Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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01/14/1997 | CA2052080C Plasma source arrangement for ion implantation |
01/12/1997 | CA2180595A1 Method for encapsulating an electronic component, electronic component suitable of being used for carrying out said method and encapsulated component obtained using the method |
01/09/1997 | WO1997001238A2 Method of operating a ccd imager, and ccd imager suitable for the implementation of such a method |
01/09/1997 | WO1997001187A1 Method of manufacture of material for semiconductor substrate, material for semiconductor substrate, and package for semiconductor |
01/09/1997 | WO1997001186A1 Methodology for developing product-specific interlayer dielectric polish processes |
01/09/1997 | WO1997001185A1 Method and apparatus for film formation |
01/09/1997 | WO1997001184A1 Positioning method |
01/09/1997 | WO1997001130A1 Method and device for producing features on a photolithographic layer |
01/09/1997 | WO1996030941A3 Method of manufacturing a semiconductor device with a bicmos circuit |
01/09/1997 | DE4336884C2 Schaltungsanordnung Circuitry |
01/09/1997 | DE19626738A1 Kassette zur Halbleiterbauelementfertigung, Herstellungsverfahren hierfür und diese verwendende Halbleiterbauelement-Fertigungsanlage Cassette for semiconductor device fabrication, manufacturing method thereof and use this semiconductor device fabrication facility |
01/09/1997 | DE19531629C1 Verfahren zur Herstellung einer EEPROM-Halbleiterstruktur Process for the preparation of an EEPROM semiconductor structure |
01/09/1997 | DE19524478A1 Elektrisch schreib- und löschbare Festwertspeicherzellenanordnung und Verfahren zu deren Herstellung Electrically writable and erasable read-only memory cell arrangement and method for its manufacture |
01/08/1997 | EP0752734A1 Nonradiative dielectric wave guide apparatus and instrument for measuring characteristics of a circuit board |
01/08/1997 | EP0752724A2 Method of forming an alloyed drain field effect transistor and device formed |
01/08/1997 | EP0752723A1 Bipolar transistor with optimized structure |
01/08/1997 | EP0752722A2 Fet with stable threshold voltage and method of manufacturing the same |
01/08/1997 | EP0752721A2 Nonvolatile semiconductor memory and driving method and fabrication method of the same |
01/08/1997 | EP0752719A1 Method of manufacturing a silicon on sapphire integrated circuit arrangement |
01/08/1997 | EP0752718A2 Method for forming conductors in integrated circuits |
01/08/1997 | EP0752717A1 A method of manufacturing a MOS integrated circuit having components with different dielectrics |
01/08/1997 | EP0752715A1 Charged particle beam apparatus |
01/08/1997 | EP0752621A1 Frame-supported pellicle for photomask protection |
01/08/1997 | EP0752611A2 LCD with bus lines overlapped by pixel electrodes and photo-imageable insulating layer therebetween |
01/08/1997 | EP0752594A2 Contact structure for electrically connecting a testing board and die |
01/08/1997 | EP0752593A2 Method for the early recognition of failures of power semiconductor modules |
01/08/1997 | EP0752587A2 Electrical connection structure |
01/08/1997 | EP0752489A1 Equipment for producing silicon single crystals |
01/08/1997 | EP0752488A1 Single crystal pulling apparatus |
01/08/1997 | EP0752165A1 Quantum-layer structure |
01/08/1997 | EP0752160A1 Method for the sealed and electrically insulating attachment of an electrical conductor extending through a metal wall |
01/08/1997 | EP0752159A1 Semiconductor device provided with a microcomponent having a fixed and a movable electrode |
01/08/1997 | EP0752158A1 Thin film electronic devices and manufacturing method |
01/08/1997 | EP0752157A1 Group iv semiconductor thin films formed at low temperature using nanocrystal precursors |
01/08/1997 | EP0752132A1 Efficient direct cell replacement fault tolerant architecture supporting completely integrated systems with means for direct communication with system operator |
01/08/1997 | EP0752121A1 Methods of fabricating active matrix pixel electrodes |
01/08/1997 | EP0752017A1 Autoclave bonding of sputtering target assembly |
01/08/1997 | EP0751847A1 A method for joining metals by soldering |
01/08/1997 | EP0723706A4 Electrostatic discharge protection circuit |
01/08/1997 | EP0607255B1 Additive compositions for high thermal cycled and aged adhesion |
01/08/1997 | EP0503077B1 Semiconductor device |
01/08/1997 | EP0403580B1 Light-sensitive novolac resins |
01/08/1997 | CN2244775Y Semiconductor packaging unit with sawthooth sea gull wing shape |
01/08/1997 | CN1139820A Interconnection device for semiconductor device and making method |
01/08/1997 | CN1139819A Electrolyte, making process and semicondoctor device |
01/08/1997 | CN1139811A Semiconductor storage device with improved stage power source line structure |
01/08/1997 | CN1139767A Method of making pattern from thin film layer by utilizing intermediate medium layer |
01/08/1997 | CN1139766A Contact type thermal chuck and making method |
01/08/1997 | CN1139709A Method for electroplating conducting-layer on a base chip |
01/08/1997 | CN1139708A Method for electroplating conducting-layer on source layer |
01/08/1997 | CN1033769C 电子电路 Electronic circuit |
01/07/1997 | USRE35420 Incontinuously adhering discrete solid particles selected from silicon dioxide and aluminum oxide to the first polysilicon layer exposed surface, applying second layer of polysilicon atop of first layer and adhered solid particles |
01/07/1997 | US5592632 Defect tolerant integrated circuit subsystem for communication between a module and a bus controller in a wafer-scale integrated circuit system |
01/07/1997 | US5592562 Inspection system for cross-sectional imaging |
01/07/1997 | US5592494 Semiconductor integrated circuit |
01/07/1997 | US5592429 Writing/erasing time interval determining circuit |
01/07/1997 | US5592427 Semiconductor memory having a sense amplifier with load transistors having different load characteristics |
01/07/1997 | US5592423 Semiconductor integrated circuit enabling external monitor and control of voltage generated in internal power supply circuit |
01/07/1997 | US5592421 Semiconductor integrated circuit for generating an internal power source voltage with reduced potential changes |
01/07/1997 | US5592418 Non-volatile analog memory cell with double polysilicon level |
01/07/1997 | US5592416 Electronic storage circuit |
01/07/1997 | US5592415 Non-volatile semiconductor memory |
01/07/1997 | US5592412 Enhanced deep trench storage node capacitance for DRAM |
01/07/1997 | US5592410 Circuit and method for reducing a compensation of a ferroelectric capacitor by multiple pulsing of the plate line following a write operation |
01/07/1997 | US5592409 Nonvolatile memory |
01/07/1997 | US5592358 Electrostatic chuck for magnetic flux processing |
01/07/1997 | US5592318 Liquid crystal display apparatus having an inorganic filler between pixel electrodes and a method for producing the same |
01/07/1997 | US5592295 Apparatus and method for semiconductor wafer edge inspection |
01/07/1997 | US5592121 Internal power-supply voltage supplier of semiconductor integrated circuit |
01/07/1997 | US5592119 Half power supply voltage generating circuit for a semiconductor device |
01/07/1997 | US5592099 IC tester joined with ion beam tester and the detection method of the failure part of IC |
01/07/1997 | US5592063 Voltage generator circuit |
01/07/1997 | US5592042 Piezoelectric/electrostrictive actuator |
01/07/1997 | US5592026 Integrated structure pad assembly for lead bonding |
01/07/1997 | US5592024 Semiconductor device having a wiring layer with a barrier layer |
01/07/1997 | US5592023 Semiconductor device |
01/07/1997 | US5592022 Electrical apparatus |
01/07/1997 | US5592020 Semiconductor device with smaller package having leads with alternating offset projections |
01/07/1997 | US5592019 Semiconductor device and module |
01/07/1997 | US5592018 Membrane dielectric isolation IC fabrication |
01/07/1997 | US5592017 Self-aligned double poly BJT using sige spacers as extrinsic base contacts |
01/07/1997 | US5592015 Dielectric isolated type semiconductor device provided with bipolar element |
01/07/1997 | US5592014 High breakdown voltage semiconductor device |
01/07/1997 | US5592013 Semiconductor device and method of fabricating the same |
01/07/1997 | US5592009 Semiconductor device having a floating node that can maintain a predetermined potential for long time, a semiconductor memory device having high data maintenance performance, and a method of manufacturing thereof |
01/07/1997 | US5592008 Semiconductor device and method for forming the same |
01/07/1997 | US5592007 Membrane dielectric isolation transistor fabrication |
01/07/1997 | US5592005 Semiconductor device |
01/07/1997 | US5592004 Ultraviolet radiation erasable |
01/07/1997 | US5592003 Nonvolatile semiconductor memory and method of rewriting data thereto |
01/07/1997 | US5592002 Non-volatile semiconductor memory device having reduced current consumption |
01/07/1997 | US5592001 Non-volatile semiconductor memory device |
01/07/1997 | US5592000 Non-volatile semiconductor memory device programmable and erasable at low voltage |
01/07/1997 | US5591999 Electrically erasable programmable read only memory device with an improved memory cell pattern layout |
01/07/1997 | US5591997 Low capacitance floating diffusion structure for a solid state image sensor |
01/07/1997 | US5591996 Recirculating charge transfer magnetic field sensor |
01/07/1997 | US5591995 Base cell for BiCMOS and CMOS gate arrays |
01/07/1997 | US5591994 Compound semiconductor field effect transistor having a controlled diffusion profile of impurity elements |
01/07/1997 | US5591992 Electrostatic discharge protection in integrated circuits, systems and methods |
01/07/1997 | US5591991 Semiconductor device and method of manufacturing the same |