Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2008
08/06/2008CN201096805Y Electric core clamp and needle sticking experimental machine using this clamp
08/06/2008CN201096803Y Improvement of chip test clamp structure
08/06/2008CN201096628Y Feedback -type railway locomotive testing bed
08/06/2008CN201096613Y Large power LED full-automatic photoelectric parameter test device
08/06/2008CN101238406A Aging room used for the last assembling process of LCD screen
08/06/2008CN101238382A Testing of an integrated circuit that contains secret information
08/06/2008CN101238381A Testing of an integrated circuit that contains secret information
08/06/2008CN101238380A Method and apparatus for cleaning a probe card
08/06/2008CN101238379A Semiconductor testing device, performance board and interface plate
08/06/2008CN101237286A Level detector, communication apparatus, and tuner
08/06/2008CN101237198A Self-reconstruction system of space solar battery module for space solar power station
08/06/2008CN101237146A Online monitoring and adjustment and control method for single phase compensation status of arc-extinction loop system
08/06/2008CN101237127A Method for eliminating neutral grounding line parallel bug in transmission and distribution system
08/06/2008CN101236773A Classification device and burning device for integrated circuit encapsulation chip
08/06/2008CN101236522A Hardware module test method and apparatus
08/06/2008CN101236236A Battery remaining capacity predicting apparatus
08/06/2008CN101236235A Accumulator battery set single battery voltage sampling apparatus and method
08/06/2008CN101236234A Multifunctional rotating switch test machine
08/06/2008CN101236233A Method and apparatus for implementing IC device testing
08/06/2008CN101236232A Method for looking for power line damaged porcelain bottle
08/06/2008CN101236231A Method and apparatus to monitor a temperature sensing device
08/06/2008CN101236230A Detection apparatus
08/06/2008CN101236229A Test zone molding type electronic assembly tester
08/06/2008CN101236228A Lightning arrester various waveform aging test device
08/06/2008CN101236227A Electric power transformer insulated on-line monitoring sensor mounting device
08/06/2008CN101236226A Ultrahigh voltage transmission lines hardware corona test method based on ultraviolet imagery technology
08/06/2008CN101236225A Electric network transformer monitoring device and monitoring method
08/06/2008CN101236224A Converter transformer DC magnetic bias electrical current practical test method
08/06/2008CN101236223A Electronic assembly test and classification device
08/06/2008CN101236217A Flat-plate type broad frequency sensor for power transmission engineering
08/06/2008CN101236216A Electrical power system metric data time difference compensation state estimation method
08/06/2008CN101236110A Luminous diode temperature tester
08/06/2008CN101234704A Electronic component transfer loading device and method
08/06/2008CN100409591C Method and apparatus for measuring far end interference in order to determine isoelectric level for end interference
08/06/2008CN100409199C Diagnostic data capture within an integrated circuit
08/06/2008CN100409021C Improved integrated circuit burn-in methods and apparatus
08/06/2008CN100409020C Time-domain reflectometer for connecting network cable at test end
08/06/2008CN100409019C Zero sequence direction measurement element with negative sequence negative direction blocking
08/06/2008CN100409018C Self-adaptable dicrimination for permanent fault of high-voltage electrical network
08/06/2008CN100409017C Testing circuit of multifunctional cable tester
08/06/2008CN100409016C Method and apparatus for testing capacitor of printed circuitboard
08/06/2008CN100409015C Test structures for estimating dishing and erosion effects in copper damascene technology
08/06/2008CN100408386C Device and method for monitoring at least one energy reserve capacitor in a restraint system
08/05/2008US7409631 Error-detection flip-flop
08/05/2008US7409621 On-chip jitter testing
08/05/2008US7409620 Simplified high speed test system
08/05/2008US7409619 System and methods for authoring domain specific rule-driven data generators
08/05/2008US7409618 Self verifying communications testing
08/05/2008US7409617 System for measuring characteristics of a digital signal
08/05/2008US7409616 Built in self test system and method for detecting and correcting cycle slip within a deserializer
08/05/2008US7409615 Test apparatus and test method
08/05/2008US7409614 Method, system and program product for boundary I/O testing employing a logic built-in self-test of an integrated circuit
08/05/2008US7409613 Simultaneous AC logic self-test of multiple clock domains
08/05/2008US7409612 Testing of integrated circuits
08/05/2008US7409611 Wrapper instruction/data register controls from test access or wrapper ports
08/05/2008US7409610 Total configuration memory cell validation built in self test (BIST) circuit
08/05/2008US7409609 Integrated circuit with a control input that can be disabled
08/05/2008US7409608 Pseudo-random wait-state and pseudo-random latency components
08/05/2008US7409601 Read-write function separation apparatus and method
08/05/2008US7409469 Multi-chip digital system having a plurality of controllers with input and output pins wherein self-identification signal are received and transmitted
08/05/2008US7409462 Packet communication control device and packet communication control method
08/05/2008US7409331 Apparatus for designing mixed signal integrated circuits and configurable synchronous digital noise emulator circuit
08/05/2008US7409306 System and method for estimating reliability of components for testing and quality optimization
08/05/2008US7409275 Vehicle diagnostic system
08/05/2008US7409249 Error display system
08/05/2008US7408902 Method of using a radio network controller for controlling data bit rates to maintain the quality of radio links
08/05/2008US7408882 Automatic discovery of network node addresses
08/05/2008US7408875 System and program product for actively managing central queue buffer allocation
08/05/2008US7408376 Array substrate
08/05/2008US7408375 Method and testing apparatus for testing integrated circuits
08/05/2008US7408374 Systems and methods for controlling of electro-migration
08/05/2008US7408373 Device for probe card power bus voltage drop reduction
08/05/2008US7408372 Method and apparatus for measuring device mismatches
08/05/2008US7408371 Apparatus for measuring on-chip characteristics in semiconductor circuits and related methods
08/05/2008US7408370 Lighting device
08/05/2008US7408369 System and method for determining thermal shutdown characteristics
08/05/2008US7408368 Semiconductor integrated circuit device having pads respectively provided with pad portions
08/05/2008US7408367 Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures
08/05/2008US7408366 Probe tips and method of making same
08/05/2008US7408365 Image sensor testing method and apparatus
08/05/2008US7408362 Electronic package and method for testing the same
08/05/2008US7408361 Detection circuit for measurement of test lead and using the same
08/05/2008US7408358 Electronic battery tester having a user interface to configure a printer
08/05/2008US7408357 Device for detecting contact wear in switching appliances
08/05/2008US7408339 Test system of semiconductor device having a handler remote control and method of operating the same
08/05/2008US7408338 Handler for testing semiconductor devices
08/05/2008US7408337 Compensating for loss in a transmission path
08/05/2008US7408322 Device for determining constant of rotating machine
08/05/2008US7408312 Control device for permanent magnet synchronous motor
08/05/2008US7407822 Method for inspecting insulating film for film carrier tape for mounting electronic components thereon, inspection apparatus for inspecting the insulating film, punching apparatus for punching the insulating film, and method for controlling the punching apparatus
08/05/2008CA2455818C Testing vias and contacts in integrated circuit fabrication
08/05/2008CA2367326C Monitoring internal parameters of electrical motor systems
07/2008
07/31/2008WO2008091550A1 Rotational positioner and methods for semiconductor wafer test systems
07/31/2008WO2008091371A2 Apparatus and method for combined micro-scale and nano-scale c-v,q-v, and i-v testing of semiconductor materials
07/31/2008WO2008091328A1 Second surface metallization
07/31/2008WO2008090776A1 Electric leak detecting circuit and electric leak detecting method
07/31/2008WO2008090635A1 Probe and electrical connection device employing it
07/31/2008WO2008090563A2 Method and system for evaluating contact elements
07/31/2008WO2008090559A1 Method and system for supporting a moving optical component on a sloped portion
07/31/2008WO2008042248A3 Method and apparatus for cooling non-native instrument in automatic test equipment