Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/1998
07/08/1998EP0579779B1 A single transistor non-volatile electrically alterable semiconductor memory device
07/08/1998EP0541288B1 Circuit module redundacy architecture
07/08/1998CN1187042A SRAM cell and method for manufacturing the same
07/08/1998CN1187041A Semiconductor memory device and method for manufacturing the same
07/08/1998CN1187040A Process for manufacturing semiconductor device
07/08/1998CN1187035A Semiconductor chip package and method for fabricating the same
07/08/1998CN1187033A Metal to metal capacitor and method for producing same
07/08/1998CN1187032A Method for working integrated circuit wiring
07/08/1998CN1187031A Wafer supporting and/or conveying apparatus
07/08/1998CN1187030A Method for packaging integrated circuit
07/08/1998CN1187029A 栅阵列球半导体封装 Ball grid array semiconductor package
07/08/1998CN1187028A Method for fabricating DMOS transistor
07/08/1998CN1187027A Method of forming protective film in semiconductor device
07/08/1998CN1187026A Capacitor and method for manufacturing the same
07/08/1998CA2194653A1 Hydrogen heat treatment method of silicon wafers using a high-purity inert substitution gas
07/07/1998US5778386 Global view storage management system for semiconductor manufacturing plants
07/07/1998US5777930 Semiconductor device
07/07/1998US5777927 Semiconductor memory
07/07/1998US5777920 Semiconductor memory device and method of manufacturing the same
07/07/1998US5777901 Method and system for automated die yield prediction in semiconductor manufacturing
07/07/1998US5777881 Method of deciding control parameters of heat treatment instrument and apparatus thereof
07/07/1998US5777839 Capacitor using dielectric film
07/07/1998US5777838 Electrostatic chuck and method of attracting wafer
07/07/1998US5777739 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers
07/07/1998US5777729 Wafer inspection method and apparatus using diffracted light
07/07/1998US5777721 Exposure method and apparatus with control of a linear motor
07/07/1998US5777701 Display device
07/07/1998US5777672 Photosensitive device with juxtaposed reading registers
07/07/1998US5777543 Ceramic resistor and electrostatic chuck having an aluminum nitride crystal phase
07/07/1998US5777495 Method for the high-linearity copying of voltage
07/07/1998US5777391 Semiconductor device having an improved connection arrangement between a semiconductor pellet and base substrate electrodes and a method of manufacture thereof
07/07/1998US5777389 Semiconductor device including ohmic contact to-n-type GaAs
07/07/1998US5777388 Semiconductor device of the type sealed in glass having a silver-copper bonding layer between slugs and connection conductors
07/07/1998US5777387 Semiconductor device constructed by mounting a semiconductor chip on a film carrier tape
07/07/1998US5777386 Semiconductor device and mount structure thereof
07/07/1998US5777382 Plastic packaging for a surface mounted integrated circuit
07/07/1998US5777380 Nonpeeling connector & dielectric support
07/07/1998US5777376 Pnp-type bipolar transistor
07/07/1998US5777375 Semiconductor device improved in a structure of an L-PNP transistor
07/07/1998US5777373 Semiconductor structure with field-limiting rings and method for making
07/07/1998US5777370 Trench isolation of field effect transistors
07/07/1998US5777367 Integrated structure active clamp for the protection of power devices against overvoltages
07/07/1998US5777366 Integrated device with a structure for protection against high electric fields
07/07/1998US5777365 Semiconductor device having a silicon-on-insulator structure
07/07/1998US5777363 Semiconductor device with composite drift region
07/07/1998US5777361 Single gate nonvolatile memory cell and method for accessing the same
07/07/1998US5777359 Semiconductor flash memory device and fabrication method of same
07/07/1998US5777358 Stacked capacitor semiconductor memory device and method for fabricating the same
07/07/1998US5777356 Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making same
07/07/1998US5777351 Compression bonded type semiconductor element and semiconductor device
07/07/1998US5777348 Active matrix substrate and inspecting method thereof
07/07/1998US5777327 Pattern shape inspection apparatus for forming specimen image on display apparatus
07/07/1998US5777300 Reduced pressure wet oxidation system; burning hydrogen and oxygen gases to generate water vapor, pressure differential
07/07/1998US5777289 RF plasma reactor with hybrid conductor and multi-radius dome ceiling
07/07/1998US5776837 Method of obtaining high quality silicon dioxide passivation on silicon carbide and resulting passivated structures
07/07/1998US5776836 Self aligned method to define features smaller than the resolution limit of a photolithography system
07/07/1998US5776835 Method of making a grooved gate structure of semiconductor device
07/07/1998US5776834 Bias plasma deposition for selective low dielectric insulation
07/07/1998US5776833 Method for forming metal plug
07/07/1998US5776832 Anti-corrosion etch process for etching metal interconnections extending over and within contact openings
07/07/1998US5776831 Method of forming a high electromigration resistant metallization system
07/07/1998US5776830 Process for fabricating connection structures
07/07/1998US5776829 Method for forming multilevel interconnections in a semiconductor device
07/07/1998US5776828 Reduced RC delay between adjacent substrate wiring lines
07/07/1998US5776827 Wiring-forming method
07/07/1998US5776826 Crack stop formation for high-productivity processes
07/07/1998US5776825 Method for forming a semiconductor device having reduced stepped portions
07/07/1998US5776824 Method for producing laminated film/metal structures for known good die ("KG") applications
07/07/1998US5776823 Alloy of tantalum, silicon, nitrogen to prevent oxidation of silicon substrate in semiconductor device
07/07/1998US5776822 Method for fabricating semiconductor device having titanium silicide film
07/07/1998US5776821 Pre-gate side-walls exposed; removing oxide layer to reduce width while retaining a mask
07/07/1998US5776820 Method of forming a high-frequency transistor T gate electrode
07/07/1998US5776819 Deposition of device quality, low hydrogen content, amorphous silicon films by hot filament technique using "safe" silicon source gas
07/07/1998US5776818 Method of fabricating silicon-on-insulator pressure detecting device
07/07/1998US5776817 Method of forming a trench structure in a semiconductor device
07/07/1998US5776816 Nitride double etching for twin well align
07/07/1998US5776815 Method for forming a contact intermediate two adjacent electrical components
07/07/1998US5776814 Process for doping two levels of a double poly bipolar transistor after formation of second poly layer
07/07/1998US5776812 Manufacturing method of semiconductor device
07/07/1998US5776811 Simplified process for fabricating flash eeprom cells
07/07/1998US5776810 Method for forming EEPROM with split gate source side injection
07/07/1998US5776809 Method for forming a capacitor
07/07/1998US5776808 Pad stack with a poly SI etch stop for TEOS mask removal with RIE
07/07/1998US5776807 Method for fabricating a triple well for bicmos devices
07/07/1998US5776806 Method of forming CMOS integrated circuitry having halo regions
07/07/1998US5776805 Metal semiconductor field effect transistor
07/07/1998US5776804 Process of fabricating semiconductor device having non-single crystal thin film transistor free from residual hydrogen left therein during hydrogen treatment stage
07/07/1998US5776803 Manufacture of electronic devices comprising thin-film circuitry on a polymer substrate
07/07/1998US5776800 Paddleless molded plastic semiconductor chip package
07/07/1998US5776798 Semiconductor package and method thereof
07/07/1998US5776796 Method of encapsulating a semiconductor package
07/07/1998US5776791 Process for collective manufacture of chips with electrodes selectively covered by a deposit
07/07/1998US5776790 C4 Pb/Sn evaporation process
07/07/1998US5776789 Method for fabricating a semiconductor memory device
07/07/1998US5776788 Method for forming a strong dielectric film by the sol-gel technique and a method for manufacturing a capacitor
07/07/1998US5776787 Spacer flash cell process
07/07/1998US5776786 Method for wire-bonding a covered wire
07/07/1998US5776663 Multilayer element with polyimide support on pattern seed layers, treatment with light beams and development
07/07/1998US5776662 Multilayer electroconductive material, lamination and chips
07/07/1998US5776660 Fabrication method for high-capacitance storage node structures