Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2004
03/10/2004CN1480780A displaying device, its mfg. method and mfg. appts.
03/10/2004CN1480569A Method of reducing crystal defect density
03/10/2004CN1480567A Method and apppts. for controlling oxygen content of reblended antimony or arsenic in silica chip
03/10/2004CN1480503A Abradant, grinding method for substrate, and mfg. method for semiconductor device
03/10/2004CN1141740C Optical receiving device integrated with circuit
03/10/2004CN1141739C Clad plate for lead frame's lead frame using the same, and method of manufacturing lead frame
03/10/2004CN1141738C Method for making inductance component on chip
03/10/2004CN1141737C Non-destructive method and device for measuring depth of buried interface
03/10/2004CN1141736C Composition for removing sidewall and method of removing sidewall
03/10/2004CN1141735C Manufacture of crystallized silicon series semiconductor films
03/10/2004CN1141734C Preparation of solar energy photovoltaic material-carbon film
03/10/2004CN1141733C Array type optical probe scanning IC photoetching method
03/10/2004CN1141732C Method of improving outline of photoresist pattern
03/10/2004CN1141714C Internal voltage generating circuit
03/10/2004CN1141628C Semiconductor device
03/10/2004CN1141619C Chemically amplitied resist composition
03/10/2004CN1141594C Semiconductor integrated circuit
03/10/2004CN1141416C Indium source reagent compsns.
03/10/2004CN1141353C Working liquids and methods for modifying structured wafers for semiconductor fabrication
03/09/2004US6704922 Correcting method of mask and mask manufactured by said method
03/09/2004US6704920 Process control for micro-lithography
03/09/2004US6704913 In situ wafer heat for reduced backside contamination
03/09/2004US6704897 Semiconductor device and the test system for the same
03/09/2004US6704889 Enhanced embedded logic analyzer
03/09/2004US6704757 Semiconductor arithmetic unit
03/09/2004US6704691 Provides time-saving way for in-line monitoring wafer quality of every wafer utilizing high speed processing ability of computer and correlation models
03/09/2004US6704675 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
03/09/2004US6704667 Real time mass flow control system with interlock
03/09/2004US6704661 Real time analysis of periodic structures on semiconductors
03/09/2004US6704609 Multi-chip semiconductor module and manufacturing process thereof
03/09/2004US6704496 High temperature drop-off of a substrate
03/09/2004US6704231 Semiconductor memory device with circuit executing burn-in testing
03/09/2004US6704222 Multi-state operation of dual floating gate array
03/09/2004US6704220 Layout for thermally selected cross-point MRAM cell
03/09/2004US6704219 FeRAM memory and method for manufacturing it
03/09/2004US6704218 FeRAM with a single access/multiple-comparison operation
03/09/2004US6704217 Symmetric segmented memory array architecture
03/09/2004US6704206 Assembly device and method for assembling an electronic component
03/09/2004US6704188 Ultra thin TCS (SiCL4) cell nitride for dram capacitor with DCS (SiH2Cl2) interface seeding layer
03/09/2004US6704180 Low input capacitance electrostatic discharge protection circuit utilizing feedback
03/09/2004US6704095 Control of a distribution of illumination in an exit pupil of an EUV illumination system
03/09/2004US6704093 Scanning exposure apparatus, scanning exposure method, and device manufacturing method
03/09/2004US6704091 Exposure apparatus and exposure method
03/09/2004US6704089 Lithographic projection apparatus, a method for determining a position of a substrate alignment mark, a device manufacturing method and device manufactured thereby
03/09/2004US6704088 Environmental-control method and apparatus for an exposure system
03/09/2004US6704085 Liquid crystal display apparatus having superimposed portion of common signal electrode, data signal wiring and scanning wiring via insulator
03/09/2004US6704069 TFT-LCD having particular gate insulator structure
03/09/2004US6703955 Variable-output-characteristic semiconductor integrated circuit device
03/09/2004US6703953 Semiconductor device, method of manufacturing semiconductor device and communication method
03/09/2004US6703861 Architecture and interconnect scheme for programmable logic circuits
03/09/2004US6703859 Programmable logic device and method of controlling clock signal thereof
03/09/2004US6703854 Burn-in apparatus having average voltage calculating circuit
03/09/2004US6703806 XYZ-axes table
03/09/2004US6703715 Semiconductor device having interconnection layer with multiply layered sidewall insulation film
03/09/2004US6703712 Microelectronic device layer deposited with multiple electrolytes
03/09/2004US6703711 Semiconductor device and method for fabricating the same
03/09/2004US6703710 Dual damascene metal trace with reduced RF impedance resulting from the skin effect
03/09/2004US6703709 Structures formed using silicide cap as an etch stop in multilayer metal processes
03/09/2004US6703708 Graded thin films
03/09/2004US6703705 Semiconductor device and method for packaging same
03/09/2004US6703701 Semiconductor device with integrated circuit elements of group III-V comprising means for preventing pollution by hydrogen
03/09/2004US6703696 Semiconductor package
03/09/2004US6703694 Frame for semiconductor package including plural lead frames having thin parts or hollows adjacent the terminal roots
03/09/2004US6703693 Apparatus for reversing lead frame
03/09/2004US6703690 Apparatus for reducing isolation stress in integrated circuits
03/09/2004US6703689 Miniature optical element for wireless bonding in an electronic instrument
03/09/2004US6703688 Relaxed silicon germanium platform for high speed CMOS electronics and high speed analog circuits
03/09/2004US6703687 Bipolar transistor and method for manufacturing the same
03/09/2004US6703686 Semiconductor device
03/09/2004US6703685 Super self-aligned collector device for mono-and hetero bipolar junction transistors
03/09/2004US6703684 Semiconductor device and method of forming a semiconductor device
03/09/2004US6703682 High sheet MOS resistor method and apparatus
03/09/2004US6703680 Programmable element programmed by changes in resistance due to phase transition
03/09/2004US6703678 Schottky barrier field effect transistor large in withstanding voltage and small in distortion and return-loss
03/09/2004US6703676 Magnetic memory device and manufacturing method thereof
03/09/2004US6703673 SOI DRAM having P-doped poly gate for a memory pass transistor
03/09/2004US6703672 Polysilicon/amorphous silicon composite gate electrode
03/09/2004US6703671 Insulated gate semiconductor device and method of manufacturing the same
03/09/2004US6703670 Eliminates the need for a separate mask and implant step to set the threshold voltage of the depletion-mode transistor
03/09/2004US6703669 Semiconductor device having serially connected memory cell transistors provided between two current terminals
03/09/2004US6703668 Local interconnect formed using silicon spacer
03/09/2004US6703667 Semiconductor integrated circuit device with connections formed using a conductor embedded in a contact hole
03/09/2004US6703666 Thin film resistor device and a method of manufacture therefor
03/09/2004US6703665 Transistor
03/09/2004US6703663 CMOS device using additional implant regions to enhance ESD performance and device manufactured thereby
03/09/2004US6703662 Semiconductor device and manufacturing method thereof
03/09/2004US6703661 Contactless NOR-type memory array and its fabrication methods
03/09/2004US6703659 Low voltage programmable and erasable flash EEPROM
03/09/2004US6703658 Non-volatile semiconductor memory device and its manufacturing method
03/09/2004US6703657 DRAM cell having electrode with protection layer
03/09/2004US6703655 Long-memory- retention-time single transistor ferroelectric ram
03/09/2004US6703654 Electrode which is smooth and has a low sheet resistivity
03/09/2004US6703652 Memory structure and method making
03/09/2004US6703650 Semiconductor integrated circuit including a circuit protecting against static electricity
03/09/2004US6703649 Semiconductor element
03/09/2004US6703648 Strained silicon PMOS having silicon germanium source/drain extensions and method for its fabrication
03/09/2004US6703641 Structure for detecting charging effects in device processing
03/09/2004US6703639 Nanofabrication for InAs/AlSb heterostructures
03/09/2004US6703638 Enhancement and depletion-mode phemt device having two ingap etch-stop layers
03/09/2004US6703630 Exposure method, electron beam exposure apparatus and fabrication method of electronic device