Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/1997
01/28/1997US5597738 Method for forming isolated CMOS structures on SOI structures
01/28/1997US5597670 Exposure method and apparatus
01/28/1997US5597669 Dustproof protection of a photomask
01/28/1997US5597667 Photomask and photomask blank
01/28/1997US5597666 Method for fabrication of a mask
01/28/1997US5597644 Glass glaze
01/28/1997US5597643 Multi-tier laminate substrate with internal heat spreader
01/28/1997US5597623 Vapor deposition of films on substrate
01/28/1997US5597610 Method for coating electric component with resin
01/28/1997US5597470 Method for making a flexible lead for a microelectronic device
01/28/1997US5597469 Process for selective application of solder to circuit packages
01/28/1997US5597458 Method for producing alloy films using cold sputter deposition process
01/28/1997US5597444 Exposing to a plasma comprising a mixture of a reduced carbon compound and a non-chlorofluorocarbon halogen compound; reducing toxicity and carcinogenic effects
01/28/1997US5597443 Method and system for chemical mechanical polishing of semiconductor wafer
01/28/1997US5597442 Determining endpoint for polishing semiconductor wafer surface
01/28/1997US5597439 Process gas inlet and distribution passages
01/28/1997US5597411 Method of forming a single crystal material
01/28/1997US5597410 Method to make a SOI wafer for IC manufacturing
01/28/1997US5597346 Method and apparatus for holding a semiconductor wafer during a chemical mechanical polish (CMP) process
01/28/1997US5597341 Semiconductor planarizing apparatus
01/28/1997US5597110 Method for forming a solder bump by solder-jetting or the like
01/28/1997CA2052543C Ion implantation and surface processing method and apparatus
01/23/1997WO1997002609A1 Photodetector involving a mosfet having a floating gate
01/23/1997WO1997002605A1 Method of fabricating a fast programming flash e2prom cell
01/23/1997WO1997002604A1 Semiconductor device and its manufacture
01/23/1997WO1997002603A1 Thyristor with a layer of charge carriers having a reduced lifetime
01/23/1997WO1997002601A1 Process for packaging a pressure-sensitive electronic circuit in a protective housing sealed all around
01/23/1997WO1997002599A1 Method of producing a read-only storage cell arrangement
01/23/1997WO1997002598A1 Semi-insulating wafer
01/23/1997WO1997002597A1 A method of manufacturing a monolithic linear optocoupler
01/23/1997WO1997002596A1 Electronic component and method of production thereof
01/23/1997WO1997002595A1 Semiconductor device and its manufacture
01/23/1997WO1997002594A1 Low damage source and drain doping technique
01/23/1997WO1997002593A1 An improved method and apparatus for detecting optimal endpoints in plasma etch processes
01/23/1997WO1997002589A1 Power segmented electrode
01/23/1997WO1997002588A1 Low inductance large area coil for an inductively coupled plasma source
01/23/1997WO1997002466A1 Optical distance sensor
01/23/1997WO1997002199A1 Door drive mechanisms for substrate carrier and load lock
01/23/1997WO1997002195A1 Load arm for load lock
01/23/1997WO1997002184A1 Smif port interface adaptor
01/23/1997DE19629286A1 Polishing pad device for chemical mechanical polishing of semiconductor wafer
01/23/1997DE19629251A1 Method for manufacturing specimens for analysing semi-conductor wafers
01/23/1997DE19629250A1 Method for manufacturing test specimens for analysing semi-conductor wafers
01/23/1997DE19629249A1 Three=dimensional defect analysis method for semiconductor wafer
01/23/1997DE19629088A1 Vertical silicon carbide field effect transistor for use in extreme environment
01/23/1997DE19628376A1 Integrated circuit device, e.g. chip scale package
01/23/1997DE19628264A1 Formation of finely-detailed printed circuits esp. for semiconductor component mounting plates
01/23/1997DE19626026A1 Rückbearbeitungsverfahren zum Analysieren eines Fehlverhaltens in einer Halbleitervorrichtung Back processing method for analyzing a misconduct in a semiconductor device
01/23/1997DE19606226A1 Vapour phase esp. MOCVD growth appts.
01/23/1997DE19530858C1 Suction plate for handling semiconductor wafer
01/23/1997DE19526902A1 Monolithisch integrierte planare Halbleiteranordnung Monolithically integrated planar semiconductor device
01/23/1997DE19526734A1 Optische Struktur und Verfahren zu deren Herstellung Optical structure and process for their preparation
01/23/1997DE19526015A1 Thin-film characterisation method for esp. hydrogen content in semiconductor prodn.
01/23/1997DE19526012A1 Elektrisch lösch- und programmierbare nicht-flüchtige Speicherzelle Electrically erasable and programmable non-volatile memory cell
01/23/1997CA2226015A1 Method of fabricating a fast programming flash e2prom cell
01/23/1997CA2225926A1 Low damage source and drain doping technique
01/23/1997CA2225751A1 A method of manufacturing a monolithic linear optocoupler
01/22/1997EP0755078A1 Metal semiconductor contact
01/22/1997EP0755077A2 High power MOS guided devices and methods of manufacturing them
01/22/1997EP0755076A2 Vertical MOS semiconductor with recessed gate and method of manufacturing the same
01/22/1997EP0755075A2 A tape carrier package
01/22/1997EP0755073A1 Method of producing semiconductor wells of different doping level
01/22/1997EP0755072A1 CMOS circuit with field plate and method of production
01/22/1997EP0755071A2 Semiconductor probe card device with a ball-bump
01/22/1997EP0755070A2 A semiconductor device and its manufacturing method
01/22/1997EP0755069A1 Method of making In-containing III/V semiconductor devices
01/22/1997EP0755068A2 Semiconductor substrate and process for production thereof
01/22/1997EP0755067A1 Method of fabrication for sublithographic etching masks
01/22/1997EP0755066A1 Electrostatic chuck
01/22/1997EP0754975A2 Process of reducing trace levels of metal impurities from resist components
01/22/1997EP0754953A1 Method of manufacturing a structure with an usable layer, which is kept at a distance from a substrate by limit stops, and method for disjoining such a layer
01/22/1997EP0754932A2 Optical film thickness measurement method, film formation method, and semiconductor laser fabrication method
01/22/1997EP0754785A1 Method of manufacturing semiconductor mirror wafers
01/22/1997EP0754776A2 Method of producing dielectric thin film element
01/22/1997EP0754525A1 Method of and apparatus for dressing polishing cloth
01/22/1997EP0754351A1 Integrated circuits with borderless vias
01/22/1997EP0754350A1 Cavity filled metal electronic package
01/22/1997EP0754349A1 Semiconductor devices and methods
01/22/1997EP0754289A1 Cantilever deflection sensor and use thereof
01/22/1997EP0754248A1 An improved module in an integrated delivery system for chemical vapors from liquid sources
01/22/1997EP0721643A4 Spacer flash cell process
01/22/1997EP0662222B1 Positive-working photoresist composition
01/22/1997EP0656149A4 Improved back-side hydrogenation technique for defect passivation in silicon solar cells.
01/22/1997EP0566591B1 Semiconductor device
01/22/1997EP0422250B1 Semiconductor device and method of producing the same
01/22/1997CN1141078A Self-addressable self-assembling microelectronic system and devices for molecular biological analysis and diagnostics
01/22/1997CN1140902A Connection leads for electronic component
01/22/1997CN1140901A Resin sealing type semiconductor device and method of making the same
01/22/1997CN1140900A Monolithic high frequency integrated circuit structure and method of manufacturing the same
01/22/1997CN1140899A Method for making semiconductor devices having electroplated leads
01/22/1997CN1140898A Method of forming sog film in semiconductor device
01/22/1997CN1140897A Method for forming cylindrical stacked capacitor in semiconductor device
01/22/1997CN1140832A Optical film thickness measurement method, film formation method, and semiconductor laser fabrication method
01/21/1997US5596618 Exposure apparatus and device manufacturing method using the same
01/21/1997US5596585 Performance driven BIST technique
01/21/1997US5596544 Very large scale integrated planar read only memory
01/21/1997US5596542 Semiconductor memory device having dual word line configuration
01/21/1997US5596541 Synchronous dynamic random access memory
01/21/1997US5596535 Semiconductor storage device
01/21/1997US5596529 Nonvolatile semiconductor memory device