Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2007
02/08/2007US20070032046 Method for simultaneously producing multiple wafers during a single epitaxial growth run and semiconductor structure grown thereby
02/08/2007US20070032045 Method for manufacturing semiconductor device and substrate processing apparatus
02/08/2007US20070032044 Method and structure for fabricating devices using one or more films provided by a layer transfer process and etch back
02/08/2007US20070032043 Soi wafer and its manufacturing method
02/08/2007US20070032042 Peeling method
02/08/2007US20070032041 Gallium nitride device substrate containing a lattice parameter altering element
02/08/2007US20070032040 Method of manufacturing a multilayer semiconductor structure with reduced ohmic losses
02/08/2007US20070032039 Sti process for eliminating silicon nitride liner induced defects
02/08/2007US20070032038 Method for forming recesses
02/08/2007US20070032037 Method of forming SOI-like structure in a bulk semiconductor substrate using self-organized atomic migration
02/08/2007US20070032036 Array substrate for lcd and method of fabrication thereof
02/08/2007US20070032035 Container capacitor structure and method of formation thereof
02/08/2007US20070032034 Method for manufacturing semiconductor storage device
02/08/2007US20070032033 Connecting structure and method for manufacturing the same
02/08/2007US20070032032 Connecting structure and method for manufacturing the same
02/08/2007US20070032031 Method for conducting electric activation of electric double layer capacitors
02/08/2007US20070032030 Method for high performance inductor fabrication using a triple damascene process with copper beol
02/08/2007US20070032029 Lateral trench power MOSFET with reduced gate-to-drain capacitance
02/08/2007US20070032028 Structure and method for reducing overlap capacitance in field effect transistors
02/08/2007US20070032027 Method for manufacturing MOS transistor of semiconductor device
02/08/2007US20070032026 Formation of strained Si channel and Si1-xGex source/drain structures using laser annealing
02/08/2007US20070032025 Method for forming germanides and devices obtained thereof
02/08/2007US20070032024 Methods for fabricating a stressed MOS device
02/08/2007US20070032023 Doped elongated semiconductors, growing such semiconductors, devices including such semiconductors, and fabricating such devices
02/08/2007US20070032022 Mask read only memory (ROM) and method of fabricating the same
02/08/2007US20070032021 Method for forming a gate dielectric of a semiconductor device
02/08/2007US20070032020 Structures and methods for forming shielded gate field effect transistors
02/08/2007US20070032019 Flash memory device and method for fabricating the same
02/08/2007US20070032018 NAND Flash Memory with Densely Packed Memory Gates and Fabrication Process
02/08/2007US20070032017 Nonvolatile memory devices and methods of fabricating the same
02/08/2007US20070032016 Protective layer in memory device and method therefor
02/08/2007US20070032015 Semiconductor device and manufacturing method of the same
02/08/2007US20070032014 Methods of forming pluralities of capacitors
02/08/2007US20070032013 Methods of forming a metal oxide layer including zirconium oxide and methods of forming a capacitor for semiconductor devices including the same
02/08/2007US20070032012 I-shaped and L-shaped contact structures and their fabrication methods
02/08/2007US20070032011 Methods of forming memory circuitry
02/08/2007US20070032010 Formation of fully silicided (FUSI) gate using a dual silicide process
02/08/2007US20070032009 Semiconductor devices having strained dual channel layers
02/08/2007US20070032008 MOS semiconductor devices having polysilicon gate electrodes and high dielectric constant gate dielectric layers and methods of manufacturing such devices
02/08/2007US20070032007 Semiconductor device and method for fabricating the same
02/08/2007US20070032006 Fabrication method of flash memory
02/08/2007US20070032005 Semiconductor device and method of fabricating the same
02/08/2007US20070032004 Copper barrier reflow process employing high speed optical annealing
02/08/2007US20070032003 Method for forming uniaxially strained devices
02/08/2007US20070032002 Ion implantation mask and method for manufacturing same, silicon carbide semiconductor device using ion implantation mask, and method for manufacturing same
02/08/2007US20070032001 Semiconductor device having a trench isolation and method of fabricating the same
02/08/2007US20070032000 Vertical pixel structures for emi-flective display and methods for making the same
02/08/2007US20070031999 Non-volatile memory cells and methods of manufacturing the same
02/08/2007US20070031998 Method and apparatus for removing encapsulating material from a packaged microelectronic device
02/08/2007US20070031997 Jig and vacuum equipment for surface adhesion and adhesion method using the vacuum operative adhesion
02/08/2007US20070031996 Packaged integrated circuit having a heat spreader and method therefor
02/08/2007US20070031995 Mounting structure, electro-optical device, and electronic apparatus
02/08/2007US20070031994 Method for Fabricating Protective Caps for Protecting Elements on a Wafer Surface
02/08/2007US20070031993 Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system
02/08/2007US20070031992 Apparatuses and methods facilitating functional block deposition
02/08/2007US20070031991 Method for depositing compounds on a substrate by means of metalorganic chemical vapor deposition
02/08/2007US20070031989 Separating semiconductor wafers having exposed micromechanical structures into individual chips
02/08/2007US20070031988 Backside silicon wafer design reducing image artifacts from infrared radiation
02/08/2007US20070031987 Method of operating image sensor
02/08/2007US20070031986 Solar cell manufacturing method
02/08/2007US20070031985 Semiconductor laser device and method for fabricating the same
02/08/2007US20070031984 Method of fabricating submicron suspended objects and application to the mechanical characterization of said objects
02/08/2007US20070031983 Thin plate manufacturing method and thin plate manufacturing apparatus
02/08/2007US20070031982 Method of classifying defects and apparatus for performing the method
02/08/2007US20070031981 Method for forming ferroelectric film and semiconductor device
02/08/2007US20070031755 Material for forming resist-protecting film for immersion exposure process, resist-protecting film made of such material, and method for forming resist pattern using such resist-protec- ting film
02/08/2007US20070031741 EUVL reflection device, method of fabricating the same, and mask, projection optics system and EUVL apparatus using the EUVL reflection device
02/08/2007US20070031687 Insulating-film-forming composition, method of producing the same, silica-based insulating film, and method of forming the same
02/08/2007US20070031675 Epoxy resin composition for packaging a semiconductor device, method of making the same, and semiconductor device using the same
02/08/2007US20070031599 Use of dissolved hafnium alkoxides or zirconium alkoxides as precursors for hafnium oxide and hafnium oxynitride layers or zirconium oxide and zirconium oxynitride layers
02/08/2007US20070031590 Thin film capacitor and method for manufacturing the same
02/08/2007US20070031279 Solder composition for electronic devices
02/08/2007US20070031236 Semiconductor processing system; a semiconductor processing chamber; and a method for loading, unloading and exchanging semiconductor work pieces from a semiconductor processing chamber
02/08/2007US20070030721 Device selection circuitry constructed with nanotube technology
02/08/2007US20070030621 Method and apparatus for chuck thermal calibration
02/08/2007US20070030471 Lithographic apparatus and device manufacturing method using dose control
02/08/2007US20070030465 Exposure apparatus and a device manfacturing method using the same
02/08/2007US20070030435 Liquid crystal display devices
02/08/2007US20070030048 Voltage Switching Circuit
02/08/2007US20070030021 Probe station thermal chuck with shielding for capacitive current
02/08/2007US20070029985 Semiconductor device
02/08/2007US20070029686 Photoresists; photomasks
02/08/2007US20070029684 Wafer dividing method
02/08/2007US20070029677 Interconnection structure
02/08/2007US20070029673 Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument
02/08/2007US20070029670 Semiconductor device and radiation detector employing it
02/08/2007US20070029666 Chip-Sized Flip-Chip Semiconductor Package and Method for Making the Same
02/08/2007US20070029663 Multilayered circuit substrate and semiconductor package structure using the same
02/08/2007US20070029661 Power plane design and jumper wire bond for voltage drop minimization
02/08/2007US20070029643 Methods for nanoscale structures from optical lithography and subsequent lateral growth
02/08/2007US20070029639 Edge intensive antifuse and method for making the same
02/08/2007US20070029637 Image sensor for reduced dark current
02/08/2007US20070029633 Shottky diode and method for fabricating the same
02/08/2007US20070029631 Package Structure and Wafer Level Package Method
02/08/2007US20070029630 Integrated circuits with contemporaneously formed array electrodes and logic interconnects
02/08/2007US20070029629 Integrated sensor and circuitry and process therefor
02/08/2007US20070029627 Reducing the dielectric constant of a portion of a gate dielectric
02/08/2007US20070029626 Semiconductor device, and method of fabricating the same
02/08/2007US20070029623 Dual-gate field effect transistor
02/08/2007US20070029620 Low-cost high-performance planar back-gate cmos