sensing air borne acoustic waves
08/02/2005US6924894 Temperature compensated interferometer
07/2005
07/28/2005WO2005069082A1 Differential critical dimension and overlay metrology apparatus and measurement method
07/28/2005WO2005067579A2 Multi-axis interferometers and methods and systems using multi-axis interferometers
07/28/2005WO2005033643A3 Rugged fabry-perot pressure sensor
07/28/2005WO2004068088A3 Optical characterization of surfaces and plates
07/28/2005US20050166118 Cyclic error compensation in interferometry systems
07/28/2005US20050162664 Compensation for errors in off-axis interferometric measurements
07/28/2005US20050162662 Method and device for measuring wall thickness of a pipe in a pipe-rolling mill
07/28/2005US20050162659 Optical interferometer
07/28/2005US20050162658 Terahertz modulation spectrometer
07/28/2005DE10392876T5 Mehrstufige Datenverarbeitung für Frequenzabtastinterferometer Multilevel Data processing Frequenzabtastinterferometer
07/28/2005DE10361522A1 Optisches System Optical system
07/28/2005DE10360570A1 Optisches Meßsystem und optisches Meßverfahren An optical measurement system and optical measurement technique
07/28/2005DE10317826B4 Verfahren und Vorrichtung zur interferometrischen Messung Method and apparatus for interferometric measurement
07/27/2005EP1556930A2 Laser system using ultrashort laser pulses
07/27/2005EP1556666A2 Two-wavelength confocal interferometer for measuring multiple surfaces
07/27/2005CN1645036A Self-mixed interference displacement sensor based on two-way laser
07/26/2005US6922250 Optical multiplex short coherence interferometry on the eye
07/26/2005US6922249 Beam masking to reduce cyclic error in beam launcher of interferometer
07/21/2005WO2005066998A1 Interference instrument
07/21/2005WO2004068554A3 Analysis and monitoring of stresses in embedded lines and vias integrated on substrates
07/21/2005US20050157953 Method and system for size calibration
07/21/2005US20050157313 Shear inducing beamsplitter for interferometric image processing
07/21/2005US20050157311 Scanning interferometer for aspheric surfaces and wavefronts
07/21/2005US20050157310 Method and apparatus for simultaneously measuring displacement and angular variations
07/21/2005US20050157281 Off-axis levelling in lithographic projection apparatus
07/21/2005US20050156100 Method and system for optically tracking a target using an interferometric technique
07/21/2005DE10392828T5 Interferometrieverfahren und -systeme mit gekoppelter Hohlraumgeometrie zur Verwendung mit einer erweiterten Quelle Interferometry and systems with coupled cavity geometry for use with an extended source
07/21/2005DE10360078A1 Optische Messvorrichtung Optical measuring device
07/21/2005DE10301607B4 Interferenzmesssonde Interference measuring probe
07/20/2005EP1554539A2 Imaging systems
07/20/2005EP1554538A1 Interferometer monitoring
07/20/2005CN1643338A Optical displacement sensor
07/14/2005WO2005062941A2 Multi-channel laser interferometric method and apparatus for detection of ultrasonic motion from a surface
07/14/2005WO2005008334A3 Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology
07/14/2005US20050152030 Orientation independent differential interference contrast microscopy technique and device
07/14/2005US20050151975 Fabry-perot fiber optic sensing device and method
07/14/2005DE202004020220U1 Abstandsmessgerät mit Laseranzeigeeinrichtung Distance meter with laser display device
07/14/2005DE19738900B4 Interferometrische Meßvorrichtung zur Formvermessung an rauhen Oberflächen Interferometric measurement device for shape measurement on rough surfaces
07/14/2005DE10392881T5 Frequenzabtast-Interferometer mit nicht spiegelnder Referenzoberfläche Frequency sample interferometer with non-reflective reference surface
07/14/2005DE102004042812A1 Phasenkompensierte Würfelecke bei der Laserinterferometrie Phase-compensated cube corner by the laser interferometry
07/12/2005US6917432 Interferometers for measuring changes in optical beam direction
07/07/2005WO2005062103A1 Optical system with a cameras device for viewing several objects arranged remotely from each other
07/07/2005WO2005061986A1 Optical measuring device for heterodyn interferometric surface measurements
07/07/2005WO2005060823A1 Optical measuring system and optical measuring method
07/07/2005WO2005060677A2 Interferometric microscopy using reflective optics for complex surface shapes
07/07/2005US20050146796 Polarizing beamsplitter
07/07/2005US20050146730 Coherent beam device for observing and measuring sample
07/07/2005US20050146727 Multi-axis interferometers and methods and systems using multi-axis interferometers
07/06/2005EP1549904A1 Device for measuring an optical path length difference
07/06/2005CN1635395A Two-photon-confocal optical manufacturing equipment for 3D micromachining or high-density information storage and method thereof
07/06/2005CN1635332A 改进型迈克尔逊干涉仪 Modified Michelson interferometer
07/05/2005US6914682 Interferometer and position measuring device
07/05/2005US6914681 Interferometric optical component analyzer based on orthogonal filters
06/2005
06/30/2005WO2005043073A3 Reconfigureable interferometer system
06/30/2005US20050140986 Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby
06/30/2005US20050140983 Device for high-accuracy measurement of dimensional changes
06/30/2005US20050140982 Method and apparatus for performing second harmonic optical coherence tomography
06/30/2005US20050140981 Measurement of optical properties
06/29/2005EP1546768A2 Laser system
06/29/2005EP1546647A1 Laser interferometer for repeatable mounting on the wall of a vacuum chamber
06/29/2005EP1546646A1 Interferometric measuring device
06/29/2005EP1546645A2 Interferometric measuring device
06/29/2005EP1206675B1 Fabrication of fabry-perot polymer film sensing interferometers
06/29/2005CN1633582A Systems and methods for inspection of ophthalmic lenses
06/29/2005CN1632451A Composite coding multiresolution three-dimensional digital imaging method
06/29/2005CN1632450A X-ray speckle device and application thereof in microdisplacement measurement
06/28/2005US6912055 Spherical form measuring and analyzing method
06/28/2005US6912053 Ring laser scatterometer
06/28/2005US6912052 Gas discharge MOPA laser spectral analysis module
06/23/2005WO2005057128A1 Device for interaction-free measurements
06/23/2005US20050134863 Interferometric microscopy using reflective optics for complex surface shapes
06/23/2005US20050134862 Characterization and compensation of errors in multi-axis interferometry systems
06/22/2005EP1543292A1 Interferometer optical element alignment
06/21/2005US6909512 Method and apparatus for estimating piston using a grism