Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2002
09/06/2002WO2002069038A2 Novel polymers and photoresist compositions comprising same
09/06/2002WO2002068944A1 Method and apparatus for measuring physical properties of micro region
09/06/2002WO2002068730A1 Plating device and plating method
09/06/2002WO2002068727A2 Copper-plating solution, plating method and plating apparatus
09/06/2002WO2002068717A1 Method for etching electronic components containing tantalum
09/06/2002WO2002068714A1 Electrostatic chuck
09/06/2002WO2002068713A1 Vaporizer
09/06/2002WO2002068712A2 Removal of etchant residues
09/06/2002WO2002068711A1 Heat treating device
09/06/2002WO2002068710A1 Method for producing parts and a vacuum processing system
09/06/2002WO2002068709A1 A chemical vapor deposition process and apparatus thereof
09/06/2002WO2002068350A1 Oxygen doping of silicon oxyfluoride glass
09/06/2002WO2002068321A2 Forming tool for forming a contoured microelectronic spring mold
09/06/2002WO2002068320A2 Devices having substrates with openings passing through the substrates and conductors in the openings, and methods of manufacture
09/06/2002WO2002068145A1 Controlled attenuation capillary
09/06/2002WO2002068129A1 Corrosion resistant component of semiconductor processing equipment and method of manufacture thereof
09/06/2002WO2002068127A2 Manifolded fluid delivery system
09/06/2002WO2002052617B1 Method and device for treating semiconductor substrates
09/06/2002WO2002048425A3 Method and system for icosaborane implantation
09/06/2002WO2002046864A3 Automated wafer handling with graphic user interface
09/06/2002WO2002045476A9 Apparatus and method for electrochemically depositing metal on a semiconductor workpiece
09/06/2002WO2002043118A3 Wafer-level transfer of membranes in semiconductor processing
09/06/2002WO2002040145A3 Spheres and method of forming a plurality of spheres
09/06/2002WO2002038386B1 A process and an apparatus for the formation of patterns in films using temperature gradients
09/06/2002WO2002033755A3 Method of fabricating heterojunction photodiodes integrated with cmos
09/06/2002WO2002033734A3 Ion processing element with composite media
09/06/2002WO2002031866A3 Infrared end-point system for cmp
09/06/2002WO2002031858A3 Gas distribution apparatus for semiconductor processing
09/06/2002WO2002031219A8 Electrostatically clamped edge ring for plasma processing
09/06/2002WO2002031011A3 Fractionation of resins using a static mixer and a liquid-liquid centrifuge
09/06/2002WO2002027061A8 Process chamber lid
09/06/2002WO2002023601A3 Method for contact etching using a hardmask and advanced resist technology
09/06/2002WO2002016063A3 Method for producing composite components by powder injection molding and composite powder appropriate for use in said method
09/06/2002WO2002013226A3 Spatial light modulator driven photocathode source electron beam pattern generator
09/06/2002WO2001086715A3 Method for soldering a first metal layer, which has a thickness of less than 5 $g(m)m, to a second metal layer, and a corresponding soldering device and semiconductor chip assembly device
09/06/2002WO2001086701A3 Method of high selectivity sac etching
09/06/2002WO2001064389A3 Vertical counter balanced test head manipulator
09/06/2002WO2001047045A9 Solution processing
09/06/2002WO2001039374A9 Starter device for normally off fets
09/06/2002WO2001037322A9 System and method for product yield prediction using a logic characterization vehicle
09/06/2002WO2001026150A9 System and method for repairing interconnect links
09/06/2002WO2001001460A9 Temperature controlled wafer chuck
09/06/2002CA2438730A1 Semiconductor developing agent
09/05/2002US20020124235 Method of forming mask for charged particle beam exposure and processing program of pattern data for forming mask for charged particle beam exposure
09/05/2002US20020124229 Lcr extraction method and computer program for performing lcr extraction in lsi design process
09/05/2002US20020124218 Method of testing a semiconductor integrated circuit and method and apparatus for generating test patterns
09/05/2002US20020124217 Testing apparatus and testing method for an integrated circuit, and integrated circuit
09/05/2002US20020123872 Method and apparatus for simulating manufacturing, electrical and physical characteristics of a semiconductor device
09/05/2002US20020123818 Production managing system of semiconductor device
09/05/2002US20020123816 Process monitoring device for sample processing apparatus and control method of sample processing apparatus
09/05/2002US20020123811 Production management system and program
09/05/2002US20020123586 Semiconductors; improved etch selectivity; preventing undercutting; lithography
09/05/2002US20020123299 Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structurs that include copper and tungsten and polishing methods
09/05/2002US20020123248 Methods of metal doping a chalcogenide material
09/05/2002US20020123247 Control of Vmin transient voltage drift by maintaining a temperature less than or equal to 350°C after the protective overcoat level
09/05/2002US20020123246 Method for fabricating a III nitride film, an underlayer for fabricating a III nitride film and a method for fabricating the same underlayer
09/05/2002US20020123245 Used to prevent the exposure light for exposing the resist from reflecting at a film lying under the resist
09/05/2002US20020123244 Impurity ion segregation precluding layer, fabrication method thereof, isolation structure for semiconductor device using the impurity ion segregation precluding layer and fabricating method thereof
09/05/2002US20020123243 Low k dielectric composite layer for integrated circuit structure which provides void-free low k dielectric material between metal lines while mitigating via poisoning
09/05/2002US20020123242 Simplified process for producing nanoporous silica
09/05/2002US20020123241 Process for forming pattern and method for producing liquid crystal display apparatus employing process for forming pattern
09/05/2002US20020123240 Electronic device manufacture
09/05/2002US20020123239 Method and apparatus for preparing nitride semiconductor surfaces
09/05/2002US20020123238 Surfaces of the single fibers comprising said fibrous structural material are coated with a pre-treating agent containing a polyhydric compound as main component
09/05/2002US20020123236 Heat treatment apparatus and method
09/05/2002US20020123235 Ruthenium silicide wet etch
09/05/2002US20020123234 Method and composition for plasma etching of a self-aligned contact opening
09/05/2002US20020123233 Method for stacking semiconductor die within an implanted medical device
09/05/2002US20020123231 Etching gas composition for silicon oxide and method of etching silicon oxide using the same
09/05/2002US20020123230 Gas distribution apparatus for semiconductor processing
09/05/2002US20020123229 Plasma processing method
09/05/2002US20020123228 Method to improve the reliability of gold to aluminum wire bonds with small pad openings
09/05/2002US20020123227 Intermediate transfer layers for nanoscale pattern transfer and nanostructure formation
09/05/2002US20020123226 Method and composition for plasma etching of a self-aligned contact opening
09/05/2002US20020123225 Control of Vmin transient voltage drift by using a PECVD silicon oxynitride film at the protective overcoat level
09/05/2002US20020123224 Chemical mechanical polishing slurry
09/05/2002US20020123223 Method of manufacturing a semiconductor device and a device obtained by means of said method
09/05/2002US20020123222 Method of fabricating a salicide layer
09/05/2002US20020123221 Chemical vapor deposition methods and methods of etching a contact opening over a node location on a semiconductor substrate
09/05/2002US20020123220 Immersing a substrate having copper conductive regions in a solution comprising palladium to deposit palladium; immersing in solution of sodium citrate and EDTA; rinsing; electroless plating cobalt-tungsten-phosphorus alloy film; rinsing
09/05/2002US20020123219 Method of forming a via of a dual damascene with low resistance
09/05/2002US20020123218 Semiconductor device and mehtod of manufacturing the same
09/05/2002US20020123217 Damascene processing employing low si-sion etch stop layer/arc
09/05/2002US20020123216 Method of manufacturing semiconductor device
09/05/2002US20020123215 Process for producing barrier film and barrier film thus produced
09/05/2002US20020123214 Control of Vmin transient voltage drift by using silicon formed with deuterium-based process gases
09/05/2002US20020123213 Stereolithographically fabricated conductive elements, semiconductor device components and assemblies including such conductive elements, and methods
09/05/2002US20020123212 Semiconductor device manufacturing method
09/05/2002US20020123211 Implantation process using substoichiometric, oxygen doses at different energies
09/05/2002US20020123210 Semiconductor device and method for manufacturing the same
09/05/2002US20020123208 Method of fabricating a self-aligned shallow trench isolation
09/05/2002US20020123207 Methods of manufacturing semiconductor devices
09/05/2002US20020123206 Method of forming an insulating layer in a trench isolation type semiconductor device
09/05/2002US20020123205 Semiconductor device and method of manufacturing the same
09/05/2002US20020123204 Method of making a hybrid substrate having a thin silicon carbide membrane layer
09/05/2002US20020123203 Ferroelectric memory configuration and a method for producing the configuration
09/05/2002US20020123202 Semiconductor device and method for manufacturing the same
09/05/2002US20020123201 Method of manufacturing CMOS thin film transistor
09/05/2002US20020123200 Plasma processing apparatus
09/05/2002US20020123199 Method of manufacturing a bipolar transistor semiconductor device