| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
|---|
| 05/26/2004 | CN1499600A Checking method and checker for thin film loading band for encasulating electronic part |
| 05/26/2004 | CN1499598A Device for tesing semiconductor |
| 05/26/2004 | CN1499597A Circuit capable of accurate measuring electric parameters of module in integrated component |
| 05/26/2004 | CN1499596A Mfg. method of assembly set with electronic component and mfg. method for related products |
| 05/26/2004 | CN1499595A Semiconductor device and its mfg. method |
| 05/26/2004 | CN1499593A Circuit wiring board and method of mfg. same |
| 05/26/2004 | CN1499592A Structure of jointed pads and preparation method |
| 05/26/2004 | CN1499591A Encapsulation structure of electronic component and its mfg. method |
| 05/26/2004 | CN1499590A Semiconductor device and its mfg. method |
| 05/26/2004 | CN1499589A Procedure of encapsulating composite crystal and device |
| 05/26/2004 | CN1499588A Low resistance T-grid MOSFET element and its mfg. method |
| 05/26/2004 | CN1499587A Method for preparing half insulated substrate by using non-adulterated indium phosphide through high temperature annealing |
| 05/26/2004 | CN1499586A Manufacturing method for continuous forming oxide/nitride/oxide insulation layer by using single wafer type reactor of chemical vapor deposition |
| 05/26/2004 | CN1499585A Method for forming material with low dielectric value and without ammonia |
| 05/26/2004 | CN1499584A Method and appts. for generating gas plasma and method of mfg. semiconductor |
| 05/26/2004 | CN1499583A Method for reducing proportion of discarding wafer in chemical-treating facility |
| 05/26/2004 | CN1499582A Method of processing semiconductor wafer |
| 05/26/2004 | CN1499581A Method of flatting semiconductor die |
| 05/26/2004 | CN1499580A Cutting appts. |
| 05/26/2004 | CN1499579A Method for mfg. semiconductor circuit element |
| 05/26/2004 | CN1499578A Self alignment semiconductor contact structure and its mfg. method |
| 05/26/2004 | CN1499577A Method for mfg. semiconductor device |
| 05/26/2004 | CN1499576A Method of disposing ion with high doping concentration for lowering defect on substrate |
| 05/26/2004 | CN1499574A Method of forming polysilicon layer and mfg. polysilicon thin film crystal |
| 05/26/2004 | CN1499573A Non-planography through selective reaction for producing mask, its products and compsns. for such method |
| 05/26/2004 | CN1499572A Part retainer |
| 05/26/2004 | CN1499571A Fig. design method of integrated circuit, exposure mask mfg. method and application |
| 05/26/2004 | CN1499544A Flat capacitor and IC socket using same, making method of such capacitor |
| 05/26/2004 | CN1499528A Semiconductor memory |
| 05/26/2004 | CN1499522A Non-volatile variohm, memory element, and its scaling method |
| 05/26/2004 | CN1499521A Magnetic memory element using metal inlaid tech and its mfg. method |
| 05/26/2004 | CN1499520A Ferromagnetic layer for magnetoresistance component |
| 05/26/2004 | CN1499519A Magnetic RAM, its mfg. and driving method |
| 05/26/2004 | CN1499518A Megnetic memory and its mfg. method |
| 05/26/2004 | CN1499458A Electrooptical device and electronic appliance |
| 05/26/2004 | CN1499457A Displaying device having nice properties |
| 05/26/2004 | CN1499456A Electrooptical device and electronic appliance |
| 05/26/2004 | CN1499299A Substrate calibrating appts, its processing device and delivery appts. |
| 05/26/2004 | CN1499298A Lightscribing device and mfg. method of such device |
| 05/26/2004 | CN1499297A Lightscribing device and mfg. method of such device |
| 05/26/2004 | CN1499295A Positive light-sensitive compsn. |
| 05/26/2004 | CN1499293A Checking method and element mfg. method |
| 05/26/2004 | CN1499292A Checking method and element mfg. method |
| 05/26/2004 | CN1499290A Non-lithographic printing method for producing self-alignment mask, produced products and compsns, for such products |
| 05/26/2004 | CN1499289A Microcast carborundum nano embossing mould |
| 05/26/2004 | CN1499288A Mask protective layer for photoetching and its mfg. method |
| 05/26/2004 | CN1499213A Route delay measuring circuit |
| 05/26/2004 | CN1499209A Mechanism for fixing probe card |
| 05/26/2004 | CN1499179A Chemical treating tank with indicator for liquid level in outer trough |
| 05/26/2004 | CN1498989A 结晶装置和结晶方法 Crystallization apparatus and the crystallization method |
| 05/26/2004 | CN1498931A Aqueous dispersion for chemical mechanical polishing and its use |
| 05/26/2004 | CN1498789A Automatic guide vehicle, prodn. system of semiconductor device, and prodn. management method of semiconductor device |
| 05/26/2004 | CN1498776A Rigidified nano stamp die plate |
| 05/26/2004 | CN1498725A Chemical mechanical polishing head with pivot mechanism and vertical regulation, and its application method |
| 05/26/2004 | CN1498724A Lapping machine and method of grinding workpiece |
| 05/26/2004 | CN1498723A 抛光垫 Polishing pad |
| 05/26/2004 | CN1498698A Substrate processor |
| 05/26/2004 | CN1498696A Method for mahufacturing catch pin of base plate clamp |
| 05/26/2004 | CN1498691A Element making appts., its making method and electronic appts. |
| 05/26/2004 | CN1151558C Integrated circuit device and process for its manufacture |
| 05/26/2004 | CN1151557C Integrated circuit device with at least one electric capacitor and making method thereof |
| 05/26/2004 | CN1151554C Semiconductor device, making method and composition type semiconductor device |
| 05/26/2004 | CN1151552C Semiconductor IC device with its layout designed by cell base method |
| 05/26/2004 | CN1151551C Method for making double-metal inlaid structure |
| 05/26/2004 | CN1151550C Method for forming self-aligning contact structure in semiconductor IC device |
| 05/26/2004 | CN1151549C Semiconductor integrated circuit and its making method |
| 05/26/2004 | CN1151548C Method for estimating qualified rate of integrated circuit device |
| 05/26/2004 | CN1151547C Semiconductor device fabrication method |
| 05/26/2004 | CN1151546C Combined preannel/oxidation process using quick heat treatment |
| 05/26/2004 | CN1151545C Mfg. method for capacitor having semi-spherical srystal grains |
| 05/26/2004 | CN1151544C Method for producing transistors |
| 05/26/2004 | CN1151543C Semiconductor device and its producing method |
| 05/26/2004 | CN1151542C Electronic device and and its mfg. method |
| 05/26/2004 | CN1151541C Electronic elements of thin-film transistor display and technology for manufacturing same |
| 05/26/2004 | CN1151510C Semiconductor memory device and its producing method |
| 05/26/2004 | CN1151482C Transistor circuit, display panel and electronic apparatus |
| 05/26/2004 | CN1151481C Current-driven emissive display device, method for driving same, and method for mfg. same |
| 05/26/2004 | CN1151408C Method for fabricating light exposure mask |
| 05/26/2004 | CN1151374C Self-addressable self-assembling microelectronic system and devices for molecular biological analysis and diagnostics |
| 05/26/2004 | CN1151358C Methods and apparatus for measuring thickness of a film, particularly of photoresist film on semiconductor sbustrate |
| 05/26/2004 | CN1151009C Fabricating interconnects and tips using sacrificial substrates |
| 05/26/2004 | CN1151008C High-strength welding head |
| 05/25/2004 | US6742172 Mask-programmable logic devices with programmable gate array sites |
| 05/25/2004 | US6742169 Semiconductor device |
| 05/25/2004 | US6742168 Method and structure for calibrating scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device |
| 05/25/2004 | US6742149 Apparatus for testing semiconductor integrated circuits |
| 05/25/2004 | US6741946 Systems and methods for facilitating automated test equipment functionality within integrated circuits |
| 05/25/2004 | US6741941 Method and apparatus for analyzing defect information |
| 05/25/2004 | US6741940 Computer-implemented method of defect analysis |
| 05/25/2004 | US6741804 Apparatus and method for rapid thermal processing |
| 05/25/2004 | US6741733 Drawing pattern verifying method |
| 05/25/2004 | US6741732 Exposure method and device manufacturing method using this exposure method |
| 05/25/2004 | US6741627 Photolithographic molecular fluorine laser system |
| 05/25/2004 | US6741623 Semiconductor device, semiconductor laser, their manufacturing methods and etching methods |
| 05/25/2004 | US6741621 Laser irradiation apparatus and method of treating semiconductor thin film |
| 05/25/2004 | US6741519 DRAM technology compatible processor/memory chips |
| 05/25/2004 | US6741510 Semiconductor memory device capable of performing burn-in test at high speed |
| 05/25/2004 | US6741508 Sense amplifier driver circuits configured to track changes in memory cell pass transistor characteristics |
| 05/25/2004 | US6741501 Nonvolatile semiconductor memory device and manufacturing method thereof |
| 05/25/2004 | US6741495 Magnetic memory device and magnetic substrate |