Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
06/2003
06/10/2003US6577402 Sensor and method for measuring changes in environmental conditions
06/10/2003US6577400 Interferometer
06/05/2003US20030103215 Scanning interferometer for aspheric surfaces and wavefronts
06/05/2003US20030103212 Real-time imaging system and method
06/05/2003US20030103211 Sensor and method for detecting fiber optic faults
06/03/2003US6573997 Hybrid shearing and phase-shifting point diffraction interferometer
06/03/2003US6573996 Method and apparatus for enhanced precision interferometric distance measurement
05/2003
05/30/2003WO2003044598A1 Compensating for effects of variations in gas refractivity in interferometers
05/30/2003WO2003044502A1 Method and apparatus for three-dimensional compositional mapping of heterogeneous materials
05/30/2003WO2003044456A1 Scanning interferometer for aspheric surfaces and wavefronts
05/30/2003WO2003044455A1 Rapid in situ mastering of an aspheric fizeau
05/29/2003US20030099264 Laser system using ultrashort laser pulses
05/29/2003US20030098982 Truncated series-based resonant cavity interferometer
05/29/2003US20030098981 System and method for interferometer non-linearity compensation
05/28/2003EP1314953A2 Interferometer and interferometric measuring procedure
05/27/2003US6570661 Optical system for oblique incidence interferometer and apparatus using the same
05/27/2003US6570660 Measuring instrument
05/27/2003US6570658 Optical part driving device incorporated into a detachable block and optical interferometer including same
05/22/2003WO2003042628A1 Apparatus and method for calibrating an interferometer
05/22/2003US20030095266 Method and apparatus for three-dimensional compositional mapping of heterogeneous materials
05/22/2003US20030095265 Interferometric cyclic error compensation
05/22/2003US20030095262 Optical interferometric sensor with optical error compensation
05/22/2003US20030095261 Tuning and temperature compensation of the air-gap etalon for dense wavelength-division multiplexing application
05/21/2003EP1312912A1 Light track observing device
05/21/2003CN1419103A Apparatus and method for raising location accuracy of laser heterodyne difference interferometer
05/15/2003WO2003040648A1 Interferometric cyclic error compensation
05/15/2003WO2003001143A3 Apparatus and method for measuring aspherical optical surfaces and wavefronts
05/15/2003US20030090798 Apparatus and method for calibrating an interferometer using a selectively rotatable sphere
05/15/2003US20030090679 Ultra small spot generator
05/15/2003US20030090678 Rapid in situ mastering of an aspheric fizeau with residual error compensation
05/15/2003US20030090677 Methods and apparatus for interferometric dimensional metrology
05/15/2003US20030090675 Interferometric methods and apparatus for determining object position while taking into account rotational displacements and warping of interferometer mirrors on the object
05/15/2003US20030090674 System and method for performing selected optical measurements
05/15/2003US20030090673 Birefringent Mach-Zehnder interferometer
05/14/2003EP0920696B1 Phase-controlled evanescent field systems and methods
05/14/2003CN1417556A Transverse double-frequency zeeman laser linearity/coaxality measuring mechanism
05/14/2003CA2372860A1 Fiber optic sensor usable over wide range of gage lengths
05/13/2003US6564089 Optical imaging device
05/13/2003US6564087 Fiber optic needle probes for optical coherence tomography imaging
05/13/2003US6563967 Fiber optic displacement sensor
05/13/2003US6563593 Dynamic angle measuring interferometer
05/13/2003US6563573 Method of evaluating imaging performance
05/08/2003WO2003038953A1 System and method for measuring stimuli using vcsel
05/08/2003WO2003038410A1 Optical scanning type observation device
05/08/2003US20030086094 Microforce measurement method and apparatus
05/08/2003US20030086093 All fiber autocorrelator
05/07/2003EP1307702A1 Frequency transform phase shifting interferometry
05/07/2003CN1416554A Optical input device for measuring finger movement
05/06/2003US6560032 Liquid immersion lens system and optical apparatus using the same
05/06/2003US6559952 System for interferometric distortion measurements that define an optical path
05/06/2003US6559951 Air refractometer
05/06/2003US6559947 Reference fringe counting fourier transform spectroscopy
05/06/2003US6559946 Method and apparatus to minimize effects of ASE in optical measurements
05/01/2003WO2003036229A1 Surface shape measuring method and device therefor
05/01/2003WO2003036226A1 Position measuring device
05/01/2003WO2003036225A1 Method for biomolecular sensing and system thereof
05/01/2003WO2003036223A1 Interferometers for measuring changes in optical beam direction
05/01/2003US20030081875 System and method for measuring physical, chemical and biological stimuli using vertical cavity surface emitting lasers with integrated tuner
05/01/2003US20030081222 Interferometer and position measuring device
05/01/2003US20030081221 Apparatus and method for measuring optical activity
05/01/2003US20030081220 Diffraction grating based interferometric systems and methods
05/01/2003US20030081218 Gravity and differential gravity sensor, and system and method for monitoring reservoirs using same
04/2003
04/30/2003CN2548118Y Interferometer continuous variable-focus imaging apparatus
04/30/2003CN1415083A Improvements to acquistion and replay system for direct-to-digital holography and holovision
04/30/2003CN1415067A Method and device for non-destructive inspection of objects by means of optical holographic interferometry measurement technology
04/30/2003CN1415066A Method and device for real non-destructive determination of residual stresses in objects by optical holographic interferometry technique
04/30/2003CN1414420A Method and device of 3D digital imaging with dynamic multiple resolution ratio
04/29/2003US6556509 Demodulator and method for interferometric outputs of increased accuracy
04/29/2003US6556305 Pulsed source scanning interferometer
04/29/2003US6556304 Method of supporting reference plate for lightwave interferometer
04/24/2003WO2003034009A2 Optical interferometric sensor with optical error compensation
04/24/2003WO2003033994A1 Measurement of complex surface shapes using a spherical wavefront
04/24/2003WO2002075384A3 Variable filter-based optical spectrometer
04/24/2003WO2002070984A8 Spectral imaging for vertical sectioning
04/24/2003US20030076506 Optical coherence interferometry and coherence tomography with spatially partially coherent light sources
04/24/2003US20030076504 Interferometric-based external measurement system and method
04/24/2003US20030076502 Method and apparatus for locking the transmission wavelength in optical communication laser packages
04/23/2003EP1303778A2 Differential interferometric scanning near-field confocal microscopy
04/23/2003EP1303736A2 Systems and methods for quantifying nonlinearities in interferometry systems
04/22/2003US6552808 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
04/22/2003US6552806 Automated minimization of optical path difference and reference mirror focus in white-light interference microscope objective
04/22/2003US6552804 Apparatus and method for interferometric measurements of angular orientation and distance to a plane mirror object
04/22/2003US6552803 Detection of film thickness through induced acoustic pulse-echos
04/22/2003US6552801 Optical interferometer
04/22/2003US6552800 Single-arm sagnac interferometer with two beam splitters
04/22/2003US6552799 Two-arm sagnac interferometer with two beam splitters
04/22/2003US6552798 Position detecting method and system for use in exposure apparatus
04/22/2003US6552796 Apparatus and method for selective data collection and signal to noise ratio enhancement using optical coherence tomography
04/17/2003WO2003004962A3 Multi-axis interferometer
04/17/2003WO2002046691A9 Monolithic corrector plate
04/17/2003US20030072007 Optical multiplex short coherence interferometry on the eye
04/17/2003US20030072006 Gires-tournois interferometer with faraday rotators for optical signal interleaver
04/17/2003US20030072005 Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring
04/17/2003US20030070475 Ultra micro indentation testing apparatus
04/17/2003DE10207186C1 Low coherence interferometry device for object scanning has variable wavelength selection device used for varying selected wavelengths of detection beam dependent on scanning position
04/16/2003EP1302803A2 Method and arrangement for high resolution optical detection of samples
04/16/2003EP1301751A1 Low-coherence interferometric device for depth scanning an object
04/16/2003EP0961914B1 Interferometer system with two wavelengths, and lithographic apparatus provided with such a system
04/16/2003EP0740769B1 Heterodyne interferometer with second harmonic correction
04/16/2003CN1411587A Method of measuring movement of input device
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