Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
03/2003
03/26/2003EP1295082A1 Differential bending and/or subsidence detector and method for monitoring a structure
03/26/2003EP1102965B1 Apparatus and method for measurement of a liquid droplet
03/26/2003CN1405784A Apparatus and method for measuring near-field optical probe needle aperture size
03/26/2003CN1405550A Apparatus and method for measuring equivalent refraction power of optical film and physical thickness
03/26/2003CN1103657C 手动脉冲发生器 Manual Pulse Generator
03/25/2003US6539326 Position detecting system for projection exposure apparatus
03/25/2003US6538774 Method of measuring cells and device for measuring the cells
03/25/2003US6538755 System and method of detecting the interface between mediums with dissimilar indices of refraction
03/25/2003US6538754 Method of measuring thickness of cell gap of reflective type liquid crystal display
03/25/2003US6538753 Method and apparatus for dimension measurement of a pattern formed by lithographic exposure tools
03/25/2003US6538750 Rotary sensor system with a single detector
03/25/2003US6538729 Unit for inspecting a surface
03/25/2003US6538455 Coupling for a reflectivity-measuring device
03/25/2003US6538260 Position measuring method, and semiconductor device manufacturing method and apparatus using the same
03/25/2003US6538252 Method and device for determining the alignment of line formations in areal, especially longitudinally moved, webs of a structural formed body
03/25/2003US6538244 Pick and place machine with improved vision system including a linescan sensor
03/25/2003US6537832 Measuring apparatus and film formation method
03/25/2003US6537673 Infrared transmitting film and infrared-sensor cover using same
03/25/2003US6537133 Method for in-situ endpoint detection for chemical mechanical polishing operations
03/25/2003US6536294 Inspection machine
03/25/2003CA2043079C Angle sensor with ccd
03/20/2003WO2003023373A1 Method for analyzing thin-film layer structure using spectroscopic ellipsometer
03/20/2003WO2003023321A1 Adjustment and measuring device and method and device for aligning the same
03/20/2003WO2002048643A3 Wheel alignment measuring method and apparatus
03/20/2003US20030055587 Rapid throughput surface topographical analysis
03/20/2003US20030055536 Device and process for alignment of machine shafts
03/20/2003US20030055528 Method and device for monitoring electric components in a pick-and-palce device for substrates
03/20/2003US20030055435 Orthopaedic implant shaper
03/20/2003US20030054574 Position detection apparatus, alignment apparatus and methods therefor, and exposure apparatus and device manufacturing method
03/20/2003US20030053714 Method and apparatus for searching for fiducial marks, and method of detecting positions of the fiducial marks
03/20/2003US20030053679 Method and apparatus for imaging workpiece geometry
03/20/2003US20030053678 Device for exposure of a strip-shaped workpiece with a meander correction device
03/20/2003US20030053080 Targeting device with four fixed reflective surfaces
03/20/2003US20030053076 Profile measuring method and measurement apparatus using interference of light
03/20/2003US20030053059 Position detection apparatus and method, exposure apparatus, and device manufacturing method
03/20/2003US20030053058 Alignment mark, alignment apparatus and method, exposure apparatus, and device manufacturing method
03/20/2003US20030053055 Methods, apparatus, computer program products, and systems for lens alignment and fabrication of optical signal controllers
03/20/2003US20030053054 Methods, apparatus, computer program products, and systems for ferrule alignment and fabrication of optical signal controllers
03/20/2003US20030053046 Defect inspecting device for substrate to be processed and method of manufacturing semiconductor device
03/20/2003US20030053037 Coordinate measuring stage and coordinate measuring instrument
03/20/2003US20030052346 Confocal 3D inspection system and process
03/20/2003US20030052262 Coded disc for an optoelectronic displacement or angle measuring device
03/20/2003US20030051529 Apparatus and method for glide height calibration of disk surfaces by use of dual-zone laser texture
03/20/2003US20030051356 Target system for use with position determination system
03/20/2003US20030051354 Device and method for alignment of components
03/19/2003EP1293990A2 Apparatus for measuring aperture size of near-field optical probe and method thereof
03/19/2003EP1293836A2 Device for exposure of a strip-shaped workpiece with a meander correction device
03/19/2003EP1293754A1 Method and device for examining the strain of elongated bodies
03/19/2003EP1293753A1 Optical distance measuring device and pick-and-place head, automatic apparatus and method for placing components onto a substrate using the optical distance measuring device
03/19/2003EP1292805A1 Measuring device for detecting the dimensions of test samples
03/19/2003EP1157253A4 Specimen topography reconstruction
03/19/2003EP1152915B1 Device for determining the pressure between a contact wire and a pantograph
03/19/2003EP0907875B1 Fringe pattern discriminator for interferometer using diffraction gratings
03/19/2003CN1404570A Fabricating optical waveguide gratings and/or characterising optical waveguides
03/19/2003CN1404034A Reference gauge for magnetic recording track check apparatus
03/19/2003CN1404003A Fingerprint inputting apparatus
03/19/2003CN1404002A Fingerprint inputting apparatus and identification method of the living utilizing fingerprint
03/19/2003CN1403821A Yarn quality and component detecting method and device
03/19/2003CN1403783A Apex cuvature radius measuring method and device for aspherics
03/19/2003CN1403782A Reflected light shield eliminating method for surface measurement of laser displacement sensor
03/19/2003CN1103440C Steel plate length on-line measuring apparatus with photoelectronic spatial filtering frequency
03/18/2003US6535291 Calibration methods for placement machines incorporating on-head linescan sensing
03/18/2003US6535290 Optical position measuring device with a beam splitter
03/18/2003US6535281 Method and apparatus for optically scanning a vehicle wheel
03/18/2003US6535114 Method and apparatus for environment recognition
03/18/2003US6534997 Apparatus and a method for locating a fault of a transmission line
03/18/2003US6534774 Method and apparatus for evaluating the quality of a semiconductor substrate
03/18/2003US6534762 Method and device for detecting position of a rotating control member
03/18/2003US6533674 Multishutter camera system
03/18/2003US6532892 Method and apparatus for recognizing and determining a position and robot including such an apparatus
03/18/2003US6532673 Method and device for automatically adjusting the axle geometry of a suspended vehicle in a production line
03/18/2003CA2349755C Method for detecting stress and strain
03/18/2003CA2195761C Fiber optic sensor method and device
03/18/2003CA2007275C Coating weight measuring and control apparatus and method
03/13/2003WO2003021196A1 Device for the optoelectronic detection of switching positions of a switching element
03/13/2003WO2003021184A1 Rapid in-situ mastering of an aspheric fizeau
03/13/2003WO2003020146A2 Passive signal sensor of an optical coordinate detection system
03/13/2003WO2002103433A3 Compact linear scanner system
03/13/2003WO2002084214B1 Optical apparatus for measuring objects having a rectilinear profile
03/13/2003WO2002041389A3 A method for monitoring line width of electronic circuit patterns
03/13/2003US20030050761 Inspection method and its apparatus, inspection system
03/13/2003US20030048941 Method for recognizing position of honeycomb structure
03/13/2003US20030048532 Optical measuring device
03/13/2003US20030048459 Measurement system and method
03/13/2003US20030048457 Rapid in-situ mastering of an aspheric fizeau
03/13/2003US20030048454 Interferometric measuring device
03/13/2003US20030048443 System and method for optical multiplexing and/or demultiplexing
03/13/2003US20030048438 Three-dimensional (3-d) coordinate measuring method, 3-d coordinate measuring apparatus, and large-structure building method
03/13/2003US20030048431 Measuring method using photoelastic analysis for finding touching point between ball and track profile
03/13/2003US20030048425 Exposure apparatus, method of controlling same, and method of manufacturing devices
03/13/2003US20030046992 Method and system for monitoring the deformations of a tyre in motion
03/12/2003EP1291616A2 Device for detecting relative motion of two objects
03/12/2003EP1291614A1 Measurement of coordinates by straighness and angle calibration and subsequent correction of measured values
03/12/2003EP1290485A2 Microscope and method for measuring surface topography in a quantitative and optical manner
03/12/2003EP1290414A1 Method and apparatus for wavefront sensing
03/12/2003EP1290408A1 Method and assembly for the photogrammetric detection of the 3-d shape of an object
03/12/2003EP1290406A2 Adjusting device with an optical regulating device having a reflector
03/12/2003EP1200853B1 Method and device for determining spatial positions and orientations
03/12/2003EP1009654B1 Ship provided with a distortion sensor and distortion sensor arrangement for measuring the distortion of a ship
03/12/2003CN1402842A Radio based proximity token with multiple antennas
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