Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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05/27/1998 | EP0844649A2 A method for boron contamination reduction in IC fabrication |
05/27/1998 | EP0844648A1 Semiconductor chip and method for manufacturing the same |
05/27/1998 | EP0844647A2 A low defect density composite dielectric |
05/27/1998 | EP0844646A2 Holder for disc-like substrates |
05/27/1998 | EP0844645A1 System, methods and apparatus for storing information during a semiconductor manufacturing process |
05/27/1998 | EP0844533A2 Correction of exposure data, particularly in manufacturing of semiconductor devices |
05/27/1998 | EP0844532A2 Exposure apparatus |
05/27/1998 | EP0844531A2 Master plate transporting system |
05/27/1998 | EP0844530A2 Reduction of pattern noise in scanning lithographic system illuminators |
05/27/1998 | EP0844529A2 Illumination system with controllable partial coherence |
05/27/1998 | EP0844431A2 System and method for controlled delivery of liquefied gases |
05/27/1998 | EP0844314A2 Distribution plate for a reaction chamber |
05/27/1998 | EP0844313A2 Method and apparatus for sputtering in a chamber having an inductively coupled plasma |
05/27/1998 | EP0844290A1 A composition and slurry useful for metal CMP |
05/27/1998 | EP0844283A1 Curable resin composition and cured products |
05/27/1998 | EP0843955A1 Method of forming raised metallic contacts on electrical circuits |
05/27/1998 | EP0843901A1 Electrically erasable, directly overwritable, multibit single cell memory elements and arrays fabricated therefrom |
05/27/1998 | EP0843899A2 High-voltage lateral mosfet soi device having a semiconductor linkup region |
05/27/1998 | EP0843898A1 Short channel fermi-threshold field effect transistors |
05/27/1998 | EP0843897A1 Monolithically integrated planar semi-conductor arrangement with temperature compensation |
05/27/1998 | EP0843895A1 Metal interconnect structure for an integrated circuit with improved electromigration reliability |
05/27/1998 | EP0843894A1 Encapsulant with fluxing properties and method of use |
05/27/1998 | EP0843891A2 Process for producing a non-volatile memory cell |
05/27/1998 | EP0843890A1 Apparatus and method for improved deposition of conformal liner films and plugs in high aspect ratio contacts |
05/27/1998 | EP0843889A1 Laser surface treatment device and method |
05/27/1998 | EP0843888A1 Process for manufacturing a self-aligned contact and doped region |
05/27/1998 | EP0843842A1 Lithography exposure mask derived from nanocrystal precursors and a method of manufacturing the same |
05/27/1998 | EP0843825A1 Semiconductor wafer test and burn-in |
05/27/1998 | EP0843640A1 Straight line wafer transfer system |
05/27/1998 | EP0749500B1 Method of manufacturing a thin silicon-oxide layer |
05/27/1998 | EP0664889B1 Method for accelerated degradation testing of semiconductor devices |
05/27/1998 | EP0577623B1 Method of making a thyristor with adjustable breakover voltage |
05/27/1998 | CN1183170A Encapsulation of transmitter and receiver modules |
05/27/1998 | CN1183169A A solder bump structure for a microelectronic substrate |
05/27/1998 | CN1183062A Cleaning device and method |
05/27/1998 | CN1183020A Zone heating, system with feedback control |
05/27/1998 | CN1182980A Threshold logic circuit needing miniature area |
05/27/1998 | CN1182962A Thin film transistor and making method |
05/27/1998 | CN1182961A Device with static electricity discharge protection |
05/27/1998 | CN1182960A Nonvolatile semiconductor storage device and making method |
05/27/1998 | CN1182959A Three-dimension device distribution |
05/27/1998 | CN1182958A Tungsten nitride (WNx) layer manufacturing method and metal wiring manufacturing method using the same |
05/27/1998 | CN1182957A Structure reinforced spherical grid array semiconductor package and system |
05/27/1998 | CN1182956A Fluorine barrier layer for preventing deterioration located between conductor and insulator |
05/27/1998 | CN1182955A Method for making IC |
05/27/1998 | CN1182947A Metal coated membrane capacitor and making method |
05/27/1998 | CN1182939A Not easily lost storage device |
05/27/1998 | CN1182921A Graph testing method and device |
05/27/1998 | CN1182881A Integrated circuit |
05/27/1998 | CN1182703A Equipment for transferring semiconductor chip |
05/27/1998 | CN1182697A Package method for LCD screen and package material |
05/27/1998 | CN1038491C Tray for IC elements |
05/26/1998 | US5757695 Mram with aligned magnetic vectors |
05/26/1998 | US5757694 Balanced resistance load type SRAM cell |
05/26/1998 | US5757692 Semiconductor memory device |
05/26/1998 | US5757691 Semiconductor memory device having wiring for selection of redundant cells but without useless region on chip |
05/26/1998 | US5757657 Adaptive incremental placement of circuits on VLSI chip |
05/26/1998 | US5757612 Structure and fabrication method for non-planar memory elements |
05/26/1998 | US5757480 Method for laser alignment in mask repair |
05/26/1998 | US5757469 Scanning lithography system haing double pass Wynne-Dyson optics |
05/26/1998 | US5757456 Display device and method of fabricating involving peeling circuits from one substrate and mounting on other |
05/26/1998 | US5757445 Single crystal silicon tiles for display panels |
05/26/1998 | US5757444 Electro-optical device and method of driving the same |
05/26/1998 | US5757409 Exposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatus |
05/26/1998 | US5757235 Metal semiconductor field effect transistor of source-ground type |
05/26/1998 | US5757211 IC precision resistor ratio matching with different tub bias voltages |
05/26/1998 | US5757202 Semiconductor device having a test mode setting circuit |
05/26/1998 | US5757199 Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit |
05/26/1998 | US5757160 Moving interferometer wafer stage |
05/26/1998 | US5757089 Method of automatic wiring |
05/26/1998 | US5757083 Drain off-set for pull down transistor for low leakage SRAM's |
05/26/1998 | US5757082 Semiconductor chips, devices incorporating same and method of making same |
05/26/1998 | US5757080 Resin-sealed semiconductor device |
05/26/1998 | US5757079 Method for repairing defective electrical connections on multi-layer thin film (MLTF) electronic packages and the resulting MLTF structure |
05/26/1998 | US5757078 Semiconductor device with increased multi-bumps and adhered multilayered insulating films and method for installing same |
05/26/1998 | US5757077 Integrated circuits with borderless vias |
05/26/1998 | US5757074 Accuracy, efficiency |
05/26/1998 | US5757073 Heatsink and package structure for wirebond chip rework and replacement |
05/26/1998 | US5757072 Structure for protecting air bridges on semiconductor chips from damage |
05/26/1998 | US5757071 Substrate surface having contact pads coated with layer of nickel-boron and reverse surface with projecting pins having layer of nickel-phosphorous and another of gold, for integrated circuits |
05/26/1998 | US5757068 Carrier film with peripheral slits |
05/26/1998 | US5757067 Resin-sealed type semiconductor device |
05/26/1998 | US5757066 Resin-molded type semiconductor device and method of manufacturing the same |
05/26/1998 | US5757065 High voltage integrated circuit diode with a charge injecting node |
05/26/1998 | US5757064 Multlayer interconnection structure for semiconductor device |
05/26/1998 | US5757063 Semiconductor device having an extrinsic gettering film |
05/26/1998 | US5757061 Ferroelectric thin film coated substrate, producing method thereof and capacitor structure element using thereof |
05/26/1998 | US5757059 Insulated gate field effect transistor |
05/26/1998 | US5757053 Effective load length increase by topography |
05/26/1998 | US5757052 Bipolar transistor and method of forming BiCMOS circuitry |
05/26/1998 | US5757048 Thin film transistor, solid state device, display device and manufacturing method of a thin film transistor |
05/26/1998 | US5757047 Semiconductor device and method of manufacturing the same |
05/26/1998 | US5757045 CMOS device structure with reduced risk of salicide bridging and reduced resistance via use of a ultra shallow, junction extension, ion implantation |
05/26/1998 | US5757044 Electrically erasable and programmable read only memory cell with split floating gate for preventing cell from over-erase |
05/26/1998 | US5757043 Charge pump semiconductor device |
05/26/1998 | US5757039 Collector up heterojunction bipolar transistor |
05/26/1998 | US5757038 Self-aligned dual gate MOSFET with an ultranarrow channel |
05/26/1998 | US5757032 Semiconductor diamond device having improved metal-diamond contact for excellent operating stability at elevated temperature |
05/26/1998 | US5757031 Semiconductor static memory device having a TFT load |
05/26/1998 | US5757030 Thin film transistor with an insulating film having an increased thickness on a periphery of a semiconductor island |