Patents for G11C 11 - Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor (76,008) |
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10/16/2001 | US6304502 Semiconductor memory device connected to memory controller and memory system employing the same |
10/16/2001 | US6304499 Integrated dynamic semiconductor memory having redundant units of memory cells, and a method of self-repair |
10/16/2001 | US6304498 Semiconductor memory device capable of suppressing degradation in operation speed after replacement with redundant memory cell |
10/16/2001 | US6304496 Semiconductor memory device with write driver reset function |
10/16/2001 | US6304495 Logic interface circuit and semiconductor memory device using this circuit |
10/16/2001 | US6304494 Semiconductor device with decreased power consumption |
10/16/2001 | US6304493 Single electron MOSFET memory device and method |
10/16/2001 | US6304492 Synchronous semiconductor memory device and method for reading data |
10/16/2001 | US6304491 Integrated semiconductor memory |
10/16/2001 | US6304485 Flash EEprom system |
10/16/2001 | US6304484 Multi-bit flash memory cell and programming method using the same |
10/16/2001 | US6304483 Circuits and methods for a static random access memory using vertical transistors |
10/16/2001 | US6304482 Apparatus of reducing power consumption of single-ended SRAM |
10/16/2001 | US6304481 Method and apparatus for storing data using spin-polarized electrons |
10/16/2001 | US6304480 Read only memory integrated semiconductor device |
10/16/2001 | US6304478 Layout for a semiconductor memory |
10/16/2001 | US6304477 Content addressable magnetic random access memory |
10/16/2001 | US6304291 Artcard for the administration of the operation of a camera device |
10/16/2001 | US6304148 Oscillator circuit for a semiconductor memory having a temperature dependent cycle |
10/16/2001 | US6304117 Variable delay circuit and semiconductor integrated circuit device |
10/16/2001 | US6304116 Delay locked looped circuits and methods of operation thereof |
10/16/2001 | US6304114 Mode setting determination signal generation circuit |
10/16/2001 | US6304069 Low power consumption multiple power supply semiconductor device and signal level converting method thereof |
10/16/2001 | US6303516 Method for forming dot element |
10/16/2001 | US6302528 Thermal actuated ink jet printing mechanism |
10/11/2001 | WO2001075899A2 Page mode erase in a flash memory array |
10/11/2001 | WO2001075894A2 Quantum magnetic memory |
10/11/2001 | WO2001075891A2 Current conveyor and method for readout of mtj memories |
10/11/2001 | WO2001003126A3 High density non-volatile memory device |
10/11/2001 | US20010029566 Rambus DRAM |
10/11/2001 | US20010029052 Semiconductor memory device and manufacturing method thereof |
10/11/2001 | US20010028599 Semiconductor memory device outputting data according to a first internal clock signal and a second internal clock signal |
10/11/2001 | US20010028597 Semiconductor memory of the dynamic random access type (DRAM) and method for actuating a memory cell |
10/11/2001 | US20010028596 Semiconductor memory device |
10/11/2001 | US20010028595 Semiconductor memory device having a word line activation block |
10/11/2001 | US20010028594 Semiconductor memory device |
10/11/2001 | US20010028593 Semiconductor memory |
10/11/2001 | US20010028592 Semiconductor memory |
10/11/2001 | US20010028591 Semiconductor memory device having normal and standby modes, semiconductor integrated circuit and mobile electronic unit |
10/11/2001 | US20010028589 Self-refresh controlling apparatus |
10/11/2001 | US20010028588 Semiconductor memory |
10/11/2001 | US20010028585 Integrated circuit with a differential amplifier |
10/11/2001 | US20010028584 Semiconductor memory device having replacing defective columns with redundant columns |
10/11/2001 | US20010028582 Ferroelectric memory element |
10/11/2001 | US20010028581 Semiconductor device |
10/11/2001 | US20010028580 Device and method for supplying current to a semiconductor memory to support a boosted voltage within the memory during testing |
10/11/2001 | US20010028579 High-speed cycle clock-synchronous memory device |
10/11/2001 | US20010028576 Nonvolatile memory device and refreshing method |
10/11/2001 | US20010028575 Static random access memory (RAM) systems and storage cell for same |
10/11/2001 | US20010028377 Ink jet printhead incorporating a backflow prevention mechanism |
10/11/2001 | US20010028278 Temperature dependent circuit, and current generating circuit, inverter and oscillation circuit using the same |
10/11/2001 | US20010028270 Sleep mode VDD detune for power reduction |
10/11/2001 | US20010028267 DLL circuit, semiconductor device using the same and delay control method |
10/11/2001 | US20010028266 Method for adjusting phase of controlling clock signal and semiconductor integrated circuit having delay locked loop circuit |
10/11/2001 | US20010028114 Semiconductor device including memory unit and semiconductor module including memory units |
10/11/2001 | US20010028090 Semiconductor circuit configuration |
10/11/2001 | DE10017368A1 Operating method for integrated memory device |
10/11/2001 | CA2408402A1 Page mode erase in a flash memory array |
10/10/2001 | EP1143537A1 Magnetoresistance effect memory device and method for producing the same |
10/10/2001 | EP1143457A2 Semiconductor memory device and testing system and testing method |
10/10/2001 | EP1143453A2 Semiconductor memory device |
10/10/2001 | EP1143452A2 Memory circuitry for programmable logic integrated circuit devices |
10/10/2001 | EP1143336A1 FPGA with increased cell utilization |
10/10/2001 | EP1143256A2 Test device for the functional testing of a semiconductor chip |
10/10/2001 | EP1141963A1 Vertically stacked field programmable nonvolatile memory and method of fabrication |
10/10/2001 | EP1141962A2 Seu hardening circuit |
10/10/2001 | EP1141961A1 Integrated circuit with a non-volatile mos ram cell |
10/10/2001 | EP1141960A1 Read/write architecture for a mram |
10/10/2001 | EP1141959A1 Integrated memory |
10/10/2001 | EP1141835A1 Integrated memory with redundancy |
10/10/2001 | EP1141736A1 Pattern generator for a packet-based memory tester |
10/10/2001 | EP1040482B1 Integrated-circuit memory with a buffer circuit |
10/10/2001 | CN1317141A Magnetoresistive element and use of same as storage element in storage system |
10/10/2001 | CN1316746A Multidigit magnetic memory element |
10/10/2001 | CN1072842C Semiconductor memory device with condenser |
10/09/2001 | US6301678 Test circuit for reducing test time in semiconductor memory device having multiple data input/output terminals |
10/09/2001 | US6301649 Semiconductor circuit with address translation circuit that enables quick serial access in row or column directions |
10/09/2001 | US6301191 Semiconductor memory device allowing reduction in power consumption during standby |
10/09/2001 | US6301190 Semiconductor memory device with a rapid packet data input, capable of operation check with low speed tester |
10/09/2001 | US6301189 Apparatus for generating write control signals applicable to double data rate SDRAM |
10/09/2001 | US6301187 Synchronous type semiconductor memory device permitting reduction in ratio of area occupied by control circuit in chip area |
10/09/2001 | US6301185 Random access memory with divided memory banks and data read/write architecture therefor |
10/09/2001 | US6301184 Semiconductor integrated circuit device having an improved operation control for a dynamic memory |
10/09/2001 | US6301183 Enhanced bus turnaround integrated circuit dynamic random access memory device |
10/09/2001 | US6301180 Sense amplifier circuit and semiconductor storage device |
10/09/2001 | US6301179 Self-equalized low power precharge sense amp for high speed SRAMs |
10/09/2001 | US6301178 Reduced cell voltage for memory device |
10/09/2001 | US6301175 Memory device with single-ended sensing and low voltage pre-charge |
10/09/2001 | US6301173 Memory device with faster reset operation |
10/09/2001 | US6301172 Gate voltage testkey for isolation transistor |
10/09/2001 | US6301171 Semiconductor memory device capable of reducing data test time in pipeline |
10/09/2001 | US6301169 Semiconductor memory device with IO compression test mode |
10/09/2001 | US6301166 Parallel tester capable of high speed plural parallel test |
10/09/2001 | US6301165 Apparatus and method for detecting faulty of cells in a semiconductor memory device |
10/09/2001 | US6301163 Semiconductor memory device and method of checking same for defect |
10/09/2001 | US6301162 Single electron MOSFET memory device and method |
10/09/2001 | US6301161 Programming flash memory analog storage using coarse-and-fine sequence |
10/09/2001 | US6301157 Method and circuit for testing memory cells in a multilevel memory device |
10/09/2001 | US6301156 Nonvolatile semiconductor memory device |
10/09/2001 | US6301150 Semiconductor device, data processing system and a method for changing threshold of a non-volatile memory cell |