Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2008
08/28/2008US20080208510 Parameterized Signal Conditioning
08/28/2008US20080208508 Test Prepared Rf Integrated Circuit
08/28/2008US20080208507 Method and apparatus for diagnosing broken scan chain based on leakage light emission
08/28/2008US20080208494 Method and Device for Determining the Charge and/or Aging State of an Energy Store
08/28/2008US20080208492 System and Method for Early Qualification of Semiconductor Devices
08/28/2008US20080208491 Integrated Circuit and Method for Classification of Electrical Devices and Short Circuit Protection
08/28/2008US20080208490 Failure determination device for cell voltage monitor
08/28/2008US20080206908 Semiconductor device test structures and methods
08/28/2008US20080206907 Method for fabricating semiconductor device to which test is performed at wafer level and apparatus for testing semiconductor device
08/28/2008US20080206903 Adaptive threshold wafer testing device and method thereof
08/28/2008US20080205282 Method for protecting the service flow and a network device
08/28/2008US20080205277 Congestion control in an IP network
08/28/2008US20080205268 Admission control method and admission control system
08/28/2008US20080205263 System and method for advanced fail-over for packet label swapping
08/28/2008US20080205262 Node controller and node system
08/28/2008US20080205173 Method and System for Testing an Integrated Circuit
08/28/2008US20080204068 Method for estimating defects in an npn transistor array
08/28/2008US20080204067 Synchronous semiconductor device, and inspection system and method for the same
08/28/2008US20080204066 Automatic test equipment capable of high speed test
08/28/2008US20080204065 Fault tolerant selection of die on wafer
08/28/2008US20080204064 Test system and high voltage measurement method
08/28/2008US20080204063 Testable Intergrated Circuit
08/28/2008US20080204059 Probe Tile for Probing Semiconductor Wafer
08/28/2008US20080204057 System and method for estimation of integrated circuit signal characteristics using optical measurements
08/28/2008US20080204056 Device and method for performing a test of semiconductor devices with an optical interface
08/28/2008US20080204055 Crosstalk suppression in wireless testing of semiconductor devices
08/28/2008US20080204045 Apparatus and method for measuring the current consumption and the capacitance of a semiconductor device
08/28/2008US20080204038 Multilayer wiring board and method for testing the same
08/28/2008US20080204037 Multilayer wiring board and method for testing the same
08/28/2008US20080204036 Pulse-generating apparatus and a method for adjusting levels of pulses outputted from pulse-generating apparatus
08/28/2008US20080204035 Fault detection circuit for printers with multiple print heads
08/28/2008US20080204034 Automated Electrical Wiring Inspection System
08/28/2008US20080204033 Integrated Circuit and Method for Monitoring and Controlling Power and for Detecting Open Load State
08/28/2008US20080204032 Electrical connector Integrity Tester
08/28/2008US20080204029 Led chain failure detection
08/28/2008US20080203939 Method and Arrangement for Monitoring a Gas Discharge Lamp
08/28/2008US20080203558 Method of semiconductor device protection, package of semiconductor device
08/28/2008US20080203268 Adjustment mechanism
08/28/2008US20080203167 Reprogramming system and method for devices including programming symbol
08/28/2008DE602004009784T2 Datenkomprimierung Data Compression
08/28/2008DE112006002567T5 Datenerfassung in automatischer Testausrüstung Data collection in automatic test equipment
08/28/2008DE112005003753T5 Prüfvorrichtung für elektronische Bauelemente und Verfahren zum Festlegen einer optimalen Andrückbedingung für einen Kontaktarm einer Prüfvorrichtung für elektronische Bauelemente Electronic device testing apparatus and method for deciding an optimal Andrückbedingung for a contact of a test apparatus for electronic components
08/28/2008DE102007010568A1 Energieverteilungsvorrichtung, insbesondere Niederspannungs-Energieverteilungsvorrichtung Power distribution device, in particular low-voltage power distribution apparatus
08/28/2008DE102007009569A1 Connection device for connecting cable with pole of battery, has measuring element including contact part for contacting battery pole, and clamping device surrounding contact part of measuring element in concentric manner
08/27/2008EP1962099A2 Method of determining the energy capacity of battery
08/27/2008EP1961621A1 Battery state judging method, and battery state judging device
08/27/2008EP1960801A1 Battery state of charge voltage hysteresis estimator
08/27/2008EP1960800A2 Determination of ir-free voltage in hybrid vehicle applications
08/27/2008EP1960799A2 Battery state of charge reset
08/27/2008EP1960798A2 Apparatus and method for adjusting an orientation of probes
08/27/2008EP1640736B1 Testing device
08/27/2008EP1521974B1 Electronic circuit with test unit for testing interconnects
08/27/2008EP1451973B1 Policy-based forward error correction in packet networks
08/27/2008EP1370880B1 A multiple-capture dft system for scan-based integrated circuits
08/27/2008CN201107396Y Direct-current power supply analog device
08/27/2008CN201107395Y Battery electric quantity colour development equipment
08/27/2008CN201107394Y Electrical signal insulating testing apparatus of permanent magnetism synchronous electric machine
08/27/2008CN201107393Y Synchronization / coordinating controller performance test platform
08/27/2008CN201107392Y Asynchronous traction electric motor four dimensional movement integrative test stand
08/27/2008CN201107391Y Control device for testing of high-voltage switchgear equipment
08/27/2008CN201107390Y Tool for debugging airplane rudder electromechanical magnetic valve
08/27/2008CN201107389Y Water cooling system of high power high-tension valve testing
08/27/2008CN201107388Y Automobile assembly line simple circuit inspection device
08/27/2008CN201107387Y Apparatus for rapidly testing and aging of computer panel card
08/27/2008CN201107386Y Test circuit board
08/27/2008CN201107385Y Semiconductor high and low temperature experiment instrument
08/27/2008CN201107384Y High voltage dc transmission stream exchanging valve non-periodic triggering tester based on charging in parallel
08/27/2008CN201107383Y Electric connector intelligent test system
08/27/2008CN201107382Y Bunch assembly line on-line automatic test bunch passage way apparatus
08/27/2008CN201107381Y Electrical wire tracing equipment
08/27/2008CN201107380Y Cable short circuit, broken circuit tester
08/27/2008CN201107379Y Chip type capacitor surge and aging test device
08/27/2008CN201107378Y LCD module debugging apparatus
08/27/2008CN201107377Y New type testing apparatus of surge protector
08/27/2008CN201107376Y Contract field feed source rotating platform
08/27/2008CN201107375Y High voltage test device of high pressure seal electric connector special for well logging
08/27/2008CN201107374Y Photoelectric device parameter monitoring equipment
08/27/2008CN201107373Y Full-automatic calibrating apparatus of cable test system
08/27/2008CN201107372Y Monitoring device for lightning arrestor on-line action
08/27/2008CN201107371Y Electric appliances durability test stand
08/27/2008CN201107370Y Breakdown rapid disjunction mechanism for insulated pretection utensil pressure test apparatus
08/27/2008CN201107369Y Intelligent fault tester for electric motor vehicle
08/27/2008CN201107368Y High-pressure electrical insulator electrified detection system
08/27/2008CN201107367Y Rolling stock hand-hold intelligent insulated detector
08/27/2008CN201107366Y Bifilar system circuit grounding automatic detection alarm
08/27/2008CN201107365Y Frequency converter drive plate
08/27/2008CN201107364Y Device lifetime test device
08/27/2008CN201107363Y Modularization composite structure of electric fire prevention testing apparatus
08/27/2008CN201107362Y Test device for automatically controlling switching machine
08/27/2008CN201107361Y Residual current type circuit of electric fire supervising detector
08/27/2008CN201107360Y Rapid test device of CAN bus signal attribute
08/27/2008CN201107359Y Series resonance pressure test apparatus
08/27/2008CN201107356Y New type motor rotor tester
08/27/2008CN201107334Y Large-capacity square wave impact current generator
08/27/2008CN201107333Y Detecting probe
08/27/2008CN201107330Y Needle clamp and needle clamp component
08/27/2008CN201107329Y Contact chucking appliance of integrated circuit sorting machines
08/27/2008CN201107057Y Three detection circuits
08/27/2008CN201107055Y Three detection circuits
08/27/2008CN201107054Y Three detection circuits