| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 04/08/2003 | US6545284 Face position detection method and apparatus, and exposure method and exposure apparatus, a production method for an exposure apparatus and a production method for a semiconductor device |
| 04/08/2003 | US6545279 Surface state monitoring method and apparatus |
| 04/08/2003 | US6545261 Fiber optic alignment system and method |
| 04/08/2003 | US6543280 Remote sensing and measurement of distances along a borehole |
| 04/08/2003 | US6543145 Wheel alignment apparatus |
| 04/03/2003 | WO2003028360A2 Three dimensional scanning camera |
| 04/03/2003 | WO2003027609A1 In-situ film thickness measurement using spectral interference at grazing incidence |
| 04/03/2003 | WO2003027608A1 System for process control of parameters of rotating workpieces |
| 04/03/2003 | WO2003027604A2 Method for measuring large components, especially the body of rail cars |
| 04/03/2003 | WO2002103649A3 Method and apparatus for detecting objects |
| 04/03/2003 | WO2002012825A9 Frequency transform phase shifting interferometry |
| 04/03/2003 | WO2002012821A9 Two piece alignment head |
| 04/03/2003 | US20030065466 Self-calibrating, multi-camera machine vision measuring system |
| 04/03/2003 | US20030063294 Sub-micron accuracy edge detector |
| 04/03/2003 | US20030063292 Single-camera tracking of an object |
| 04/03/2003 | US20030063291 Apparatus for measuring characteristics of a hole and associated method |
| 04/03/2003 | US20030063288 Measurement method and apparatus of an external digital camera imager assembly |
| 04/03/2003 | US20030063287 Measurement method and apparatus of an external digital camera imager assembly |
| 04/03/2003 | US20030063281 Inspection device for body to be inspected and inspection device of foreign matters in liquid filled in transparent container |
| 04/03/2003 | US20030063277 Method for the calibration and alignment of multiple multi-axis motion stages for optical alignment to a planar waveguide device and system |
| 04/03/2003 | US20030063270 Method and device for examining the strain of elongated bodies |
| 04/03/2003 | US20030063267 Interferometer system for a semiconductor exposure system |
| 04/03/2003 | US20030062416 Three dimensional vision device and method, and structured light bar-code patterns for use in the same |
| 04/03/2003 | US20030062288 System and method for check-weighing the content of a blister |
| 04/03/2003 | CA2461115A1 Method for measurement of large components, in particular car bodies for rail vehicules |
| 04/02/2003 | EP1298428A1 Device for inspecting liquid-filled transparent containers |
| 04/02/2003 | EP1298412A1 Plate thickness inspecting apparatus |
| 04/02/2003 | EP1298411A2 Apparatus for measuring dentiform objects |
| 04/02/2003 | EP1298410A1 Method for measuring interference and apparatus for measuring interference |
| 04/02/2003 | EP1297493A2 Image processing system for use with inspection systems |
| 04/02/2003 | EP1297326A2 Optical system |
| 04/02/2003 | EP1297311A1 Optical deformation sensor with operational testing by different wavelenghts, for side crashes |
| 04/02/2003 | EP1296797A1 Method for detecting and identifying defects in a laser beam weld seam |
| 04/02/2003 | EP1212602A4 Use of scattered and/or transmitted light in determining characteristics, including dimensional information, of object such as part of flat-panel display |
| 04/02/2003 | EP1212580A4 Method and apparatus for performing optical measurements of layers and surface properties |
| 04/02/2003 | EP1204842A4 Apparatus and method for visually identifying micro-forces with a palette of cantilever array blocks |
| 04/02/2003 | EP1176919A4 Apparatus and method for compensating for respiratory and patient motion during treatment |
| 04/02/2003 | EP0995108B1 Method for the automatic recognition of surface defects in body shells and device for carrying out said method |
| 04/02/2003 | EP0983496B1 Process and device for determining the cell density of a honeycombed body, in particular for an exhaust fume catalytic converter |
| 04/02/2003 | EP0971802B1 Method and device for detecting falsely oriented parts and or parts deviating from a given model |
| 04/02/2003 | CN2543029Y Planar array screw imaging device |
| 04/02/2003 | CN2543028Y Optical fibre band geometric parameter tester |
| 04/02/2003 | CN2543027Y Optical fibre all-purpose tester |
| 04/02/2003 | CN1408064A Method measuring movement of material sheet and optical sensor therefor |
| 04/02/2003 | CN1407329A Surface test devices |
| 04/02/2003 | CN1407313A Automatic room measuring method and apparatus |
| 04/02/2003 | CN1104764C Laser aid |
| 04/02/2003 | CN1104643C Foreign matter checking method and device |
| 04/01/2003 | US6542849 Method for determining defect depth using thermal imaging |
| 04/01/2003 | US6542783 Tool position measurement method, offset measurement method, reference member and bonding apparatus |
| 04/01/2003 | US6542251 Illumination and imaging device for multiple spectral regions, and coordinate measuring machine having an illumination and imaging device for multiple spectral regions |
| 04/01/2003 | US6542250 Method of three-dimensionally measuring object surfaces |
| 04/01/2003 | US6542249 Three-dimensional measurement method and apparatus |
| 04/01/2003 | US6542248 Device and method for the determination of the quality of structured surfaces |
| 04/01/2003 | US6542245 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus |
| 04/01/2003 | US6542235 System and method of three-dimensional inspection of circular parts |
| 04/01/2003 | US6542234 Method of detecting the particles of a tobacco particle stream |
| 04/01/2003 | US6541761 Optical position measuring system with a graduation that causes essentially only first orders of diffraction |
| 04/01/2003 | US6541760 Rotation detecting apparatus detecting rotation operation by light transmission to prevent invalid detection |
| 04/01/2003 | US6541748 Optical disk checkup/measuring apparatus |
| 04/01/2003 | US6541747 Focal mechanism and method for controlling focal point position, and apparatus and method for inspecting semiconductor wafer |
| 04/01/2003 | US6539789 Detection of irregularities in a convex surface, such as a tire sidewall, using band-pass filtering |
| 04/01/2003 | US6539642 Probe type shape measuring sensor, and NC processing equipment and shape measuring method using the sensor |
| 03/28/2003 | CA2405877A1 Apparatus and method for improving quality of elevated concrete floors |
| 03/27/2003 | WO2003026375A1 Angle rejection filter |
| 03/27/2003 | WO2003025999A1 Wafer shape evaluating method, wafer, and wafer selecting method |
| 03/27/2003 | WO2003025499A1 Tilt sensing apparatus |
| 03/27/2003 | WO2003025498A1 System and method for measuring the dimensions of moving packages |
| 03/27/2003 | WO2003025497A1 Apparatus for measuring thickness profile and refractive index distribution of multiple layers of thin films by means of two-dimensional reflectometry and method of measuring the same |
| 03/27/2003 | WO2003025496A2 Optical method measuring thin film growth |
| 03/27/2003 | WO2003008900B1 Method for the scanning measurement of a surface contour |
| 03/27/2003 | WO2002086420B1 Calibration apparatus, system and method |
| 03/27/2003 | WO2002023231A3 Generation of a library of periodic grating diffraction signals |
| 03/27/2003 | US20030061594 Pattern inspection apparatus |
| 03/27/2003 | US20030060998 Aircraft identification and docking guidance systems |
| 03/27/2003 | US20030060919 Position determining apparatus for coordinate machine |
| 03/27/2003 | US20030059691 Automatic measurement; calibration; adjustment accuracy; controlling exposure of optical pattern |
| 03/27/2003 | US20030058456 Device for the measurement of dental objects |
| 03/27/2003 | US20030058455 Three-dimensional shape measuring apparatus |
| 03/27/2003 | US20030058454 Method and system for measuring the topography of a sample |
| 03/27/2003 | US20030058453 Apparatus and method for measuring two opposite surfaces of a body |
| 03/27/2003 | US20030058449 Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure |
| 03/27/2003 | US20030058445 Optical alignment detection system |
| 03/27/2003 | US20030058443 Spectroscopic scatterometer system |
| 03/27/2003 | US20030058435 Method of reviewing detected defects |
| 03/27/2003 | US20030057384 Method of detecting flaw and apparatus for detecting flaw |
| 03/27/2003 | US20030057365 Folded reflecting path optical spot scanning system |
| 03/27/2003 | US20030057352 Apparatus for measuring aperture size of near-field optical probe and method thereof |
| 03/27/2003 | US20030057141 Apparatus for processing a sheet |
| 03/27/2003 | DE20216852U1 Surface analyzer using deflectometry technique, e.g. for sheet metal, has intensity patterns generated at spatial light modulator and picked up by electronic camera |
| 03/26/2003 | EP1296367A1 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
| 03/26/2003 | EP1296291A2 Apparatus for processing a sheet |
| 03/26/2003 | EP1296191A2 Method of optimising the imaging properties of a plurality of optical elements |
| 03/26/2003 | EP1295345A1 Position sensitive photo detector |
| 03/26/2003 | EP1295090A1 A position detector for a scanning device |
| 03/26/2003 | EP1295087A2 3d machine vision measuring system with vehicle position adjustment mechanism for positioning vehicle |
| 03/26/2003 | EP1295086A1 Glint-resistant position determination system |
| 03/26/2003 | EP1295085A1 Method and system for conducting wheel alignment |
| 03/26/2003 | EP1295084A1 Method and apparatus for measuring vehicle wheel scrub radius |
| 03/26/2003 | EP1295083A2 Target system for use with position determination system |