| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 03/03/2004 | CN1479379A Semiconductor device and its making method |
| 03/03/2004 | CN1479377A Capacitor of semiconductor device and its preparing method |
| 03/03/2004 | CN1479376A Structure of storage device and its manufacturing method |
| 03/03/2004 | CN1479375A 电容器 Capacitors |
| 03/03/2004 | CN1479374A External discharge protection circuite |
| 03/03/2004 | CN1479373A 半导体元件及半导体封装 Semiconductor elements and semiconductor packages |
| 03/03/2004 | CN1479371A Packaging baseplate having electrostatic discharge protection |
| 03/03/2004 | CN1479368A Flattening method of flas storage device |
| 03/03/2004 | CN1479367A Method of manufacturing bicarrier complementary gold oxygen semi conductor on silicon insolator base |
| 03/03/2004 | CN1479366A Manufacturing method of semiconductor memory device |
| 03/03/2004 | CN1479365A Structure of L-type word line gap wall and its manufacturing method |
| 03/03/2004 | CN1479364A Method of forming contact hole with exposed conductive pattern on semi conductor substrate |
| 03/03/2004 | CN1479363A Method of conforming rear end manufacturing process |
| 03/03/2004 | CN1479362A Method of forming shallow slot partition structure |
| 03/03/2004 | CN1479360A Method of monstoring real defect through eliminating duplicate defect which does not influence acceptance raet |
| 03/03/2004 | CN1479359A Packaging mould with electrostatic discharge protection |
| 03/03/2004 | CN1479358A Packaging mould with electrostatic protection |
| 03/03/2004 | CN1479357A Packaging method capable of proceeding electric defect test for top surface and botton surface of wafer |
| 03/03/2004 | CN1479356A Manufacturing method of semiconductor assembly part capable of improving lattice defectin silicon build up crystal layer |
| 03/03/2004 | CN1479355A Fluted plane bigrid structure MOS device and its manufacturing method |
| 03/03/2004 | CN1479354A Method of preparing SON type field-effect transistor |
| 03/03/2004 | CN1479353A Separating processing method for material layer |
| 03/03/2004 | CN1479352A Method and device for deciding semiconductor making process state and semiconductor making device |
| 03/03/2004 | CN1479351A No-scrape chemical mechanical grinding technology |
| 03/03/2004 | CN1479350A Method of forming different thickness bigrid insulating layer |
| 03/03/2004 | CN1479349A Flip-chip packaged scab technology |
| 03/03/2004 | CN1479328A Aging circuit of capacitor |
| 03/03/2004 | CN1479313A Semiconductor storing device and semiconductor integrated circuit |
| 03/03/2004 | CN1479175A Method for etching surface material with induced chemical reaction by focused electron beam on surface |
| 03/03/2004 | CN1479174A Photoetching device and method for manufacturing device |
| 03/03/2004 | CN1479172A Pattern forming method and substrate treatment device |
| 03/03/2004 | CN1479137A Semiclnductor display device and electronic device with the semiconductor display device |
| 03/03/2004 | CN1479073A Distortion measurement method and exposure equipment |
| 03/03/2004 | CN1478824A Electronic element for high frequency using low-dielectric loss angle tangent insulating material |
| 03/03/2004 | CN1478800A Photoetch resist copolymer |
| 03/03/2004 | CN1140932C Zinc oxide film, photoelectric element and process for production thereof |
| 03/03/2004 | CN1140929C Non-volatile semiconductor memory featuring effective cell area reduction using contactless technology |
| 03/03/2004 | CN1140927C Method for producing storage cell |
| 03/03/2004 | CN1140926C Method for manufacturing DRAM cell capacitor |
| 03/03/2004 | CN1140925C Semiconductor device and method for manufacturing thereof |
| 03/03/2004 | CN1140924C Method for producing double-metal mosaic structure |
| 03/03/2004 | CN1140923C Gap fill of semiconductor structure using doped silicate glasses with multi-step deposition/anneal process |
| 03/03/2004 | CN1140922C Method for eliminating leakage current of shallow channel isolation area |
| 03/03/2004 | CN1140921C Method for controlling cracking of ceramic thin film circuit |
| 03/03/2004 | CN1140920C Double wafer structure without wafer holder |
| 03/03/2004 | CN1140919C Activation method for reducing P-type film resistance by laser |
| 03/03/2004 | CN1140918C Method for eliminating barried layer pore of semiconductor element |
| 03/03/2004 | CN1140917C Method of making semiconductor structure containing metal oxide interface of silicon |
| 03/03/2004 | CN1140916C Synthesis of half rotary coposite material |
| 03/03/2004 | CN1140915C Method for obtaining large-area high-quality GaN self-supporting substrate |
| 03/03/2004 | CN1140914C Method for mfg. semiconductor structure having crystalline alkaline earth metal oxide interface with silicon |
| 03/03/2004 | CN1140913C Workpiece vibration damper |
| 03/03/2004 | CN1140891C Process for preparing organic electroluminescent device with quantum trap |
| 03/02/2004 | US6701512 Focus monitoring method, exposure apparatus, and exposure mask |
| 03/02/2004 | US6701510 Computer readable medium with definition of interface recorded thereon, verification method for feasibility to connect given circuit and method of generating signal pattern |
| 03/02/2004 | US6701509 Integrated circuit power and ground routing |
| 03/02/2004 | US6701504 Block based design methodology |
| 03/02/2004 | US6701502 Integrated circuit device, arrangement/wiring method thereof, arrangement/wiring apparatus thereof, and recording medium |
| 03/02/2004 | US6701500 Logic circuit module, method for designing a semiconductor integrated circuit using the same, and semiconductor integrated circuit |
| 03/02/2004 | US6701497 Method for effective capacitance calculation of interconnect portion and delay calculation of electronic circuit |
| 03/02/2004 | US6701259 Defect source identifier |
| 03/02/2004 | US6701204 System and method for finding defective tools in a semiconductor fabrication facility |
| 03/02/2004 | US6701202 Performance evaluation method for plasma processing apparatus |
| 03/02/2004 | US6701199 Methodology to obtain integrated process results prior to process tools being installed |
| 03/02/2004 | US6700914 Vertical cavity surface emitting laser device |
| 03/02/2004 | US6700826 Semiconductor apparatus |
| 03/02/2004 | US6700815 Refresh scheme for dynamic page programming |
| 03/02/2004 | US6700771 Decoupling capacitor for high frequency noise immunity |
| 03/02/2004 | US6700763 Protected dual-voltage microcircuit power arrangement |
| 03/02/2004 | US6700715 Oscillation damping system |
| 03/02/2004 | US6700663 Method of monitoring a laser crystallization process |
| 03/02/2004 | US6700648 Method for controlling a processing apparatus |
| 03/02/2004 | US6700646 Lithographic apparatus, method of manufacturing a device, and device manufactured thereby |
| 03/02/2004 | US6700643 Device for exposure of a peripheral area of a film circuit board |
| 03/02/2004 | US6700642 Laser exposure apparatus |
| 03/02/2004 | US6700631 Method of separating thin-film device, method of transferring thin-film device, thin-film device, active matrix substrate, and liquid crystal display device |
| 03/02/2004 | US6700600 Beam positioning in microlithography writing |
| 03/02/2004 | US6700474 Dual layer; easily integrated into an existing cmos, bipolar, or bicmos process flow |
| 03/02/2004 | US6700458 Device and method for coupling two circuit components which have different impedances |
| 03/02/2004 | US6700437 Semiconductor device including logic circuit and macro circuit which has a function for stopping a direct current |
| 03/02/2004 | US6700435 Local supply generator for a digital CMOS integrated circuit having an analog signal processing circuitry |
| 03/02/2004 | US6700433 Drain activated/deactivated AC coupled bandpass RF switch |
| 03/02/2004 | US6700429 Semiconductor device |
| 03/02/2004 | US6700412 Semiconductor device |
| 03/02/2004 | US6700406 Multi-valued logical circuit with less latch-up |
| 03/02/2004 | US6700385 Apparatus and method for detection and measurement of environmental parameters |
| 03/02/2004 | US6700363 Reference voltage generator |
| 03/02/2004 | US6700330 EL display device and electronic device |
| 03/02/2004 | US6700249 Direct drive vertical lift and rotation stage |
| 03/02/2004 | US6700211 Method for forming conductors in semiconductor devices |
| 03/02/2004 | US6700210 Electronic assemblies containing bow resistant semiconductor packages |
| 03/02/2004 | US6700209 Partial underfill for flip-chip electronic packages |
| 03/02/2004 | US6700208 Surface mounting substrate having bonding pads in staggered arrangement |
| 03/02/2004 | US6700205 Semiconductor devices having contact plugs and local interconnects |
| 03/02/2004 | US6700203 Semiconductor structure having in-situ formed unit resistors |
| 03/02/2004 | US6700202 Reducing the oxidized interface with a hydrogen containing plasma and introducing second-layer-forming compounds |
| 03/02/2004 | US6700200 Reliable via structures having hydrophobic inner wall surfaces |
| 03/02/2004 | US6700199 Gold-silver bonding wire for semiconductor device |
| 03/02/2004 | US6700198 Resin for semiconductor wire |
| 03/02/2004 | US6700196 Programmable multi-chip module |