| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 08/20/2008 | CN100412558C High temperature aging test device for display panel |
| 08/20/2008 | CN100412557C Method of predicting lifetime of MISFET with high-k grid dielectric layer |
| 08/20/2008 | CN100412556C Low-voltage electric network sequential discriminating leakage selecting method and protector |
| 08/20/2008 | CN100412554C Antenna coupling tester |
| 08/20/2008 | CN100412553C Detector of Radar peak value field strength |
| 08/20/2008 | CN100412542C Method for real-timely testing performance of multi-channel photovoltaic cell |
| 08/20/2008 | CN100412506C System and method for inspecting differential signal line deviation |
| 08/20/2008 | CN100412504C Pattern inspection method and apparatus, and pattern alignment method |
| 08/20/2008 | CN100412500C Detecting needle alignment proving circuit and proving method in semiconductor device |
| 08/19/2008 | US7415730 Microcomputer and test method therefore |
| 08/19/2008 | US7415649 Semi-conductor component test device with shift register, and semi-conductor component test procedure |
| 08/19/2008 | US7415647 Test mode for pin-limited devices |
| 08/19/2008 | US7415646 Page—EXE erase algorithm for flash memory |
| 08/19/2008 | US7415645 Method and apparatus for soft-error immune and self-correcting latches |
| 08/19/2008 | US7415644 Self-repairing of microprocessor array structures |
| 08/19/2008 | US7415643 Coverage circuit for performance counter |
| 08/19/2008 | US7415633 Method and apparatus for preventing and recovering from TLB corruption by soft error |
| 08/19/2008 | US7415536 Address query response method, program, and apparatus, and address notification method, program, and apparatus |
| 08/19/2008 | US7415535 Virtual MAC address system and method |
| 08/19/2008 | US7415479 Method and apparatus for assigning test numbers |
| 08/19/2008 | US7415377 Relay testing system and method |
| 08/19/2008 | US7415367 System and method to locate common path distortion on cable systems |
| 08/19/2008 | US7415087 Circuits with state circuitry having cross connected control inputs |
| 08/19/2008 | US7415019 Apparatus and method for collecting active route topology information in a mobile ad hoc network |
| 08/19/2008 | US7414983 Methods for managing data transmissions between a mobile station and a serving station |
| 08/19/2008 | US7414973 Communication traffic management systems and methods |
| 08/19/2008 | US7414972 Jitter controlled WFQ algorithm on network processors and latency constrained hardware |
| 08/19/2008 | US7414970 Provision of static QoS control using dynamic service based policy mechanisms |
| 08/19/2008 | US7414965 Hitless protection switching |
| 08/19/2008 | US7414914 Semiconductor memory device |
| 08/19/2008 | US7414894 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 08/19/2008 | US7414425 Damping control in a three-phase motor with a single current sensor |
| 08/19/2008 | US7414424 Directional power detection by quadrature sampling |
| 08/19/2008 | US7414423 Wafer-level test module for testing image sensor chips, the related test method and fabrication |
| 08/19/2008 | US7414422 System in-package test inspection apparatus and test inspection method |
| 08/19/2008 | US7414421 Insertable calibration device |
| 08/19/2008 | US7414419 Micro-electromechanical probe circuit substrate |
| 08/19/2008 | US7414418 Method and apparatus for increasing operating frequency of a system for testing electronic devices |
| 08/19/2008 | US7414417 Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts |
| 08/19/2008 | US7414416 Electrical condition monitoring method for polymers |
| 08/19/2008 | US7414410 Cable diagnostics using time domain reflectometry and application using the same |
| 08/19/2008 | US7414409 Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers |
| 08/19/2008 | US7414390 Signal detection contactor and signal calibration system |
| 08/19/2008 | US7414332 Electric power unit and electronics device obtaining power from a plurality of power sources |
| 08/19/2008 | US7413914 Method and apparatus for manufacturing semiconductor device, method and apparatus for controlling the same, and method and apparatus for simulating manufacturing process of semiconductor device |
| 08/19/2008 | US7413672 Controlling plasma processing using parameters derived through the use of a planar ion flux probing arrangement |
| 08/19/2008 | US7412767 Microprobe tips and methods for making |
| 08/19/2008 | CA2348004C Fault conditions affecting high speed data services |
| 08/14/2008 | WO2008097751A1 Distributing data among test boards to determine test parameters |
| 08/14/2008 | WO2008097678A1 Integrated fault output/fault response delay circuit |
| 08/14/2008 | WO2008096926A1 System for testing performance of array ultrasound transducer |
| 08/14/2008 | WO2008096922A1 Method for diagnosing troubles in scan chain via symbolic simulation |
| 08/14/2008 | WO2008096771A1 Device and method for detecting abnormality of electric storage device |
| 08/14/2008 | WO2008096653A1 Amplification control device, test signal generation module, test device, amplification control method, program, recording medium |
| 08/14/2008 | WO2008096298A2 A method for detecting signals produced by partial electric discharges |
| 08/14/2008 | WO2008096284A1 A method for processing data pertaining to an activity of partial electrical discharges |
| 08/14/2008 | WO2008096209A1 Device and method for testing a circuit |
| 08/14/2008 | WO2008095692A1 Measuring instrument comprising a measuring wheel |
| 08/14/2008 | WO2008095467A1 Method and arrangement for detecting mechanical defects in a semiconductor component, in particular a solar cell or solar cell arrangement |
| 08/14/2008 | WO2008095315A1 Battery management system |
| 08/14/2008 | WO2008066788A2 Demand-driven prioritized data structure |
| 08/14/2008 | WO2008060624A3 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 08/14/2008 | WO2008021739A3 Register with a context switch device and method of context switching |
| 08/14/2008 | WO2007149743A3 Token based flow control for data communication |
| 08/14/2008 | WO2007091765A8 System, method, and article of manufacture for determining an estimated combined battery state-parameter vector |
| 08/14/2008 | US20080195908 Method and apparatus for generating expect data from a captured bit pattern, and memory device using same |
| 08/14/2008 | US20080195907 Circuit Arrangement and Method of Testing an Application Circuit Provided in Said Circuit Arrangement |
| 08/14/2008 | US20080195904 Test Point Insertion and Scan Chain Reordering for Broadcast-Scan Based Compression |
| 08/14/2008 | US20080195346 Low power scan testing techniques and apparatus |
| 08/14/2008 | US20080195345 Integrated circuit and the corresponding test method, computer device and program |
| 08/14/2008 | US20080195340 Performing temporal checking |
| 08/14/2008 | US20080195339 Performing Temporal Checking |
| 08/14/2008 | US20080195337 Scannable Virtual Rail Method and Ring Oscillator Circuit for Measuring Variations in Device Characteristics |
| 08/14/2008 | US20080192647 Detecting Media Rate For Measuring Network Jitter |
| 08/14/2008 | US20080192640 Loopback Circuit |
| 08/14/2008 | US20080192633 Apparatus and method for controlling data flow in communication system |
| 08/14/2008 | US20080192627 Method for Providing Alternative Paths as Rapid Reaction in the Failure of a Link Between Two Routing Domains |
| 08/14/2008 | US20080192390 Semiconductor device including protection circuit and switch circuit and its testing method |
| 08/14/2008 | US20080192379 Manufacturing method for magnetic disk drive |
| 08/14/2008 | US20080191732 Supply Voltage Monitoring |
| 08/14/2008 | US20080191731 Semiconductor device testing apparatus and device interface board |
| 08/14/2008 | US20080191730 Circuit testing apparatus |
| 08/14/2008 | US20080191729 Thermal interface for electronic chip testing |
| 08/14/2008 | US20080191728 Isolation circuit |
| 08/14/2008 | US20080191725 Apparatus and method for testing semiconductor devices |
| 08/14/2008 | US20080191724 Electrical testing device for testing electrical test samples |
| 08/14/2008 | US20080191723 Ic Carrier, Ic Socket and Method for Testing Ic Device |
| 08/14/2008 | US20080191722 Isolation buffers with controlled equal time delays |
| 08/14/2008 | US20080191721 Electrical test device for testing electrical test pieces |
| 08/14/2008 | US20080191720 Multilayer Substrate and Probe Card |
| 08/14/2008 | US20080191708 Inspection Device, Analysis/Display Device, Inspection Device |
| 08/14/2008 | US20080191707 Configurable interface device |
| 08/14/2008 | US20080191706 Systems and methods for testing conductive members employing electromagnetic back scattering |
| 08/14/2008 | US20080191705 Ground loop locator |
| 08/14/2008 | US20080191704 Method to Improve Isolation of an Open Net Fault in an Interposer Mounted Module |
| 08/14/2008 | US20080191703 Wide range current sensing method and system |
| 08/14/2008 | US20080191702 System and Method For Measuring Fuel Cell Voltage |
| 08/14/2008 | US20080191701 Method and Apparatus for Inspecting Light-Emitting Element and Method and Apparatus for Burn-In |
| 08/14/2008 | US20080191687 Test Handler Having Size-Changeable Test Site |
| 08/14/2008 | US20080191683 High impedance, high parallelism, high temperature memory test system architecture |