Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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05/13/1998 | CN1181618A External terminal fabrication method for ball grid array package |
05/13/1998 | CN1181617A Production of electronic device |
05/13/1998 | CN1181616A Method for forming field oxide of semiconductor device |
05/13/1998 | CN1181615A Complex structural device of metal oxide field effect transistor and bipolar electrostatic induction transistor |
05/13/1998 | CN1181614A Method for making integrated circuit |
05/13/1998 | CN1181520A Chemically amplified resist composition |
05/13/1998 | CN1038349C Device and method for accurate etching and removal of thin film |
05/12/1998 | US5751896 Method and apparatus to compensate for non-uniform film growth during chemical vapor deposition |
05/12/1998 | US5751651 Semiconductor integrated circuit device having a hierarchical power source configuration |
05/12/1998 | US5751640 Semiconductor memory device and method thereof |
05/12/1998 | US5751639 DRAM having a power supply voltage lowering circuit |
05/12/1998 | US5751607 Method of sputter deposition simulation by inverse trajectory calculation |
05/12/1998 | US5751582 Controlling process modules using site models and monitor wafer control |
05/12/1998 | US5751581 Material movement server |
05/12/1998 | US5751553 Thin multichip module including a connector frame socket having first and second apertures |
05/12/1998 | US5751540 Ferroelectric capacitor with rhodium electrodes |
05/12/1998 | US5751538 Mask holding device and method for holding mask |
05/12/1998 | US5751537 Multielectrode electrostatic chuck with fuses |
05/12/1998 | US5751428 Exposure method and exposure apparatus using the same |
05/12/1998 | US5751426 Positional deviation measuring device and method for measuring the positional deviation between a plurality of diffraction gratings formed on the same object |
05/12/1998 | US5751381 Active matrix LCD device with image signal lines having a multilayered structure |
05/12/1998 | US5751261 Control system for display panels |
05/12/1998 | US5751201 Resonator with metal layers devoid of DC connection and semiconductor device in substrate |
05/12/1998 | US5751183 Bipolar transistor circuit having a free collector |
05/12/1998 | US5751165 High speed customizable logic array device |
05/12/1998 | US5751160 Output buffer with improved operational speed and transitional current |
05/12/1998 | US5751141 IDDQ -testing of bias generator circuit |
05/12/1998 | US5751068 Tape with solder forms for semiconductor devices |
05/12/1998 | US5751067 Nitrogen compound conductor layer |
05/12/1998 | US5751066 Structure with selective gap fill of submicron interconnects |
05/12/1998 | US5751065 Integrated circuit with active devices under bond pads |
05/12/1998 | US5751064 Intermediate structure for integrated circuit devices |
05/12/1998 | US5751060 Electronic package |
05/12/1998 | US5751058 Semiconductor device having parallel overlapping main current terminals |
05/12/1998 | US5751056 Reliable metal leads in high speed LSI semiconductors using dummy leads |
05/12/1998 | US5751055 Semiconductor single crystalline substrate and method for production thereof |
05/12/1998 | US5751054 Zener diodes on the same wafer with BiCDMOS structures |
05/12/1998 | US5751053 Semiconductor device having a bipolar transistor and method of manufacturing the same |
05/12/1998 | US5751052 Inductive driver circuit and method therefor |
05/12/1998 | US5751051 Semiconductor device equipped with electrostatic breakdown protection circuit |
05/12/1998 | US5751050 Semiconductor device having a polysilicon resistor element with increased stability and method of fabricating same |
05/12/1998 | US5751048 Semiconductor device having a contact window structure |
05/12/1998 | US5751047 Semiconductor circuit with reduced P-N junction capacitance |
05/12/1998 | US5751046 Semiconductor device with VT implant |
05/12/1998 | US5751045 Nand type non-volatile memory device |
05/12/1998 | US5751044 Manufacture device of four transistor sram cell layout and device |
05/12/1998 | US5751043 SRAM with SIPOS resistor |
05/12/1998 | US5751041 Semiconductor integrated circuit device |
05/12/1998 | US5751040 Self-aligned source/drain mask ROM memory cell using trench etched channel |
05/12/1998 | US5751039 Programmable non-volatile memory cell and method of forming a non-volatile memory cell |
05/12/1998 | US5751038 Electrically erasable and programmable read only memory (EEPROM) having multiple overlapping metallization layers |
05/12/1998 | US5751037 Non-volatile memory cell having dual gate electrodes |
05/12/1998 | US5751036 Floating gate type non-volatile semiconductor memory device |
05/12/1998 | US5751035 Semiconductor device provided with LDD transistors |
05/12/1998 | US5751034 High dielectric constant barium-strontium-niobium oxides for integrated circuit applications |
05/12/1998 | US5751032 Color linear charge coupled device and method for driving the same |
05/12/1998 | US5751031 Memory and other integrated circuitry having a conductive interconnect line pitch of less than 0.6 micron |
05/12/1998 | US5751029 Field-effect semiconductor device having heterojunction |
05/12/1998 | US5751028 Semiconductor device formed on a substrate having an off-angle surface |
05/12/1998 | US5751027 Field effect semiconductor device with a low-noise drift layer and a high-power drift layer |
05/12/1998 | US5751026 Epitaxial wafer of gallium arsenide phosphide |
05/12/1998 | US5751025 High voltage current limiter and method for making |
05/12/1998 | US5751024 Insulated gate semiconductor device |
05/12/1998 | US5751023 Semiconductor device and method of manufacturing the same |
05/12/1998 | US5751020 Structure of a liquid crystal display unit having exposed channel region |
05/12/1998 | US5751019 Method and structure for reducing short circuits between overlapping conductors |
05/12/1998 | US5751018 Mercaptans |
05/12/1998 | US5751017 Thin film transistor having double gate insulating layer |
05/12/1998 | US5751016 Device having a switch comprising a chromium layer |
05/12/1998 | US5751004 Projection reticle transmission control for coulomb interaction analysis |
05/12/1998 | US5751003 Loadlock assembly for an ion implantation system |
05/12/1998 | US5751002 Ion implantation apparatus |
05/12/1998 | US5750990 Method for measuring critical dimension of pattern on sample |
05/12/1998 | US5750987 Ion beam processing apparatus |
05/12/1998 | US5750908 Testing system with real time/off line functionality allocation |
05/12/1998 | US5750898 Passivation/patterning of PZR diamond films for high temperature transducer operability |
05/12/1998 | US5750632 Isolation of novolak resin by low temperature sub surface forced steam distillation |
05/12/1998 | US5750443 Method of manufacturing semiconductor device |
05/12/1998 | US5750442 Germanium as an antireflective coating and method of use |
05/12/1998 | US5750441 Mask having a tapered profile used during the formation of a semiconductor device |
05/12/1998 | US5750440 Apparatus and method for dynamically mixing slurry for chemical mechanical polishing |
05/12/1998 | US5750439 Method of making aluminum alloy wiring with less silicon nodule |
05/12/1998 | US5750438 Method for fabricating a local interconnection structure |
05/12/1998 | US5750437 Avoiding current leakage accompanied with silicidation |
05/12/1998 | US5750435 Method for minimizing the hot carrier effect in N-MOSFET devices |
05/12/1998 | US5750434 Dry polishing with chromium oxide or cerium oxide and iron oxide |
05/12/1998 | US5750433 Methods of forming electrically isolated active region pedestals using trench-based isolation techniques |
05/12/1998 | US5750432 Defect control in formation of dielectrically isolated semiconductor device regions |
05/12/1998 | US5750431 Method for fabricating a stacked capacitor |
05/12/1998 | US5750430 Method for making metal oxide semiconductor field effect transistor (MOSFET) |
05/12/1998 | US5750429 Semiconductor device and manufacture method of the same |
05/12/1998 | US5750428 Self-aligned non-volatile process with differentially grown gate oxide thickness |
05/12/1998 | US5750427 Non-volatile memory cell structure and process for forming same |
05/12/1998 | US5750426 Method of making MOS precision capacitor with low voltage coefficient |
05/12/1998 | US5750424 Blanket implanting dopant of first conductivity type to form souce and drain regions, selectively introducing dopant of second conductivity type |
05/12/1998 | US5750423 Method for encapsulation of semiconductor devices with resin and leadframe therefor |
05/12/1998 | US5750422 Method for making integrated circuit packaging with reinforced leads |
05/12/1998 | US5750421 Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device |
05/12/1998 | US5750420 Method for manufacturing a structure with a useful layer held at a distance from a substrate by abutments, and for detaching such a layer |
05/12/1998 | US5750419 Process for forming a semiconductor device having a ferroelectric capacitor |