Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2004
02/19/2004US20040033668 Method to fabricate elevated source/drain transistor with large area for silicidation
02/19/2004US20040033667 Method for isolating hybrid device in image sensor
02/19/2004US20040033666 Isolated complementary MOS devices in epi-less substrate
02/19/2004US20040033665 Structure and method of controlling short-channel effect of very short channel MOSFET
02/19/2004US20040033664 Semiconductor device having electrically erasable programmable read-only memory (EEPROM) and Mask-ROM and method of fabricating the same
02/19/2004US20040033663 Floating gate and fabricating method of the same
02/19/2004US20040033662 Integrated circuit capacitors having doped HSG electrodes
02/19/2004US20040033661 Semiconductor device and method for manufacturing the same
02/19/2004US20040033660 Method for manufacturing capacitor
02/19/2004US20040033659 Method for fabricating transistors having damascene formed gate contacts and self-aligned borderless bit line contacts
02/19/2004US20040033658 Method of fabricating MOS transistors
02/19/2004US20040033657 Method for fabricating memory unit with T-shaped gate
02/19/2004US20040033656 Large area, fast frame rate charge coupled device
02/19/2004US20040033655 Floating gate and method of fabricating the same
02/19/2004US20040033653 Method of forming a gate of a non-volatile memory device
02/19/2004US20040033652 Method for fabricating microstructures and arrangement of microstructures
02/19/2004US20040033651 Method for separating a film and a substrate
02/19/2004US20040033650 Low-resistance contact to silicon having a titanium silicide interface and an amorphous titanium carbonitride barrier layer
02/19/2004US20040033649 Semiconductor device and method for manufacturing the same
02/19/2004US20040033648 Method of fabricating thin film transistor
02/19/2004US20040033647 Method for fabricating sram cell
02/19/2004US20040033646 Methods of forming field effect transistors, and methods of forming integrated circuitry
02/19/2004US20040033645 Novel silicon-controlled rectifier structures on silicon-on insulator with shallow trench isolation
02/19/2004US20040033644 Methods for transfer molding encapsulation of a semiconductor die with attached heat sink
02/19/2004US20040033643 Vibration-assisted method for underfilling flip-chip electronic devices
02/19/2004US20040033642 Methods for application of adhesive tape to semiconductor devices
02/19/2004US20040033641 Method of creating a hight performance organic semiconductor device
02/19/2004US20040033640 Solid state image device and manufacturing method thereof
02/19/2004US20040033635 Method of detecting spatially correlated variations in a parameter of an integrated circuit die
02/19/2004US20040033634 Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices
02/19/2004US20040033632 Method of calculating the real added defect counts
02/19/2004US20040033631 Methods for inspection sample preparation
02/19/2004US20040033630 Charge pump or other charge storage capacitor including PZT layer for combined use as encapsulation layer and dielectric layer of ferroelectric capacitor and a method for manufacturing the same
02/19/2004US20040033628 Method for forming a plane structure
02/19/2004US20040033448 Misalignment is automatically detected and corrected, eliminating the need for reworking
02/19/2004US20040033445 Method of forming a photoresist pattern and method for patterning a layer using a photoresist
02/19/2004US20040033444 Method of manufacturing semiconductor device and method of forming pattern
02/19/2004US20040033443 Photolithography with a decreased number of photo processes
02/19/2004US20040033441 Negative resist composition
02/19/2004US20040033438 Alkali-insoluble or slightly soluble resin protected with an acid-labile protecting group, carboxylic acid generating compound, and sulfonic acid generating compound
02/19/2004US20040033437 Radiation-sensitive composition
02/19/2004US20040033432 Improved resolution, improved focus latitude, and minimized line width variation or shape degradation even on long-term PED.
02/19/2004US20040033426 Alignment system uses a self-referencing interferometer that produces two overlapping and relatively rotated images of an alignment markers.
02/19/2004US20040033425 Irradiating with at least one beam of molecules, at least one beam of photons and at least one beam of electrons
02/19/2004US20040033381 Interlayer insulating film, method for forming the same and polymer composition
02/19/2004US20040033373 Low kappa dielectric inorganic/organic hybrid films and methods of making
02/19/2004US20040033366 Bis(perfluoroalkanesulfonyl)imides and their salts as surfactants/additives for applications having extreme environments and methods therefor
02/19/2004US20040033361 Component of glass-like carbon for CVD apparatus and process for production thereof
02/19/2004US20040033339 Porous body and method of manufacturing the same
02/19/2004US20040033318 Apparatus and method for forming thin-film
02/19/2004US20040033283 Apparatus for encasing array packages
02/19/2004US20040033125 Modular frame for a wafer fabrication system
02/19/2004US20040033008 Optical interconnection apparatus and interconnection module
02/19/2004US20040032979 Defect inspection method
02/19/2004US20040032931 X-ray alignment system for fabricaing electronic chips
02/19/2004US20040032788 Nonvolatile semiconductor memory
02/19/2004US20040032774 Non-volatile semiconductor memory device and data write control method for the same
02/19/2004US20040032773 Programmable memory address and decode circuits with vertical body transistors
02/19/2004US20040032764 Semiconductor memory device
02/19/2004US20040032762 DMOS device with a programmable threshold voltage
02/19/2004US20040032579 Method for determining wavefront aberrations
02/19/2004US20040032575 Exposure apparatus and an exposure method
02/19/2004US20040032574 Lithographic projection apparatus, device manufacturing method, and device manufacturing thereby
02/19/2004US20040032279 Semiconductor device having bonding pads and probe pads
02/19/2004US20040032272 Contactor having contact electrodes formed by laser processing
02/19/2004US20040032256 Frequency measuring device, polishing device using the same and eddy current sensor
02/19/2004US20040032244 Time recording device and a time recording method employing a semiconductor element
02/19/2004US20040032029 Semiconductor device and its production method
02/19/2004US20040032027 Memory cell having a thin insulation collar and memory module
02/19/2004US20040032026 Wafer level package and the process of the same
02/19/2004US20040032025 Flip chip package with thermometer
02/19/2004US20040032024 Low fabrication cost, high performance, high reliability chip scale package
02/19/2004US20040032021 Structure of a heat dissipation fin
02/19/2004US20040032020 Protective structures for bond wires
02/19/2004US20040032019 Semiconductor device
02/19/2004US20040032017 Structure and method of stacking multiple semiconductor substrates of a composite semiconductor device
02/19/2004US20040032015 Semiconductor device
02/19/2004US20040032013 Semiconductor dice packages employing at least one redistribution layer and methods of fabrication
02/19/2004US20040032012 Hermetically packaging a microelectromechanical switch and a film bulk acoustic resonator
02/19/2004US20040032010 Amorphous soft magnetic shielding and keeper for MRAM devices
02/19/2004US20040032009 Semicondutor wafer device
02/19/2004US20040032006 For isolation of a semiconductor device; structures having different constructions in a cell region and a peripheral region of a substrate
02/19/2004US20040032005 Complementary analog bipolar transistors with trench-constrained isolation diffusion
02/19/2004US20040032003 Semiconductor device fabricated on surface of silicon having <110>direction of crystal plane and its production method
02/19/2004US20040032001 Method for forming a dual gate oxide device using a metal oxide and resulting device
02/19/2004US20040031997 Semiconductor device, method for evaluating the same, and method for fabricating the same
02/19/2004US20040031996 Semiconductor device and method for forming
02/19/2004US20040031995 Standard-cell type semiconductor integrated circuit device with a mixed arrangement of standard cells differing in height
02/19/2004US20040031994 Semiconductor device with gate space of positive slope and fabrication method thereof
02/19/2004US20040031992 DRAM having improved leakage performance and method for making same
02/19/2004US20040031991 Particularly suitable for preventing short-circuits between semiconductor layers and between a data line and the gate line
02/19/2004US20040031990 Semiconductor on insulator apparatus and method
02/19/2004US20040031988 Semiconductor integrated circuit device having deposited layer for gate insulation
02/19/2004US20040031987 Method for fabricating a transistor configuration including trench transistor cells having a field electrode, trench transistor, and trench configuration
02/19/2004US20040031986 Non-volatile memory and semiconductor device
02/19/2004US20040031985 Boron-doped gate electrode formed above high- permittivity insulator film and high-permittivity nitride formed between
02/19/2004US20040031984 Vertical NROM and methods for making thereof
02/19/2004US20040031983 Structure of a memory device and fabrication method thereof
02/19/2004US20040031981 Self-aligned vertical gate semiconductor device
02/19/2004US20040031980 Semiconductor integrated circuit device and method for manufacturing the same