Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
03/2006
03/16/2006US20060058682 Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
03/16/2006US20060056784 Coherence microscope
03/16/2006US20060056468 Control system and apparatus for use with ultra-fast laser
03/16/2006US20060055940 Phase measuring method and apparatus for measuring characterization of optical thin films
03/16/2006US20060055937 Multi-beam heterodyne laser Doppler vibrometer
03/16/2006US20060055936 System and method for optical coherence imaging
03/16/2006US20060055935 Wavelength dispersive fourier transform spectrometer
03/16/2006US20060055915 Measuring apparatus, test reticle, exposure apparatus and device manufacturing method
03/16/2006DE4204601B4 Vorrichtung zum Erfassen von Lageinformationen mit einer optischen Beobachtungseinheit und Verfahren zur Ermittlung von Lageinformationen An apparatus for detecting position information with an optical viewing unit and method for determining location information
03/16/2006DE102004038239A1 Luftfeder mit integrierter optischer Höhenstandssensorik Air suspension with integrated optical ride height sensors
03/16/2006DE102004038186A1 Verfahren zum Vermessen von Oberflächen mittels einer interferometrischen Anordnung Method for measuring surfaces using an interferometric arrangement
03/15/2006EP1635137A1 Optical device for studying an object
03/15/2006EP1634035A2 Interferometric measuring device
03/15/2006CN1746616A Optical signall processor and process thereof
03/15/2006CN1245605C Device for measuring 2D displacement
03/14/2006US7012939 Wavelength stabilization module having light-receiving element array and method of manufacturing the same
03/14/2006US7012700 Interferometric optical systems having simultaneously scanned optical path length and focus
03/14/2006US7012698 Method and arrangement for contactless determination of geometric and optical characteristics
03/14/2006US7012697 Heterodyne based optical spectrum analysis with controlled optical attenuation
03/14/2006US7012696 Optical heterodyne detection in optical cavity ringdown spectroscopy
03/14/2006US7012695 Method and apparatus for multiwavelength imaging spectrometer
03/14/2006US7012245 Calculation of sensor array induced phase angle
03/14/2006CA2316984C Spectral imaging apparatus and methodology
03/09/2006WO2006025759A1 Interferometric device (variants)
03/09/2006WO2005114150B1 Low coherence interferometric system for optical metrology
03/09/2006WO2005114149B1 Low coherence interferometry utilizing phase
03/09/2006WO2005031397A3 Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces
03/09/2006WO2005008199A3 Method and apparatus for compact fabry-perot imaging spectrometer
03/08/2006EP1631788A1 Digital holographic microscope for 3d imaging and process using it
03/08/2006EP1502332B1 Optical arrangement for generating a broadband spectrum
03/08/2006EP0963540B1 System and method for laser ultrasonic bond integrity evaluation
03/08/2006CN1743793A Holographic phase difference amplifying restructuring device based on sagnac interferometer
03/08/2006CN1743792A Interferometer for measuring virtual contact surfaces
03/07/2006US7009716 System for monitoring optical output/wavelength
03/07/2006US7009715 Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed
03/07/2006US7009714 Method of dry etching a sample and dry etching system
03/07/2006US7009713 Optical position measuring system using an interference pattern
03/07/2006US7009712 Leaky guided wave modes used in interferometric confocal microscopy to measure properties of trenches
03/07/2006US7009711 Retroreflector coating for an interferometer
03/07/2006US7009710 Direct combination of fiber optic light beams
03/07/2006US7009709 Active control of two orthogonal polarizations for heterodyne beam delivery
03/07/2006US7009708 Symmetric periscope for concentric beam configuration in an ultra-high precision laser interferometric beam launcher
03/07/2006US7009707 Apparatus and method of sensing fluid flow using sensing means coupled to an axial coil spring
03/07/2006US7009691 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
03/02/2006WO2006023634A2 Multiple reference non-invasive analysis system
03/02/2006WO2006023614A2 Frequency resolved imaging system
03/02/2006WO2006023523A2 System and method for optical measurement
03/02/2006WO2006023489A2 Cyclic error compensation in interferometry systems
03/02/2006WO2006023406A2 Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry
03/02/2006WO2006023345A2 System for rotation measurement with laser interferometry
03/02/2006WO2005106382A3 Optical transducer for detecting liquid level and electronic circuit therefor
03/02/2006US20060044566 Interferometric Optical Apparatus And Method Using Wavefront Division
03/02/2006US20060044549 Smart spacecraft structures based on laser metrology
03/02/2006US20060044536 Exposure apparatus equipped with interferometer and exposure apparatus using the exposure apparatus
03/01/2006EP1630520A2 Apparatus and method of heterodyne interferometry for imaging
03/01/2006EP1546645B1 Interferometric measuring device
03/01/2006CN1740738A Inner three-directional moire interferometer
03/01/2006CN1243952C Position phase-difference enlarger of combined interferometer
03/01/2006CN1243951C Interferometer equipment and measurement method in interferometer
02/2006
02/28/2006US7006562 Phase demodulator, phase difference detector, and interferometric system using the phase difference detector
02/28/2006US7006234 Common-path point-diffraction phase-shifting interferometer incorporating a birefringent polymer membrane
02/28/2006US7006233 Method of detecting a distortion on a surface
02/28/2006US7006232 Phase-referenced doppler optical coherence tomography
02/28/2006US7006231 Diffraction grating based interferometric systems and methods
02/28/2006US7006230 Interferometric method and apparatus for the characterization of optical pulses
02/23/2006WO2006020776A2 Method and apparatus for interferometric measurement of components with large aspect ratios
02/23/2006WO2005070166A3 Method and system for optically tracking a target using an interferometric technique
02/23/2006US20060039009 Chip-size wavelength detector
02/23/2006US20060039007 Vibration-insensitive interferometer
02/23/2006US20060039006 Polarizing beam splitter device, interferometer module, lithographic apparatus, and device manufacturing method
02/23/2006US20060039005 Differential interferometers creating desired beam patterns
02/23/2006US20060039004 Process, system and software arrangement for determining at least one location in a sample using an optical coherence tomography
02/23/2006DE20221476U1 Automatic regulation of focus and lighting and optical sensing of edge position for precision optical measurement involves determining weighted sum of individual auxiliary parameters
02/23/2006DE10258248B4 System zur interferometrischen Passeprüfung System for interferometric testing Passe
02/23/2006DE102004039410A1 Verfahren und Vorrichtung zur Regelung eines automatischen Bearbeitungsprozesses Method and apparatus for controlling an automatic machining process
02/22/2006CN1737494A Surface profile analytical method for object needing measure
02/22/2006CN1737492A Multidimensional adjustable optical image moving device
02/22/2006CN1243213C X ray interferometer with twin zone plates
02/21/2006US7003186 Waveguide-based optical interferometer
02/21/2006US7002697 Tunable optical instruments
02/21/2006US7002696 Band pass interferometer with tuning capabilities
02/21/2006US7002695 Dual-spot phase-sensitive detection
02/21/2006US7002694 Interferometer system and method for recording an interferogram using weighted averaging over multiple frequencies, and method for providing and manufacturing an object having a target surface
02/21/2006US7002693 Thickness measurement method and apparatus
02/21/2006US7002692 Infrared circular dichroism measuring apparatus and infrared circular dichroism measuring method
02/21/2006US7002691 Spatially-heterodyned holography
02/21/2006US7000477 Optical pressure sensor
02/16/2006WO2006017837A2 Process, system and software arrangement for determining at least one location in a sample using an optical coherence tomography
02/16/2006US20060033934 Method and apparatus for interferometric measurement of components with large aspect ratios
02/16/2006US20060033933 Method and device for wave-front sensing
02/16/2006US20060033932 Scatterometry by phase sensitive reflectometer
02/16/2006US20060033931 System and method for three-dimensional measurement
02/16/2006US20060033930 Time-resolved nonlinear complex sensitivity measuring instrument
02/16/2006US20060033929 Phase measuring method and apparatus for multi-frequency interferometry
02/16/2006US20060033928 Method and apparatus for measuring the absorption coefficient and the reduced scattering coefficient of a multiple scattering medium
02/16/2006US20060033927 Heterodyne optical spectrum analyzer
02/16/2006US20060033926 Spatially distributed spectrally neutral optical attenuator
02/16/2006US20060033925 Interferometric measuring device
02/16/2006US20060033924 Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry
02/16/2006US20060033923 Autonomous ultra-short optical pulse compression, phase compensating and waveform shaping device
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