Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2014
05/06/2014US8716870 Direct write interconnections and method of manufacturing thereof
05/06/2014US8716863 Structure and method for high performance interconnect
05/06/2014US8716852 Micro-electro mechanical systems (MEMS) having outgasing prevention structures and methods of forming the same
05/06/2014US8716849 Semiconductor device including one or more stiffening elements
05/06/2014US8716840 Backside thermal patterning of buried oxide (BOX)
05/06/2014US8716837 Bipolar junction transistors with a link region connecting the intrinsic and extrinsic bases
05/06/2014US8716836 Semiconductor wafer, semiconductor wafer manufacturing method, and electronic device
05/06/2014US8716834 Semiconductor device including antenna
05/06/2014US8716833 Semiconductor devices and methods of manufacturing the same
05/06/2014US8716830 Thermally efficient integrated circuit package
05/06/2014US8716829 Semiconductor devices with sealed, unlined trenches and methods of forming same
05/06/2014US8716828 Semiconductor device with isolation trench liner
05/06/2014US8716827 Diffusion resistor with reduced voltage coefficient of resistance and increased breakdown voltage using CMOS wells
05/06/2014US8716812 Interfacial layer regrowth control in high-K gate structure for field effect transistor
05/06/2014US8716810 Selective floating body SRAM cell
05/06/2014US8716809 Hardened programmable devices
05/06/2014US8716807 Fabrication of devices having different interfacial oxide thickness via lateral oxidation
05/06/2014US8716806 Methods of channel stress engineering and structures formed thereby
05/06/2014US8716795 Fabrication of lateral double-diffused metal oxide semiconductor (LDMOS) devices
05/06/2014US8716792 Semiconductor device with a charge carrier compensation structure and method for the production of a semiconductor device
05/06/2014US8716790 Laterally diffused metal oxide semiconductor device and method of forming the same
05/06/2014US8716783 Power device with self-aligned source regions
05/06/2014US8716782 Power semiconductor device having a thin gate insulating film with high-k dielectric materials and method for manufacturing the same
05/06/2014US8716777 Semiconductor device and method for manufacturing the same
05/06/2014US8716775 Semiconductor integrated circuit having reservoir capacitor
05/06/2014US8716767 Compliant bipolar micro device transfer head
05/06/2014US8716752 Structure and method for making a strained silicon transistor
05/06/2014US8716751 Methods of containing defects for non-silicon device engineering
05/06/2014US8716749 Substrate structures and methods of manufacturing the same
05/06/2014US8716748 Semiconductor device and method of manufacturing the same, and power supply apparatus
05/06/2014US8716737 Die-bonded LED
05/06/2014US8716735 Light-emitting diode with metal structure and heat sink
05/06/2014US8716716 Method and system for junction termination in GaN materials using conductivity modulation
05/06/2014US8716711 Thin-film transistor and thin-film diode having amorphous-oxide semiconductor layer
05/06/2014US8716710 Thin-film transistor array substrate and method of fabricating the same
05/06/2014US8716707 Electronic device
05/06/2014US8716689 Thermal diode device and methods
05/06/2014US8716210 Material for cleaning a substrate
05/06/2014US8716209 Agent for post-etch treatment of silicon dielectric film, method of manufacturing semiconductor device, and semiconductor device
05/06/2014US8716156 Methods of forming fins for a FinFET semiconductor device using a mandrel oxidation process
05/06/2014US8716155 Method to enhance charge trapping
05/06/2014US8716154 Reduced pattern loading using silicon oxide multi-layers
05/06/2014US8716153 Device and method for producing dielectric layers in microwave plasma
05/06/2014US8716152 Method of controlling silicon oxide film thickness
05/06/2014US8716151 Method of fabricating semiconductor devices
05/06/2014US8716150 Method of forming a low-K dielectric film
05/06/2014US8716149 Methods for fabricating integrated circuits having improved spacers
05/06/2014US8716148 Semiconductor device manufacturing method
05/06/2014US8716147 Manufacturing method of semiconductor device and substrate processing apparatus
05/06/2014US8716146 Low temperature etching of silicon nitride structures using phosphoric acid solutions
05/06/2014US8716145 Critical concentration in etching doped poly silicon with HF/HNO3
05/06/2014US8716144 Method for manufacturing semiconductor device
05/06/2014US8716143 Plasma based photoresist removal system for cleaning post ash residue
05/06/2014US8716142 Semiconductor device and method of manufacturing the same
05/06/2014US8716141 Electrode configurations for semiconductor devices
05/06/2014US8716140 Method of forming micropattern, die formed by this method of forming micropattern, transfer method and micropattern forming method using this die
05/06/2014US8716139 Method of patterning a semiconductor device
05/06/2014US8716138 Method for fabricating a field side sub-bitline nor flash array
05/06/2014US8716137 Method for etching polycrystalline silicon, method for manufacturing semiconductor device, and etching program
05/06/2014US8716136 Method of forming a semiconductor structure including a wet etch process for removing silicon nitride
05/06/2014US8716135 Method of eliminating a lithography operation
05/06/2014US8716134 Interconnect structure employing a Mn-group VIIIB alloy liner
05/06/2014US8716133 Three photomask sidewall image transfer method
05/06/2014US8716132 Radiation-assisted selective deposition of metal-containing cap layers
05/06/2014US8716131 Through silicon via layout
05/06/2014US8716130 Method of manufacturing semiconductor device
05/06/2014US8716129 Method for manufacturing silicon carbide semiconductor device
05/06/2014US8716128 Methods of forming through silicon via openings
05/06/2014US8716127 Metal alloy cap integration
05/06/2014US8716126 Semiconductor device comprising self-aligned contact bars and metal lines with increased via landing regions
05/06/2014US8716125 Methods of in-situ vapor phase deposition of self-assembled monolayers as copper adhesion promoters and diffusion barriers
05/06/2014US8716124 Trench silicide and gate open with local interconnect with replacement gate process
05/06/2014US8716123 Method of forming an integrated circuit device
05/06/2014US8716122 Method of manufacturing semiconductor device having surface protective films on bond pad
05/06/2014US8716121 Ohmic electrode and method of forming the same
05/06/2014US8716120 High-k metal gate electrode structures formed by reducing a gate fill aspect ratio in replacement gate technology
05/06/2014US8716119 Methods of forming transistor gates
05/06/2014US8716118 Replacement gate structure for transistor with a high-K gate stack
05/06/2014US8716117 Semiconductor device and method of forming the same
05/06/2014US8716114 Semiconductor device manufacturing method and semiconductor device
05/06/2014US8716113 Crystalline semiconductor film manufacturing method and crystalline semiconductor film manufacturing apparatus
05/06/2014US8716112 Method for crystallizing amorphous silicon thin film and method for fabricating poly crystalline thin film transistor using the same
05/06/2014US8716111 Method for manufacturing trench type superjunction device and trench type superjunction device
05/06/2014US8716110 Laser processing method and laser processing apparatus
05/06/2014US8716109 Chip package and fabrication method thereof
05/06/2014US8716108 Integrated circuit packaging system with ultra-thin chip and method of manufacture thereof
05/06/2014US8716107 Epitaxial lift off stack having a non-uniform handle and methods thereof
05/06/2014US8716106 Method for producing a bonded substrate
05/06/2014US8716105 Methods for bonding semiconductor structures involving annealing processes, and bonded semiconductor structures and intermediate structures formed using such methods
05/06/2014US8716104 Method of fabricating isolation structure
05/06/2014US8716103 Semiconductor device and method of fabricating same
05/06/2014US8716101 Structure and method of reducing electromigration cracking and extrusion effects in semiconductor devices
05/06/2014US8716100 Method of fabricating metal-insulator-metal (MIM) capacitor within topmost thick inter-metal dielectric layers
05/06/2014US8716099 Phase-change memory
05/06/2014US8716098 Selective removal method and structure of silver in resistive switching device for a non-volatile memory device
05/06/2014US8716097 MOS transistors having reduced leakage well-substrate junctions
05/06/2014US8716096 Self-aligned emitter-base in advanced BiCMOS technology
05/06/2014US8716095 Manufacturing method of gate stack and semiconductor device
05/06/2014US8716094 FinFET formation using double patterning memorization
05/06/2014US8716093 Methods of manufacturing a semiconductor device