Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2007
02/28/2007CN1921066A Wafer laser marker method and its wafer
02/28/2007CN1921035A Cross-coupled inductor pair formed in an integrated circuit
02/28/2007CN1920720A Method for adjusting machine set, manufacture control system and semiconductive manufacture system
02/28/2007CN1920718A Method for improving materials moving efficiency and manufacture system using same
02/28/2007CN1920717A Method for sharing semiconductive machine and manufacture system using same
02/28/2007CN1920708A Power supply system, power supply method and lot processing method
02/28/2007CN1920671A Composition for removing a photoresist residue and polymer residue, and residue removal process using the same
02/28/2007CN1920670A Latent overlay metrology
02/28/2007CN1920669A Laser micro-image device
02/28/2007CN1920664A Etching tape and method of fabricating array substrate for liquid crystal display using the same
02/28/2007CN1920662A Coining photolithography device and method thereof
02/28/2007CN1920630A Liquid crystal display device and fabrication method thereof
02/28/2007CN1920585A Substrate detector and substrate detection method
02/28/2007CN1920578A Method of manufacturing a probe and a detection card
02/28/2007CN1920540A Device and method for inspecting the surface of a wafer
02/28/2007CN1920519A Preparation of two copper rings gripped transmission samples with ion beam
02/28/2007CN1920124A Method for reducing defect concentrations in crystals
02/28/2007CN1920105A Method and apparatus for fluid processing a workpiece
02/28/2007CN1920093A Boron phosphor silicon oxide technology
02/28/2007CN1920055A Microelectronic system and apparatus capable of self-addressing and self-assembling for molecular biological analysis and diagnosis
02/28/2007CN1919955A Aqueous dispersion for chemical mechanical polishing, kit for preparing the aqueous dispersion, chemical mechanical polishing process, and process for producing semiconductor devices
02/28/2007CN1919933A Method of preparing electric conductive adhesive by chemical plating silver on graphite powder surface
02/28/2007CN1919720A Method of preparing multistage silicon nano component
02/28/2007CN1919520A Laser system and method for processing a memory link with in integrated circuit
02/28/2007CN1302564C Multi-layer structure, and actuator element, capacitive element and filter element using the same
02/28/2007CN1302560C 电子电路 Electronic circuit
02/28/2007CN1302556C Semiconductor storage device and semiconductor integrated circuit
02/28/2007CN1302555C Non-volatile semiconductor storage unit structure and mfg. method thereof
02/28/2007CN1302554C Layout of static RAM units and device
02/28/2007CN1302553C Separation grid flash storage unit and its manufacturing method
02/28/2007CN1302552C Semiconductor memory and producing method thereof
02/28/2007CN1302551C Semiconductor memory device and readout amplifier part thereof
02/28/2007CN1302549C Hv-SOI LDMOS device with integrated diode to improve reliability and avalanche ruggedness
02/28/2007CN1302548C Magnetic memory device and method of manufacturing the same
02/28/2007CN1302547C Electrostatic discharge protective circuit structure and manufacturing method thereof
02/28/2007CN1302546C Method to improve performance of microelectronic circuits
02/28/2007CN1302541C Chip packaging base plate having flexible circuit board and method for manufacturing the same
02/28/2007CN1302540C Method for promoting memory cell confining force of silicon nitride ROM
02/28/2007CN1302539C Method for making flush memory
02/28/2007CN1302538C CMOS well structure and method of forming the same
02/28/2007CN1302537C Selective nitridation of gate oxides
02/28/2007CN1302536C Virtual grounding array mixed signal embedded shielding read-only memory and producing method thereof
02/28/2007CN1302535C Integrated cicuit structure and mfg. method
02/28/2007CN1302534C Semiconductor device with multilayer wiring layers and its mfg. method
02/28/2007CN1302533C Ultra-low effective dielectric constant interconnection structure and mfg. method thereof
02/28/2007CN1302532C Electronic device manufacture
02/28/2007CN1302531C Belt for carrying automatic welding
02/28/2007CN1302530C Method for packaging electronic component
02/28/2007CN1302529C Three buffer layer method for preparing high quality zinc oxide monocrystalline film
02/28/2007CN1302528C Method for manufacturing thin-film transistor element
02/28/2007CN1302527C Method for mfg of semiconduceor device
02/28/2007CN1302526C Method for preparing nitrogen-doped and annealed wafer and nitrogen-doped and annealed wafer
02/28/2007CN1302525C Method for controlling etch bias of carbon doped oxide films
02/28/2007CN1302524C Wet resist removing process after silk etching
02/28/2007CN1302523C Glass deactivating forming process for table top rectifier
02/28/2007CN1302522C Terminal detection system for chemical and mechanical polisher
02/28/2007CN1302521C Method for improving inversion layer mobility in silicon carbide metal-oxide semiconductor field-effect transistor
02/28/2007CN1302520C Method for forming polycrystalline series film layer by utilizing laser crystallization
02/28/2007CN1302519C Manufacturing method of semiconductor device
02/28/2007CN1302518C High resistivity silicon carbide single crystal and mfg. method
02/28/2007CN1302517C Method of self-organized growth of uniform and ordered semiconductor quantum lattice
02/28/2007CN1302516C Method of manufacturing modules with an integrated circuit
02/28/2007CN1302515C Semiconductor manufacturing apparatus having a built-in inspection apparatus and a device manufacturing method using said manufacturing apparatus
02/28/2007CN1302512C Electrode member for plasma treating appts., plasma treating appts. and plasma treating method
02/28/2007CN1302511C Method for predicting the lifetime of a filament in an ion source and ion source device
02/28/2007CN1302488C Resistance material, resistance produced by the same, method for producing resistance and solution for resistance material aggradation
02/28/2007CN1302482C Magnetic film memory device with redundant repair function
02/28/2007CN1302453C Bias potential generating device
02/28/2007CN1302388C Hierarchical built-in self-test for system-on-chip design
02/28/2007CN1302342C Chemical rinse composition
02/28/2007CN1302341C Liquid treatment method and liquid treatment device
02/28/2007CN1302337C Mask for use in lithography, method of making a mask, lithographic apparatus, and device manufacturing method
02/28/2007CN1302314C Semiconductor display equipment and design method mfg. method and order form receiving system
02/28/2007CN1302286C Probe contacting system having plane adjusting mechanism
02/28/2007CN1302152C Chemical vapor depositing apparatus
02/28/2007CN1302151C Method and device for producing ferroelectric apparatus
02/28/2007CN1302150C Method for forming metal film
02/28/2007CN1302096C Pre cleaning solution recipe for deposit side wall medium of flash memory control grid stack structure and its using method
02/28/2007CN1301947C Process for producing perfluorocarbons and use thereof
02/28/2007CN1301897C Method for making minisize flow passage by lead frame technology
02/28/2007CN1301833C Transportation appts.
02/28/2007CN1301832C Substrate transport apparatus with multiple arms on common axis of rotation
02/28/2007CN1301804C Method of cleaning maintaining rotary etching machine
02/27/2007US7185312 Exposure method for correcting line width variation in a photomask
02/27/2007US7185311 Mask evaluating method, mask evaluating system, method of manufacturing mask and computer program product
02/27/2007US7185307 Method of fabricating and integrated circuit through utilizing metal layers to program randomly positioned basic units
02/27/2007US7185296 Method of extraction of wire capacitances in LSI device having diagonal wires and extraction program for same
02/27/2007US7185244 Semiconductor integrated circuit and electronic system
02/27/2007US7185225 Self-reparable semiconductor and method thereof
02/27/2007US7184928 Extended defect sizing
02/27/2007US7184913 Testing system, a computer implemented testing method and a method for manufacturing electronic devices
02/27/2007US7184909 Method for calibrating a bondhead
02/27/2007US7184849 Method of planning tasks in a machine, method of controlling a machine, supervisory machine control system, lithographic apparatus, lithographic processing cell and computer program
02/27/2007US7184612 Hardware configuration for parallel data processing without cross communication
02/27/2007US7184382 Energy beam irradiating apparatus
02/27/2007US7184356 Semiconductor memory device
02/27/2007US7184344 Semiconductor device comprising a differential sense amplifier, a write column selection switch and a read column selection switch
02/27/2007US7184323 4N pre-fetch memory data transfer system
02/27/2007US7184321 Data line disturbance free memory block divided flash memory and microcomputer having flash memory therein
02/27/2007US7184316 Non-volatile memory cell array having common drain lines and method of operating the same