Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
08/2003
08/14/2003US20030151750 Compensating for effects of variations in gas refractivity in interferometers
08/14/2003US20030151749 Interferometric optical surface comparison apparatus and method thereof
08/14/2003DE10203797C1 Three-dimensional interferometric measuring method allows evaluation of depth information for interesting area of camera image selected via defined criteria
08/13/2003EP1334464A1 Optical input device for measuring finger movement
08/13/2003EP1334463A1 Method of measuring the movement of an input device.
08/13/2003EP1285221A4 In-situ mirror characterization
08/13/2003CN1117963C Method for achieving nanometer measurement utilizing synthetic wavelength method
08/12/2003US6606182 Tuning and temperature compensation of the air-gap etalon for dense wavelength-division multiplexing application
08/12/2003US6606159 Optical storage system based on scanning interferometric near-field confocal microscopy
08/07/2003WO2003065119A2 Overlay measurements using periodic gratings
08/07/2003WO2003064977A2 Multiple degree of freedom interferometer
08/07/2003WO2003064968A1 Multiple-pass interferometry
08/07/2003WO2003064967A1 Interferometry method based on changing frequency
08/07/2003WO2003064966A1 Interference measuring method, interference measuring device, production method for projection optical system, projection optical system, and projection aligner
08/07/2003WO2003064962A2 Multi-axis interferometer
08/07/2003WO2003036225A9 Method for biomolecular sensing and system thereof
08/07/2003US20030147083 Optical storage system based on scanning interferometric near-field confocal microscopy
08/07/2003US20030147082 Interferometric patterning for lithography
08/06/2003EP1332332A2 Height scanning interferometry method and apparatus including phase gap analysis
08/06/2003EP1332331A1 Interferometric sensor and method to detect optical fields
08/06/2003EP0832417B1 Method for simultaneous detection of multiple fluorophores for in situ hybridization and chromosome painting
08/05/2003US6603562 Two-dimensional positioning apparatus and method for measuring laser light from the apparatus
08/05/2003US6603560 High sensitivity fiber optic interferometric MEMS
08/05/2003US6603559 Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring
07/2003
07/31/2003WO2003062802A2 Apparatus and method for rangings and noise reduction of low coherence interferometry lci and optical coherence tomography (oct) signals by parallel detection of spectral bands
07/31/2003WO2003062743A1 Improved spatial wavefront analysis and 3d measurement
07/31/2003WO2003062739A2 Method and apparatus for compensation of time-varying optical properties of gas in interferometry
07/31/2003US20030144807 System and method for heterodyne interferometer high velocity type non-linearity compensation
07/31/2003US20030142934 Endoscopic imaging system
07/31/2003US20030142321 Positioning stage device
07/31/2003US20030142318 Spectral image input device
07/31/2003US20030142317 Interferometry method based on changing frequency
07/31/2003CA2474331A1 Apparatus and method for rangings and noise reduction of low coherence interferometry lci and optical coherence tomography (oct) signals by parallel detection of spectral bands
07/30/2003EP1330628A1 Method for correcting physical errors in measuring microscopic objects
07/30/2003EP0981717B1 Interferometer tunable by pancharatnam phase with separate analyzer
07/30/2003EP0883791B1 Interferometer of Fabry-Perot type with possible zero spacing
07/29/2003US6600568 System and method of measuring image sensor chip shift
07/29/2003US6600564 Device and method for optical path length measurement
07/24/2003WO2003060588A1 Method and device for microscopic display with local probes of a three-dimensional object
07/24/2003WO2003060422A2 Interferometric optical system
07/24/2003WO2002091116A3 Apparatus and method for measuring intensity and phase of a light pulse with an interferometric asymmetric single-shot autocorrelator
07/24/2003WO2002071042B1 Frequency-encoded parallel oct and associated systems and methods
07/24/2003US20030137671 Apparatus and method for mechanical phase shifting interferometry
07/24/2003CA2472651A1 Method and device for microscopic display with local probes of a three-dimensional object
07/23/2003EP1328772A1 Optical coherence interferometry and coherence tomography with spatially partially coherent light sources
07/23/2003CN1431478A Micro displacement real time interferometry apparatus
07/23/2003CN1431463A High power holographic phase difference amplifying device
07/23/2003CN1431462A Frequency shift without chromatic aberration of wideband light source and device generation interferential heterodgne signal
07/23/2003CN1431459A Dual frequency laser synthesized wavelength interferometer
07/22/2003US6597505 Apparatus for producing and guiding a light beam
07/22/2003US6597461 Tunable fabry-perot interferometer using entropic materials
07/22/2003US6597460 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum
07/22/2003US6597459 Data age adjustments
07/22/2003US6597458 Method and system for stabilizing and demodulating an interferometer at quadrature
07/22/2003US6597453 Computer joystick
07/22/2003US6597442 Apparatus for measuring aberration of a lens and an apparatus for adjusting a position of the lens
07/17/2003WO2003058163A1 System and method for inspection using white light intererometry
07/17/2003WO2003050470A3 Phase-shifting interferometry method and system
07/17/2003US20030133219 Interference device, position detecting device, positioning device and information recording apparatus using the same
07/17/2003US20030133125 Alignment stage, exposure apparatus, and semiconductor device manufacturing method
07/10/2003WO2003055383A1 Systems and methods for processing signals from an interferometer by an ultrasound console
07/10/2003US20030128369 Compensating for effects of non-isotropic gas mixtures in interferometers
07/10/2003US20030128367 Alignment sensor
07/10/2003US20030128366 Imaging systems
07/10/2003US20030128334 Apparatus and method for customized laser correction of refractive error
07/10/2003CA2459254A1 Systems and methods for processing signals from an interferometer by an ultrasound console
07/09/2003CN2559962Y Incremental coder for projector
07/08/2003US6590664 Interferometer with optical fiber interconnected dual arm sampler
07/03/2003WO2003054474A1 Method and apparatus for calibrating a wavelength-tuning interferometer
07/03/2003US20030123784 Optical interferometer generating a mode-locked laser oscillation, all-optical switch, all-optical asymmetric demultiplexer and all-optical pulse reshaping apparatus
07/03/2003US20030123125 Detunable Fabry-Perot interferometer and an add/drop multiplexer using the same
07/03/2003US20030121889 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them
07/03/2003DE19651667C2 Vorrichtung zur dreidimensionalen Untersuchung eines Objektes Apparatus for three-dimensional examination of an object
07/02/2003EP1324006A1 Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer )
07/02/2003EP1324004A2 Phase noise compensation in an interferometric system
07/02/2003EP1322907A2 Optical device
07/02/2003CN2558954Y Micro diamond needle detecting apparatus and imaging device thereof
07/02/2003CN1427242A Apparatus and method for measuring non-spheric surface with hologram and concave surface
07/01/2003US6587206 Method for characterizing particles in a liquid medium using interferometry
06/2003
06/26/2003WO2003052345A1 System and method for measuring optical distance
06/26/2003US20030117632 Method for self-calibrated sub-aperture stitching for surface figure measurement
06/26/2003US20030117631 Interferometers for measuring changes in optical beam direction
06/25/2003EP1321738A2 Interferometric system and method for measuring length
06/25/2003EP0977973B1 Circuitry for processing signals occurring in a heterodyne interferometer
06/25/2003EP0894239B1 Object fixturing in interferometer
06/25/2003CN2557920Y Improved microscale microscope
06/24/2003US6584241 Fast, environmentally-stable fiber switches using a Sagnac interferometer
06/19/2003WO2003050590A1 Endoscopic imaging system
06/19/2003WO2003050470A2 Phase-shifting interferometry method and system
06/19/2003US20030115004 Laser measurement system with digital delay compensation
06/19/2003US20030112446 Method for biomolecular sensing and system thereof
06/19/2003US20030112444 System and method for measuring optical distance
06/19/2003US20030112442 Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser
06/17/2003US6580514 Non-contact silicon melt surface evaluation method and system
06/17/2003US6580512 Method of producing an optical fibre resonant cavity, in particular for an interferometric sensor, and optical fibre resonant cavity produced thereby
06/12/2003WO2003048746A1 Sensor and method for detecting fiber optic faults
06/12/2003WO2003048681A1 Compensating for effects of non-isotropics gas mixtures in interferometers
06/12/2003WO2003048680A1 A method of alignment by using interferometry
06/12/2003US20030107744 Interferometer arrangement and interferometric measuring method
06/12/2003US20030107743 Phase noise compensation in an interferometric system
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