Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
04/2003
04/16/2003CN1410747A Lens tester
04/15/2003US6549801 Phase-resolved optical coherence tomography and optical doppler tomography for imaging fluid flow in tissue with fast scanning speed and high velocity sensitivity
04/15/2003US6549687 System and method for measuring physical, chemical and biological stimuli using vertical cavity surface emitting lasers with integrated tuner
04/15/2003US6549547 Ultrashort-pulse source with controllable multiple-wavelength output
04/15/2003US6549285 Two-arm Sagnac interferometer with three beam splitters
04/10/2003WO2003029751A1 Method and device for measuring point diffraction interference
04/10/2003US20030067611 Point-diffraction interferometer
04/10/2003US20030067607 Method and arrangement for the depth-resolved detection of specimens
04/09/2003EP1200797B1 Apparatus and method for the non-destructive testing of articles using optical metrology
04/08/2003US6545763 Method for measuring a thickness profile and a refractive index using white-light scanning interferometry and recording medium therefor
04/08/2003US6545761 Embedded interferometer for reference-mirror calibration of interferometric microscope
04/08/2003US6545260 Light scanning optical device which acquires a high resolution two-dimensional image without employing a charge-coupled device
04/03/2003WO2002012825A9 Frequency transform phase shifting interferometry
04/03/2003US20030063290 Non-etalon wavelength locking optical sub-assembly and assoicated methods
04/03/2003US20030063267 Interferometer system for a semiconductor exposure system
04/02/2003EP1298410A1 Method for measuring interference and apparatus for measuring interference
04/02/2003EP1082580B1 Modulation interferometer and fiberoptically divided measuring p robe with light guided
04/02/2003CN1408064A Method measuring movement of material sheet and optical sensor therefor
04/01/2003US6542247 Multi-axis interferometer with integrated optical structure and method for manufacturing rhomboid assemblies
04/01/2003US6542246 Blood vessel imaging system
04/01/2003US6542243 Resonator optics monitoring method
04/01/2003US6541759 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance and employing optical fibers for remote photoelectric detection
03/2003
03/26/2003EP1296367A1 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them
03/26/2003CN2541816Y Large vision field image measuring microscope
03/25/2003US6538747 Flexure hinge phase shift adapter for fizeau interferometer
03/25/2003US6538746 Method and device for measuring absolute interferometric length
03/25/2003US6537832 Measuring apparatus and film formation method
03/20/2003WO2003023320A1 Suppressed drift interferometer
03/20/2003WO2003005067A3 Method and apparatus to reduce effects of sheared wavefronts on interferometric phase measurements
03/20/2003WO2002088705A3 Method and apparatus for determination of atherosclerotic plaque type by measurement of tissue optical properties
03/20/2003WO2002061799A3 Control system and apparatus for use with laser excitation or ionization
03/20/2003US20030053079 Optical interferometry
03/20/2003US20030053073 Passive zero shear interferometers
03/20/2003US20030053072 Arrangements for coherence topographic ray tracing on the eye
03/20/2003US20030053071 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
03/20/2003US20030053069 Method and system for measuring optical characteristics of a sub-component within a composite optical system
03/20/2003US20030053068 Interferometric optical component analyzer based on orthogonal filters
03/19/2003EP1292805A1 Measuring device for detecting the dimensions of test samples
03/19/2003EP0907875B1 Fringe pattern discriminator for interferometer using diffraction gratings
03/18/2003US6535290 Optical position measuring device with a beam splitter
03/13/2003US20030048456 Multiple-pass interferometry
03/13/2003US20030048454 Interferometric measuring device
03/12/2003EP1290485A2 Microscope and method for measuring surface topography in a quantitative and optical manner
03/11/2003US6532073 Fringe analysis error detection method and fringe analysis error correction method
03/06/2003WO2003019113A1 Apparatus for optically monitoring safety structure
03/06/2003WO2003019112A1 Optical interferometry
03/06/2003WO2003019111A1 Dynamic interferometric controlling direction of input beam
03/06/2003WO2003019110A1 Multiple-pass interferometry
03/06/2003WO2003019109A1 Tilted interferometer
03/06/2003US20030043385 Scanning interferometer for aspheric surfaces and wavefronts
03/06/2003US20030043384 Dynamic interferometer controlling direction of input beam
03/06/2003US20030043380 Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer
03/06/2003US20030043372 Apparatus for determining an overlay error and critical dimensions in a semiconductor structure by means of scatterometry
03/05/2003EP1288641A1 Polarisation interferometer
03/05/2003EP1287593A1 Gas laser and optical system
03/04/2003US6529279 Interferometer and method for measuring the refractive index and optical path length effects of air
03/04/2003US6529278 Optical interference apparatus and position detection apparatus
02/2003
02/27/2003WO2003016815A1 In-situ mirror characterization
02/27/2003US20030039428 Optical fiber interferosensor, signal-processing system for optical fiber interferosensor and recording medium
02/27/2003US20030038949 Microinterferometers with performance optimization
02/27/2003US20030038947 Tilted interferometer
02/27/2003US20030038943 Method and apparatus for measuring wavelength jitter of light signal
02/27/2003US20030037616 Method for vibration measurement and interferometer
02/26/2003EP1286201A2 Alignment method for optimizing extinction ratios of coated polarizing beam splitters
02/26/2003EP1286150A2 Interferometric optical component analyzer based on orthogonal filters
02/26/2003EP1286133A2 Direct combination of fiber optic light beams
02/26/2003EP1286132A2 Birefringent beam combiners for polarized beams in interferometers
02/26/2003EP1285223A2 Data age adjustments
02/26/2003EP1285222A1 Interferometric apparatus and method
02/26/2003EP1285221A1 In-situ mirror characterization
02/25/2003US6525826 Interferometer and method for measuring the refractive index and optical path length effects of air
02/25/2003US6525825 Interferometer and method for measuring the refractive index and optical path length effects of air
02/25/2003US6525824 Dual beam optical interferometer
02/25/2003US6525821 Acquisition and replay systems for direct-to-digital holography and holovision
02/25/2003US6525814 Apparatus and method for producing a spectrally variable radiation source and systems including same
02/25/2003US6524871 Defect inspection apparatus and defect inspection method
02/20/2003WO2003014827A1 An interferometer system for a semiconductor exposure system
02/20/2003WO2003014774A2 Amplified tree structure technology for fiber optic sensor arrays
02/20/2003WO2003014674A2 Two delay coil sagnac-based sensor array
02/20/2003WO2003014663A1 Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping
02/20/2003WO2003014656A1 Increase of the long-term operational reliability of a fibre optic interferometer by protecting the light source
02/20/2003US20030035566 Phase unwrapping method for fringe image analysis
02/20/2003US20030035118 Optical measurement and inspection method and apparatus having enhanced optical path difference detection
02/20/2003US20030035114 In-situ mirror characterization
02/20/2003US20030035113 Quadrature phase shift interferometer with unwrapping of phase
02/20/2003US20030035112 Birefringent beam combiners for polarized beams in interferometers
02/20/2003US20030035111 Alignment method for optimizing extinction ratios of coated polarizing beam splitters
02/19/2003EP0941448B1 Interferometric measurement of positions, position changes and physical quantities derivated therefrom
02/18/2003US6522410 Method for processing low coherence interferometric data
02/18/2003US6522407 Optical detection dental disease using polarized light
02/13/2003WO2003012367A1 Passive zero shear interferometers
02/13/2003WO2003012366A1 Common element confocal interferometer
02/13/2003WO2003011764A2 Real-time imaging system and method
02/13/2003US20030030819 Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer
02/13/2003US20030030818 Multi-axis interferometer
02/13/2003US20030030816 Nonlinearity error correcting method and phase angle measuring method for displacement measurement in two-freqency laser interferometer and displacement measurement system using the same
02/12/2003CN1396435A Photoelectric detection method and device based on orthogonal dual polarized light beams for rolled angle
02/12/2003CN1396434A Internally focusing telescope for regulating raster resonator of infrared laser device
02/12/2003CN1395902A Cornea measuring equipment by optical coherent chromatography X-ray photographic method
02/11/2003US6519074 Electrostatically-actuated tunable optical components using entropic materials
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