Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2008
08/14/2008US20080189931 Frame packaged array electronic component
08/14/2008DE112006002529T5 Dreipunkt-Sicht-Ausrichtsystem mit einer einzigen Kamera für ein Vorrichtungs-Handhabungsgerät Three-point vision alignment system with a single camera for a device handling apparatus
08/14/2008DE102008004800A1 Elektrische Prüfeinrichtung zur Prüfung von elektrischen Prüflingen Electrical test equipment for testing of electrical devices under test
08/14/2008DE102008004792A1 Elektrische Prüfeinrichtung zur Prüfung von elektrischen Prüflingen Electrical test equipment for testing of electrical devices under test
08/14/2008DE102007007167A1 Short-circuit detector for detecting and indicating e.g. short-circuit of switching system, has adjusting unit for adjusting evaluating unit to determined type-specific transducer signal characteristic from stored signal characteristics
08/14/2008DE102007006477A1 Method for monitoring health condition of electrical energy storage of vehicle, involves determining internal resistance over voltage change in voltage by switching off consumer load that is attached at main electrical system of vehicle
08/14/2008DE102007006275A1 Device for measuring characteristics of electronic functional elements, has belt guide in which band section of flexible band are transported with one or multiple functional elements with internal band speed
08/14/2008DE102007006274A1 Messvorrichtung mit einem Messrad Measuring device with a measuring wheel
08/14/2008DE102007006273A1 Device for measurement of characteristic of electronic functional elements, has closed chain consisting of chain links and chain guidance where chain is guided along measuring section with speed
08/14/2008DE102007006196A1 Kontakteinheit für eine Vorrichtung zur Inbetriebnahme eines Bauteils, Testvorrichtung, und Verfahren zum Inbetriebnehmen und Testen eines Bauteils Contact unit for a device for commissioning a component test apparatus and method for commissioning and testing of a component
08/14/2008DE102007006195A1 Kontaktelement, Kontakteinheit, Verfahren zur Herstellung einer Kontakteinheit und Verfahren zur Inbetriebnahme für Fine-Pitch Bauteile Contact element, the contact unit, method for producing a contact unit and method for starting up for fine-pitch components
08/14/2008DE102006057774B3 Führungsbahn für elektronische Bauelemente Guideway for electronic components
08/14/2008CA2677988A1 A method for processing data pertaining to an activity of partial electrical discharges
08/13/2008EP1956388A1 Radar system incorporating a HEMT with a switched check voltage (pinch-off-voltage) applied to its gate
08/13/2008EP1956381A2 Electrical testing device for testing electrical test items
08/13/2008EP1955086A2 Nanoscale fault isolation and measurement system
08/13/2008EP1955080A1 Apparatus for detecting an electrical variable of a rechargeable battery and method for producing said apparatus
08/13/2008EP1642471B1 Method and apparatus for control channel scheduling in a packet data communication system
08/13/2008EP1627487A4 Method and apparatus for determining a quality measure of a channel within a communication system
08/13/2008EP1412767B1 Method and error location in branched low voltage and medium voltage networks and evaluation circuit used thereof
08/13/2008EP1373909B1 Circuit for improved test and calibration in automated test equipment.
08/13/2008EP1194784B1 Temperature compensated vertical pin probing device
08/13/2008EP1181567A4 Detection of bridge tap using frequency domain analysis
08/13/2008CN201100864Y Lithium battery activation detection table
08/13/2008CN101243453A Controlling embedded memory access
08/13/2008CN101243325A Method and apparatus for determining deterioration of secondary battery, and power supply system therewith
08/13/2008CN101243324A Test sequence optimization method and design tool
08/13/2008CN101243323A Probe card
08/13/2008CN101242715A Portable electronic device with shell separation detection function
08/13/2008CN101242014A Dynamic battery storage capacity display device for portable electronic device
08/13/2008CN101241450A Method and system for using IR drop data for instruction thread direction
08/13/2008CN101241376A Intelligent switch power source power detection and control device
08/13/2008CN101241171A Power supply apparatus test device and method
08/13/2008CN101241170A Lithium ionic cell monomer or batteries low temperature performance evaluation method
08/13/2008CN101241169A Accumulator on-line test device
08/13/2008CN101241168A Hybrid power automobile drive electric motor test bench and test method
08/13/2008CN101241167A DC switch test system and its working method
08/13/2008CN101241166A Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics
08/13/2008CN101241165A Multi-layer structure defect inspection device
08/13/2008CN101241164A Multifunctional electric cable failure detector
08/13/2008CN101241163A Flicker source recognition method
08/13/2008CN101241162A Cable tester
08/13/2008CN101241161A Single-phase three-hole power socket detection device
08/13/2008CN101241160A Electronic components test seat detection device and its detection method
08/13/2008CN101241159A Electrical testing device for testing electrical test items
08/13/2008CN101241158A Electrical testing device for testing electrical test items
08/13/2008CN101241157A Voltage temporary drop simulation test procedure and method
08/13/2008CN101241156A Method for loading direct current mutual-inductor for applying to converter transformer bias magnet monitoring
08/13/2008CN101241155A Electric power apparatus integrated automated detection system
08/13/2008CN101241144A Probe card for testing wafer
08/13/2008CN101241143A Integrated circuit test seat and its test interface
08/13/2008CN101241085A CAM (computer aided manufacturing) reference for inspection of multi-color and contour images
08/13/2008CN101241084A Method and system for wafer inspection
08/13/2008CN101241039A Method and subassembly for testing two-sided chip photoelectric performance
08/13/2008CN100411173C Layered power source noise monitoring device of ultra large scale integrated circuit and system
08/13/2008CN100411128C Test probe and manufacturing method for test probe
08/13/2008CN100410953C Method for identifying a physical failure location and system for combining pure logic and physical layout information
08/13/2008CN100410950C Semiconductor integrated circuit and design method thereof
08/13/2008CN100410679C Device and method for indicating mobile communication terminal battery allowrance
08/13/2008CN100410678C Method and apparatus for measuring complex impedance of cells and batteries
08/13/2008CN100410677C Method and apparatus for asynchronous motor fault diagnosis for beam-pumping unit
08/13/2008CN100410676C Test pattern for reliability measurement of copper interconnection line having moisture window and method for manufacturing the same
08/13/2008CN100410675C Power cable damage synchronous magnetic field directioning positioning method
08/13/2008CN100410674C Device for checking faulty component in the overhead transmission line or lightning stroke
08/13/2008CN100410673C Cable failure prefixed point detection method and detection device
08/13/2008CN100410672C Signal output device and operation method
08/13/2008CN100410671C Method for on-line monitoring insulating hidden danger of double-pipe for transformer
08/13/2008CN100410669C Electronic type current transformer
08/12/2008US7412640 Self-synchronizing pseudorandom bit sequence checker
08/12/2008US7412639 System and method for testing circuitry on a wafer
08/12/2008US7412638 Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit
08/12/2008US7412637 Method and apparatus for broadcasting test patterns in a scan based integrated circuit
08/12/2008US7412636 Scan string segmentation for digital test compression
08/12/2008US7412635 Utilizing multiple bitstreams to avoid localized defects in partially defective programmable integrated circuits
08/12/2008US7412634 On-chip sampling circuit and method
08/12/2008US7412633 Communication interface for diagnostic circuits of an integrated circuit
08/12/2008US7412468 Generation of cryptographically strong random numbers using MISRS
08/12/2008US7412344 System for synchronously controlling the testing of pluralities of devices and the method of the same
08/12/2008US7412343 Methods for delay-fault testing in field-programmable gate arrays
08/12/2008US7412342 Low cost test for IC's or electrical modules using standard reconfigurable logic devices
08/12/2008US7411918 Dynamic radio link adaptation for interference in cellular systems
08/12/2008US7411915 Automatically configuring switch ports with appropriate features
08/12/2008US7411913 Process for automatically detecting the throughput of a network, particularly of the can bus type and for configuring with the detected throughput by transition analysis, and corresponding device
08/12/2008US7411911 Network availability status detection device and method
08/12/2008US7411908 Method and system for network emulation using bandwidth emulation techniques
08/12/2008US7411900 Fast restoration for virtually-concatenated data traffic
08/12/2008US7411515 Remote control with low battery indication
08/12/2008US7411410 LCD test device and test process thereof
08/12/2008US7411409 Digital leakage detector that detects transistor leakage current in an integrated circuit
08/12/2008US7411408 Measurement method using solar simulator
08/12/2008US7411405 Method and apparatus for reliable network cable connectivity
08/12/2008US7411404 Apparatus, system, and method for detecting an electrical short condition in a dynamoelectric machine
08/12/2008US7411403 Electrical switching apparatus and method employing active acoustic sensing to detect an electrical conductivity fault of a power circuit
08/12/2008US7411401 Systems and methods for reducing common-mode platform noise in electric-field sensors
08/12/2008US7411400 Method for testing battery condition
08/12/2008US7411384 Wafer chuck
08/12/2008US7411383 Method and apparatus for discharging voltages from a circuit under test
08/12/2008US7411315 Battery communication system
08/12/2008US7410815 Apparatus and method for non-contact assessment of a constituent in semiconductor substrates
08/12/2008US7409762 Method for fabricating an interconnect for semiconductor components