Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2007
02/14/2007CN1913177A Thin film transistor and method of manufacturing the same
02/14/2007CN1913175A 半导体元件及其形成方法 Semiconductor device and method of forming
02/14/2007CN1913173A Memory component and its manufacturing method
02/14/2007CN1913171A Light emitting device and manufacturing method
02/14/2007CN1913169A Nonvolatile semiconductor memory device and method of manufacturing the same
02/14/2007CN1913167A CMOS image sensor and method of manufacturing the same
02/14/2007CN1913163A Thin film transistor substrate and method of manufacturing the same
02/14/2007CN1913162A Integrated circuit and formation method thereof
02/14/2007CN1913161A Connection structure and method for manufacturing same
02/14/2007CN1913160A Flash memory device and method of fabricating the same
02/14/2007CN1913158A Semiconductor device and method of manufacturing the same
02/14/2007CN1913157A Electro-static discharge protecting device and method for fabricating the same
02/14/2007CN1913155A Liquid crystal display device and method for manufacturing the same
02/14/2007CN1913154A Image sensing module and its package method
02/14/2007CN1913153A Image sensing module and its package method
02/14/2007CN1913150A Method for fabricating electronic circuit module and integrated circuit device
02/14/2007CN1913149A Method of manufacturing a semiconductor device comprising stacked chips and a corresponding semiconductor device
02/14/2007CN1913146A Thin film conductor and method of fabrication
02/14/2007CN1913145A Driving film, driving package, manufacturing method thereof and display comprising the same
02/14/2007CN1913141A Semiconductor device and method of manufacturing the same
02/14/2007CN1913135A PLCC package with integrated lens and method for making the package
02/14/2007CN1913132A Nonvolatile semiconductor integrated circuit devices and fabrication methods thereof
02/14/2007CN1913131A Cmos图像传感器及其制造方法 Cmos image sensor and its manufacturing method
02/14/2007CN1913130A Manufacturing process of semiconductor device chip punch through isolation area and PN junction
02/14/2007CN1913129A Method for repairing thin film transistor line on display panel
02/14/2007CN1913128A Methods of forming dual-damascene metal wiring patterns for integrated circuit devices and wiring patterns formed thereby
02/14/2007CN1913127A Method for manufacturing semiconductor device and semiconductor device
02/14/2007CN1913126A Semiconductor device having a structure to improve contact processing margin, and method of fabricating the same
02/14/2007CN1913125A Via bottom contact and method of manufacturing same
02/14/2007CN1913124A Integration control and reliability enhancement of interconnect air cavities
02/14/2007CN1913123A Method of fabricating trench isolation of semiconductor device
02/14/2007CN1913122A Method for forming void-free trench isolation layer
02/14/2007CN1913121A Manufacturing method of semiconductor structure and associated semiconductor structure
02/14/2007CN1913120A Method of manufacturing a semiconductor device and the semiconductor device
02/14/2007CN1913119A Method of forming align key in well structure formation process and method of forming element isolation structure using the align key
02/14/2007CN1913118A Testing method for detecting localized failure on a semiconductor wafer
02/14/2007CN1913117A Method for improving electron circuit layout efficiency, electronic connector and electronic panel
02/14/2007CN1913116A Repairing method for bad paster in mobile phone camera mould set
02/14/2007CN1913115A Method and apparatus for flip-chip bonding
02/14/2007CN1913114A Manufacturing method of optical image pick-up device
02/14/2007CN1913113A Semiconductor device and a manufacturing method of the same
02/14/2007CN1913112A Method for manufacturing semiconductor element
02/14/2007CN1913111A Semiconductor element and formation method
02/14/2007CN1913110A Manufacturing method of thin film transistor
02/14/2007CN1913109A Manufacturing method of multi-crystal siliconthin film transistor assembly of high pressure steam annealing
02/14/2007CN1913108A Substrate treating apparatus and method
02/14/2007CN1913107A Process for producing doped semiconductor wafers from silicon, and the wafers produced thereby
02/14/2007CN1913106A Semiconductor device, and method of manufacturing the same
02/14/2007CN1913105A Laser irradiation method and laser irradiation apparatus, and method for fabricating semiconductor device
02/14/2007CN1913104A Nitride-based semiconductor component manufacturing method
02/14/2007CN1913103A Methods of forming metal-insulator-metal (mim) capacitors with passivation layers on dielectric layers and devices so formed
02/14/2007CN1913102A Silicon wafer cleaning method
02/14/2007CN1913101A Decompression drying device
02/14/2007CN1913100A 加热装置 Heating device
02/14/2007CN1913099A Chamber for vacuum processing device and device having the chamber
02/14/2007CN1913098A Loading umloading device of semiconductor processing piece and its loading and unloading method
02/14/2007CN1913044A Thick film conductor composition, and its use in ltcc circuit and device
02/14/2007CN1913040A Method for configuring parameter in NOR FLASH
02/14/2007CN1912881A Delay calculation method, timing analysis method, calculation object network approximation method, and delay control method
02/14/2007CN1912749A Method for removing photoetching agent and method of regeneration photoetching agent
02/14/2007CN1912748A Exposure device and exposure method
02/14/2007CN1912746A Electron beam graph scanning processor
02/14/2007CN1912745A Barrier coating compositions for photoresist and methods of forming photoresist patterns using the same
02/14/2007CN1912740A Exposure mask
02/14/2007CN1912739A Light exposure mask and method for manufacturing semiconductor device using the same
02/14/2007CN1912697A Substrate rotary processor
02/14/2007CN1912657A Method for manufacturing a device, a device and electronic machine
02/14/2007CN1912644A 半导体集成电路 The semiconductor integrated circuit
02/14/2007CN1912643A Delay time measuring device and method
02/14/2007CN1912640A Apparatus for inspecting substrate and control method for the same
02/14/2007CN1912637A Donut-type parallel probe card and method of testing semiconductor wafer using same
02/14/2007CN1912636A Probe structure of preventing noise interference for semiconductor test board
02/14/2007CN1912633A Semiconductor test plate structure for preventing noise interference
02/14/2007CN1912631A Applied module of test plate
02/14/2007CN1912453A Wafer surface illumination device in wafer inspection system and method thereof
02/14/2007CN1912187A Etchant composition, methods of patterning conductive layer and manufacturing flat panel display device using the same
02/14/2007CN1912178A Chemical vapor deposition chamber with dual frequency bias and method for manufacturing a photomask using the same
02/14/2007CN1912172A Method for controlling large or small of grain of multielement oxide film
02/14/2007CN1911937A Stabilizers to inhibit the polymerization of substituted cyclotetrasiloxane
02/14/2007CN1911781A Manufacturing method used for improving performance of non-refrigerating infrared focal plane array device
02/14/2007CN1301048C Method for producing distributing base board
02/14/2007CN1301044C 电路装置 Circuit device
02/14/2007CN1301043C Circuit device and its mfg. method
02/14/2007CN1300930C Electric motor, electric motor driving circuit, and semiconductor integrated circuit
02/14/2007CN1300901C Light emitting element structure using nitride bulk single crystal layer
02/14/2007CN1300860C Method for producing N-type layer ohmic contact electrode of GaN LED
02/14/2007CN1300859C Light emitting element
02/14/2007CN1300856C Thin-film transistor structure and producing method thereof
02/14/2007CN1300855C Preparing method for silicon substrate mixed structure grid media material on insulator
02/14/2007CN1300854C Enlaid gate multi-mesa MOS transistor and manufacture thereof
02/14/2007CN1300853C Method for manufacturing integrate semiconductor structure
02/14/2007CN1300852C Non-volatile semi-conductor storage
02/14/2007CN1300851C Semiconductor memory device with signal distributive circuits formed above memory unit
02/14/2007CN1300850C Semiconductor device and method for fabricating the same
02/14/2007CN1300849C Metal insulator metal capacitor
02/14/2007CN1300848C Semiconductor circuit device and imitation method of such circuit
02/14/2007CN1300847C Micro- or nano-electronic component comprising a power source and means for protecting the power source
02/14/2007CN1300846C Semiconductor device and method of fabricating same
02/14/2007CN1300845C Adhesive thin sheet for producing semiconductor device, semiconductor device and its producing method
02/14/2007CN1300843C Package assembly for electronic device and method of making same