| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) | 
|---|
| 07/01/1987 | EP0227549A2 Semiconductor memory device including read only memory element for storing fixed information | 
| 07/01/1987 | EP0227523A2 Method for obtaining regions of dielectrically isolated single crystal silicon | 
| 07/01/1987 | EP0227491A2 Test interface for a MOS technique integrated circuit | 
| 07/01/1987 | EP0227464A2 High density read-only memory | 
| 07/01/1987 | EP0227438A2 Magnetron sputter device having separate confining magnetic fields to separate targets and magnetically enhanced R.F. bias | 
| 07/01/1987 | EP0227373A2 Process for fabricating a semiconductor structure | 
| 07/01/1987 | EP0227349A1 Heating apparatus | 
| 07/01/1987 | EP0227303A2 Method of manufacturing semiconductor devices having side-wall isolation | 
| 07/01/1987 | EP0227228A2 Substrate holder for wafers during MBE growth | 
| 07/01/1987 | EP0227189A2 Method of manufacturing a thin conductor device | 
| 07/01/1987 | EP0227183A2 Thin film capacitors and method of making the same | 
| 07/01/1987 | EP0227147A1 Integrated circuit containing a load capacitance and an integrated reference source | 
| 07/01/1987 | EP0227125A1 Vessel for the liquid-phase epitaxy of semiconductor films | 
| 07/01/1987 | EP0227085A2 A method of manufacturing IGFETs having minimal junction depth using epitaxial recrystallization | 
| 07/01/1987 | EP0227076A2 Method of manufacturing monocrystal thin-film | 
| 07/01/1987 | EP0226949A2 Control apparatus for adhesive force of adhesive agent adhering between semiconductor wafer and substrate | 
| 07/01/1987 | EP0226931A2 A method of preparing semiconductor substrates | 
| 07/01/1987 | EP0226913A2 Method and device for situating and/or displaying probe points carrying a characteristic time-dependent signal | 
| 07/01/1987 | EP0226893A1 Process for the high-precision measuring of bi-dimensional structures, and reference mask for carrying out the process | 
| 07/01/1987 | EP0226892A2 Process for manufacturing of bipolar and complementary MOS-transistors on a common silicon substrate | 
| 07/01/1987 | EP0226890A1 Method for the fabrication of self-aligned bipolar transistor structures with reduced base resistance | 
| 07/01/1987 | EP0226794A1 Method of drawing-up a single crystal using a double-crucible apparatus and double-crucible apparatus therefor | 
| 07/01/1987 | EP0226772A2 Method of manufacturing semiconductor substrates | 
| 07/01/1987 | EP0226741A2 Process for producing a positive photoresist | 
| 07/01/1987 | EP0226739A1 Structured semiconductor body | 
| 07/01/1987 | CN86108046A Vertical inverter circuit | 
| 07/01/1987 | CN86107851A Charge-coupled device | 
| 06/30/1987 | US4677650 Charge coupled semiconductor device with dynamic control | 
| 06/30/1987 | US4677526 Plastic pin grid array chip carrier | 
| 06/30/1987 | US4677474 Wafer prober | 
| 06/30/1987 | US4677457 Semiconductor device with bidimensional charge carrier gas | 
| 06/30/1987 | US4677456 Semiconductor structure and manufacturing method | 
| 06/30/1987 | US4677451 Vertical channel field effect transistor | 
| 06/30/1987 | US4677370 Method of testing wire bonds for defects using a magnetic field | 
| 06/30/1987 | US4677369 CMOS temperature insensitive voltage reference | 
| 06/30/1987 | US4677317 High voltage signal output circuit provided with low voltage drive signal processing stages | 
| 06/30/1987 | US4677314 Buffer circuit having a P-channel output mosfet with an open drain terminal connected to an external load | 
| 06/30/1987 | US4677303 Automatic printed circuit board imaging system | 
| 06/30/1987 | US4677301 Alignment apparatus | 
| 06/30/1987 | US4677254 Process for minimizing distortion in multilayer ceramic substrates and the intermediate unsintered green ceramic substrate produced thereby | 
| 06/30/1987 | US4677043 Stepper process for VLSI circuit manufacture utilizing radiation absorbing dyestuff for registration of alignment markers and reticle | 
| 06/30/1987 | US4676884 Wafer processing machine with evacuated wafer transporting and storage system | 
| 06/30/1987 | US4676869 Silicon dioxide on silicon substrate | 
| 06/30/1987 | US4676868 Method for planarizing semiconductor substrates | 
| 06/30/1987 | US4676867 Planarization process for double metal MOS using spin-on glass as a sacrificial layer | 
| 06/30/1987 | US4676866 Process to increase tin thickness | 
| 06/30/1987 | US4676864 Bonding method of semiconductor device | 
| 06/30/1987 | US4676863 Method of fabricating a mesa stripe on a semiconductor wafer plane | 
| 06/30/1987 | US4676847 Controlled boron doping of silicon | 
| 06/30/1987 | US4676845 Passivated deep p/n junction | 
| 06/30/1987 | US4676841 Fabrication of dielectrically isolated devices utilizing buried oxygen implant and subsequent heat treatment at temperatures above 1300° C. | 
| 06/30/1987 | US4676840 In a high pressure inert athosphere | 
| 06/30/1987 | US4676827 Oxygen free copper ally; prevention of damage to bonding pad | 
| 06/30/1987 | US4676761 Process for producing a matrix of electronic components | 
| 06/30/1987 | US4676709 Long arm manipulator for standard mechanical interface apparatus | 
| 06/30/1987 | US4676699 Semiconductor wafer guides | 
| 06/30/1987 | US4676649 Multi-axis gas bearing stage assembly | 
| 06/30/1987 | US4676644 Device for monitoring the thickness of thin layers | 
| 06/30/1987 | US4676637 Exposure apparatus with foreign particle detector | 
| 06/30/1987 | US4676631 Device for adjusting projection magnification | 
| 06/30/1987 | US4676614 Apparatus for regulating the optical characteristics of a projection optical system | 
| 06/30/1987 | US4676195 Capacitance coupled type, electrode structure | 
| 06/30/1987 | US4676008 Cage-type wafer carrier and method | 
| 06/30/1987 | US4675985 Method for manufacturing a semiconductor memory device having a high radiation resistance | 
| 06/30/1987 | US4675984 Method of exposing only the top surface of a mesa | 
| 06/30/1987 | US4675983 Method of making a semiconductor including forming graft/extrinsic and intrinsic base regions | 
| 06/30/1987 | US4675982 Method of making self-aligned recessed oxide isolation regions | 
| 06/30/1987 | US4675981 Method of making implanted device regions in a semiconductor using a master mask member | 
| 06/30/1987 | US4675980 Method for making vertically layered MOMOM tunnel device | 
| 06/30/1987 | US4675978 Method for fabricating a radiation hardened oxide having two portions | 
| 06/30/1987 | CA1223674A1 Apparatus for automatically mounting chip-type circuit elements on substrate | 
| 06/30/1987 | CA1223673A1 Mode selection layer for semiconductor device | 
| 06/30/1987 | CA1223671A1 Backside gettering of silicon wafers | 
| 06/30/1987 | CA1223670A1 Integrated circuit chip wiring arrangement providing reduced circuit inductance and controlled voltage gradients | 
| 06/30/1987 | CA1223653A1 Pbs-pbse ir detector arrays and fabrication method | 
| 06/30/1987 | CA1223432A1 Force assembler apparatus for robots | 
| 06/25/1987 | DE3641689A1 Method of fabricating a semiconductor component and a semiconductor chip used therein | 
| 06/25/1987 | DE3545258A1 Method for producing circuits using thin-film technology | 
| 06/25/1987 | DE3545243A1 Patterned semiconductor body | 
| 06/25/1987 | DE3545239A1 Patterned semiconductor body | 
| 06/24/1987 | EP0226549A1 A monolithic integrated circuit, particularly of either the MOS or CMOS type, and method of manufacturing same | 
| 06/24/1987 | EP0226517A2 Method for isolating regions of different impurity concentrations in a semiconductor substrate | 
| 06/24/1987 | EP0226494A2 Electron beam test probe system for analyzing integrated circuits | 
| 06/24/1987 | EP0226469A1 A semiconductor integrated circuit device | 
| 06/24/1987 | EP0226451A2 Sensor arrays | 
| 06/24/1987 | EP0226385A1 Rhodium capped gold IC metallization | 
| 06/24/1987 | EP0226383A2 Resonant-tunneling transistor | 
| 06/24/1987 | EP0226316A1 Multilayer wiring substrate | 
| 06/24/1987 | EP0226311A2 Process for annealing III-V compound semiconductor material | 
| 06/24/1987 | EP0226296A1 Optical component and waveguide assembly | 
| 06/24/1987 | EP0226293A2 Method for producing a buried contact Schottky logic array, and device produced thereby | 
| 06/24/1987 | EP0226208A2 Insulating film for semiconductor, production of the same and liquid composition for producing the same | 
| 06/24/1987 | EP0226136A2 Apparatus for the non-cutting machining of components | 
| 06/24/1987 | EP0226106A2 Method of fabricating semiconductor device having low resistance non-alloyed contact layer | 
| 06/24/1987 | EP0226091A2 Semiconductor isolation using trenches and oxidation of anodized silicon sublayer | 
| 06/24/1987 | EP0226050A1 Method for mounting an IC on a substrate | 
| 06/24/1987 | EP0226033A1 Device for picking up and conveying components | 
| 06/24/1987 | EP0226009A2 Photoresist compositions of controlled dissolution rate in alkaline developers | 
| 06/24/1987 | EP0225969A1 Apparatus and method for controlling irradiation of electron beam at fixed position in electron beam tester system | 
| 06/24/1987 | EP0225962A2 Insulated gate transistor with latching inhibited |