Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/1997
01/15/1997EP0753796A1 Scanning exposure apparatus and device for manufacturing method using the same
01/15/1997EP0753764A1 Improvements in or relating to semiconductor devices
01/15/1997EP0753763A1 Improvements in or relating to semiconductor devices
01/15/1997EP0753671A1 Method of manufacturing elements of floating, rigid microstructures and apparatus equipped with such elements
01/15/1997EP0753600A1 Small size sputtering target and high vacuum sputtering apparatus using the same
01/15/1997EP0753201A1 Sputtering target erosion profile control for collimated deposition
01/15/1997EP0753193A1 Improvements in an apparatus and method of use of radiofrequency identification tags
01/15/1997EP0753180A1 Method of manufacturing a chip card, and chip card thus produced
01/15/1997EP0753178A1 Timing model and characterization system for logic simulation of integrated circuits which takes into account process, temperature and power supply variations
01/15/1997EP0753101A1 Engine components including ceramic-metal composites
01/15/1997EP0721514A4 Magnetically enhanced multiple capacitive plasma generation apparatus and related method
01/15/1997EP0665814B1 Precursors and processes for making metal oxides
01/15/1997EP0454837B1 Separation of diode array chips during fabrication thereof
01/15/1997CN1140467A Cleaning agent and method
01/15/1997CN1140389A Method for making electronic circuit
01/15/1997CN1140337A Active matrix electro-optical device
01/15/1997CN1140336A Semiconductor device and manufacturing method thereof
01/15/1997CN1140335A Protecting diode for semiconductor device
01/15/1997CN1140334A Semiconductor device which dissipates heat
01/15/1997CN1140333A Method of manufacturing semiconductor device
01/15/1997CN1140332A Method of forming tungsten plug in semiconductor device
01/15/1997CN1140331A Cleaning method and system of semiconductor substrate and production method of cleaning liquid
01/15/1997CN1140330A Method for forming impurity junction regions of semiconductor device
01/15/1997CN1140317A Resistor trimming method
01/14/1997USRE35423 Method and apparatus for performing automated circuit board solder quality inspections
01/14/1997US5594693 Matrix device with redundancy fuses for integrated memory
01/14/1997US5594692 Semiconductor integrated circuit
01/14/1997US5594688 Nonvolatile semiconductor memory device and method of producing the same
01/14/1997US5594684 Polysilicon programming memory cell
01/14/1997US5594682 High density self-aligned stack in trench DRAM technology
01/14/1997US5594587 Illumination device with allowable error amount of telecentricity on the surface of the object to be illuminated and exposure apparatus using the same
01/14/1997US5594549 Position detecting method and projection exposure apparatus using the same
01/14/1997US5594526 Optical integrator and projection exposure apparatus using the same
01/14/1997US5594349 Dielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and method
01/14/1997US5594330 Movement actuator/sensor systems
01/14/1997US5594328 Passive probe employing cluster of charge monitors for determining simultaneous charging characteristics of wafer environment inside IC process equipment
01/14/1997US5594281 Semiconductor apparatus having wiring structure of an integrated circuit in which a plurality of logic circuits of the same structure are arranged in the same direction
01/14/1997US5594280 Method of forming a thin film and apparatus of forming a metal thin film utilizing temperature controlling means
01/14/1997US5594279 Semiconductor device having shield wiring for noise suppression
01/14/1997US5594275 J-leaded semiconductor package having a plurality of stacked ball grid array packages
01/14/1997US5594274 Lead frame for use in a semiconductor device and method of manufacturing the semiconductor device using the same
01/14/1997US5594273 Apparatus for performing wafer-level testing of integrated circuits where test pads lie within integrated circuit die but overly no active circuitry for improved yield
01/14/1997US5594272 Bipolar transistor with base and emitter contact holes having shorter central portions
01/14/1997US5594271 Load current detecting device including a multi-emitter bipolar transistor
01/14/1997US5594270 Semiconductor memory device
01/14/1997US5594269 Resistive load for integrated circuit devices
01/14/1997US5594268 Method of manufacturing high performance bipolar transistors in a BICMOS process
01/14/1997US5594266 Integrated circuit (IC) with a two-terminal diode device to protect metal-oxide-metal capacitors from ESD damage
01/14/1997US5594264 LDD semiconductor device with peak impurity concentrations
01/14/1997US5594262 Elevated temperature gallium arsenide field effect transistor with aluminum arsenide to aluminum gallium arsenide mole fractioned buffer layer
01/14/1997US5594259 Semiconductor device and a method for producing the same
01/14/1997US5594258 Semiconductor device with reticle specific implant verification indicator
01/14/1997US5594247 Apparatus and method for depositing charge on a semiconductor wafer
01/14/1997US5594098 Passing formaldehyde solution through ion exchange resin
01/14/1997US5593928 Method of making a semiconductor device having floating source and drain regions
01/14/1997US5593926 Method of manufacturing semiconductor device
01/14/1997US5593925 Semiconductor device capable of preventing humidity invasion
01/14/1997US5593924 Use of a capping layer to attain low titanium-silicide sheet resistance and uniform silicide thickness for sub-micron silicon and polysilicon lines
01/14/1997US5593923 Method of fabricating semiconductor device having refractory metal silicide layer on impurity region using damage implant and single step anneal
01/14/1997US5593922 Method for buried contact isolation in SRAM devices
01/14/1997US5593921 Method of forming vias
01/14/1997US5593920 Method for forming contact structures in integrated circuits
01/14/1997US5593919 Process for forming a semiconductor device including conductive members
01/14/1997US5593918 Techniques for forming superconductive lines
01/14/1997US5593917 Method of making semiconductor components with electrochemical recovery of the substrate
01/14/1997US5593916 Etch resistant polyether ether ketone resin
01/14/1997US5593915 Method of manufacturing semiconductor device
01/14/1997US5593914 Method for constructing ferroelectric capacitor-like structures on silicon dioxide surfaces
01/14/1997US5593912 SOI trench DRAM cell for 256 MB DRAM and beyond
01/14/1997US5593910 Charge detection device, a method for producing the same, and a charge transfer and detection apparatus including such a charge detection device
01/14/1997US5593909 Method for fabricating a MOS transistor having an offset resistance
01/14/1997US5593908 Lateral resonant tunneling
01/14/1997US5593907 Large tilt angle boron implant methodology for reducing subthreshold current in NMOS integrated circuit devices
01/14/1997US5593906 Method of processing a polysilicon film on a single-crystal silicon substrate
01/14/1997US5593905 Method of forming stacked barrier-diffusion source and etch stop for double polysilicon BJT with patterned base link
01/14/1997US5593904 Method for manufacturing NAND type semiconductor memory device
01/14/1997US5593815 Cleaving process in manufacturing a semiconductor laser
01/14/1997US5593813 Method for forming submicroscopic patterns
01/14/1997US5593812 Photoresist having increased sensitivity and use thereof
01/14/1997US5593799 Phase shifting, diffraction grating
01/14/1997US5593774 Polyimide base film; thermoplastic or thermosetting adhesive layers; tear strength; semiconductors
01/14/1997US5593761 Electron beam shaping mask for an electron beam system with pattern writing capability
01/14/1997US5593741 Method and apparatus for forming silicon oxide film by chemical vapor deposition
01/14/1997US5593725 Anti-reflective layer and method for manufacturing semiconductor device using the same
01/14/1997US5593722 Method of producing thick multi-layer substrates
01/14/1997US5593601 Etching recipe for the CrSi film
01/14/1997US5593551 Magnetron sputtering source for low pressure operation
01/14/1997US5593538 Method for etching a dielectric layer on a semiconductor
01/14/1997US5593537 Apparatus for processing semiconductor wafers
01/14/1997US5593511 Method of nitridization of titanium thin films
01/14/1997US5593505 Method for cleaning semiconductor wafers with sonic energy and passing through a gas-liquid-interface
01/14/1997US5593498 Apparatus for rotating a crucible of a crystal pulling machine
01/14/1997US5593497 Method for forming a deposited film
01/14/1997US5593494 Precision controlled precipitation of oxygen in silicon
01/14/1997US5593465 Mounting for carrier bodies in an apparatus for the deposition of semiconductor material
01/14/1997US5593344 Wafer polishing machine with fluid bearings and drive systems
01/14/1997US5593083 Castellated nozzle and method of use therof
01/14/1997US5592734 Method and apparatus for framing a film mounted integrated circuit
01/14/1997CA2149929C Devices using metallized magnetic substrates
01/14/1997CA2068816C Apparatus and method for assembling circuit structures